mirror of
https://github.com/bsdhw/SMART.git
synced 2025-05-31 16:21:41 +05:30
Update of reports (new: 3633, modified: 0)
This commit is contained in:
Andrey Ponomarenko
178
SSD/Samsung/MZ7/MZ7KM960HAHP-00005/A0CF441064D0
Normal file
178
SSD/Samsung/MZ7/MZ7KM960HAHP-00005/A0CF441064D0
Normal file
@@ -0,0 +1,178 @@
|
||||
smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE-p2 amd64] (local build)
|
||||
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
|
||||
|
||||
=== START OF INFORMATION SECTION ===
|
||||
Model Family: Samsung based SSDs
|
||||
Device Model: SAMSUNG MZ7KM960HAHP-00005
|
||||
Serial Number: --
|
||||
LU WWN Device Id: 5 002538 ...
|
||||
Firmware Version: GXM1003Q
|
||||
User Capacity: 960,197,124,096 bytes [960 GB]
|
||||
Sector Size: 512 bytes logical/physical
|
||||
Rotation Rate: Solid State Device
|
||||
TRIM Command: Available, deterministic, zeroed
|
||||
Device is: In smartctl database 7.3/5319
|
||||
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
|
||||
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
|
||||
Local Time is: Sat Oct 1 13:49:00 2022 EDT
|
||||
SMART support is: Available - device has SMART capability.
|
||||
SMART support is: Enabled
|
||||
AAM feature is: Unavailable
|
||||
APM feature is: Unavailable
|
||||
Rd look-ahead is: Enabled
|
||||
Write cache is: Enabled
|
||||
DSN feature is: Unavailable
|
||||
ATA Security is: Disabled, frozen [SEC2]
|
||||
Wt Cache Reorder: Enabled
|
||||
|
||||
=== START OF READ SMART DATA SECTION ===
|
||||
SMART overall-health self-assessment test result: PASSED
|
||||
|
||||
General SMART Values:
|
||||
Offline data collection status: (0x02) Offline data collection activity
|
||||
was completed without error.
|
||||
Auto Offline Data Collection: Disabled.
|
||||
Self-test execution status: ( 0) The previous self-test routine completed
|
||||
without error or no self-test has ever
|
||||
been run.
|
||||
Total time to complete Offline
|
||||
data collection: ( 3600) seconds.
|
||||
Offline data collection
|
||||
capabilities: (0x53) SMART execute Offline immediate.
|
||||
Auto Offline data collection on/off support.
|
||||
Suspend Offline collection upon new
|
||||
command.
|
||||
No Offline surface scan supported.
|
||||
Self-test supported.
|
||||
No Conveyance Self-test supported.
|
||||
Selective Self-test supported.
|
||||
SMART capabilities: (0x0003) Saves SMART data before entering
|
||||
power-saving mode.
|
||||
Supports SMART auto save timer.
|
||||
Error logging capability: (0x01) Error logging supported.
|
||||
General Purpose Logging supported.
|
||||
Short self-test routine
|
||||
recommended polling time: ( 2) minutes.
|
||||
Extended self-test routine
|
||||
recommended polling time: ( 60) minutes.
|
||||
SCT capabilities: (0x003d) SCT Status supported.
|
||||
SCT Error Recovery Control supported.
|
||||
SCT Feature Control supported.
|
||||
SCT Data Table supported.
|
||||
|
||||
SMART Attributes Data Structure revision number: 1
|
||||
Vendor Specific SMART Attributes with Thresholds:
|
||||
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
|
||||
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
|
||||
9 Power_On_Hours -O--CK 089 089 000 - 51995
|
||||
12 Power_Cycle_Count -O--CK 099 099 000 - 38
|
||||
177 Wear_Leveling_Count PO--C- 099 099 005 - 167
|
||||
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
|
||||
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 7689
|
||||
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
|
||||
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
|
||||
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
|
||||
184 End-to-End_Error PO--CK 100 100 097 - 0
|
||||
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
|
||||
190 Airflow_Temperature_Cel -O--CK 063 054 000 - 37
|
||||
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
|
||||
197 Current_Pending_Sector -O--CK 100 100 000 - 0
|
||||
199 CRC_Error_Count -OSRCK 100 100 000 - 0
|
||||
202 Exception_Mode_Status PO--CK 100 100 010 - 0
|
||||
235 POR_Recovery_Count -O--C- 099 099 000 - 32
|
||||
241 Total_LBAs_Written -O--CK 099 099 000 - 237339129069
|
||||
242 Total_LBAs_Read -O--CK 099 099 000 - 59652626957
|
||||
243 SATA_Downshift_Ct -O--CK 100 100 000 - 0
|
||||
244 Thermal_Throttle_St -O--CK 100 100 000 - 0
|
||||
245 Timed_Workld_Media_Wear -O--CK 100 100 000 - 65535
|
||||
246 Timed_Workld_RdWr_Ratio -O--CK 100 100 000 - 65535
|
||||
247 Timed_Workld_Timer -O--CK 100 100 000 - 65535
|
||||
251 NAND_Writes -O--CK 100 100 000 - 285758229320
|
||||
||||||_ K auto-keep
|
||||
|||||__ C event count
|
||||
||||___ R error rate
|
||||
|||____ S speed/performance
|
||||
||_____ O updated online
|
||||
|______ P prefailure warning
|
||||
|
||||
General Purpose Log Directory Version 1
|
||||
SMART Log Directory Version 1 [multi-sector log support]
|
||||
Address Access R/W Size Description
|
||||
0x00 GPL,SL R/O 1 Log Directory
|
||||
0x01 SL R/O 1 Summary SMART error log
|
||||
0x02 SL R/O 1 Comprehensive SMART error log
|
||||
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
|
||||
0x06 SL R/O 1 SMART self-test log
|
||||
0x07 GPL R/O 1 Extended self-test log
|
||||
0x09 SL R/W 1 Selective self-test log
|
||||
0x10 GPL R/O 1 NCQ Command Error log
|
||||
0x11 GPL R/O 1 SATA Phy Event Counters log
|
||||
0x13 GPL R/O 1 SATA NCQ Send and Receive log
|
||||
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
|
||||
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
|
||||
0xce SL VS 16 Device vendor specific log
|
||||
0xe0 GPL,SL R/W 1 SCT Command/Status
|
||||
0xe1 GPL,SL R/W 1 SCT Data Transfer
|
||||
|
||||
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
|
||||
No Errors Logged
|
||||
|
||||
SMART Extended Self-test Log Version: 1 (1 sectors)
|
||||
No self-tests have been logged. [To run self-tests, use: smartctl -t]
|
||||
|
||||
SMART Selective self-test log data structure revision number 1
|
||||
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
|
||||
1 0 0 Not_testing
|
||||
2 0 0 Not_testing
|
||||
3 0 0 Not_testing
|
||||
4 0 0 Not_testing
|
||||
5 0 0 Not_testing
|
||||
255 0 65535 Read_scanning was completed without error
|
||||
Selective self-test flags (0x0):
|
||||
After scanning selected spans, do NOT read-scan remainder of disk.
|
||||
If Selective self-test is pending on power-up, resume after 0 minute delay.
|
||||
|
||||
SCT Status Version: 3
|
||||
SCT Version (vendor specific): 256 (0x0100)
|
||||
Device State: SCT command executing in background (5)
|
||||
Current Temperature: 37 Celsius
|
||||
Power Cycle Min/Max Temperature: 35/37 Celsius
|
||||
Lifetime Min/Max Temperature: 0/70 Celsius
|
||||
Under/Over Temperature Limit Count: 4294967295/4294967295
|
||||
|
||||
SCT Temperature History Version: 3 (Unknown, should be 2)
|
||||
Temperature Sampling Period: 1 minute
|
||||
Temperature Logging Interval: 10 minutes
|
||||
Min/Max recommended Temperature: 0/70 Celsius
|
||||
Min/Max Temperature Limit: 0/70 Celsius
|
||||
Temperature History Size (Index): 128 (18)
|
||||
|
||||
SCT Error Recovery Control:
|
||||
Read: Disabled
|
||||
Write: Disabled
|
||||
|
||||
Device Statistics (GP/SMART Log 0x04) not supported
|
||||
|
||||
Pending Defects log (GP Log 0x0c) not supported
|
||||
|
||||
SATA Phy Event Counters (GP Log 0x11)
|
||||
ID Size Value Description
|
||||
0x0001 2 0 Command failed due to ICRC error
|
||||
0x0002 2 0 R_ERR response for data FIS
|
||||
0x0003 2 0 R_ERR response for device-to-host data FIS
|
||||
0x0004 2 0 R_ERR response for host-to-device data FIS
|
||||
0x0005 2 0 R_ERR response for non-data FIS
|
||||
0x0006 2 0 R_ERR response for device-to-host non-data FIS
|
||||
0x0007 2 0 R_ERR response for host-to-device non-data FIS
|
||||
0x0008 2 0 Device-to-host non-data FIS retries
|
||||
0x0009 2 16 Transition from drive PhyRdy to drive PhyNRdy
|
||||
0x000a 2 16 Device-to-host register FISes sent due to a COMRESET
|
||||
0x000b 2 0 CRC errors within host-to-device FIS
|
||||
0x000d 2 0 Non-CRC errors within host-to-device FIS
|
||||
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
|
||||
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
|
||||
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
|
||||
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
|
||||
|
||||
|
||||
|
||||
226
SSD/Samsung/MZ7/MZ7LM240HMHQ-00005/B85A8E22D7EE
Normal file
226
SSD/Samsung/MZ7/MZ7LM240HMHQ-00005/B85A8E22D7EE
Normal file
@@ -0,0 +1,226 @@
|
||||
smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.0-STABLE amd64] (local build)
|
||||
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
|
||||
|
||||
=== START OF INFORMATION SECTION ===
|
||||
Model Family: Samsung based SSDs
|
||||
Device Model: SAMSUNG MZ7LM240HMHQ-00005
|
||||
Serial Number: --
|
||||
LU WWN Device Id: 5 002538 ...
|
||||
Firmware Version: GXT5204Q
|
||||
User Capacity: 240,057,409,536 bytes [240 GB]
|
||||
Sector Size: 512 bytes logical/physical
|
||||
Rotation Rate: Solid State Device
|
||||
Form Factor: 2.5 inches
|
||||
TRIM Command: Available, deterministic, zeroed
|
||||
Device is: In smartctl database 7.3/5319
|
||||
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
|
||||
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
|
||||
Local Time is: Sun Jun 19 15:19:33 2022 CEST
|
||||
SMART support is: Available - device has SMART capability.
|
||||
SMART support is: Enabled
|
||||
AAM feature is: Unavailable
|
||||
APM feature is: Disabled
|
||||
Rd look-ahead is: Enabled
|
||||
Write cache is: Enabled
|
||||
DSN feature is: Unavailable
|
||||
ATA Security is: Disabled, frozen [SEC2]
|
||||
Wt Cache Reorder: Enabled
|
||||
|
||||
=== START OF READ SMART DATA SECTION ===
|
||||
SMART overall-health self-assessment test result: PASSED
|
||||
|
||||
General SMART Values:
|
||||
Offline data collection status: (0x02) Offline data collection activity
|
||||
was completed without error.
|
||||
Auto Offline Data Collection: Disabled.
|
||||
Self-test execution status: ( 0) The previous self-test routine completed
|
||||
without error or no self-test has ever
|
||||
been run.
|
||||
Total time to complete Offline
|
||||
data collection: ( 1740) seconds.
|
||||
Offline data collection
|
||||
capabilities: (0x53) SMART execute Offline immediate.
|
||||
Auto Offline data collection on/off support.
|
||||
Suspend Offline collection upon new
|
||||
command.
|
||||
No Offline surface scan supported.
|
||||
Self-test supported.
|
||||
No Conveyance Self-test supported.
|
||||
Selective Self-test supported.
|
||||
SMART capabilities: (0x0003) Saves SMART data before entering
|
||||
power-saving mode.
|
||||
Supports SMART auto save timer.
|
||||
Error logging capability: (0x01) Error logging supported.
|
||||
General Purpose Logging supported.
|
||||
Short self-test routine
|
||||
recommended polling time: ( 2) minutes.
|
||||
Extended self-test routine
|
||||
recommended polling time: ( 29) minutes.
|
||||
SCT capabilities: (0x003d) SCT Status supported.
|
||||
SCT Error Recovery Control supported.
|
||||
SCT Feature Control supported.
|
||||
SCT Data Table supported.
|
||||
|
||||
SMART Attributes Data Structure revision number: 1
|
||||
Vendor Specific SMART Attributes with Thresholds:
|
||||
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
|
||||
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
|
||||
9 Power_On_Hours -O--CK 096 096 000 - 16291
|
||||
12 Power_Cycle_Count -O--CK 099 099 000 - 80
|
||||
177 Wear_Leveling_Count PO--C- 098 098 005 - 83
|
||||
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
|
||||
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 821
|
||||
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
|
||||
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
|
||||
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
|
||||
184 End-to-End_Error PO--CK 100 100 097 - 0
|
||||
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
|
||||
190 Airflow_Temperature_Cel -O--CK 064 058 000 - 36
|
||||
194 Temperature_Celsius -O---K 064 058 000 - 36 (Min/Max 21/45)
|
||||
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
|
||||
197 Current_Pending_Sector -O--CK 100 100 000 - 0
|
||||
199 CRC_Error_Count -OSRCK 099 099 000 - 17
|
||||
202 Exception_Mode_Status PO--CK 100 100 010 - 0
|
||||
235 POR_Recovery_Count -O--C- 099 099 000 - 57
|
||||
241 Total_LBAs_Written -O--CK 099 099 000 - 9979275263
|
||||
242 Total_LBAs_Read -O--CK 099 099 000 - 6318899519
|
||||
243 SATA_Downshift_Ct -O--CK 100 100 000 - 0
|
||||
244 Thermal_Throttle_St -O--CK 100 100 000 - 0
|
||||
245 Timed_Workld_Media_Wear -O--CK 100 100 000 - 65535
|
||||
246 Timed_Workld_RdWr_Ratio -O--CK 100 100 000 - 65535
|
||||
247 Timed_Workld_Timer -O--CK 100 100 000 - 65535
|
||||
251 NAND_Writes -O--CK 100 100 000 - 44713336384
|
||||
||||||_ K auto-keep
|
||||
|||||__ C event count
|
||||
||||___ R error rate
|
||||
|||____ S speed/performance
|
||||
||_____ O updated online
|
||||
|______ P prefailure warning
|
||||
|
||||
General Purpose Log Directory Version 1
|
||||
SMART Log Directory Version 1 [multi-sector log support]
|
||||
Address Access R/W Size Description
|
||||
0x00 GPL,SL R/O 1 Log Directory
|
||||
0x01 SL R/O 1 Summary SMART error log
|
||||
0x02 SL R/O 1 Comprehensive SMART error log
|
||||
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
|
||||
0x04 GPL,SL R/O 8 Device Statistics log
|
||||
0x06 SL R/O 1 SMART self-test log
|
||||
0x07 GPL R/O 1 Extended self-test log
|
||||
0x08 GPL R/O 2 Power Conditions log
|
||||
0x09 SL R/W 1 Selective self-test log
|
||||
0x10 GPL R/O 1 NCQ Command Error log
|
||||
0x11 GPL R/O 1 SATA Phy Event Counters log
|
||||
0x13 GPL R/O 1 SATA NCQ Send and Receive log
|
||||
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
|
||||
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
|
||||
0xa0 GPL VS 16 Device vendor specific log
|
||||
0xce SL VS 16 Device vendor specific log
|
||||
0xe0 GPL,SL R/W 1 SCT Command/Status
|
||||
0xe1 GPL,SL R/W 1 SCT Data Transfer
|
||||
|
||||
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
|
||||
No Errors Logged
|
||||
|
||||
SMART Extended Self-test Log Version: 1 (1 sectors)
|
||||
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
|
||||
# 1 Short offline Completed without error 00% 16264 -
|
||||
# 2 Short offline Completed without error 00% 16240 -
|
||||
# 3 Short offline Completed without error 00% 16216 -
|
||||
# 4 Short offline Completed without error 00% 16192 -
|
||||
# 5 Short offline Completed without error 00% 16168 -
|
||||
# 6 Short offline Completed without error 00% 16144 -
|
||||
# 7 Short offline Completed without error 00% 16120 -
|
||||
# 8 Short offline Completed without error 00% 16096 -
|
||||
# 9 Short offline Completed without error 00% 16072 -
|
||||
#10 Short offline Completed without error 00% 16048 -
|
||||
#11 Short offline Completed without error 00% 16024 -
|
||||
#12 Short offline Completed without error 00% 16000 -
|
||||
#13 Short offline Completed without error 00% 15976 -
|
||||
#14 Short offline Completed without error 00% 15952 -
|
||||
#15 Short offline Completed without error 00% 15928 -
|
||||
#16 Short offline Completed without error 00% 15925 -
|
||||
#17 Short offline Completed without error 00% 15902 -
|
||||
#18 Short offline Completed without error 00% 15901 -
|
||||
#19 Short offline Completed without error 00% 15877 -
|
||||
|
||||
SMART Selective self-test log data structure revision number 1
|
||||
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
|
||||
1 0 0 Not_testing
|
||||
2 0 0 Not_testing
|
||||
3 0 0 Not_testing
|
||||
4 0 0 Not_testing
|
||||
5 0 0 Not_testing
|
||||
255 0 65535 Read_scanning was completed without error
|
||||
Selective self-test flags (0x0):
|
||||
After scanning selected spans, do NOT read-scan remainder of disk.
