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Update of reports (new: 3633, modified: 0)
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Andrey Ponomarenko
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HDD/IBM-Hitachi/IC25/IC25N080ATMR04-0/2F9DA03FD063
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HDD/IBM-Hitachi/IC25/IC25N080ATMR04-0/2F9DA03FD063
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smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.0-RELEASE-p11 i386] (local build)
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Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
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=== START OF INFORMATION SECTION ===
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Model Family: Hitachi Travelstar 80GN
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Device Model: IC25N080ATMR04-0
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Serial Number: --
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Firmware Version: MO4OAD4A
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User Capacity: 80,026,361,856 bytes [80.0 GB]
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Sector Size: 512 bytes logical/physical
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Device is: In smartctl database 7.3/5319
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ATA Version is: ATA/ATAPI-6 T13/1410D revision 3a
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Local Time is: Sat Apr 30 18:50:12 2022 EDT
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SMART support is: Available - device has SMART capability.
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SMART support is: Enabled
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AAM level is: 128 (quiet), recommended: 128
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APM level is: 128 (minimum power consumption without standby)
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Rd look-ahead is: Enabled
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Write cache is: Enabled
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DSN feature is: Unavailable
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ATA Security is: Disabled, frozen [SEC2]
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Wt Cache Reorder: Unavailable
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=== START OF READ SMART DATA SECTION ===
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SMART overall-health self-assessment test result: PASSED
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General SMART Values:
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Offline data collection status: (0x00) Offline data collection activity
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was never started.
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Auto Offline Data Collection: Disabled.
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Self-test execution status: ( 0) The previous self-test routine completed
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without error or no self-test has ever
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been run.
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Total time to complete Offline
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data collection: ( 645) seconds.
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Offline data collection
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capabilities: (0x5b) SMART execute Offline immediate.
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Auto Offline data collection on/off support.
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Suspend Offline collection upon new
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command.
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Offline surface scan supported.
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Self-test supported.
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No Conveyance Self-test supported.
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Selective Self-test supported.
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SMART capabilities: (0x0003) Saves SMART data before entering
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power-saving mode.
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Supports SMART auto save timer.
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Error logging capability: (0x01) Error logging supported.
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General Purpose Logging supported.
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Short self-test routine
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recommended polling time: ( 2) minutes.
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Extended self-test routine
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recommended polling time: ( 69) minutes.
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SMART Attributes Data Structure revision number: 16
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Vendor Specific SMART Attributes with Thresholds:
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ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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1 Raw_Read_Error_Rate PO-R-- 100 100 062 - 0
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2 Throughput_Performance P-S--- 100 100 040 - 0
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3 Spin_Up_Time POS--- 125 125 033 - 1
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4 Start_Stop_Count -O--C- 100 100 000 - 1101
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5 Reallocated_Sector_Ct PO--CK 100 100 005 - 0
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7 Seek_Error_Rate PO-R-- 100 100 067 - 0
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8 Seek_Time_Performance P-S--- 100 100 040 - 0
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9 Power_On_Hours -O--C- 097 097 000 - 1491
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10 Spin_Retry_Count PO--C- 100 100 060 - 0
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12 Power_Cycle_Count -O--CK 100 100 000 - 1099
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191 G-Sense_Error_Rate -O-R-- 100 100 000 - 0
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192 Power-Off_Retract_Count -O--CK 100 100 000 - 101
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193 Load_Cycle_Count -O--C- 095 095 000 - 57293
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194 Temperature_Celsius -O---- 177 177 000 - 31 (Min/Max 13/53)
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196 Reallocated_Event_Count -O--CK 100 100 000 - 4
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197 Current_Pending_Sector -O---K 100 100 000 - 0
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198 Offline_Uncorrectable ---R-- 100 100 000 - 0
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199 UDMA_CRC_Error_Count -O-R-- 200 200 000 - 0
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||||||_ K auto-keep
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|||||__ C event count
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||||___ R error rate
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|||____ S speed/performance
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||_____ O updated online
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|______ P prefailure warning
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General Purpose Log Directory Version 1
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SMART Log Directory Version 1 [multi-sector log support]
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Address Access R/W Size Description
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0x00 GPL,SL R/O 1 Log Directory
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0x01 SL R/O 1 Summary SMART error log
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0x03 GPL R/O 1 Ext. Comprehensive SMART error log
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0x06 SL R/O 1 SMART self-test log
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0x07 GPL R/O 1 Extended self-test log
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0x80-0x9f GPL,SL R/W 16 Host vendor specific log
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SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
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Device Error Count: 335 (device log contains only the most recent 4 errors)
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CR = Command Register
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FEATR = Features Register
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COUNT = Count (was: Sector Count) Register
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LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8
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LH = LBA High (was: Cylinder High) Register ] LBA
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LM = LBA Mid (was: Cylinder Low) Register ] Register
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LL = LBA Low (was: Sector Number) Register ]
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DV = Device (was: Device/Head) Register
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DC = Device Control Register
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ER = Error register
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ST = Status register
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Powered_Up_Time is measured from power on, and printed as
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DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
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SS=sec, and sss=millisec. It "wraps" after 49.710 days.
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Error 335 [2] occurred at disk power-on lifetime: 1230 hours (51 days + 6 hours)
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When the command that caused the error occurred, the device was active or idle.
