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Andrey Ponomarenko
2023-02-14 01:25:13 +03:00
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smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE-p2 amd64] (local build)
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: SK hynix SATA SSDs
Device Model: SHGS31-250GS-2
Serial Number: --
Firmware Version: 90000Q00
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic
Device is: In smartctl database 7.3/5319
ATA Version is: ACS-3 (minor revision not indicated)
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Oct 25 23:07:02 2022 PDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Disabled
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x51) SMART execute Offline immediate.
No Auto Offline data collection support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0002) Does not save SMART data before
entering power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 40) minutes.
SMART Attributes Data Structure revision number: 0
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate -OSR-- 166 166 006 - 0
5 Retired_Block_Count -O--CK 100 100 036 - 0
9 Power_On_Hours -O--CK 080 080 000 - 17790
12 Power_Cycle_Count -O--CK 100 100 020 - 37
100 Total_Erase_Count -O--CK 100 100 000 - 2186277
168 Min_Erase_Count -O--CK 098 098 000 - 87
169 Max_Erase_Count -O--CK 095 095 000 - 166
171 Program_Fail_Count -O--CK 100 100 000 - 0
172 Erase_Fail_Count -O--CK 100 100 000 - 0
174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 25
175 Program_Fail_Count_Chip -O--CK 100 100 000 - 0
176 Unused_Rsvd_Blk_Cnt_Tot -O--CK 100 100 000 - 0
177 Wear_Leveling_Count -O--CK 097 097 000 - 116
178 Used_Rsvd_Blk_Cnt_Chip -O--CK 100 100 000 - 0
179 Used_Rsvd_Blk_Cnt_Tot -O--CK 100 100 000 - 0
180 Erase_Fail_Count -O--CK 100 100 000 - 394
184 End-to-End_Error -O--CK 100 100 000 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
188 Command_Timeout -O--CK 100 100 000 - 0
194 Temperature_Celsius -O---K 035 043 000 - 35 (Min/Max 30/43)
195 Hardware_ECC_Recovered -OSR-- 100 100 000 - 0
196 Reallocated_Event_Count -O--CK 100 100 036 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0
204 Soft_ECC_Correction -OSR-- 064 001 000 - 4927
212 Phy_Error_Count -O--CK 100 100 000 - 206
233 Media_Wearout_Indicator PO---K 097 097 001 - 97
234 Unknown_SK_hynix_Attrib -O--CK 100 100 000 - 30942
241 Total_Writes_GB -O--CK 100 100 000 - 12181
242 Total_Reads_GB -O--CK 100 100 000 - 396
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 4 Comprehensive SMART error log
0x03 GPL R/O 5 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 2 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (5 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (2 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 37 --- Lifetime Power-On Resets
0x01 0x010 4 17790 --- Power-on Hours
0x01 0x018 6 23792868610 --- Logical Sectors Written
0x01 0x020 6 922128860 --- Number of Write Commands
0x01 0x028 6 775197262 --- Logical Sectors Read
0x01 0x030 6 61901826 --- Number of Read Commands
0x01 0x038 6 3914457856 --- Date and Time TimeStamp
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 35 --- Current Temperature
0x05 0x010 1 29 --- Average Short Term Temperature
0x05 0x018 1 - --- Average Long Term Temperature
0x05 0x020 1 43 --- Highest Temperature
0x05 0x028 1 20 --- Lowest Temperature
0x05 0x030 1 - --- Highest Average Short Term Temperature
0x05 0x038 1 27 --- Lowest Average Short Term Temperature
0x05 0x040 1 - --- Highest Average Long Term Temperature
0x05 0x048 1 29 --- Lowest Average Long Term Temperature
0x05 0x050 4 0 --- Time in Over-Temperature
0x05 0x058 1 80 --- Specified Maximum Operating Temperature
0x05 0x060 4 290420 --- Time in Under-Temperature
0x05 0x068 1 -20 --- Specified Minimum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 218 --- Number of Hardware Resets
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 3 --- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x000a 2 8 Device-to-host register FISes sent due to a COMRESET

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smartctl 7.2 2020-12-30 r5155 [FreeBSD 13.0-RELEASE amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: SHGS31-500GS-2
Serial Number: --
Firmware Version: 90000Q00
User Capacity: 500,107,862,016 bytes [500 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-3 (minor revision not indicated)
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Fri Jun 17 02:28:34 2022 CDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM level is: 254 (maximum performance)
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x51) SMART execute Offline immediate.