|
||||
If Selective self-test is pending on power-up, resume after 0 minute delay.
|
||||
|
||||
SCT Status Version: 3
|
||||
SCT Version (vendor specific): 256 (0x0100)
|
||||
Device State: SCT command executing in background (5)
|
||||
Current Temperature: 36 Celsius
|
||||
Power Cycle Min/Max Temperature: 35/37 Celsius
|
||||
Lifetime Min/Max Temperature: 21/45 Celsius
|
||||
Under/Over Temperature Limit Count: 0/0
|
||||
|
||||
SCT Temperature History Version: 2
|
||||
Temperature Sampling Period: 1 minute
|
||||
Temperature Logging Interval: 10 minutes
|
||||
Min/Max recommended Temperature: 0/70 Celsius
|
||||
Min/Max Temperature Limit: 0/70 Celsius
|
||||
Temperature History Size (Index): 128 (30)
|
||||
|
||||
SCT Error Recovery Control:
|
||||
Read: Disabled
|
||||
Write: Disabled
|
||||
|
||||
Device Statistics (GP Log 0x04)
|
||||
Page Offset Size Value Flags Description
|
||||
0x01 ===== = = === == General Statistics (rev 1) ==
|
||||
0x01 0x008 4 80 --- Lifetime Power-On Resets
|
||||
0x01 0x010 4 16291 --- Power-on Hours
|
||||
0x01 0x018 6 9979275263 --- Logical Sectors Written
|
||||
0x01 0x020 6 136840667 --- Number of Write Commands
|
||||
0x01 0x028 6 6318899519 --- Logical Sectors Read
|
||||
0x01 0x030 6 72158388 --- Number of Read Commands
|
||||
0x01 0x038 6 2346000 --- Date and Time TimeStamp
|
||||
0x04 ===== = = === == General Errors Statistics (rev 1) ==
|
||||
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
|
||||
0x04 0x010 4 2 --- Resets Between Cmd Acceptance and Completion
|
||||
0x05 ===== = = === == Temperature Statistics (rev 1) ==
|
||||
0x05 0x008 1 36 --- Current Temperature
|
||||
0x05 0x020 1 45 --- Highest Temperature
|
||||
0x05 0x028 1 21 --- Lowest Temperature
|
||||
0x05 0x058 1 55 --- Specified Maximum Operating Temperature
|
||||
0x06 ===== = = === == Transport Statistics (rev 1) ==
|
||||
0x06 0x008 4 283 --- Number of Hardware Resets
|
||||
0x06 0x010 4 0 --- Number of ASR Events
|
||||
0x06 0x018 4 17 --- Number of Interface CRC Errors
|
||||
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
|
||||
0x07 0x008 1 1 N-- Percentage Used Endurance Indicator
|
||||
|||_ C monitored condition met
|
||||
||__ D supports DSN
|
||||
|___ N normalized value
|
||||
|
||||
Pending Defects log (GP Log 0x0c) not supported
|
||||
|
||||
SATA Phy Event Counters (GP Log 0x11)
|
||||
ID Size Value Description
|
||||
0x0001 2 0 Command failed due to ICRC error
|
||||
0x0002 2 0 R_ERR response for data FIS
|
||||
0x0003 2 0 R_ERR response for device-to-host data FIS
|
||||
0x0004 2 0 R_ERR response for host-to-device data FIS
|
||||
0x0005 2 0 R_ERR response for non-data FIS
|
||||
0x0006 2 0 R_ERR response for device-to-host non-data FIS
|
||||
0x0007 2 0 R_ERR response for host-to-device non-data FIS
|
||||
0x0008 2 0 Device-to-host non-data FIS retries
|
||||
0x0009 2 6 Transition from drive PhyRdy to drive PhyNRdy
|
||||
0x000a 2 6 Device-to-host register FISes sent due to a COMRESET
|
||||
0x000b 2 0 CRC errors within host-to-device FIS
|
||||
0x000d 2 0 Non-CRC errors within host-to-device FIS
|
||||
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
|
||||
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
|
||||
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
|
||||
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
|
||||
|
||||
159
SSD/Samsung/MZ7/MZ7LN128HAHQ-00000/B2FE4D2AEA68
Normal file
159
SSD/Samsung/MZ7/MZ7LN128HAHQ-00000/B2FE4D2AEA68
Normal file
@@ -0,0 +1,159 @@
|
||||
smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.0-STABLE amd64] (local build)
|
||||
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
|
||||
|
||||
=== START OF INFORMATION SECTION ===
|
||||
Model Family: Samsung based SSDs
|
||||
Device Model: SAMSUNG MZ7LN128HAHQ-00000
|
||||
Serial Number: --
|
||||
LU WWN Device Id: 5 002538 ...
|
||||
Firmware Version: MVT0300Q
|
||||
User Capacity: 128,035,676,160 bytes [128 GB]
|
||||
Sector Size: 512 bytes logical/physical
|
||||
Rotation Rate: Solid State Device
|
||||
Form Factor: 2.5 inches
|
||||
TRIM Command: Available
|
||||
Device is: In smartctl database 7.3/5319
|
||||
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
|
||||
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s)
|
||||
Local Time is: Tue Apr 19 19:37:27 2022 UTC
|
||||
SMART support is: Available - device has SMART capability.
|
||||
SMART support is: Enabled
|
||||
AAM feature is: Unavailable
|
||||
APM feature is: Unavailable
|
||||
Rd look-ahead is: Enabled
|
||||
Write cache is: Enabled
|
||||
DSN feature is: Unavailable
|
||||
ATA Security is: Disabled, frozen [SEC2]
|
||||
Read SCT Status failed: Input/output error
|
||||
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
|
||||
|
||||
=== START OF READ SMART DATA SECTION ===
|
||||
SMART overall-health self-assessment test result: PASSED
|
||||
|
||||
General SMART Values:
|
||||
Offline data collection status: (0x00) Offline data collection activity
|
||||
was never started.
|
||||
Auto Offline Data Collection: Disabled.
|
||||
Self-test execution status: ( 0) The previous self-test routine completed
|
||||
without error or no self-test has ever
|
||||
been run.
|
||||
Total time to complete Offline
|
||||
data collection: ( 0) seconds.
|
||||
Offline data collection
|
||||
capabilities: (0x53) SMART execute Offline immediate.
|
||||
Auto Offline data collection on/off support.
|
||||
Suspend Offline collection upon new
|
||||
command.
|
||||
No Offline surface scan supported.
|
||||
Self-test supported.
|
||||
No Conveyance Self-test supported.
|
||||
Selective Self-test supported.
|
||||
SMART capabilities: (0x0003) Saves SMART data before entering
|
||||
power-saving mode.
|
||||
Supports SMART auto save timer.
|
||||
Error logging capability: (0x01) Error logging supported.
|
||||
General Purpose Logging supported.
|
||||
Short self-test routine
|
||||
recommended polling time: ( 2) minutes.
|
||||
Extended self-test routine
|
||||
recommended polling time: ( 64) minutes.
|
||||
SCT capabilities: (0x003d) SCT Status supported.
|
||||
SCT Error Recovery Control supported.
|
||||
SCT Feature Control supported.
|
||||
SCT Data Table supported.
|
||||
|
||||
SMART Attributes Data Structure revision number: 1
|
||||
Vendor Specific SMART Attributes with Thresholds:
|
||||
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
|
||||
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
|
||||
9 Power_On_Hours -O--CK 099 099 000 - 1021
|
||||
12 Power_Cycle_Count -O--CK 099 099 000 - 45
|
||||
170 Unused_Rsvd_Blk_Ct_Chip -O--CK 100 100 010 - 0
|
||||
171 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
|
||||
172 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
|
||||
173 Wear_Leveling_Count PO--CK 099 099 005 - 4
|
||||
174 Unexpect_Power_Loss_Ct -O--CK 099 099 000 - 7
|
||||
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
|
||||
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 320
|
||||
184 End-to-End_Error PO--CK 100 100 097 - 0
|
||||
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
|
||||
194 Temperature_Celsius -O--CK 082 057 000 - 18
|
||||
199 CRC_Error_Count -OSRCK 100 100 000 - 0
|
||||
233 Media_Wearout_Indicator PO--C- 099 099 000 - 16721290
|
||||
241 Total_LBAs_Written -O--CK 099 099 000 - 501
|
||||
242 Total_LBAs_Read -O--CK 099 099 000 - 368
|
||||
249 NAND_Writes_1GiB -O--CK 099 099 000 - 516
|
||||
250 SATA_Iface_Downshift -O--CK 099 099 000 - 1051977172
|
||||
251 NAND_Writes -O--CK 099 099 000 - 1083246208
|
||||
||||||_ K auto-keep
|
||||
|||||__ C event count
|
||||
||||___ R error rate
|
||||
|||____ S speed/performance
|
||||
||_____ O updated online
|
||||
|______ P prefailure warning
|
||||
|
||||
General Purpose Log Directory Version 1
|
||||
SMART Log Directory Version 1 [multi-sector log support]
|
||||
Address Access R/W Size Description
|
||||
0x00 GPL,SL R/O 1 Log Directory
|
||||
0x01 SL R/O 1 Summary SMART error log
|
||||
0x02 SL R/O 1 Comprehensive SMART error log
|
||||
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
|
||||
0x06 SL R/O 1 SMART self-test log
|
||||
0x07 GPL R/O 1 Extended self-test log
|
||||
0x09 SL R/W 1 Selective self-test log
|
||||
0x10 GPL R/O 1 NCQ Command Error log
|
||||
0x11 GPL R/O 1 SATA Phy Event Counters log
|
||||
0x13 GPL R/O 1 SATA NCQ Send and Receive log
|
||||
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
|
||||
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
|
||||
0xdf GPL,SL VS 1 Device vendor specific log
|
||||
0xe0 GPL,SL R/W 1 SCT Command/Status
|
||||
0xe1 GPL,SL R/W 1 SCT Data Transfer
|
||||
|
||||
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
|
||||
No Errors Logged
|
||||
|
||||
SMART Extended Self-test Log Version: 1 (1 sectors)
|
||||
No self-tests have been logged. [To run self-tests, use: smartctl -t]
|
||||
|
||||
SMART Selective self-test log data structure revision number 1
|
||||
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
|
||||
1 0 0 Not_testing
|
||||
2 0 0 Not_testing
|
||||
3 0 0 Not_testing
|
||||
4 0 0 Not_testing
|
||||
5 0 0 Not_testing
|
||||
255 0 65535 Read_scanning was never started
|
||||
Selective self-test flags (0x0):
|
||||
After scanning selected spans, do NOT read-scan remainder of disk.
|
||||
If Selective self-test is pending on power-up, resume after 0 minute delay.
|
||||
|
||||
Read SCT Status failed: Input/output error
|
||||
|
||||
Read SCT Status failed: Input/output error
|
||||
SCT (Get) Error Recovery Control command failed
|
||||
|
||||
Device Statistics (GP/SMART Log 0x04) not supported
|
||||
|
||||
Pending Defects log (GP Log 0x0c) not supported
|
||||
|
||||
SATA Phy Event Counters (GP Log 0x11)
|
||||
ID Size Value Description
|
||||
0x0001 2 0 Command failed due to ICRC error
|
||||
0x0002 2 0 R_ERR response for data FIS
|
||||
0x0003 2 0 R_ERR response for device-to-host data FIS
|
||||
0x0004 2 0 R_ERR response for host-to-device data FIS
|
||||
0x0005 2 0 R_ERR response for non-data FIS
|
||||
0x0006 2 0 R_ERR response for device-to-host non-data FIS
|
||||
0x0007 2 0 R_ERR response for host-to-device non-data FIS
|
||||
0x0008 2 0 Device-to-host non-data FIS retries
|
||||
0x0009 2 5 Transition from drive PhyRdy to drive PhyNRdy
|
||||
0x000a 2 5 Device-to-host register FISes sent due to a COMRESET
|
||||
0x000b 2 0 CRC errors within host-to-device FIS
|
||||
0x000d 2 0 Non-CRC errors within host-to-device FIS
|
||||
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
|
||||
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
|
||||
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
|
||||
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
|
||||
|
||||
208
SSD/Samsung/MZ7/MZ7LN128HAHQ-000H1/31DD7818D814
Normal file
208
SSD/Samsung/MZ7/MZ7LN128HAHQ-000H1/31DD7818D814
Normal file
@@ -0,0 +1,208 @@
|
||||
smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.0-STABLE amd64] (local build)
|
||||
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
|
||||
|
||||
=== START OF INFORMATION SECTION ===
|
||||
Model Family: Samsung based SSDs
|
||||
Device Model: SAMSUNG MZ7LN128HAHQ-000H1
|
||||
Serial Number: --
|
||||
LU WWN Device Id: 5 002538 ...
|
||||
Firmware Version: MVT03H3Q
|
||||
User Capacity: 128,035,676,160 bytes [128 GB]
|
||||
Sector Sizes: 512 bytes logical, 4096 bytes physical
|
||||
Rotation Rate: Solid State Device
|
||||
Form Factor: 2.5 inches
|
||||
TRIM Command: Available, deterministic, zeroed
|
||||
Device is: In smartctl database 7.3/5319
|
||||
ATA Version is: ACS-3, ATA8-ACS T13/1699-D revision 4c
|
||||
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
|
||||
Local Time is: Thu Jun 30 15:33:36 2022 PST
|
||||
SMART support is: Available - device has SMART capability.
|
||||
SMART support is: Enabled
|
||||
AAM feature is: Unavailable
|
||||
APM feature is: Disabled
|
||||
Rd look-ahead is: Enabled
|
||||
Write cache is: Enabled
|
||||
DSN feature is: Disabled
|
||||
ATA Security is: Disabled, frozen [SEC2]
|
||||
Wt Cache Reorder: Enabled
|
||||
|
||||
=== START OF READ SMART DATA SECTION ===
|
||||
SMART overall-health self-assessment test result: PASSED
|
||||
|
||||
General SMART Values:
|
||||
Offline data collection status: (0x02) Offline data collection activity
|
||||
was completed without error.
|
||||
Auto Offline Data Collection: Disabled.
|
||||
Self-test execution status: ( 0) The previous self-test routine completed
|
||||
without error or no self-test has ever
|
||||
been run.
|
||||
Total time to complete Offline
|
||||
data collection: ( 3840) seconds.
|
||||
Offline data collection
|
||||
capabilities: (0x5b) SMART execute Offline immediate.
|
||||
Auto Offline data collection on/off support.
|
||||
Suspend Offline collection upon new
|
||||
command.
|
||||
Offline surface scan supported.
|
||||
Self-test supported.
|
||||
No Conveyance Self-test supported.
|
||||
Selective Self-test supported.
|
||||
SMART capabilities: (0x0003) Saves SMART data before entering
|
||||
power-saving mode.
|
||||
Supports SMART auto save timer.
|
||||
Error logging capability: (0x01) Error logging supported.
|
||||
General Purpose Logging supported.
|
||||
Short self-test routine
|
||||
recommended polling time: ( 2) minutes.
|
||||
Extended self-test routine
|
||||
recommended polling time: ( 64) minutes.
|
||||
SCT capabilities: (0x003d) SCT Status supported.
|
||||
SCT Error Recovery Control supported.
|
||||
SCT Feature Control supported.
|
||||
SCT Data Table supported.
