smartctl 7.4 2023-08-01 r5530 [FreeBSD 14.2-RELEASE i386] (local build)
Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Model Family:     Seagate Barracuda 7200.9
Device Model:     ST380811AS
Serial Number:    --
Firmware Version: 3.AAE
User Capacity:    80,026,361,856 bytes [80.0 GB]
Sector Size:      512 bytes logical/physical
Device is:        In smartctl database 7.3/5528
ATA Version is:   ATA/ATAPI-7 (minor revision not indicated)
Local Time is:    Mon Dec 16 22:34:55 2024 MSK
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is:   Unavailable
APM feature is:   Unavailable
Rd look-ahead is: Enabled
Write cache is:   Enabled
DSN feature is:   Unavailable
ATA Security is:  Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Unavailable

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x82)	Offline data collection activity
					was completed without error.
					Auto Offline Data Collection: Enabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever 
					been run.
Total time to complete Offline 
data collection: 		(  430) seconds.
Offline data collection
capabilities: 			 (0x5b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					No Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   1) minutes.
Extended self-test routine
recommended polling time: 	 (  27) minutes.

SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAGS    VALUE WORST THRESH FAIL RAW_VALUE
  1 Raw_Read_Error_Rate     POSR--   102   069   006    -    119420903
  3 Spin_Up_Time            PO----   095   094   000    -    0
  4 Start_Stop_Count        -O--CK   098   098   020    -    2437
  5 Reallocated_Sector_Ct   PO--CK   100   100   036    -    8
  7 Seek_Error_Rate         POSR--   083   060   030    -    211660935
  9 Power_On_Hours          -O--CK   087   087   000    -    11520
 10 Spin_Retry_Count        PO--C-   100   100   097    -    0
 12 Power_Cycle_Count       -O--CK   098   098   020    -    2981
187 Reported_Uncorrect      -O--CK   015   015   000    -    85
189 High_Fly_Writes         -O-RCK   100   100   000    -    0
190 Airflow_Temperature_Cel -O---K   060   051   045    -    40 (Min/Max 36/40)
194 Temperature_Celsius     -O---K   040   049   000    -    40 (0 12 0 0 0)
195 Hardware_ECC_Recovered  -O-RC-   048   046   000    -    66325951
197 Current_Pending_Sector  -O--C-   100   100   000    -    0
198 Offline_Uncorrectable   ----C-   100   100   000    -    0
199 UDMA_CRC_Error_Count    -OSRCK   200   200   000    -    3
200 Multi_Zone_Error_Rate   ------   100   253   000    -    0
202 Data_Address_Mark_Errs  -O--CK   100   253   000    -    0
                            ||||||_ K auto-keep
                            |||||__ C event count
                            ||||___ R error rate
                            |||____ S speed/performance
                            ||_____ O updated online
                            |______ P prefailure warning

ATA_READ_LOG_EXT (addr=0x00:0x00, page=0, n=1) failed: 48-bit ATA commands not implemented [JMicron]
Read GP Log Directory failed

SMART Log Directory Version 1 [multi-sector log support]
Address    Access  R/W   Size  Description
0x00           SL  R/O      1  Log Directory
0x01           SL  R/O      1  Summary SMART error log
0x02           SL  R/O      5  Comprehensive SMART error log
0x03           SL  R/O      5  Ext. Comprehensive SMART error log
0x06           SL  R/O      1  SMART self-test log
0x07           SL  R/O      1  Extended self-test log
0x09           SL  R/W      1  Selective self-test log
0x10           SL  R/O      1  NCQ Command Error log
0x11           SL  R/O      1  SATA Phy Event Counters log
0x20           SL  R/O      1  Streaming performance log
0x21           SL  R/O      1  Write stream error log
0x22           SL  R/O      1  Read stream error log
0x23           SL  R/O      1  Delayed sector log
0x80-0x9f      SL  R/W     16  Host vendor specific log
0xa0           SL  VS       1  Device vendor specific log
0xa1           SL  VS      20  Device vendor specific log
0xa2           SL  VS     101  Device vendor specific log
0xa8           SL  VS      20  Device vendor specific log
0xa9           SL  VS       1  Device vendor specific log
0xe0           SL  R/W      1  SCT Command/Status
0xe1           SL  R/W      1  SCT Data Transfer