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After command completion occurred, registers were:
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ER -- ST COUNT LBA_48 LH LM LL DV DC
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-- -- -- == -- == == == -- -- -- -- --
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40 -- 51 00 6c 00 00 02 52 14 fb e2 00 Error: UNC 108 sectors at LBA = 0x025214fb = 38933755
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Commands leading to the command that caused the error were:
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CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name
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-- == -- == -- == == == -- -- -- -- -- --------------- --------------------
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c8 00 00 00 70 09 0a ce 52 14 f7 e2 00 00:30:33.300 READ DMA
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c8 00 00 00 18 2c 47 b6 09 0a b7 e0 00 00:30:33.300 READ DMA
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c8 00 00 00 08 2c 47 b6 2c 47 af e1 00 00:30:33.300 READ DMA
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c8 00 00 00 08 09 0a fb 2c 47 af e1 00 00:30:33.300 READ DMA
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c8 00 00 00 2d 09 0a ae 09 0a cf e0 00 00:30:33.300 READ DMA
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Error 334 [1] occurred at disk power-on lifetime: 1230 hours (51 days + 6 hours)
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When the command that caused the error occurred, the device was active or idle.
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After command completion occurred, registers were:
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ER -- ST COUNT LBA_48 LH LM LL DV DC
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-- -- -- == -- == == == -- -- -- -- --
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40 -- 51 00 7c 00 00 02 52 14 fb e2 00 Error: UNC 124 sectors at LBA = 0x025214fb = 38933755
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Commands leading to the command that caused the error were:
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CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name
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-- == -- == -- == == == -- -- -- -- -- --------------- --------------------
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c8 00 00 00 80 2c 47 b6 52 14 f7 e2 00 00:30:29.600 READ DMA
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c8 00 00 00 08 2c 47 b6 2c 47 af e1 00 00:30:29.500 READ DMA
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c8 00 00 00 08 08 dc 1d 2c 47 af e1 00 00:30:29.500 READ DMA
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c8 00 00 00 1f 08 db fe 08 db ff e0 00 00:30:29.500 READ DMA
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c8 00 00 00 28 09 09 a6 08 db d7 e0 00 00:30:29.500 READ DMA
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Error 333 [0] occurred at disk power-on lifetime: 1230 hours (51 days + 6 hours)
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When the command that caused the error occurred, the device was active or idle.
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After command completion occurred, registers were:
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ER -- ST COUNT LBA_48 LH LM LL DV DC
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-- -- -- == -- == == == -- -- -- -- --
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40 -- 51 00 7c 00 00 02 52 14 fb e2 7c Error: UNC 124 sectors at LBA = 0x025214fb = 38933755
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Commands leading to the command that caused the error were:
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CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name
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-- == -- == -- == == == -- -- -- -- -- --------------- --------------------
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c8 00 00 00 80 2c 47 b6 52 14 f7 e2 00 00:30:25.700 READ DMA
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c8 00 00 00 08 2c 47 b6 2c 47 af e1 00 00:30:25.700 READ DMA
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c8 00 00 00 08 08 dd 23 2c 47 af e1 00 00:30:25.700 READ DMA
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c8 00 00 00 55 08 dc ce 08 dc cf e0 00 00:30:25.700 READ DMA
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c8 00 00 00 28 2c 47 b6 08 dc a7 e0 00 00:30:25.700 READ DMA
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Error 332 [3] occurred at disk power-on lifetime: 1230 hours (51 days + 6 hours)
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When the command that caused the error occurred, the device was active or idle.
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After command completion occurred, registers were:
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ER -- ST COUNT LBA_48 LH LM LL DV DC
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-- -- -- == -- == == == -- -- -- -- --
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40 -- 51 00 7c 00 00 02 52 14 fb e2 00 Error: UNC 124 sectors at LBA = 0x025214fb = 38933755
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Commands leading to the command that caused the error were:
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CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name
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-- == -- == -- == == == -- -- -- -- -- --------------- --------------------
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c8 00 00 00 80 2c 47 b6 52 14 f7 e2 00 00:30:21.900 READ DMA
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c8 00 00 00 08 2c 47 b6 2c 47 af e1 00 00:30:21.900 READ DMA
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c8 00 00 00 08 07 ef 9a 2c 47 af e1 00 00:30:21.900 READ DMA
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c8 00 00 00 14 2a 1d 86 07 ef 87 e0 00 00:30:21.900 READ DMA
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ca 00 00 00 08 2c 47 b6 2a 1d 7f e1 00 00:30:21.800 WRITE DMA
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SMART Extended Self-test Log Version: 1 (1 sectors)
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No self-tests have been logged. [To run self-tests, use: smartctl -t]
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Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
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SMART Selective self-test log data structure revision number 1
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SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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1 0 0 Not_testing
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2 0 0 Not_testing
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3 0 0 Not_testing
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4 0 0 Not_testing
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5 0 0 Not_testing
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Selective self-test flags (0x0):
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After scanning selected spans, do NOT read-scan remainder of disk.
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If Selective self-test is pending on power-up, resume after 0 minute delay.
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SCT Commands not supported
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Device Statistics (GP/SMART Log 0x04) not supported
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Pending Defects log (GP Log 0x0c) not supported
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SATA Phy Event Counters (GP Log 0x11) not supported
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