|
||||
|
||||
SMART Attributes Data Structure revision number: 1
|
||||
Vendor Specific SMART Attributes with Thresholds:
|
||||
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
|
||||
1 Raw_Read_Error_Rate POSR-K 100 100 050 - 0
|
||||
5 Reallocated_Sector_Ct PO--CK 100 100 005 - 0
|
||||
9 Power_On_Hours -O--CK 100 100 000 - 17318
|
||||
12 Power_Cycle_Count -O--CK 100 100 000 - 717
|
||||
171 Program_Fail_Count_Chip -O--CK 100 100 000 - 0
|
||||
172 Erase_Fail_Count_Chip -O--CK 100 100 000 - 0
|
||||
173 Wear_Leveling_Count -O--CK 094 094 005 - 76
|
||||
174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 309
|
||||
176 Erase_Fail_Count_Chip -O---K 100 100 000 - 319
|
||||
181 Program_Fail_Cnt_Total -O---K 099 001 000 - 25662460
|
||||
183 Runtime_Bad_Block -O--CK 100 100 000 - 0
|
||||
184 End-to-End_Error PO-RCK 100 100 097 - 0
|
||||
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
|
||||
188 Command_Timeout -O--CK 100 100 000 - 18
|
||||
194 Temperature_Celsius -O---K 035 058 000 - 35 (Min/Max 32/43)
|
||||
198 Offline_Uncorrectable ----CK 100 100 000 - 0
|
||||
199 CRC_Error_Count -O--CK 100 100 000 - 0
|
||||
201 Supercap_Status PO---K 100 100 005 - 100
|
||||
241 Total_LBAs_Written -O--CK 100 100 000 - 526301
|
||||
242 Total_LBAs_Read -O--CK 100 100 000 - 712972
|
||||
243 SATA_Downshift_Ct -O--CK 100 100 000 - 526301
|
||||
||||||_ K auto-keep
|
||||
|||||__ C event count
|
||||
||||___ R error rate
|
||||
|||____ S speed/performance
|
||||
||_____ O updated online
|
||||
|______ P prefailure warning
|
||||
|
||||
General Purpose Log Directory Version 1
|
||||
SMART Log Directory Version 1 [multi-sector log support]
|
||||
Address Access R/W Size Description
|
||||
0x00 GPL,SL R/O 1 Log Directory
|
||||
0x01 SL R/O 1 Summary SMART error log
|
||||
0x02 SL R/O 1 Comprehensive SMART error log
|
||||
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
|
||||
0x04 GPL,SL R/O 8 Device Statistics log
|
||||
0x06 SL R/O 1 SMART self-test log
|
||||
0x07 GPL R/O 1 Extended self-test log
|
||||
0x09 SL R/W 1 Selective self-test log
|
||||
0x0a GPL R/W 1 Device Statistics Notification
|
||||
0x0c GPL R/O 1 Pending Defects log
|
||||
0x0d GPL,SL R/O 1 LPS Mis-alignment log
|
||||
0x10 GPL R/O 1 NCQ Command Error log
|
||||
0x11 GPL R/O 1 SATA Phy Event Counters log
|
||||
0x13 GPL R/O 1 SATA NCQ Send and Receive log
|
||||
0x19 GPL R/O 8 LBA Status log
|
||||
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
|
||||
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
|
||||
0xce SL VS 16 Device vendor specific log
|
||||
0xe0 GPL,SL R/W 1 SCT Command/Status
|
||||
0xe1 GPL,SL R/W 1 SCT Data Transfer
|
||||
|
||||
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
|
||||
No Errors Logged
|
||||
|
||||
SMART Extended Self-test Log Version: 1 (1 sectors)
|
||||
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
|
||||
# 1 Short offline Completed without error 00% 17015 -
|
||||
# 2 Short offline Completed without error 00% 16959 -
|
||||
# 3 Short offline Completed without error 00% 16901 -
|
||||
# 4 Short offline Completed without error 00% 1 -
|
||||
|
||||
SMART Selective self-test log data structure revision number 1
|
||||
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
|
||||
1 0 0 Not_testing
|
||||
2 0 0 Not_testing
|
||||
3 0 0 Not_testing
|
||||
4 0 0 Not_testing
|
||||
5 0 0 Not_testing
|
||||
255 0 65535 Read_scanning was completed without error
|
||||
Selective self-test flags (0x0):
|
||||
After scanning selected spans, do NOT read-scan remainder of disk.
|
||||
If Selective self-test is pending on power-up, resume after 0 minute delay.
|
||||
|
||||
SCT Status Version: 3
|
||||
SCT Version (vendor specific): 256 (0x0100)
|
||||
Device State: Active (0)
|
||||
Current Temperature: 35 Celsius
|
||||
Power Cycle Min/Max Temperature: 35/36 Celsius
|
||||
Lifetime Min/Max Temperature: 26/58 Celsius
|
||||
Under/Over Temperature Limit Count: 0/0
|
||||
|
||||
SCT Temperature History Version: 2
|
||||
Temperature Sampling Period: 1 minute
|
||||
Temperature Logging Interval: 10 minutes
|
||||
Min/Max recommended Temperature: 0/70 Celsius
|
||||
Min/Max Temperature Limit: 0/70 Celsius
|
||||
Temperature History Size (Index): 128 (95)
|
||||
|
||||
SCT Error Recovery Control:
|
||||
Read: Disabled
|
||||
Write: Disabled
|
||||
|
||||
Device Statistics (GP Log 0x04)
|
||||
Page Offset Size Value Flags Description
|
||||
0x01 ===== = = === == General Statistics (rev 1) ==
|
||||
0x01 0x008 4 717 -D- Lifetime Power-On Resets
|
||||
0x01 0x010 4 17318 -D- Power-on Hours
|
||||
0x01 0x018 6 17245863510 -D- Logical Sectors Written
|
||||
0x01 0x020 6 362727022 -D- Number of Write Commands
|
||||
0x01 0x028 6 23362671959 -D- Logical Sectors Read
|
||||
0x01 0x030 6 581206748 -D- Number of Read Commands
|
||||
0x04 ===== = = === == General Errors Statistics (rev 1) ==
|
||||
0x04 0x008 4 0 -D- Number of Reported Uncorrectable Errors
|
||||
0x04 0x010 4 18 -D- Resets Between Cmd Acceptance and Completion
|
||||
0x05 ===== = = === == Temperature Statistics (rev 1) ==
|
||||
0x05 0x008 1 35 -D- Current Temperature
|
||||
0x05 0x020 1 58 -D- Highest Temperature
|
||||
0x05 0x028 1 26 -D- Lowest Temperature
|
||||
0x05 0x058 1 55 -D- Specified Maximum Operating Temperature
|
||||
0x06 ===== = = === == Transport Statistics (rev 1) ==
|
||||
0x06 0x008 4 5805 -D- Number of Hardware Resets
|
||||
0x06 0x010 4 0 -D- Number of ASR Events
|
||||
0x06 0x018 4 0 -D- Number of Interface CRC Errors
|
||||
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
|
||||
0x07 0x008 1 6 ND- Percentage Used Endurance Indicator
|
||||
|||_ C monitored condition met
|
||||
||__ D supports DSN
|
||||
|___ N normalized value
|
||||
|
||||
Pending Defects log (GP Log 0x0c)
|
||||
No Defects Logged
|
||||
|
||||
SATA Phy Event Counters (GP Log 0x11)
|
||||
ID Size Value Description
|
||||
0x0001 2 0 Command failed due to ICRC error
|
||||
0x0002 2 0 R_ERR response for data FIS
|
||||
0x0003 2 0 R_ERR response for device-to-host data FIS
|
||||
0x0004 2 0 R_ERR response for host-to-device data FIS
|
||||
0x0005 2 0 R_ERR response for non-data FIS
|
||||
0x0006 2 0 R_ERR response for device-to-host non-data FIS
|
||||
0x0007 2 0 R_ERR response for host-to-device non-data FIS
|
||||
0x0008 2 0 Device-to-host non-data FIS retries
|
||||
0x0009 2 31 Transition from drive PhyRdy to drive PhyNRdy
|
||||
0x000a 2 31 Device-to-host register FISes sent due to a COMRESET
|
||||
0x000b 2 0 CRC errors within host-to-device FIS
|
||||
0x000d 2 0 Non-CRC errors within host-to-device FIS
|
||||
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
|
||||
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
|
||||
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
|
||||
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
|
||||
|
||||
170
SSD/Samsung/MZ7/MZ7LN128HCHP-00000/169747ADD465
Normal file
170
SSD/Samsung/MZ7/MZ7LN128HCHP-00000/169747ADD465
Normal file
@@ -0,0 +1,170 @@
|
||||
smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE amd64] (local build)
|
||||
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
|
||||
|
||||
=== START OF INFORMATION SECTION ===
|
||||
Model Family: Samsung based SSDs
|
||||
Device Model: SAMSUNG MZ7LN128HCHP-00000
|
||||
Serial Number: --
|
||||
LU WWN Device Id: 5 002538 ...
|
||||
Firmware Version: EMT0100Q
|
||||
User Capacity: 128,035,676,160 bytes [128 GB]
|
||||
Sector Size: 512 bytes logical/physical
|
||||
Rotation Rate: Solid State Device
|
||||
TRIM Command: Available
|
||||
Device is: In smartctl database 7.3/5319
|
||||
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
|
||||
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
|
||||
Local Time is: Tue Jan 24 14:11:16 2023 UTC
|
||||
SMART support is: Available - device has SMART capability.
|
||||
SMART support is: Enabled
|
||||
AAM feature is: Unavailable
|
||||
APM feature is: Unavailable
|
||||
Rd look-ahead is: Enabled
|
||||
Write cache is: Enabled
|
||||
DSN feature is: Unavailable
|
||||
ATA Security is: Disabled, frozen [SEC2]
|
||||
Wt Cache Reorder: Enabled
|
||||
|
||||
=== START OF READ SMART DATA SECTION ===
|
||||
SMART overall-health self-assessment test result: PASSED
|
||||
|
||||
General SMART Values:
|
||||
Offline data collection status: (0x00) Offline data collection activity
|
||||
was never started.
|
||||
Auto Offline Data Collection: Disabled.
|
||||
Self-test execution status: ( 0) The previous self-test routine completed
|
||||
without error or no self-test has ever
|
||||
been run.
|
||||
Total time to complete Offline
|
||||
data collection: ( 0) seconds.
|
||||
Offline data collection
|
||||
capabilities: (0x53) SMART execute Offline immediate.
|
||||
Auto Offline data collection on/off support.
|
||||
Suspend Offline collection upon new
|
||||
command.
|
||||
No Offline surface scan supported.
|
||||
Self-test supported.
|
||||
No Conveyance Self-test supported.
|
||||
Selective Self-test supported.
|
||||
SMART capabilities: (0x0003) Saves SMART data before entering
|
||||
power-saving mode.
|
||||
Supports SMART auto save timer.
|
||||
Error logging capability: (0x01) Error logging supported.
|
||||
General Purpose Logging supported.
|
||||
Short self-test routine
|
||||
recommended polling time: ( 2) minutes.
|
||||
Extended self-test routine
|
||||
recommended polling time: ( 64) minutes.
|
||||
SCT capabilities: (0x003d) SCT Status supported.
|
||||
SCT Error Recovery Control supported.
|
||||
SCT Feature Control supported.
|
||||
SCT Data Table supported.
|
||||
|
||||
SMART Attributes Data Structure revision number: 1
|
||||
Vendor Specific SMART Attributes with Thresholds:
|
||||
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
|
||||
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
|
||||
9 Power_On_Hours -O--CK 096 096 000 - 19750
|
||||
12 Power_Cycle_Count -O--CK 096 096 000 - 3059
|
||||
170 Unused_Rsvd_Blk_Ct_Chip -O--CK 100 100 010 - 0
|
||||
171 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
|
||||
172 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
|
||||
173 Wear_Leveling_Count PO--CK 093 093 005 - 131
|
||||
174 Unexpect_Power_Loss_Ct -O--CK 099 099 000 - 119
|
||||
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
|
||||
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 350
|
||||
184 End-to-End_Error PO--CK 100 100 097 - 0
|
||||
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
|
||||
194 Temperature_Celsius -O--CK 066 047 000 - 34
|
||||
199 CRC_Error_Count -OSRCK 100 100 000 - 0
|
||||
233 Media_Wearout_Indicator PO--C- 093 093 000 - 15678307
|
||||
241 Total_LBAs_Written -O--CK 099 099 000 - 6330
|
||||
242 Total_LBAs_Read -O--CK 099 099 000 - 10322
|
||||
249 NAND_Writes_1GiB -O--CK 099 099 000 - 16800
|
||||
||||||_ K auto-keep
|
||||
|||||__ C event count
|
||||
||||___ R error rate
|
||||
|||____ S speed/performance
|
||||
||_____ O updated online
|
||||
|______ P prefailure warning
|
||||
|
||||
General Purpose Log Directory Version 1
|
||||
SMART Log Directory Version 1 [multi-sector log support]
|
||||
Address Access R/W Size Description
|
||||
0x00 GPL,SL R/O 1 Log Directory
|
||||
0x01 SL R/O 1 Summary SMART error log
|
||||
0x02 SL R/O 1 Comprehensive SMART error log
|
||||
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
|
||||
0x06 SL R/O 1 SMART self-test log
|
||||
0x07 GPL R/O 1 Extended self-test log
|
||||
0x09 SL R/W 1 Selective self-test log
|
||||
0x10 GPL R/O 1 NCQ Command Error log
|
||||
0x11 GPL R/O 1 SATA Phy Event Counters log
|
||||
0x13 GPL R/O 1 SATA NCQ Send and Receive log
|
||||
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
|
||||
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
|
||||
0xdf GPL,SL VS 1 Device vendor specific log
|
||||
0xe0 GPL,SL R/W 1 SCT Command/Status
|
||||
0xe1 GPL,SL R/W 1 SCT Data Transfer
|
||||
|
||||
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
|
||||
No Errors Logged
|
||||
|
||||
SMART Extended Self-test Log Version: 1 (1 sectors)
|
||||
No self-tests have been logged. [To run self-tests, use: smartctl -t]
|
||||
|
||||
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
|
||||
SMART Selective self-test log data structure revision number 1
|
||||
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
|
||||
1 0 0 Not_testing
|
||||
2 0 0 Not_testing
|
||||
3 0 0 Not_testing
|
||||
4 0 0 Not_testing
|
||||
5 0 0 Not_testing
|
||||
255 0 65535 Read_scanning was never started
|
||||
Selective self-test flags (0x0):
|
||||
After scanning selected spans, do NOT read-scan remainder of disk.
|
||||
If Selective self-test is pending on power-up, resume after 0 minute delay.
|
||||
|
||||
SCT Status Version: 3
|
||||
SCT Version (vendor specific): 256 (0x0100)
|
||||
Device State: SCT command executing in background (5)
|
||||
Current Temperature: 32 Celsius
|
||||
Power Cycle Min/Max Temperature: 26/36 Celsius
|
||||
Lifetime Min/Max Temperature: 0/70 Celsius
|
||||
Under/Over Temperature Limit Count: 0/0
|
||||
|
||||
SCT Temperature History Version: 3 (Unknown, should be 2)
|
||||
Temperature Sampling Period: 1 minute
|
||||
Temperature Logging Interval: 10 minutes
|
||||
Min/Max recommended Temperature: 0/70 Celsius
|
||||
Min/Max Temperature Limit: 0/70 Celsius
|
||||
Temperature History Size (Index): 128 (29)
|
||||
|
||||
SCT Error Recovery Control:
|
||||
Read: Disabled
|
||||
Write: Disabled
|
||||
|
||||
Device Statistics (GP/SMART Log 0x04) not supported
|
||||
|
||||
Pending Defects log (GP Log 0x0c) not supported
|
||||
|
||||
SATA Phy Event Counters (GP Log 0x11)
|
||||
ID Size Value Description
|
||||
0x0001 2 0 Command failed due to ICRC error
|
||||
0x0002 2 0 R_ERR response for data FIS
|
||||
0x0003 2 0 R_ERR response for device-to-host data FIS
|
||||
0x0004 2 0 R_ERR response for host-to-device data FIS
|
||||
0x0005 2 0 R_ERR response for non-data FIS
|
||||
0x0006 2 0 R_ERR response for device-to-host non-data FIS
|
||||
0x0007 2 0 R_ERR response for host-to-device non-data FIS
|
||||
0x0008 2 0 Device-to-host non-data FIS retries
|
||||
0x0009 2 9 Transition from drive PhyRdy to drive PhyNRdy
|
||||
0x000a 2 7 Device-to-host register FISes sent due to a COMRESET
|
||||
0x000b 2 0 CRC errors within host-to-device FIS
|
||||
0x000d 2 0 Non-CRC errors within host-to-device FIS
|
||||
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
|
||||
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
|
||||
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
|
||||
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
|
||||
|
||||
170
SSD/Samsung/MZ7/MZ7LN128HCHP-00000/D58E33E95009
Normal file
170
SSD/Samsung/MZ7/MZ7LN128HCHP-00000/D58E33E95009
Normal file
@@ -0,0 +1,170 @@
|
||||
smartctl 7.2 2020-12-30 r5155 [FreeBSD 13.0-RELEASE amd64] (local build)
|
||||
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
|
||||
|
||||
=== START OF INFORMATION SECTION ===
|
||||
Model Family: Samsung based SSDs
|
||||
Device Model: SAMSUNG MZ7LN128HCHP-00000
|
||||
Serial Number: --
|
||||
LU WWN Device Id: 5 002538 ...
|
||||
Firmware Version: EMT0100Q
|
||||
User Capacity: 128,035,676,160 bytes [128 GB]
|
||||
Sector Size: 512 bytes logical/physical
|
||||
Rotation Rate: Solid State Device
|
||||
TRIM Command: Available
|
||||
Device is: In smartctl database [for details use: -P show]
|
||||
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
|
||||
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
|
||||
Local Time is: Sun Oct 9 12:42:30 2022 EDT
|
||||
SMART support is: Available - device has SMART capability.
|
||||
SMART support is: Enabled
|
||||
AAM feature is: Unavailable
|
||||
APM feature is: Unavailable
|
||||
Rd look-ahead is: Enabled
|
||||
Write cache is: Enabled
|
||||
DSN feature is: Unavailable
|
||||
ATA Security is: Disabled, frozen [SEC2]
|
||||
Wt Cache Reorder: Enabled
|
||||
|
||||
=== START OF READ SMART DATA SECTION ===
|
||||
SMART overall-health self-assessment test result: PASSED
|
||||
|
||||
General SMART Values:
|
||||
Offline data collection status: (0x00) Offline data collection activity
|
||||
was never started.