No Auto Offline data collection support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0002) Does not save SMART data before
entering power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 80) minutes.
SMART Attributes Data Structure revision number: 0
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate -OSR-- 166 166 006 - 0
5 Reallocated_Sector_Ct -O--CK 100 100 036 - 0
9 Power_On_Hours -O--CK 098 098 000 - 2607
12 Power_Cycle_Count -O--CK 100 100 020 - 88
100 Unknown_Attribute -O--CK 100 100 000 - 23493
168 Unknown_Attribute -O--CK 100 100 000 - 1
169 Unknown_Attribute -O--CK 100 100 000 - 7
171 Unknown_Attribute -O--CK 100 100 000 - 0
172 Unknown_Attribute -O--CK 100 100 000 - 0
174 Unknown_Attribute -O--CK 100 100 000 - 61
175 Program_Fail_Count_Chip -O--CK 100 100 000 - 0
176 Erase_Fail_Count_Chip -O--CK 100 100 000 - 0
177 Wear_Leveling_Count -O--CK 100 100 000 - 1
178 Used_Rsvd_Blk_Cnt_Chip -O--CK 100 100 000 - 0
179 Used_Rsvd_Blk_Cnt_Tot -O--CK 100 100 000 - 0
180 Unused_Rsvd_Blk_Cnt_Tot -O--CK 100 100 000 - 837
184 End-to-End_Error -O--CK 100 100 000 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
188 Command_Timeout -O--CK 100 100 000 - 0
194 Temperature_Celsius -O---K 031 043 000 - 31 (Min/Max 24/43)
195 Hardware_ECC_Recovered -OSR-- 100 100 000 - 0
196 Reallocated_Event_Count -O--CK 100 100 036 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0
204 Soft_ECC_Correction -OSR-- 001 001 000 - 266125
212 Unknown_Attribute -O--CK 100 100 000 - 7429
233 Media_Wearout_Indicator PO---K 100 100 001 - 100
234 Unknown_Attribute -O--CK 100 100 000 - 300
241 Total_LBAs_Written -O--CK 100 100 000 - 297
242 Total_LBAs_Read -O--CK 100 100 000 - 485
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 4 Comprehensive SMART error log
0x03 GPL R/O 5 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 2 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (5 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (2 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 88 --- Lifetime Power-On Resets
0x01 0x010 4 2607 --- Power-on Hours
0x01 0x018 6 580690758 --- Logical Sectors Written
0x01 0x020 6 10950820 --- Number of Write Commands
0x01 0x028 6 948522772 --- Logical Sectors Read
0x01 0x030 6 5457014 --- Number of Read Commands
0x01 0x038 6 795265408 --- Date and Time TimeStamp
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 31 --- Current Temperature
0x05 0x010 1 31 --- Average Short Term Temperature
0x05 0x018 1 31 --- Average Long Term Temperature
0x05 0x020 1 43 --- Highest Temperature
0x05 0x028 1 24 --- Lowest Temperature
0x05 0x030 1 - --- Highest Average Short Term Temperature
0x05 0x038 1 25 --- Lowest Average Short Term Temperature
0x05 0x040 1 - --- Highest Average Long Term Temperature
0x05 0x048 1 29 --- Lowest Average Long Term Temperature
0x05 0x050 4 0 --- Time in Over-Temperature
0x05 0x058 1 80 --- Specified Maximum Operating Temperature
0x05 0x060 4 154300 --- Time in Under-Temperature
0x05 0x068 1 -20 --- Specified Minimum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 818 --- Number of Hardware Resets
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 0 --- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x000a 2 12 Device-to-host register FISes sent due to a COMRESET