smartctl 7.4 2023-08-01 r5530 [FreeBSD 14.1-RELEASE-p4 amd64] (local build)
Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Model Family:     Seagate Barracuda 7200.7 and 7200.7 Plus
Device Model:     ST3120026AS
Serial Number:    --
Firmware Version: 3.18
User Capacity:    120,034,123,776 bytes [120 GB]
Sector Size:      512 bytes logical/physical
Device is:        In smartctl database 7.3/5528
ATA Version is:   ATA/ATAPI-6 T13/1410D revision 2
Local Time is:    Thu Sep 26 12:07:46 2024 MSK
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is:   Unavailable
APM feature is:   Unavailable
Rd look-ahead is: Enabled
Write cache is:   Enabled
DSN feature is:   Unavailable
ATA Security is:  Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Unavailable

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x82)	Offline data collection activity
					was completed without error.
					Auto Offline Data Collection: Enabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever 
					been run.
Total time to complete Offline 
data collection: 		(  430) seconds.
Offline data collection
capabilities: 			 (0x5b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					No Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					No General Purpose Logging support.
Short self-test routine 
recommended polling time: 	 (   1) minutes.
Extended self-test routine
recommended polling time: 	 (  85) minutes.

SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAGS    VALUE WORST THRESH FAIL RAW_VALUE
  1 Raw_Read_Error_Rate     POSR--   068   050   006    -    241218222
  3 Spin_Up_Time            PO----   097   096   000    -    0
  4 Start_Stop_Count        -O--CK   100   100   020    -    2
  5 Reallocated_Sector_Ct   PO--CK   100   100   036    -    28
  7 Seek_Error_Rate         POSR--   084   060   030    -    4586828452
  9 Power_On_Hours          -O--CK   075   075   000    -    22252
 10 Spin_Retry_Count        PO--C-   100   100   097    -    0
 12 Power_Cycle_Count       -O--CK   100   100   020    -    247
194 Temperature_Celsius     -O---K   041   054   000    -    41
195 Hardware_ECC_Recovered  -O-RC-   068   050   000    -    241218222
197 Current_Pending_Sector  -O--C-   100   100   000    -    43
198 Offline_Uncorrectable   ----C-   100   100   000    -    43
199 UDMA_CRC_Error_Count    -OSRCK   200   200   000    -    0
200 Multi_Zone_Error_Rate   ------   100   253   000    -    0
202 Data_Address_Mark_Errs  -O--CK   098   251   000    -    2
                            ||||||_ K auto-keep
                            |||||__ C event count
                            ||||___ R error rate
                            |||____ S speed/performance
                            ||_____ O updated online
                            |______ P prefailure warning

General Purpose Log Directory not supported

SMART Log Directory Version 1 [multi-sector log support]
Address    Access  R/W   Size  Description
0x00           SL  R/O      1  Log Directory
0x01           SL  R/O      1  Summary SMART error log
0x02           SL  R/O      5  Comprehensive SMART error log
0x03           SL  R/O      5  Ext. Comprehensive SMART error log
0x06           SL  R/O      1  SMART self-test log
0x07           SL  R/O      1  Extended self-test log
0x09           SL  R/W      1  Selective self-test log
0x20           SL  R/O      1  Streaming performance log
0x21           SL  R/O      1  Write stream error log
0x22           SL  R/O      1  Read stream error log
0x23           SL  R/O      1  Delayed sector log
0x80-0x9f      SL  R/W     16  Host vendor specific log
0xa0           SL  VS       1  Device vendor specific log
0xa1           SL  VS      20  Device vendor specific log
0xa2           SL  VS     101  Device vendor specific log
0xa8           SL  VS      20  Device vendor specific log
0xa9           SL  VS       1  Device vendor specific log

SMART Extended Comprehensive Error Log (GP Log 0x03) not supported

SMART Error Log Version: 1
ATA Error Count: 669 (device log contains only the most recent five errors)
	CR = Command Register [HEX]
	FR = Features Register [HEX]
	SC = Sector Count Register [HEX]
	SN = Sector Number Register [HEX]
	CL = Cylinder Low Register [HEX]
	CH = Cylinder High Register [HEX]
	DH = Device/Head Register [HEX]
	DC = Device Command Register [HEX]
	ER = Error register [HEX]
	ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 669 occurred at disk power-on lifetime: 22005 hours (916 days + 21 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 00 a4 04 0c 40  Error: UNC at LBA = 0x000c04a4 = 787620

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 03 01 a4 04 0c 40 00      17:22:56.787  READ DMA
  c8 03 01 a3 04 0c 40 00      17:23:30.168  READ DMA
  c8 03 01 a2 04 0c 40 00      17:23:30.167  READ DMA
  ef 03 46 01 00 00 00 00      17:23:30.154  SET FEATURES [Set transfer mode]
  ec 00 01 01 00 00 00 00      17:23:30.143  IDENTIFY DEVICE

Error 668 occurred at disk power-on lifetime: 22004 hours (916 days + 20 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 00 a1 04 0c 40  Error: UNC at LBA = 0x000c04a1 = 787617

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 03 01 a1 04 0c 40 00      17:21:53.866  READ DMA
  c8 03 01 a0 04 0c 40 00      17:21:53.866  READ DMA
  c8 03 01 9f 04 0c 40 00      17:21:53.866  READ DMA
  c8 03 01 9e 04 0c 40 00      17:21:53.866  READ DMA
  c8 03 01 9d 04 0c 40 00      17:21:53.866  READ DMA

Error 667 occurred at disk power-on lifetime: 22004 hours (916 days + 20 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 21 a1 04 0c 40  Error: UNC 33 sectors at LBA = 0x000c04a1 = 787617

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 03 40 80 04 0c 40 00      17:20:14.385  READ DMA
  c8 03 40 c0 50 07 40 00      17:20:14.332  READ DMA
  c8 03 40 40 41 07 40 00      17:20:14.330  READ DMA
  c8 03 40 c0 1e 30 40 00      17:20:14.315  READ DMA
  c8 03 40 c0 ec 10 40 00      17:20:14.314  READ DMA

Error 666 occurred at disk power-on lifetime: 22004 hours (916 days + 20 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 00 cd ff 02 40  Error: UNC at LBA = 0x0002ffcd = 196557

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 03 01 cd ff 02 40 00      17:13:01.967  READ DMA
  ef 03 46 01 00 00 00 00      17:13:01.738  SET FEATURES [Set transfer mode]
  ec 00 01 01 00 00 00 00      17:13:01.225  IDENTIFY DEVICE
  00 00 01 00 00 00 00 ff      17:13:00.996  NOP [Abort queued commands]
  00 00 01 00 00 00 00 ff      17:12:30.483  NOP [Abort queued commands]

Error 665 occurred at disk power-on lifetime: 22004 hours (916 days + 20 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 00 cc ff 02 40  Error: UNC at LBA = 0x0002ffcc = 196556

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 03 01 cc ff 02 40 00      17:10:53.990  READ DMA
  c8 03 01 cb ff 02 40 00      17:10:53.761  READ DMA
  ef 03 46 01 00 00 00 00      17:10:53.247  SET FEATURES [Set transfer mode]
  ec 00 01 01 00 00 00 00      17:10:53.019  IDENTIFY DEVICE
  00 00 46 00 00 00 00 ff      17:11:26.300  NOP [Abort queued commands]

SMART Extended Self-test Log (GP Log 0x07) not supported

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]

SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

SCT Commands not supported

Device Statistics (GP/SMART Log 0x04) not supported

Pending Defects log (GP Log 0x0c) not supported

SATA Phy Event Counters (GP Log 0x11) not supported