|
||||
Auto Offline Data Collection: Disabled.
|
||||
Self-test execution status: ( 0) The previous self-test routine completed
|
||||
without error or no self-test has ever
|
||||
been run.
|
||||
Total time to complete Offline
|
||||
data collection: ( 0) seconds.
|
||||
Offline data collection
|
||||
capabilities: (0x53) SMART execute Offline immediate.
|
||||
Auto Offline data collection on/off support.
|
||||
Suspend Offline collection upon new
|
||||
command.
|
||||
No Offline surface scan supported.
|
||||
Self-test supported.
|
||||
No Conveyance Self-test supported.
|
||||
Selective Self-test supported.
|
||||
SMART capabilities: (0x0003) Saves SMART data before entering
|
||||
power-saving mode.
|
||||
Supports SMART auto save timer.
|
||||
Error logging capability: (0x01) Error logging supported.
|
||||
General Purpose Logging supported.
|
||||
Short self-test routine
|
||||
recommended polling time: ( 2) minutes.
|
||||
Extended self-test routine
|
||||
recommended polling time: ( 64) minutes.
|
||||
SCT capabilities: (0x003d) SCT Status supported.
|
||||
SCT Error Recovery Control supported.
|
||||
SCT Feature Control supported.
|
||||
SCT Data Table supported.
|
||||
|
||||
SMART Attributes Data Structure revision number: 1
|
||||
Vendor Specific SMART Attributes with Thresholds:
|
||||
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
|
||||
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
|
||||
9 Power_On_Hours -O--CK 099 099 000 - 2707
|
||||
12 Power_Cycle_Count -O--CK 097 097 000 - 2747
|
||||
170 Unused_Rsvd_Blk_Ct_Chip -O--CK 100 100 010 - 0
|
||||
171 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
|
||||
172 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
|
||||
173 Wear_Leveling_Count PO--CK 096 096 005 - 73
|
||||
174 Unexpect_Power_Loss_Ct -O--CK 099 099 000 - 34
|
||||
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
|
||||
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 397
|
||||
184 End-to-End_Error PO--CK 100 100 097 - 0
|
||||
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
|
||||
194 Temperature_Celsius -O--CK 068 044 000 - 32
|
||||
199 CRC_Error_Count -OSRCK 100 100 000 - 0
|
||||
233 Media_Wearout_Indicator PO--C- 096 096 000 - 16164846
|
||||
241 Total_LBAs_Written -O--CK 099 099 000 - 6273
|
||||
242 Total_LBAs_Read -O--CK 099 099 000 - 4256
|
||||
249 NAND_Writes_1GiB -O--CK 099 099 000 - 9344
|
||||
||||||_ K auto-keep
|
||||
|||||__ C event count
|
||||
||||___ R error rate
|
||||
|||____ S speed/performance
|
||||
||_____ O updated online
|
||||
|______ P prefailure warning
|
||||
|
||||
General Purpose Log Directory Version 1
|
||||
SMART Log Directory Version 1 [multi-sector log support]
|
||||
Address Access R/W Size Description
|
||||
0x00 GPL,SL R/O 1 Log Directory
|
||||
0x01 SL R/O 1 Summary SMART error log
|
||||
0x02 SL R/O 1 Comprehensive SMART error log
|
||||
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
|
||||
0x06 SL R/O 1 SMART self-test log
|
||||
0x07 GPL R/O 1 Extended self-test log
|
||||
0x09 SL R/W 1 Selective self-test log
|
||||
0x10 GPL R/O 1 NCQ Command Error log
|
||||
0x11 GPL R/O 1 SATA Phy Event Counters log
|
||||
0x13 GPL R/O 1 SATA NCQ Send and Receive log
|
||||
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
|
||||
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
|
||||
0xdf GPL,SL VS 1 Device vendor specific log
|
||||
0xe0 GPL,SL R/W 1 SCT Command/Status
|
||||
0xe1 GPL,SL R/W 1 SCT Data Transfer
|
||||
|
||||
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
|
||||
No Errors Logged
|
||||
|
||||
SMART Extended Self-test Log Version: 1 (1 sectors)
|
||||
No self-tests have been logged. [To run self-tests, use: smartctl -t]
|
||||
|
||||
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
|
||||
SMART Selective self-test log data structure revision number 1
|
||||
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
|
||||
1 0 0 Not_testing
|
||||
2 0 0 Not_testing
|
||||
3 0 0 Not_testing
|
||||
4 0 0 Not_testing
|
||||
5 0 0 Not_testing
|
||||
255 0 65535 Read_scanning was never started
|
||||
Selective self-test flags (0x0):
|
||||
After scanning selected spans, do NOT read-scan remainder of disk.
|
||||
If Selective self-test is pending on power-up, resume after 0 minute delay.
|
||||
|
||||
SCT Status Version: 3
|
||||
SCT Version (vendor specific): 256 (0x0100)
|
||||
Device State: SCT command executing in background (5)
|
||||
Current Temperature: 31 Celsius
|
||||
Power Cycle Min/Max Temperature: 29/32 Celsius
|
||||
Lifetime Min/Max Temperature: 0/70 Celsius
|
||||
Under/Over Temperature Limit Count: 0/0
|
||||
|
||||
SCT Temperature History Version: 3 (Unknown, should be 2)
|
||||
Temperature Sampling Period: 1 minute
|
||||
Temperature Logging Interval: 10 minutes
|
||||
Min/Max recommended Temperature: 0/70 Celsius
|
||||
Min/Max Temperature Limit: 0/70 Celsius
|
||||
Temperature History Size (Index): 128 (9)
|
||||
|
||||
SCT Error Recovery Control:
|
||||
Read: Disabled
|
||||
Write: Disabled
|
||||
|
||||
Device Statistics (GP/SMART Log 0x04) not supported
|
||||
|
||||
Pending Defects log (GP Log 0x0c) not supported
|
||||
|
||||
SATA Phy Event Counters (GP Log 0x11)
|
||||
ID Size Value Description
|
||||
0x0001 2 0 Command failed due to ICRC error
|
||||
0x0002 2 0 R_ERR response for data FIS
|
||||
0x0003 2 0 R_ERR response for device-to-host data FIS
|
||||
0x0004 2 0 R_ERR response for host-to-device data FIS
|
||||
0x0005 2 0 R_ERR response for non-data FIS
|
||||
0x0006 2 0 R_ERR response for device-to-host non-data FIS
|
||||
0x0007 2 0 R_ERR response for host-to-device non-data FIS
|
||||
0x0008 2 0 Device-to-host non-data FIS retries
|
||||
0x0009 2 7 Transition from drive PhyRdy to drive PhyNRdy
|
||||
0x000a 2 7 Device-to-host register FISes sent due to a COMRESET
|
||||
0x000b 2 0 CRC errors within host-to-device FIS
|
||||
0x000d 2 0 Non-CRC errors within host-to-device FIS
|
||||
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
|
||||
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
|
||||
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
|
||||
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
|
||||
|
||||
186
SSD/Samsung/MZ7/MZ7LN128HCHP-000H1/63D6BC8BCA11
Normal file
186
SSD/Samsung/MZ7/MZ7LN128HCHP-000H1/63D6BC8BCA11
Normal file
@@ -0,0 +1,186 @@
|
||||
smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE-p5 amd64] (local build)
|
||||
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
|
||||
|
||||
=== START OF INFORMATION SECTION ===
|
||||
Model Family: Samsung based SSDs
|
||||
Device Model: SAMSUNG MZ7LN128HCHP-000H1
|
||||
Serial Number: --
|
||||
LU WWN Device Id: 5 002538 ...
|
||||
Firmware Version: EMT02H0Q
|
||||
User Capacity: 128,035,676,160 bytes [128 GB]
|
||||
Sector Size: 512 bytes logical/physical
|
||||
Rotation Rate: Solid State Device
|
||||
Form Factor: 2.5 inches
|
||||
TRIM Command: Available, deterministic
|
||||
Device is: In smartctl database 7.3/5319
|
||||
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
|
||||
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
|
||||
Local Time is: Fri Jan 6 21:56:05 2023 EET
|
||||
SMART support is: Available - device has SMART capability.
|
||||
SMART support is: Enabled
|
||||
AAM feature is: Unavailable
|
||||
APM feature is: Unavailable
|
||||
Rd look-ahead is: Enabled
|
||||
Write cache is: Enabled
|
||||
DSN feature is: Unavailable
|
||||
ATA Security is: Disabled, frozen [SEC2]
|
||||
Wt Cache Reorder: Enabled
|
||||
|
||||
=== START OF READ SMART DATA SECTION ===
|
||||
SMART overall-health self-assessment test result: PASSED
|
||||
|
||||
General SMART Values:
|
||||
Offline data collection status: (0x02) Offline data collection activity
|
||||
was completed without error.
|
||||
Auto Offline Data Collection: Disabled.
|
||||
Self-test execution status: ( 0) The previous self-test routine completed
|
||||
without error or no self-test has ever
|
||||
been run.
|
||||
Total time to complete Offline
|
||||
data collection: ( 1080) seconds.
|
||||
Offline data collection
|
||||
capabilities: (0x53) SMART execute Offline immediate.
|
||||
Auto Offline data collection on/off support.
|
||||
Suspend Offline collection upon new
|
||||
command.
|
||||
No Offline surface scan supported.
|
||||
Self-test supported.
|
||||
No Conveyance Self-test supported.
|
||||
Selective Self-test supported.
|
||||
SMART capabilities: (0x0003) Saves SMART data before entering
|
||||
power-saving mode.
|
||||
Supports SMART auto save timer.
|
||||
Error logging capability: (0x01) Error logging supported.
|
||||
General Purpose Logging supported.
|
||||
Short self-test routine
|
||||
recommended polling time: ( 2) minutes.
|
||||
Extended self-test routine
|
||||
recommended polling time: ( 18) minutes.
|
||||
SCT capabilities: (0x003d) SCT Status supported.
|
||||
SCT Error Recovery Control supported.
|
||||
SCT Feature Control supported.
|
||||
SCT Data Table supported.
|
||||
|
||||
SMART Attributes Data Structure revision number: 1
|
||||
Vendor Specific SMART Attributes with Thresholds:
|
||||
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
|
||||
1 Raw_Read_Error_Rate POSR-K 200 200 002 - 0
|
||||
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
|
||||
9 Power_On_Hours -O--CK 047 047 001 - 34423
|
||||
11 Unknown_SSD_Attribute -O---K 099 099 001 - 40
|
||||
12 Power_Cycle_Count -O--CK 099 099 001 - 122
|
||||
170 Unused_Rsvd_Blk_Ct_Chip PO--CK 100 100 010 - 364
|
||||
171 Program_Fail_Count_Chip -O---K 100 100 010 - 0
|
||||
172 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
|
||||
173 Wear_Leveling_Count PO--CK 071 071 005 - 601
|
||||
174 Unexpect_Power_Loss_Ct -O--CK 099 099 001 - 40
|
||||
183 Runtime_Bad_Block -O--CK 100 100 001 - 0
|
||||
184 End-to-End_Error PO--CK 100 100 097 - 0
|
||||
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
|
||||
188 Command_Timeout -O--CK 100 100 000 - 3
|
||||
190 Airflow_Temperature_Cel -O---K 072 051 040 - 28
|
||||
196 Reallocated_Event_Count -O--CK 253 253 001 - 0
|
||||
198 Offline_Uncorrectable ----CK 100 100 001 - 0
|
||||
199 CRC_Error_Count -O---K 100 100 001 - 0
|
||||
||||||_ K auto-keep
|
||||
|||||__ C event count
|
||||
||||___ R error rate
|
||||
|||____ S speed/performance
|
||||
||_____ O updated online
|
||||
|______ P prefailure warning
|
||||
|
||||
General Purpose Log Directory Version 1
|
||||
SMART Log Directory Version 1 [multi-sector log support]
|
||||
Address Access R/W Size Description
|
||||
0x00 GPL,SL R/O 1 Log Directory
|
||||
0x01 SL R/O 1 Summary SMART error log
|
||||
0x02 SL R/O 1 Comprehensive SMART error log
|
||||
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
|
||||
0x04 GPL,SL R/O 3 Device Statistics log
|
||||
0x06 SL R/O 1 SMART self-test log
|
||||
0x07 GPL R/O 1 Extended self-test log
|
||||
0x09 SL R/W 1 Selective self-test log
|
||||
0x10 GPL R/O 1 NCQ Command Error log
|
||||
0x11 GPL R/O 1 SATA Phy Event Counters log
|
||||
0x13 GPL R/O 1 SATA NCQ Send and Receive log
|
||||
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
|
||||
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
|
||||
0xb6 GPL,SL VS 127 Device vendor specific log
|
||||
0xe0 GPL,SL R/W 1 SCT Command/Status
|
||||
0xe1 GPL,SL R/W 1 SCT Data Transfer
|
||||
|
||||
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
|
||||
No Errors Logged
|
||||
|
||||
SMART Extended Self-test Log Version: 1 (1 sectors)
|
||||
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
|
||||
# 1 Short offline Completed without error 00% 34369 -
|
||||
|
||||
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
|
||||
SMART Selective self-test log data structure revision number 1
|
||||
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
|
||||
1 0 0 Not_testing
|
||||
2 0 0 Not_testing
|
||||
3 0 0 Not_testing
|
||||
4 0 0 Not_testing
|
||||
5 0 0 Not_testing
|
||||
255 0 65535 Read_scanning was completed without error
|
||||
Selective self-test flags (0x0):
|
||||
After scanning selected spans, do NOT read-scan remainder of disk.
|
||||
If Selective self-test is pending on power-up, resume after 0 minute delay.
|
||||
|
||||
SCT Status Version: 3
|
||||
SCT Version (vendor specific): 256 (0x0100)
|
||||
Device State: SCT command executing in background (5)
|
||||
Current Temperature: 40 Celsius
|
||||
Power Cycle Min/Max Temperature: 40/40 Celsius
|
||||
Lifetime Min/Max Temperature: 0/70 Celsius
|
||||
Under/Over Temperature Limit Count: 4294967295/4294901760
|
||||
SMART Status: 0xffff (Reserved)
|
||||
|
||||
SCT Temperature History Version: 3 (Unknown, should be 2)
|
||||
Temperature Sampling Period: 1 minute
|
||||
Temperature Logging Interval: 10 minutes
|
||||
Min/Max recommended Temperature: 0/70 Celsius
|
||||
Min/Max Temperature Limit: 0/70 Celsius
|
||||
Temperature History Size (Index): 128 (0)
|
||||
|
||||
SCT Error Recovery Control:
|
||||
Read: Disabled
|
||||
Write: Disabled
|
||||
|
||||
Device Statistics (GP Log 0x04)
|
||||
Page Offset Size Value Flags Description
|
||||
0x01 ===== = = === == General Statistics (rev 2) ==
|
||||
0x01 0x018 6 53617496585 --- Logical Sectors Written
|
||||
0x01 0x028 6 23090393173 --- Logical Sectors Read
|
||||
0x01 0x1f8 7 - --C+ Unknown
|
||||
0x05 ===== = = === == Temperature Statistics (rev 1) ==
|
||||
0x05 0x008 1 28 --- Current Temperature
|
||||
0x05 0x020 1 40 --- Highest Temperature
|
||||
0x05 0x028 1 24 --- Lowest Temperature
|
||||
|||_ C monitored condition met
|
||||
||__ D supports DSN
|
||||
|___ N normalized value
|
||||
|
||||
Pending Defects log (GP Log 0x0c) not supported
|
||||
|
||||
SATA Phy Event Counters (GP Log 0x11)
|
||||
ID Size Value Description
|
||||
0x0001 2 0 Command failed due to ICRC error
|
||||
0x0002 2 0 R_ERR response for data FIS
|
||||
0x0003 2 0 R_ERR response for device-to-host data FIS
|
||||
0x0004 2 0 R_ERR response for host-to-device data FIS
|
||||
0x0005 2 0 R_ERR response for non-data FIS
|
||||
0x0006 2 0 R_ERR response for device-to-host non-data FIS
|
||||
0x0007 2 0 R_ERR response for host-to-device non-data FIS
|
||||
0x0008 2 0 Device-to-host non-data FIS retries
|
||||
0x0009 2 2 Transition from drive PhyRdy to drive PhyNRdy
|
||||
0x000a 2 2 Device-to-host register FISes sent due to a COMRESET
|
||||
0x000b 2 0 CRC errors within host-to-device FIS
|
||||
0x000d 2 0 Non-CRC errors within host-to-device FIS
|
||||
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
|
||||
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
|
||||
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
|
||||
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
|
||||
|
||||
170
SSD/Samsung/MZ7/MZ7LN128HCHP-000L1/BB4BFD98D361
Normal file
170
SSD/Samsung/MZ7/MZ7LN128HCHP-000L1/BB4BFD98D361
Normal file
@@ -0,0 +1,170 @@
|
||||
smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE amd64] (local build)
|
||||
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
|
||||
|
||||
=== START OF INFORMATION SECTION ===
|
||||
Model Family: Samsung based SSDs
|
||||
Device Model: SAMSUNG MZ7LN128HCHP-000L1
|
||||
Serial Number: --
|
||||
LU WWN Device Id: 5 002538 ...