SMART Extended Comprehensive Error Log (GP Log 0x03) not supported

SMART Error Log Version: 1
ATA Error Count: 318 (device log contains only the most recent five errors)
	CR = Command Register [HEX]
	FR = Features Register [HEX]
	SC = Sector Count Register [HEX]
	SN = Sector Number Register [HEX]
	CL = Cylinder Low Register [HEX]
	CH = Cylinder High Register [HEX]
	DH = Device/Head Register [HEX]
	DC = Device Command Register [HEX]
	ER = Error register [HEX]
	ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 318 occurred at disk power-on lifetime: 11520 hours (480 days + 0 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  84 51 6f 11 6e 87 e0  Error: ICRC, ABRT 111 sectors at LBA = 0x00876e11 = 8875537

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 80 00 6e 87 e0 00      00:04:13.309  READ DMA EXT
  25 00 80 80 6d 87 e0 00      00:04:13.307  READ DMA EXT
  25 00 80 00 6d 87 e0 00      00:04:13.304  READ DMA EXT
  25 00 80 80 6c 87 e0 00      00:04:13.302  READ DMA EXT
  25 00 80 00 6c 87 e0 00      00:04:13.297  READ DMA EXT

Error 317 occurred at disk power-on lifetime: 11520 hours (480 days + 0 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  84 51 3f 81 e0 73 e0  Error: ICRC, ABRT 63 sectors at LBA = 0x0073e081 = 7594113

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 80 40 e0 73 e0 00      00:04:10.822  READ DMA EXT
  25 00 80 c0 df 73 e0 00      00:04:10.819  READ DMA EXT
  25 00 80 40 df 73 e0 00      00:04:10.815  READ DMA EXT
  25 00 80 c0 de 73 e0 00      00:04:10.813  READ DMA EXT
  25 00 80 40 de 73 e0 00      00:04:10.810  READ DMA EXT

Error 316 occurred at disk power-on lifetime: 11520 hours (480 days + 0 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  84 51 0f b1 44 d7 e0  Error: ICRC, ABRT 15 sectors at LBA = 0x00d744b1 = 14107825

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 40 80 44 d7 e0 00      00:03:59.543  READ DMA EXT
  25 00 40 80 b8 c3 e0 00      00:03:59.541  READ DMA EXT
  25 00 80 00 b8 c3 e0 00      00:03:59.539  READ DMA EXT
  25 00 80 80 b7 c3 e0 00      00:03:59.537  READ DMA EXT
  25 00 80 00 b7 c3 e0 00      00:03:59.535  READ DMA EXT

Error 315 occurred at disk power-on lifetime: 11520 hours (480 days + 0 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  84 51 1f 61 8f 9c e0  Error: ICRC, ABRT 31 sectors at LBA = 0x009c8f61 = 10260321

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 40 40 8f 9c e0 00      00:03:54.626  READ DMA EXT
  25 00 40 00 a8 9a e0 00      00:03:54.616  READ DMA EXT
  25 00 40 40 93 9a e0 00      00:03:54.605  READ DMA EXT
  25 00 40 80 7e 9a e0 00      00:03:54.596  READ DMA EXT
  25 00 40 c0 69 9a e0 00      00:03:54.585  READ DMA EXT

Error 314 occurred at disk power-on lifetime: 11520 hours (480 days + 0 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  84 51 5f a1 a0 00 e0  Error: ICRC, ABRT 95 sectors at LBA = 0x0000a0a1 = 41121

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 80 80 a0 00 e0 00      00:01:45.184  READ DMA EXT
  25 00 80 00 a0 00 e0 00      00:03:46.336  READ DMA EXT
  25 00 80 80 9f 00 e0 00      00:03:46.334  READ DMA EXT
  25 00 80 00 9f 00 e0 00      00:03:46.332  READ DMA EXT
  25 00 40 00 a2 00 e0 00      00:03:46.328  READ DMA EXT

SMART Extended Self-test Log (GP Log 0x07) not supported

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Short offline       Completed without error       00%     11489         -
# 2  Short offline       Completed without error       00%     11149         -

SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

SCT Commands not supported

Device Statistics (GP/SMART Log 0x04) not supported

Pending Defects log (GP Log 0x0c) not supported

ATA_READ_LOG_EXT (addr=0x11:0x00, page=0, n=1) failed: 48-bit ATA commands not implemented [JMicron]
Read SATA Phy Event Counters failed