|
||||
Firmware Version: EMT03L0Q
|
||||
User Capacity: 128,035,676,160 bytes [128 GB]
|
||||
Sector Size: 512 bytes logical/physical
|
||||
Rotation Rate: Solid State Device
|
||||
TRIM Command: Available
|
||||
Device is: In smartctl database 7.3/5319
|
||||
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
|
||||
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
|
||||
Local Time is: Fri Jul 29 12:14:18 2022 MDT
|
||||
SMART support is: Available - device has SMART capability.
|
||||
SMART support is: Enabled
|
||||
AAM feature is: Unavailable
|
||||
APM feature is: Unavailable
|
||||
Rd look-ahead is: Enabled
|
||||
Write cache is: Enabled
|
||||
DSN feature is: Unavailable
|
||||
ATA Security is: Disabled, NOT FROZEN [SEC1]
|
||||
Wt Cache Reorder: Enabled
|
||||
|
||||
=== START OF READ SMART DATA SECTION ===
|
||||
SMART overall-health self-assessment test result: PASSED
|
||||
|
||||
General SMART Values:
|
||||
Offline data collection status: (0x00) Offline data collection activity
|
||||
was never started.
|
||||
Auto Offline Data Collection: Disabled.
|
||||
Self-test execution status: ( 0) The previous self-test routine completed
|
||||
without error or no self-test has ever
|
||||
been run.
|
||||
Total time to complete Offline
|
||||
data collection: ( 0) seconds.
|
||||
Offline data collection
|
||||
capabilities: (0x53) SMART execute Offline immediate.
|
||||
Auto Offline data collection on/off support.
|
||||
Suspend Offline collection upon new
|
||||
command.
|
||||
No Offline surface scan supported.
|
||||
Self-test supported.
|
||||
No Conveyance Self-test supported.
|
||||
Selective Self-test supported.
|
||||
SMART capabilities: (0x0003) Saves SMART data before entering
|
||||
power-saving mode.
|
||||
Supports SMART auto save timer.
|
||||
Error logging capability: (0x01) Error logging supported.
|
||||
General Purpose Logging supported.
|
||||
Short self-test routine
|
||||
recommended polling time: ( 2) minutes.
|
||||
Extended self-test routine
|
||||
recommended polling time: ( 64) minutes.
|
||||
SCT capabilities: (0x003d) SCT Status supported.
|
||||
SCT Error Recovery Control supported.
|
||||
SCT Feature Control supported.
|
||||
SCT Data Table supported.
|
||||
|
||||
SMART Attributes Data Structure revision number: 1
|
||||
Vendor Specific SMART Attributes with Thresholds:
|
||||
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
|
||||
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
|
||||
9 Power_On_Hours -O--CK 099 099 000 - 417
|
||||
12 Power_Cycle_Count -O--CK 099 099 000 - 122
|
||||
170 Unused_Rsvd_Blk_Ct_Chip -O--CK 100 100 010 - 0
|
||||
171 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
|
||||
172 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
|
||||
173 Wear_Leveling_Count PO--CK 099 099 005 - 3
|
||||
174 Unexpect_Power_Loss_Ct -O--CK 099 099 000 - 66
|
||||
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
|
||||
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 388
|
||||
184 End-to-End_Error PO--CK 100 100 097 - 0
|
||||
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
|
||||
194 Temperature_Celsius -O--CK 073 050 000 - 27
|
||||
199 CRC_Error_Count -OSRCK 100 100 000 - 0
|
||||
233 Media_Wearout_Indicator PO--C- 099 099 000 - 16752049
|
||||
241 Total_LBAs_Written -O--CK 099 099 000 - 358
|
||||
242 Total_LBAs_Read -O--CK 099 099 000 - 256
|
||||
249 NAND_Writes_1GiB -O--CK 099 099 000 - 384
|
||||
||||||_ K auto-keep
|
||||
|||||__ C event count
|
||||
||||___ R error rate
|
||||
|||____ S speed/performance
|
||||
||_____ O updated online
|
||||
|______ P prefailure warning
|
||||
|
||||
General Purpose Log Directory Version 1
|
||||
SMART Log Directory Version 1 [multi-sector log support]
|
||||
Address Access R/W Size Description
|
||||
0x00 GPL,SL R/O 1 Log Directory
|
||||
0x01 SL R/O 1 Summary SMART error log
|
||||
0x02 SL R/O 1 Comprehensive SMART error log
|
||||
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
|
||||
0x06 SL R/O 1 SMART self-test log
|
||||
0x07 GPL R/O 1 Extended self-test log
|
||||
0x09 SL R/W 1 Selective self-test log
|
||||
0x10 GPL R/O 1 NCQ Command Error log
|
||||
0x11 GPL R/O 1 SATA Phy Event Counters log
|
||||
0x13 GPL R/O 1 SATA NCQ Send and Receive log
|
||||
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
|
||||
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
|
||||
0xdf GPL,SL VS 1 Device vendor specific log
|
||||
0xe0 GPL,SL R/W 1 SCT Command/Status
|
||||
0xe1 GPL,SL R/W 1 SCT Data Transfer
|
||||
|
||||
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
|
||||
No Errors Logged
|
||||
|
||||
SMART Extended Self-test Log Version: 1 (1 sectors)
|
||||
No self-tests have been logged. [To run self-tests, use: smartctl -t]
|
||||
|
||||
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
|
||||
SMART Selective self-test log data structure revision number 1
|
||||
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
|
||||
1 0 0 Not_testing
|
||||
2 0 0 Not_testing
|
||||
3 0 0 Not_testing
|
||||
4 0 0 Not_testing
|
||||
5 0 0 Not_testing
|
||||
255 0 65535 Read_scanning was never started
|
||||
Selective self-test flags (0x0):
|
||||
After scanning selected spans, do NOT read-scan remainder of disk.
|
||||
If Selective self-test is pending on power-up, resume after 0 minute delay.
|
||||
|
||||
SCT Status Version: 3
|
||||
SCT Version (vendor specific): 256 (0x0100)
|
||||
Device State: SCT command executing in background (5)
|
||||
Current Temperature: 27 Celsius
|
||||
Power Cycle Min/Max Temperature: 25/40 Celsius
|
||||
Lifetime Min/Max Temperature: 0/70 Celsius
|
||||
Under/Over Temperature Limit Count: 0/0
|
||||
|
||||
SCT Temperature History Version: 3 (Unknown, should be 2)
|
||||
Temperature Sampling Period: 1 minute
|
||||
Temperature Logging Interval: 10 minutes
|
||||
Min/Max recommended Temperature: 0/70 Celsius
|
||||
Min/Max Temperature Limit: 0/70 Celsius
|
||||
Temperature History Size (Index): 128 (27)
|
||||
|
||||
SCT Error Recovery Control:
|
||||
Read: Disabled
|
||||
Write: Disabled
|
||||
|
||||
Device Statistics (GP/SMART Log 0x04) not supported
|
||||
|
||||
Pending Defects log (GP Log 0x0c) not supported
|
||||
|
||||
SATA Phy Event Counters (GP Log 0x11)
|
||||
ID Size Value Description
|
||||
0x0001 2 0 Command failed due to ICRC error
|
||||
0x0002 2 0 R_ERR response for data FIS
|
||||
0x0003 2 0 R_ERR response for device-to-host data FIS
|
||||
0x0004 2 0 R_ERR response for host-to-device data FIS
|
||||
0x0005 2 0 R_ERR response for non-data FIS
|
||||
0x0006 2 0 R_ERR response for device-to-host non-data FIS
|
||||
0x0007 2 0 R_ERR response for host-to-device non-data FIS
|
||||
0x0008 2 0 Device-to-host non-data FIS retries
|
||||
0x0009 2 5 Transition from drive PhyRdy to drive PhyNRdy
|
||||
0x000a 2 5 Device-to-host register FISes sent due to a COMRESET
|
||||
0x000b 2 0 CRC errors within host-to-device FIS
|
||||
0x000d 2 0 Non-CRC errors within host-to-device FIS
|
||||
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
|
||||
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
|
||||
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
|
||||
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
|
||||
|
||||
206
SSD/Samsung/MZ7/MZ7LN256HAJQ-000H1/564F3F3A5E7A
Normal file
206
SSD/Samsung/MZ7/MZ7LN256HAJQ-000H1/564F3F3A5E7A
Normal file
@@ -0,0 +1,206 @@
|
||||
smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE amd64] (local build)
|
||||
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
|
||||
|
||||
=== START OF INFORMATION SECTION ===
|
||||
Model Family: Samsung based SSDs
|
||||
Device Model: SAMSUNG MZ7LN256HAJQ-000H1
|
||||
Serial Number: --
|
||||
LU WWN Device Id: 5 002538 ...
|
||||
Firmware Version: MVT03H3Q
|
||||
User Capacity: 256,060,514,304 bytes [256 GB]
|
||||
Sector Sizes: 512 bytes logical, 4096 bytes physical
|
||||
Rotation Rate: Solid State Device
|
||||
Form Factor: 2.5 inches
|
||||
TRIM Command: Available, deterministic, zeroed
|
||||
Device is: In smartctl database 7.3/5319
|
||||
ATA Version is: ACS-3, ATA8-ACS T13/1699-D revision 4c
|
||||
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
|
||||
Local Time is: Sat Aug 13 20:30:03 2022 UTC
|
||||
SMART support is: Available - device has SMART capability.
|
||||
SMART support is: Enabled
|
||||
AAM feature is: Unavailable
|
||||
APM feature is: Disabled
|
||||
Rd look-ahead is: Enabled
|
||||
Write cache is: Enabled
|
||||
DSN feature is: Disabled
|
||||
ATA Security is: Disabled, frozen [SEC2]
|
||||
Wt Cache Reorder: Enabled
|
||||
|
||||
=== START OF READ SMART DATA SECTION ===
|
||||
SMART overall-health self-assessment test result: PASSED
|
||||
|
||||
General SMART Values:
|
||||
Offline data collection status: (0x02) Offline data collection activity
|
||||
was completed without error.
|
||||
Auto Offline Data Collection: Disabled.
|
||||
Self-test execution status: ( 0) The previous self-test routine completed
|
||||
without error or no self-test has ever
|
||||
been run.
|
||||
Total time to complete Offline
|
||||
data collection: ( 5100) seconds.
|
||||
Offline data collection
|
||||
capabilities: (0x5b) SMART execute Offline immediate.
|
||||
Auto Offline data collection on/off support.
|
||||
Suspend Offline collection upon new
|
||||
command.
|
||||
Offline surface scan supported.
|
||||
Self-test supported.
|
||||
No Conveyance Self-test supported.
|
||||
Selective Self-test supported.
|
||||
SMART capabilities: (0x0003) Saves SMART data before entering
|
||||
power-saving mode.
|
||||
Supports SMART auto save timer.
|
||||
Error logging capability: (0x01) Error logging supported.
|
||||
General Purpose Logging supported.
|
||||
Short self-test routine
|
||||
recommended polling time: ( 2) minutes.
|
||||
Extended self-test routine
|
||||
recommended polling time: ( 85) minutes.
|
||||
SCT capabilities: (0x003d) SCT Status supported.
|
||||
SCT Error Recovery Control supported.
|
||||
SCT Feature Control supported.
|
||||
SCT Data Table supported.
|
||||
|
||||
SMART Attributes Data Structure revision number: 1
|
||||
Vendor Specific SMART Attributes with Thresholds:
|
||||
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
|
||||
1 Raw_Read_Error_Rate POSR-K 100 100 050 - 0
|
||||
5 Reallocated_Sector_Ct PO--CK 100 100 005 - 0
|
||||
9 Power_On_Hours -O--CK 100 100 000 - 29484
|
||||
12 Power_Cycle_Count -O--CK 100 100 000 - 138
|
||||
171 Program_Fail_Count_Chip -O--CK 100 100 000 - 0
|
||||
172 Erase_Fail_Count_Chip -O--CK 100 100 000 - 0
|
||||
173 Wear_Leveling_Count -O--CK 086 086 005 - 168
|
||||
174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 59
|
||||
176 Erase_Fail_Count_Chip -O---K 100 100 000 - 638
|
||||
181 Program_Fail_Cnt_Total -O---K 095 001 000 - 162211209
|
||||
183 Runtime_Bad_Block -O--CK 100 100 000 - 0
|
||||
184 End-to-End_Error PO-RCK 100 100 097 - 0
|
||||
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
|
||||
188 Command_Timeout -O--CK 100 100 000 - 3
|
||||
194 Temperature_Celsius -O---K 032 064 000 - 32 (Min/Max 23/46)
|
||||
198 Offline_Uncorrectable ----CK 100 100 000 - 0
|
||||
199 CRC_Error_Count -O--CK 100 100 000 - 0
|
||||
201 Supercap_Status PO---K 100 100 005 - 100
|
||||
241 Total_LBAs_Written -O--CK 100 100 000 - 3168495
|
||||
242 Total_LBAs_Read -O--CK 100 100 000 - 2274083
|
||||
243 SATA_Downshift_Ct -O--CK 100 100 000 - 3168495
|
||||
||||||_ K auto-keep
|
||||
|||||__ C event count
|
||||
||||___ R error rate
|
||||
|||____ S speed/performance
|
||||
||_____ O updated online
|
||||
|______ P prefailure warning
|
||||
|
||||
General Purpose Log Directory Version 1
|
||||
SMART Log Directory Version 1 [multi-sector log support]
|
||||
Address Access R/W Size Description
|
||||
0x00 GPL,SL R/O 1 Log Directory
|
||||
0x01 SL R/O 1 Summary SMART error log
|
||||
0x02 SL R/O 1 Comprehensive SMART error log
|
||||
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
|
||||
0x04 GPL,SL R/O 8 Device Statistics log
|
||||
0x06 SL R/O 1 SMART self-test log
|
||||
0x07 GPL R/O 1 Extended self-test log
|
||||
0x09 SL R/W 1 Selective self-test log
|
||||
0x0a GPL R/W 1 Device Statistics Notification
|
||||
0x0c GPL R/O 1 Pending Defects log
|
||||
0x0d GPL,SL R/O 1 LPS Mis-alignment log
|
||||
0x10 GPL R/O 1 NCQ Command Error log
|
||||
0x11 GPL R/O 1 SATA Phy Event Counters log
|
||||
0x13 GPL R/O 1 SATA NCQ Send and Receive log
|
||||
0x19 GPL R/O 8 LBA Status log
|
||||
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
|
||||
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
|
||||
0xce SL VS 16 Device vendor specific log
|
||||
0xe0 GPL,SL R/W 1 SCT Command/Status
|
||||
0xe1 GPL,SL R/W 1 SCT Data Transfer
|
||||
|
||||
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
|
||||
No Errors Logged
|
||||
|
||||
SMART Extended Self-test Log Version: 1 (1 sectors)
|
||||
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
|
||||
# 1 Short offline Completed without error 00% 26313 -
|
||||
# 2 Short offline Completed without error 00% 0 -
|
||||
|
||||
SMART Selective self-test log data structure revision number 1
|
||||
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
|
||||
1 0 0 Not_testing
|
||||
2 0 0 Not_testing
|
||||
3 0 0 Not_testing
|
||||
4 0 0 Not_testing
|
||||
5 0 0 Not_testing
|
||||
255 0 65535 Read_scanning was completed without error
|
||||
Selective self-test flags (0x0):
|
||||
After scanning selected spans, do NOT read-scan remainder of disk.
|
||||
If Selective self-test is pending on power-up, resume after 0 minute delay.
|
||||
|
||||
SCT Status Version: 3
|
||||
SCT Version (vendor specific): 256 (0x0100)
|
||||
Device State: Active (0)
|
||||
Current Temperature: 33 Celsius
|
||||
Power Cycle Min/Max Temperature: 27/44 Celsius
|
||||
Lifetime Min/Max Temperature: 23/64 Celsius
|
||||
Under/Over Temperature Limit Count: 0/0
|
||||
|
||||
SCT Temperature History Version: 2
|
||||
Temperature Sampling Period: 1 minute
|
||||
Temperature Logging Interval: 10 minutes
|
||||
Min/Max recommended Temperature: 0/70 Celsius
|
||||
Min/Max Temperature Limit: 0/70 Celsius
|
||||
Temperature History Size (Index): 128 (104)
|
||||
|
||||
SCT Error Recovery Control:
|
||||
Read: Disabled
|
||||
Write: Disabled
|
||||
|
||||
Device Statistics (GP Log 0x04)
|
||||
Page Offset Size Value Flags Description
|
||||
0x01 ===== = = === == General Statistics (rev 1) ==
|
||||
0x01 0x008 4 138 -D- Lifetime Power-On Resets
|
||||
0x01 0x010 4 29484 -D- Power-on Hours
|
||||
0x01 0x018 6 103825248672 -D- Logical Sectors Written
|
||||
0x01 0x020 6 4052885370 -D- Number of Write Commands
|
||||
0x01 0x028 6 74517168421 -D- Logical Sectors Read
|
||||
0x01 0x030 6 1728975880 -D- Number of Read Commands
|
||||
0x04 ===== = = === == General Errors Statistics (rev 1) ==
|
||||
0x04 0x008 4 0 -D- Number of Reported Uncorrectable Errors
|
||||
0x04 0x010 4 3 -D- Resets Between Cmd Acceptance and Completion
|
||||
0x05 ===== = = === == Temperature Statistics (rev 1) ==
|
||||
0x05 0x008 1 33 -D- Current Temperature
|
||||
0x05 0x020 1 64 -D- Highest Temperature
|
||||
0x05 0x028 1 23 -D- Lowest Temperature
|
||||
0x05 0x058 1 55 -D- Specified Maximum Operating Temperature
|
||||
0x06 ===== = = === == Transport Statistics (rev 1) ==
|
||||
0x06 0x008 4 775 -D- Number of Hardware Resets
|
||||
0x06 0x010 4 0 -D- Number of ASR Events
|
||||
0x06 0x018 4 0 -D- Number of Interface CRC Errors
|
||||
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
|
||||
0x07 0x008 1 14 ND- Percentage Used Endurance Indicator
|
||||
|||_ C monitored condition met
|
||||
||__ D supports DSN
|
||||
|___ N normalized value
|
||||
|
||||
Pending Defects log (GP Log 0x0c)
|
||||
No Defects Logged
|
||||
|
||||
SATA Phy Event Counters (GP Log 0x11)
|
||||
ID Size Value Description
|
||||
0x0001 2 0 Command failed due to ICRC error
|
||||
0x0002 2 0 R_ERR response for data FIS
|
||||
0x0003 2 0 R_ERR response for device-to-host data FIS
|
||||
0x0004 2 0 R_ERR response for host-to-device data FIS
|
||||
0x0005 2 0 R_ERR response for non-data FIS
|
||||
0x0006 2 0 R_ERR response for device-to-host non-data FIS
|
||||
0x0007 2 0 R_ERR response for host-to-device non-data FIS
|
||||
0x0008 2 0 Device-to-host non-data FIS retries
|
||||
0x0009 2 11 Transition from drive PhyRdy to drive PhyNRdy
|
||||
0x000a 2 11 Device-to-host register FISes sent due to a COMRESET
|
||||
0x000b 2 0 CRC errors within host-to-device FIS
|
||||
0x000d 2 0 Non-CRC errors within host-to-device FIS
|
||||
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
|
||||
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
|
||||
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
|
||||
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
|
||||
|
||||
199
SSD/Samsung/MZ7/MZ7LN256HAJQ-000L7/043754B212E4
Normal file
199
SSD/Samsung/MZ7/MZ7LN256HAJQ-000L7/043754B212E4
Normal file
@@ -0,0 +1,199 @@
|
||||
smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.0-STABLE amd64] (local build)
|
||||
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
|
||||
|
||||
=== START OF INFORMATION SECTION ===
|
||||
Model Family: Samsung based SSDs
|
||||
Device Model: SAMSUNG MZ7LN256HAJQ-000L7
|
||||
Serial Number: --
|
||||
LU WWN Device Id: 5 002538 ...
|
||||
Firmware Version: MVT05L6Q
|
||||
User Capacity: 256,060,514,304 bytes [256 GB]
|
||||
Sector Sizes: 512 bytes logical, 4096 bytes physical
|
||||
Rotation Rate: Solid State Device
|
||||
Form Factor: 2.5 inches
|
||||
TRIM Command: Available
|
||||
Device is: In smartctl database 7.3/5319
|
||||
ATA Version is: ACS-3, ATA8-ACS T13/1699-D revision 4c
|
||||
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
|
||||
Local Time is: Mon Apr 11 23:14:24 2022 CEST
|
||||
SMART support is: Available - device has SMART capability.
|
||||
SMART support is: Enabled
|
||||
AAM feature is: Unavailable
|
||||
APM feature is: Unavailable
|
||||
Rd look-ahead is: Enabled
|
||||
Write cache is: Enabled
|
||||
DSN feature is: Unavailable
|
||||
ATA Security is: Disabled, frozen [SEC2]
|
||||
Wt Cache Reorder: Enabled
|
||||
|
||||
=== START OF READ SMART DATA SECTION ===
|
||||
SMART overall-health self-assessment test result: PASSED
|
||||
|
||||
General SMART Values:
|
||||
Offline data collection status: (0x80) Offline data collection activity
|
||||
was never started.
|
||||
Auto Offline Data Collection: Enabled.
|
||||
Self-test execution status: ( 0) The previous self-test routine completed
|
||||
without error or no self-test has ever
|
||||
been run.
|
||||
Total time to complete Offline
|
||||
data collection: ( 0) seconds.
|
||||
Offline data collection
|
||||
capabilities: (0x53) SMART execute Offline immediate.
|
||||
Auto Offline data collection on/off support.
|
||||
Suspend Offline collection upon new
|
||||
command.
|
||||
No Offline surface scan supported.
|
||||
Self-test supported.
|
||||
No Conveyance Self-test supported.
|
||||
Selective Self-test supported.
|
||||
SMART capabilities: (0x0003) Saves SMART data before entering
|
||||
power-saving mode.
|
||||
Supports SMART auto save timer.
|
||||
Error logging capability: (0x01) Error logging supported.
|
||||
General Purpose Logging supported.
|
||||
Short self-test routine
|
||||
recommended polling time: ( 2) minutes.
|
||||
Extended self-test routine
|
||||
recommended polling time: ( 85) minutes.
|
||||
SCT capabilities: (0x003d) SCT Status supported.
|
||||
SCT Error Recovery Control supported.
|
||||
SCT Feature Control supported.
|
||||
SCT Data Table supported.
|
||||
|
||||
SMART Attributes Data Structure revision number: 1
|
||||
Vendor Specific SMART Attributes with Thresholds:
|
||||
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
|
||||
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
|
||||
9 Power_On_Hours -O--CK 099 099 000 - 4
|
||||
12 Power_Cycle_Count -O--CK 099 099 000 - 10
|
||||
170 Unused_Rsvd_Blk_Ct_Chip -O--CK 100 100 010 - 0
|
||||
171 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
|
||||
172 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
|
||||
173 Wear_Leveling_Count PO--CK 100 100 005 - 0
|
||||
174 Unexpect_Power_Loss_Ct -O--CK 099 099 000 - 5
|
||||
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
|
||||
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 636
|
||||
184 End-to-End_Error PO--CK 100 100 097 - 0
|
||||
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
|
||||
194 Temperature_Celsius -O--CK 076 060 000 - 24 (Min/Max 24/40)
|
||||
199 CRC_Error_Count -OSRCK 100 100 000 - 0
|
||||
233 Media_Wearout_Indicator PO--C- 100 100 001 - 16777215
|
||||
234 Unknown_Samsung_Attr -O--CK 100 100 000 - 0
|
||||
241 Total_LBAs_Written -O--CK 099 099 000 - 88
|
||||
242 Total_LBAs_Read -O--CK 099 099 000 - 32
|
||||
249 NAND_Writes_1GiB -O--CK 099 099 000 - 88
|
||||
||||||_ K auto-keep
|
||||
|||||__ C event count
|
||||
||||___ R error rate
|
||||
|||____ S speed/performance
|
||||
||_____ O updated online
|
||||
|______ P prefailure warning
|
||||
|
||||
General Purpose Log Directory Version 1
|
||||
SMART Log Directory Version 1 [multi-sector log support]
|
||||
Address Access R/W Size Description
|
||||
0x00 GPL,SL R/O 1 Log Directory
|
||||
0x01 SL R/O 1 Summary SMART error log
|
||||
0x02 SL R/O 1 Comprehensive SMART error log
|
||||
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
|
||||
0x04 GPL,SL R/O 8 Device Statistics log
|
||||
0x06 SL R/O 1 SMART self-test log
|
||||
0x07 GPL R/O 1 Extended self-test log
|
||||
0x09 SL R/W 1 Selective self-test log
|
||||
0x10 GPL R/O 1 NCQ Command Error log
|
||||
0x11 GPL R/O 1 SATA Phy Event Counters log
|
||||
0x13 GPL R/O 1 SATA NCQ Send and Receive log
|
||||
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
|
||||
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
|
||||
0xa5 SL VS 16 Device vendor specific log
|
||||
0xce SL VS 16 Device vendor specific log
|
||||
0xdf GPL,SL VS 1 Device vendor specific log
|
||||
0xe0 GPL,SL R/W 1 SCT Command/Status
|
||||
0xe1 GPL,SL R/W 1 SCT Data Transfer
|
||||
|
||||
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
|
||||
No Errors Logged
|
||||
|
||||
SMART Extended Self-test Log Version: 1 (1 sectors)
|
||||
No self-tests have been logged. [To run self-tests, use: smartctl -t]
|
||||
|
||||
SMART Selective self-test log data structure revision number 1
|
||||
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
|
||||
1 0 0 Not_testing
|
||||
2 0 0 Not_testing
|
||||
3 0 0 Not_testing
|
||||
4 0 0 Not_testing
|
||||
5 0 0 Not_testing
|
||||
255 0 65535 Read_scanning was never started
|
||||
Selective self-test flags (0x0):
|
||||
After scanning selected spans, do NOT read-scan remainder of disk.
|
||||
If Selective self-test is pending on power-up, resume after 0 minute delay.
|
||||
|
||||
SCT Status Version: 3
|
||||
SCT Version (vendor specific): 256 (0x0100)
|
||||
Device State: Active (0)
|
||||
Current Temperature: 24 Celsius
|
||||
Power Cycle Min/Max Temperature: ?/28 Celsius
|
||||
Lifetime Min/Max Temperature: 29/40 Celsius
|
||||
Under/Over Temperature Limit Count: 0/0
|
||||
|
||||
SCT Temperature History Version: 2
|
||||
Temperature Sampling Period: 1 minute
|
||||
Temperature Logging Interval: 10 minutes
|
||||
Min/Max recommended Temperature: 0/70 Celsius
|
||||
Min/Max Temperature Limit: 0/70 Celsius
|
||||
Temperature History Size (Index): 128 (47)
|
||||
|
||||
SCT Error Recovery Control:
|
||||
Read: Disabled
|
||||
Write: Disabled
|
||||
|
||||
Device Statistics (GP Log 0x04)
|
||||
Page Offset Size Value Flags Description
|
||||
0x01 ===== = = === == General Statistics (rev 1) ==
|
||||
0x01 0x008 4 10 --- Lifetime Power-On Resets
|
||||
0x01 0x010 4 4 --- Power-on Hours
|
||||
0x01 0x018 6 185218800 --- Logical Sectors Written
|
||||
0x01 0x020 6 0 --- Number of Write Commands
|
||||
0x01 0x028 6 67948487 --- Logical Sectors Read
|
||||
0x01 0x030 6 0 --- Number of Read Commands
|
||||
0x04 ===== = = === == General Errors Statistics (rev 1) ==
|
||||
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
|
||||
0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion
|
||||
0x05 ===== = = === == Temperature Statistics (rev 1) ==
|
||||
0x05 0x008 1 24 --- Current Temperature
|
||||
0x05 0x020 1 40 --- Highest Temperature
|
||||
0x05 0x028 1 29 --- Lowest Temperature
|
||||
0x05 0x058 1 55 --- Specified Maximum Operating Temperature
|
||||
0x06 ===== = = === == Transport Statistics (rev 1) ==
|
||||
0x06 0x008 4 72 --- Number of Hardware Resets
|
||||
0x06 0x010 4 0 --- Number of ASR Events
|
||||
0x06 0x018 4 0 --- Number of Interface CRC Errors
|
||||
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
|
||||
0x07 0x008 1 0 N-- Percentage Used Endurance Indicator
|
||||
|||_ C monitored condition met
|
||||
||__ D supports DSN
|
||||
|___ N normalized value
|
||||
|
||||
Pending Defects log (GP Log 0x0c) not supported
|
||||
|
||||
SATA Phy Event Counters (GP Log 0x11)
|
||||
ID Size Value Description
|
||||
0x0001 2 0 Command failed due to ICRC error
|
||||
0x0002 2 0 R_ERR response for data FIS
|
||||
0x0003 2 0 R_ERR response for device-to-host data FIS
|
||||
0x0004 2 0 R_ERR response for host-to-device data FIS
|
||||
0x0005 2 0 R_ERR response for non-data FIS
|
||||
0x0006 2 0 R_ERR response for device-to-host non-data FIS
|
||||
0x0007 2 0 R_ERR response for host-to-device non-data FIS
|
||||
0x0008 2 0 Device-to-host non-data FIS retries
|
||||
0x0009 2 11 Transition from drive PhyRdy to drive PhyNRdy
|
||||
0x000a 2 11 Device-to-host register FISes sent due to a COMRESET
|
||||
0x000b 2 0 CRC errors within host-to-device FIS
|
||||
0x000d 2 0 Non-CRC errors within host-to-device FIS
|
||||
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
|
||||
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
|
||||
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
|
||||
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
|
||||
|
||||
184
SSD/Samsung/MZ7/MZ7LN256HCHP-000H1/21B82C77F2A5
Normal file
184
SSD/Samsung/MZ7/MZ7LN256HCHP-000H1/21B82C77F2A5
Normal file
@@ -0,0 +1,184 @@
|
||||
smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.0-STABLE amd64] (local build)
|
||||
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
|
||||
|
||||
=== START OF INFORMATION SECTION ===
|
||||
Model Family: Samsung based SSDs
|
||||
Device Model: SAMSUNG MZ7LN256HCHP-000H1
|
||||
Serial Number: --
|
||||
LU WWN Device Id: 5 002538 ...
|
||||
Firmware Version: EMT02H0Q
|
||||
User Capacity: 256,060,514,304 bytes [256 GB]
|
||||
Sector Size: 512 bytes logical/physical
|
||||
Rotation Rate: Solid State Device
|
||||
Form Factor: 2.5 inches
|
||||
TRIM Command: Available, deterministic
|
||||
Device is: In smartctl database 7.3/5319
|
||||
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
|
||||
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
|
||||
Local Time is: Sat Apr 9 17:14:38 2022 CEST
|
||||
SMART support is: Available - device has SMART capability.
|
||||
SMART support is: Enabled
|
||||
AAM feature is: Unavailable
|
||||
APM feature is: Unavailable
|
||||
Rd look-ahead is: Enabled
|
||||
Write cache is: Enabled
|
||||
DSN feature is: Unavailable
|
||||
ATA Security is: Disabled, frozen [SEC2]
|
||||
Wt Cache Reorder: Enabled
|
||||
|
||||
=== START OF READ SMART DATA SECTION ===
|
||||
SMART overall-health self-assessment test result: PASSED
|
||||
|
||||
General SMART Values:
|
||||
Offline data collection status: (0x02) Offline data collection activity
|
||||
was completed without error.
|
||||
Auto Offline Data Collection: Disabled.
|
||||
Self-test execution status: ( 0) The previous self-test routine completed
|
||||
without error or no self-test has ever
|
||||
been run.
|
||||
Total time to complete Offline
|
||||
data collection: ( 2160) seconds.
|
||||
Offline data collection
|
||||
capabilities: (0x53) SMART execute Offline immediate.
|
||||
Auto Offline data collection on/off support.
|
||||
Suspend Offline collection upon new
|
||||
command.
|
||||
No Offline surface scan supported.
|
||||
Self-test supported.
|
||||
No Conveyance Self-test supported.
|
||||
Selective Self-test supported.
|
||||
SMART capabilities: (0x0003) Saves SMART data before entering
|
||||
power-saving mode.
|
||||
Supports SMART auto save timer.
|
||||
Error logging capability: (0x01) Error logging supported.
|
||||
General Purpose Logging supported.
|
||||
Short self-test routine
|
||||
recommended polling time: ( 2) minutes.
|
||||
Extended self-test routine
|
||||
recommended polling time: ( 36) minutes.
|
||||
SCT capabilities: (0x003d) SCT Status supported.
|
||||
SCT Error Recovery Control supported.
|
||||
SCT Feature Control supported.
|
||||
SCT Data Table supported.
|
||||
|
||||
SMART Attributes Data Structure revision number: 1
|
||||
Vendor Specific SMART Attributes with Thresholds:
|
||||
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
|
||||
1 Raw_Read_Error_Rate POSR-K 200 200 002 - 0
|
||||
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
|
||||
9 Power_On_Hours -O--CK 099 099 001 - 101
|
||||
11 Unknown_SSD_Attribute -O---K 099 099 001 - 17
|
||||
12 Power_Cycle_Count -O--CK 099 099 001 - 63
|
||||
170 Unused_Rsvd_Blk_Ct_Chip PO--CK 100 100 010 - 774
|
||||
171 Program_Fail_Count_Chip -O---K 100 100 010 - 0
|
||||
172 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
|
||||
173 Wear_Leveling_Count PO--CK 099 099 005 - 1
|
||||
174 Unexpect_Power_Loss_Ct -O--CK 099 099 001 - 17
|
||||
183 Runtime_Bad_Block -O--CK 100 100 001 - 0
|
||||
184 End-to-End_Error PO--CK 100 100 097 - 0
|
||||
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
|
||||
188 Command_Timeout -O--CK 100 100 000 - 0
|
||||
190 Airflow_Temperature_Cel -O---K 070 054 040 - 30
|
||||
196 Reallocated_Event_Count -O--CK 253 253 001 - 0
|
||||
198 Offline_Uncorrectable ----CK 100 100 001 - 0
|
||||
199 CRC_Error_Count -O---K 100 100 001 - 0
|
||||
||||||_ K auto-keep
|
||||
|||||__ C event count
|
||||
||||___ R error rate
|
||||
|||____ S speed/performance
|
||||
||_____ O updated online
|
||||
|______ P prefailure warning
|
||||
|
||||
General Purpose Log Directory Version 1
|
||||
SMART Log Directory Version 1 [multi-sector log support]
|
||||
Address Access R/W Size Description
|
||||
0x00 GPL,SL R/O 1 Log Directory
|
||||
0x01 SL R/O 1 Summary SMART error log
|
||||
0x02 SL R/O 1 Comprehensive SMART error log
|
||||
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
|
||||
0x04 GPL,SL R/O 3 Device Statistics log
|
||||
0x06 SL R/O 1 SMART self-test log
|
||||
0x07 GPL R/O 1 Extended self-test log
|
||||
0x09 SL R/W 1 Selective self-test log
|
||||
0x10 GPL R/O 1 NCQ Command Error log
|
||||
0x11 GPL R/O 1 SATA Phy Event Counters log
|
||||
0x13 GPL R/O 1 SATA NCQ Send and Receive log
|
||||
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
|
||||
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
|
||||
0xb6 GPL,SL VS 127 Device vendor specific log
|
||||
0xe0 GPL,SL R/W 1 SCT Command/Status
|
||||
0xe1 GPL,SL R/W 1 SCT Data Transfer
|
||||
|
||||
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
|
||||
No Errors Logged
|
||||
|
||||
SMART Extended Self-test Log Version: 1 (1 sectors)
|
||||
No self-tests have been logged. [To run self-tests, use: smartctl -t]
|
||||
|
||||
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
|
||||
SMART Selective self-test log data structure revision number 1
|
||||
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
|
||||
1 0 0 Not_testing
|
||||
2 0 0 Not_testing
|
||||
3 0 0 Not_testing
|
||||
4 0 0 Not_testing
|
||||
5 0 0 Not_testing
|
||||
255 0 65535 Read_scanning was completed without error
|
||||
Selective self-test flags (0x0):
|
||||
After scanning selected spans, do NOT read-scan remainder of disk.
|
||||
If Selective self-test is pending on power-up, resume after 0 minute delay.
|
||||
|
||||
SCT Status Version: 3
|
||||
SCT Version (vendor specific): 256 (0x0100)
|
||||
Device State: SCT command executing in background (5)
|
||||
Current Temperature: 28 Celsius
|
||||
Power Cycle Min/Max Temperature: 28/40 Celsius
|
||||
Lifetime Min/Max Temperature: 0/70 Celsius
|
||||
Under/Over Temperature Limit Count: 4294967295/4294901760
|
||||
SMART Status: 0xffff (Reserved)
|
||||
|
||||
SCT Temperature History Version: 3 (Unknown, should be 2)
|
||||
Temperature Sampling Period: 1 minute
|
||||
Temperature Logging Interval: 10 minutes
|
||||
Min/Max recommended Temperature: 0/70 Celsius
|
||||
Min/Max Temperature Limit: 0/70 Celsius
|
||||
Temperature History Size (Index): 128 (13)
|
||||
|
||||
SCT Error Recovery Control:
|
||||
Read: Disabled
|
||||
Write: Disabled
|
||||
|
||||
Device Statistics (GP Log 0x04)
|
||||
Page Offset Size Value Flags Description
|
||||
0x01 ===== = = === == General Statistics (rev 2) ==
|
||||
0x01 0x018 6 704965460 --- Logical Sectors Written
|
||||
0x01 0x028 6 694152711 --- Logical Sectors Read
|
||||
0x05 ===== = = === == Temperature Statistics (rev 1) ==
|
||||
0x05 0x008 1 30 --- Current Temperature
|
||||
0x05 0x020 1 30 --- Highest Temperature
|
||||
0x05 0x028 1 30 --- Lowest Temperature
|
||||
|||_ C monitored condition met
|
||||
||__ D supports DSN
|
||||
|___ N normalized value
|
||||
|
||||
Pending Defects log (GP Log 0x0c) not supported
|
||||
|
||||
SATA Phy Event Counters (GP Log 0x11)
|
||||
ID Size Value Description
|
||||
0x0001 2 0 Command failed due to ICRC error
|
||||
0x0002 2 0 R_ERR response for data FIS
|
||||
0x0003 2 0 R_ERR response for device-to-host data FIS
|
||||
0x0004 2 0 R_ERR response for host-to-device data FIS
|
||||
0x0005 2 0 R_ERR response for non-data FIS
|
||||
0x0006 2 0 R_ERR response for device-to-host non-data FIS
|
||||
0x0007 2 0 R_ERR response for host-to-device non-data FIS
|
||||
0x0008 2 0 Device-to-host non-data FIS retries
|
||||
0x0009 2 5 Transition from drive PhyRdy to drive PhyNRdy
|
||||
0x000a 2 5 Device-to-host register FISes sent due to a COMRESET
|
||||
0x000b 2 0 CRC errors within host-to-device FIS
|
||||
0x000d 2 0 Non-CRC errors within host-to-device FIS
|
||||
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
|
||||
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
|
||||
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
|
||||
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
|
||||
|
||||
209
SSD/Samsung/MZ7/MZ7LN256HMJP-000H1/40485272C1DF
Normal file
209
SSD/Samsung/MZ7/MZ7LN256HMJP-000H1/40485272C1DF
Normal file
@@ -0,0 +1,209 @@
|
||||
smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE-p2 amd64] (local build)
|
||||
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
|
||||
|
||||
=== START OF INFORMATION SECTION ===
|
||||
Model Family: Samsung based SSDs
|
||||
Device Model: SAMSUNG MZ7LN256HMJP-000H1
|
||||
Serial Number: --
|
||||
LU WWN Device Id: 5 002538 ...
|
||||
Firmware Version: MAV01H3Q
|
||||
User Capacity: 256,060,514,304 bytes [256 GB]
|
||||
Sector Sizes: 512 bytes logical, 4096 bytes physical
|
||||
Rotation Rate: Solid State Device
|
||||
Form Factor: 2.5 inches
|
||||
TRIM Command: Available, deterministic, zeroed
|
||||
Device is: In smartctl database 7.3/5319
|
||||
ATA Version is: ACS-3, ATA8-ACS T13/1699-D revision 4c
|
||||
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
|
||||
Local Time is: Wed Oct 5 17:20:13 2022 UTC
|
||||
SMART support is: Available - device has SMART capability.
|
||||
SMART support is: Enabled
|
||||
AAM feature is: Unavailable
|
||||
APM feature is: Disabled
|
||||
Rd look-ahead is: Enabled
|
||||
Write cache is: Enabled
|
||||
DSN feature is: Disabled
|
||||
ATA Security is: Disabled, frozen [SEC2]
|
||||
Wt Cache Reorder: Enabled
|
||||
|
||||
=== START OF READ SMART DATA SECTION ===
|
||||
SMART overall-health self-assessment test result: PASSED
|
||||
|
||||
General SMART Values:
|
||||
Offline data collection status: (0x02) Offline data collection activity
|
||||
was completed without error.
|
||||
Auto Offline Data Collection: Disabled.
|
||||
Self-test execution status: ( 0) The previous self-test routine completed
|
||||
without error or no self-test has ever
|
||||
been run.
|
||||
Total time to complete Offline
|
||||
data collection: ( 5100) seconds.
|
||||
Offline data collection
|
||||
capabilities: (0x5b) SMART execute Offline immediate.
|
||||
Auto Offline data collection on/off support.
|
||||
Suspend Offline collection upon new
|
||||
command.
|
||||
Offline surface scan supported.
|
||||
Self-test supported.
|
||||
No Conveyance Self-test supported.
|
||||
Selective Self-test supported.
|
||||
SMART capabilities: (0x0003) Saves SMART data before entering
|
||||
power-saving mode.
|
||||
Supports SMART auto save timer.
|
||||
Error logging capability: (0x01) Error logging supported.
|
||||
General Purpose Logging supported.
|
||||
Short self-test routine
|
||||
recommended polling time: ( 2) minutes.
|
||||
Extended self-test routine
|
||||
recommended polling time: ( 85) minutes.
|
||||
SCT capabilities: (0x003d) SCT Status supported.
|
||||
SCT Error Recovery Control supported.
|
||||
SCT Feature Control supported.
|
||||
SCT Data Table supported.
|
||||
|
||||
SMART Attributes Data Structure revision number: 1
|
||||
Vendor Specific SMART Attributes with Thresholds:
|
||||
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
|
||||
1 Raw_Read_Error_Rate POSR-K 100 100 050 - 0
|
||||
5 Reallocated_Sector_Ct PO--CK 100 100 005 - 0
|
||||
9 Power_On_Hours -O--CK 100 100 000 - 24032
|
||||
12 Power_Cycle_Count -O--CK 100 100 000 - 215
|
||||
171 Program_Fail_Count_Chip -O--CK 100 100 000 - 0
|
||||
172 Erase_Fail_Count_Chip -O--CK 100 100 000 - 0
|
||||
173 Wear_Leveling_Count -O--CK 094 094 005 - 74
|
||||
174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 107
|
||||
176 Erase_Fail_Count_Chip -O---K 100 100 000 - 814
|
||||
181 Program_Fail_Cnt_Total -O---K 099 086 000 - 281474976710655
|
||||
183 Runtime_Bad_Block -O--CK 100 100 000 - 0
|
||||
184 End-to-End_Error PO-RCK 100 100 097 - 0
|
||||
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
|
||||
188 Command_Timeout -O--CK 100 100 000 - 0
|
||||
194 Temperature_Celsius -O---K 029 052 000 - 29 (Min/Max 25/40)
|
||||
198 Offline_Uncorrectable ----CK 100 100 000 - 0
|
||||
199 CRC_Error_Count -O--CK 100 100 000 - 0
|
||||
241 Total_LBAs_Written -O--CK 100 100 000 - 1276770
|
||||
242 Total_LBAs_Read -O--CK 100 100 000 - 490623
|
||||
243 SATA_Downshift_Ct -O--CK 100 100 000 - 1276770
|
||||
||||||_ K auto-keep
|
||||
|||||__ C event count
|
||||
||||___ R error rate
|
||||
|||____ S speed/performance
|
||||
||_____ O updated online
|
||||
|______ P prefailure warning
|
||||
|
||||
General Purpose Log Directory Version 1
|
||||
SMART Log Directory Version 1 [multi-sector log support]
|
||||
Address Access R/W Size Description
|
||||
0x00 GPL,SL R/O 1 Log Directory
|
||||
0x01 SL R/O 1 Summary SMART error log
|
||||
0x02 SL R/O 1 Comprehensive SMART error log
|
||||
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
|
||||
0x04 GPL,SL R/O 8 Device Statistics log
|
||||
0x06 SL R/O 1 SMART self-test log
|
||||
0x07 GPL R/O 1 Extended self-test log
|
||||
0x09 SL R/W 1 Selective self-test log
|
||||
0x0a GPL R/W 1 Device Statistics Notification
|
||||
0x0c GPL R/O 1 Pending Defects log
|
||||
0x0d GPL,SL R/O 1 LPS Mis-alignment log
|
||||
0x10 GPL R/O 1 NCQ Command Error log
|
||||
0x11 GPL R/O 1 SATA Phy Event Counters log
|
||||
0x13 GPL R/O 1 SATA NCQ Send and Receive log
|
||||
0x19 GPL R/O 8 LBA Status log
|
||||
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
|
||||
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
|
||||
0xce SL VS 16 Device vendor specific log
|
||||
0xe0 GPL,SL R/W 1 SCT Command/Status
|
||||
0xe1 GPL,SL R/W 1 SCT Data Transfer
|
||||
|
||||
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
|
||||
No Errors Logged
|
||||
|
||||
SMART Extended Self-test Log Version: 1 (1 sectors)
|
||||
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
|
||||
# 1 Short offline Completed without error 00% 19038 -
|
||||
# 2 Short offline Completed without error 00% 19019 -
|
||||
# 3 Short offline Completed without error 00% 5 -
|
||||
# 4 Short offline Completed without error 00% 1 -
|
||||
|
||||
SMART Selective self-test log data structure revision number 1
|
||||
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
|
||||
1 0 0 Not_testing
|
||||
2 0 0 Not_testing
|
||||
3 0 0 Not_testing
|
||||
4 0 0 Not_testing
|
||||
5 0 0 Not_testing
|
||||
255 0 65535 Read_scanning was completed without error
|
||||
Selective self-test flags (0x0):
|
||||
After scanning selected spans, do NOT read-scan remainder of disk.
|
||||
If Selective self-test is pending on power-up, resume after 0 minute delay.
|
||||
|
||||
SCT Status Version: 3
|
||||
SCT Version (vendor specific): 256 (0x0100)
|
||||
Device State: Active (0)
|
||||
Current Temperature: 29 Celsius
|
||||
Power Cycle Min/Max Temperature: ?/29 Celsius
|
||||
Lifetime Min/Max Temperature: 24/51 Celsius
|
||||
Under/Over Temperature Limit Count: 0/0
|
||||
|
||||
SCT Temperature History Version: 2
|
||||
Temperature Sampling Period: 1 minute
|
||||
Temperature Logging Interval: 10 minutes
|
||||
Min/Max recommended Temperature: 0/70 Celsius
|
||||
Min/Max Temperature Limit: 0/70 Celsius
|
||||
Temperature History Size (Index): 128 (111)
|
||||
|
||||
SCT Error Recovery Control:
|
||||
Read: Disabled
|
||||
Write: Disabled
|
||||
|
||||
Device Statistics (GP Log 0x04)
|
||||
Page Offset Size Value Flags Description
|
||||
0x01 ===== = = === == General Statistics (rev 1) ==
|
||||
0x01 0x008 4 215 -D- Lifetime Power-On Resets
|
||||
0x01 0x010 4 24032 -D- Power-on Hours
|
||||
0x01 0x018 6 41837204661 -D- Logical Sectors Written
|
||||
0x01 0x020 6 1307059159 -D- Number of Write Commands
|
||||
0x01 0x028 6 16076753945 -D- Logical Sectors Read
|
||||
0x01 0x030 6 333674993 -D- Number of Read Commands
|
||||
0x04 ===== = = === == General Errors Statistics (rev 1) ==
|
||||
0x04 0x008 4 0 -D- Number of Reported Uncorrectable Errors
|
||||
0x04 0x010 4 0 -D- Resets Between Cmd Acceptance and Completion
|
||||
0x05 ===== = = === == Temperature Statistics (rev 1) ==
|
||||
0x05 0x008 1 29 -D- Current Temperature
|
||||
0x05 0x020 1 51 -D- Highest Temperature
|
||||
0x05 0x028 1 24 -D- Lowest Temperature
|
||||
0x05 0x058 1 55 -D- Specified Maximum Operating Temperature
|
||||
0x06 ===== = = === == Transport Statistics (rev 1) ==
|
||||
0x06 0x008 4 1682 -D- Number of Hardware Resets
|
||||
0x06 0x010 4 0 -D- Number of ASR Events
|
||||
0x06 0x018 4 0 -D- Number of Interface CRC Errors
|
||||
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
|
||||
0x07 0x008 1 6 ND- Percentage Used Endurance Indicator
|
||||
|||_ C monitored condition met
|
||||
||__ D supports DSN
|
||||
|___ N normalized value
|
||||
|
||||
Pending Defects log (GP Log 0x0c)
|
||||
No Defects Logged
|
||||
|
||||
SATA Phy Event Counters (GP Log 0x11)
|
||||
ID Size Value Description
|
||||
0x0001 2 0 Command failed due to ICRC error
|
||||
0x0002 2 0 R_ERR response for data FIS
|
||||
0x0003 2 0 R_ERR response for device-to-host data FIS
|
||||
0x0004 2 0 R_ERR response for host-to-device data FIS
|
||||
0x0005 2 0 R_ERR response for non-data FIS
|
||||
0x0006 2 0 R_ERR response for device-to-host non-data FIS
|
||||
0x0007 2 0 R_ERR response for host-to-device non-data FIS
|
||||
0x0008 2 0 Device-to-host non-data FIS retries
|
||||
0x0009 2 15 Transition from drive PhyRdy to drive PhyNRdy
|
||||
0x000a 2 11 Device-to-host register FISes sent due to a COMRESET
|
||||
0x000b 2 0 CRC errors within host-to-device FIS
|
||||
0x000d 2 0 Non-CRC errors within host-to-device FIS
|
||||
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
|
||||
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
|
||||
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
|
||||
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
|
||||
|
||||
|
||||
|
||||
207
SSD/Samsung/MZ7/MZ7LN256HMJP-000H1/896CD85EF90B
Normal file
207
SSD/Samsung/MZ7/MZ7LN256HMJP-000H1/896CD85EF90B
Normal file
@@ -0,0 +1,207 @@
|
||||
smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE-p5 amd64] (local build)
|
||||
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
|
||||
|
||||
=== START OF INFORMATION SECTION ===
|
||||
Model Family: Samsung based SSDs
|
||||
Device Model: SAMSUNG MZ7LN256HMJP-000H1
|
||||
Serial Number: --
|
||||
LU WWN Device Id: 5 002538 ...
|
||||
Firmware Version: MAV01H3Q
|
||||
User Capacity: 256,060,514,304 bytes [256 GB]
|
||||
Sector Sizes: 512 bytes logical, 4096 bytes physical
|
||||
Rotation Rate: Solid State Device
|
||||
Form Factor: 2.5 inches
|
||||
TRIM Command: Available, deterministic, zeroed
|
||||
Device is: In smartctl database 7.3/5319
|
||||
ATA Version is: ACS-3, ATA8-ACS T13/1699-D revision 4c
|
||||
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
|
||||
Local Time is: Mon Dec 19 17:22:30 2022 CET
|
||||
SMART support is: Available - device has SMART capability.
|
||||
SMART support is: Enabled
|
||||
AAM feature is: Unavailable
|
||||
APM feature is: Disabled
|
||||
Rd look-ahead is: Enabled
|
||||
Write cache is: Enabled
|
||||
DSN feature is: Disabled
|
||||
ATA Security is: Disabled, frozen [SEC2]
|
||||
Wt Cache Reorder: Enabled
|
||||
|
||||
=== START OF READ SMART DATA SECTION ===
|
||||
SMART overall-health self-assessment test result: PASSED
|
||||
|
||||
General SMART Values:
|
||||
Offline data collection status: (0x02) Offline data collection activity
|
||||
was completed without error.
|
||||
Auto Offline Data Collection: Disabled.
|
||||
Self-test execution status: ( 0) The previous self-test routine completed
|
||||
without error or no self-test has ever
|
||||
been run.
|
||||
Total time to complete Offline
|
||||
data collection: ( 5100) seconds.
|
||||
Offline data collection
|
||||
capabilities: (0x5b) SMART execute Offline immediate.
|
||||
Auto Offline data collection on/off support.
|
||||
Suspend Offline collection upon new
|
||||
command.
|
||||
Offline surface scan supported.
|
||||
Self-test supported.
|
||||
No Conveyance Self-test supported.
|
||||
Selective Self-test supported.
|
||||
SMART capabilities: (0x0003) Saves SMART data before entering
|
||||
power-saving mode.
|
||||
Supports SMART auto save timer.
|
||||
Error logging capability: (0x01) Error logging supported.
|
||||
General Purpose Logging supported.
|
||||
Short self-test routine
|
||||
recommended polling time: ( 2) minutes.
|
||||
Extended self-test routine
|
||||
recommended polling time: ( 85) minutes.
|
||||
SCT capabilities: (0x003d) SCT Status supported.
|
||||
SCT Error Recovery Control supported.
|
||||
SCT Feature Control supported.
|
||||
SCT Data Table supported.
|
||||
|
||||
SMART Attributes Data Structure revision number: 1
|
||||
Vendor Specific SMART Attributes with Thresholds:
|
||||
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
|
||||
1 Raw_Read_Error_Rate POSR-K 100 100 050 - 0
|
||||
5 Reallocated_Sector_Ct PO--CK 100 100 005 - 0
|
||||
9 Power_On_Hours -O--CK 100 100 000 - 8721
|
||||
12 Power_Cycle_Count -O--CK 100 100 000 - 354
|
||||
171 Program_Fail_Count_Chip -O--CK 100 100 000 - 0
|
||||
172 Erase_Fail_Count_Chip -O--CK 100 100 000 - 0
|
||||
173 Wear_Leveling_Count -O--CK 095 095 005 - 57
|
||||
174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 293
|
||||
176 Erase_Fail_Count_Chip -O---K 100 100 000 - 785
|
||||
181 Program_Fail_Cnt_Total -O---K 100 041 000 - 281474976710655
|
||||
183 Runtime_Bad_Block -O--CK 100 100 000 - 0
|
||||
184 End-to-End_Error PO-RCK 100 100 097 - 0
|
||||
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
|
||||
188 Command_Timeout -O--CK 100 100 000 - 1
|
||||
194 Temperature_Celsius -O---K 049 054 000 - 49 (Min/Max 31/53)
|
||||
198 Offline_Uncorrectable ----CK 100 100 000 - 0
|
||||
199 CRC_Error_Count -O--CK 100 100 000 - 0
|
||||
241 Total_LBAs_Written -O--CK 100 100 000 - 750373
|
||||
242 Total_LBAs_Read -O--CK 100 100 000 - 1487920
|
||||
243 SATA_Downshift_Ct -O--CK 100 100 000 - 750373
|
||||
||||||_ K auto-keep
|
||||
|||||__ C event count
|
||||
||||___ R error rate
|
||||
|||____ S speed/performance
|
||||
||_____ O updated online
|
||||
|______ P prefailure warning
|
||||
|
||||
General Purpose Log Directory Version 1
|
||||
SMART Log Directory Version 1 [multi-sector log support]
|
||||
Address Access R/W Size Description
|
||||
0x00 GPL,SL R/O 1 Log Directory
|
||||
0x01 SL R/O 1 Summary SMART error log
|
||||
0x02 SL R/O 1 Comprehensive SMART error log
|
||||
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
|
||||
0x04 GPL,SL R/O 8 Device Statistics log
|
||||
0x06 SL R/O 1 SMART self-test log
|
||||
0x07 GPL R/O 1 Extended self-test log
|
||||
0x09 SL R/W 1 Selective self-test log
|
||||
0x0a GPL R/W 1 Device Statistics Notification
|
||||
0x0c GPL R/O 1 Pending Defects log
|
||||
0x0d GPL,SL R/O 1 LPS Mis-alignment log
|
||||
0x10 GPL R/O 1 NCQ Command Error log
|
||||
0x11 GPL R/O 1 SATA Phy Event Counters log
|
||||
0x13 GPL R/O 1 SATA NCQ Send and Receive log
|
||||
0x19 GPL R/O 8 LBA Status log
|
||||
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
|
||||
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
|
||||
0xce SL VS 16 Device vendor specific log
|
||||
0xe0 GPL,SL R/W 1 SCT Command/Status
|
||||
0xe1 GPL,SL R/W 1 SCT Data Transfer
|
||||
|
||||
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
|
||||
No Errors Logged
|
||||
|
||||
SMART Extended Self-test Log Version: 1 (1 sectors)
|
||||
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
|
||||
# 1 Short offline Completed without error 00% 246 -
|
||||
# 2 Offline Completed without error 00% 212 -
|
||||
# 3 Short offline Aborted by host 90% 212 -
|
||||
# 4 Short offline Completed without error 00% 0 -
|
||||
|
||||
SMART Selective self-test log data structure revision number 1
|
||||
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
|
||||
1 0 0 Not_testing
|
||||
2 0 0 Not_testing
|
||||
3 0 0 Not_testing
|
||||
4 0 0 Not_testing
|
||||
5 0 0 Not_testing
|
||||
255 0 65535 Read_scanning was completed without error
|
||||
Selective self-test flags (0x0):
|
||||
After scanning selected spans, do NOT read-scan remainder of disk.
|
||||
If Selective self-test is pending on power-up, resume after 0 minute delay.
|
||||
|
||||
SCT Status Version: 3
|
||||
SCT Version (vendor specific): 256 (0x0100)
|
||||
Device State: Active (0)
|
||||
Current Temperature: 49 Celsius
|
||||
Power Cycle Min/Max Temperature: ?/50 Celsius
|
||||
Lifetime Min/Max Temperature: 22/54 Celsius
|
||||
Under/Over Temperature Limit Count: 0/0
|
||||
|
||||
SCT Temperature History Version: 2
|
||||
Temperature Sampling Period: 1 minute
|
||||
Temperature Logging Interval: 10 minutes
|
||||
Min/Max recommended Temperature: 0/70 Celsius
|
||||
Min/Max Temperature Limit: 0/70 Celsius
|
||||
Temperature History Size (Index): 128 (58)
|
||||
|
||||
SCT Error Recovery Control:
|
||||
Read: Disabled
|
||||
Write: Disabled
|
||||
|
||||
Device Statistics (GP Log 0x04)
|
||||
Page Offset Size Value Flags Description
|
||||
0x01 ===== = = === == General Statistics (rev 1) ==
|
||||
0x01 0x008 4 354 -D- Lifetime Power-On Resets
|
||||
0x01 0x010 4 8721 -D- Power-on Hours
|
||||
0x01 0x018 6 24588232763 -D- Logical Sectors Written
|
||||
0x01 0x020 6 440850871 -D- Number of Write Commands
|
||||
0x01 0x028 6 48756189726 -D- Logical Sectors Read
|
||||
0x01 0x030 6 432619314 -D- Number of Read Commands
|
||||
0x04 ===== = = === == General Errors Statistics (rev 1) ==
|
||||
0x04 0x008 4 0 -D- Number of Reported Uncorrectable Errors
|
||||
0x04 0x010 4 1 -D- Resets Between Cmd Acceptance and Completion
|
||||
0x05 ===== = = === == Temperature Statistics (rev 1) ==
|
||||
0x05 0x008 1 49 -D- Current Temperature
|
||||
0x05 0x020 1 54 -D- Highest Temperature
|
||||
0x05 0x028 1 22 -D- Lowest Temperature
|
||||
0x05 0x058 1 55 -D- Specified Maximum Operating Temperature
|
||||
0x06 ===== = = === == Transport Statistics (rev 1) ==
|
||||
0x06 0x008 4 475 -D- Number of Hardware Resets
|
||||
0x06 0x010 4 0 -D- Number of ASR Events
|
||||
0x06 0x018 4 0 -D- Number of Interface CRC Errors
|
||||
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
|
||||
0x07 0x008 1 4 ND- Percentage Used Endurance Indicator
|
||||
|||_ C monitored condition met
|
||||
||__ D supports DSN
|
||||
|___ N normalized value
|
||||
|
||||
Pending Defects log (GP Log 0x0c)
|
||||
No Defects Logged
|
||||
|
||||
SATA Phy Event Counters (GP Log 0x11)
|
||||
ID Size Value Description
|
||||
0x0001 2 0 Command failed due to ICRC error
|
||||
0x0002 2 0 R_ERR response for data FIS
|
||||
0x0003 2 0 R_ERR response for device-to-host data FIS
|
||||
0x0004 2 0 R_ERR response for host-to-device data FIS
|
||||
0x0005 2 0 R_ERR response for non-data FIS
|
||||
0x0006 2 0 R_ERR response for device-to-host non-data FIS
|
||||
0x0007 2 0 R_ERR response for host-to-device non-data FIS
|
||||
0x0008 2 0 Device-to-host non-data FIS retries
|
||||
0x0009 2 7 Transition from drive PhyRdy to drive PhyNRdy
|
||||
0x000a 2 7 Device-to-host register FISes sent due to a COMRESET
|
||||
0x000b 2 0 CRC errors within host-to-device FIS
|
||||
0x000d 2 0 Non-CRC errors within host-to-device FIS
|
||||
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
|
||||
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
|
||||
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
|
||||
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
|
||||
|
||||
173
SSD/Samsung/MZ7/MZ7LN512HMJP-000L7/B88EF3725EFF
Normal file
173
SSD/Samsung/MZ7/MZ7LN512HMJP-000L7/B88EF3725EFF
Normal file
@@ -0,0 +1,173 @@
|
||||
smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE amd64] (local build)
|
||||
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
|
||||
|
||||
=== START OF INFORMATION SECTION ===
|
||||
Model Family: Samsung based SSDs
|
||||
Device Model: SAMSUNG MZ7LN512HMJP-000L7
|
||||
Serial Number: --
|
||||
LU WWN Device Id: 5 002538 ...
|
||||
Firmware Version: MAV01L6Q
|
||||
User Capacity: 512,110,190,592 bytes [512 GB]
|
||||
Sector Size: 512 bytes logical/physical
|
||||
Rotation Rate: Solid State Device
|
||||
Form Factor: 2.5 inches
|
||||
TRIM Command: Available
|
||||
Device is: In smartctl database 7.3/5319
|
||||
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
|
||||
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
|
||||
Local Time is: Thu Jul 14 00:06:58 2022 EDT
|
||||
SMART support is: Available - device has SMART capability.
|
||||
SMART support is: Enabled
|
||||
AAM feature is: Unavailable
|
||||
APM feature is: Unavailable
|
||||
Rd look-ahead is: Enabled
|
||||
Write cache is: Enabled
|
||||
DSN feature is: Unavailable
|
||||
ATA Security is: Disabled, NOT FROZEN [SEC1]
|
||||
Wt Cache Reorder: Enabled
|
||||
|
||||
=== START OF READ SMART DATA SECTION ===
|
||||
SMART overall-health self-assessment test result: PASSED
|
||||
|
||||
General SMART Values:
|
||||
Offline data collection status: (0x00) Offline data collection activity
|
||||
was never started.
|
||||
Auto Offline Data Collection: Disabled.
|
||||
Self-test execution status: ( 0) The previous self-test routine completed
|
||||
without error or no self-test has ever
|
||||
been run.
|
||||
Total time to complete Offline
|
||||
data collection: ( 0) seconds.
|
||||
Offline data collection
|
||||
capabilities: (0x53) SMART execute Offline immediate.
|
||||
Auto Offline data collection on/off support.
|
||||
Suspend Offline collection upon new
|
||||
command.
|
||||
No Offline surface scan supported.
|
||||
Self-test supported.
|
||||
No Conveyance Self-test supported.
|
||||
Selective Self-test supported.
|
||||
SMART capabilities: (0x0003) Saves SMART data before entering
|
||||
power-saving mode.
|
||||
Supports SMART auto save timer.
|
||||
Error logging capability: (0x01) Error logging supported.
|
||||
General Purpose Logging supported.
|
||||
Short self-test routine
|
||||
recommended polling time: ( 2) minutes.
|
||||
Extended self-test routine
|
||||
recommended polling time: ( 85) minutes.
|
||||
SCT capabilities: (0x003d) SCT Status supported.
|
||||
SCT Error Recovery Control supported.
|
||||
SCT Feature Control supported.
|
||||
SCT Data Table supported.
|
||||
|
||||
SMART Attributes Data Structure revision number: 1
|
||||
Vendor Specific SMART Attributes with Thresholds:
|
||||
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
|
||||
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
|
||||
9 Power_On_Hours -O--CK 099 099 000 - 733
|
||||
12 Power_Cycle_Count -O--CK 098 098 000 - 1366
|
||||
170 Unused_Rsvd_Blk_Ct_Chip -O--CK 100 100 010 - 0
|
||||
171 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
|
||||
172 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
|
||||
173 Wear_Leveling_Count PO--CK 099 099 005 - 1
|
||||
174 Unexpect_Power_Loss_Ct -O--CK 099 099 000 - 54
|
||||
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
|
||||
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 1609
|
||||
184 End-to-End_Error PO--CK 100 100 097 - 0
|
||||
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
|
||||
194 Temperature_Celsius -O--CK 064 054 000 - 36 (Min/Max 14/46)
|
||||
199 CRC_Error_Count -OSRCK 100 100 000 - 0
|
||||
233 Media_Wearout_Indicator PO--C- 099 099 001 - 16763233
|
||||
241 Total_LBAs_Written -O--CK 099 099 000 - 993
|
||||
242 Total_LBAs_Read -O--CK 099 099 000 - 905
|
||||
249 NAND_Writes_1GiB -O--CK 099 099 000 - 993
|
||||
||||||_ K auto-keep
|
||||
|||||__ C event count
|
||||
||||___ R error rate
|
||||
|||____ S speed/performance
|
||||
||_____ O updated online
|
||||
|______ P prefailure warning
|
||||
|
||||
General Purpose Log Directory Version 1
|
||||
SMART Log Directory Version 1 [multi-sector log support]
|
||||
Address Access R/W Size Description
|
||||
0x00 GPL,SL R/O 1 Log Directory
|
||||
0x01 SL R/O 1 Summary SMART error log
|
||||
0x02 SL R/O 1 Comprehensive SMART error log
|
||||
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
|
||||
0x06 SL R/O 1 SMART self-test log
|
||||
0x07 GPL R/O 1 Extended self-test log
|
||||
0x09 SL R/W 1 Selective self-test log
|
||||
0x10 GPL R/O 1 NCQ Command Error log
|
||||
0x11 GPL R/O 1 SATA Phy Event Counters log
|
||||
0x13 GPL R/O 1 SATA NCQ Send and Receive log
|
||||
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
|
||||
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
|
||||
0xa5 SL VS 16 Device vendor specific log
|
||||
0xce SL VS 16 Device vendor specific log
|
||||
0xdf GPL,SL VS 1 Device vendor specific log
|
||||
0xe0 GPL,SL R/W 1 SCT Command/Status
|
||||
0xe1 GPL,SL R/W 1 SCT Data Transfer
|
||||
|
||||
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
|
||||
No Errors Logged
|
||||
|
||||
SMART Extended Self-test Log Version: 1 (1 sectors)
|
||||
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
|
||||
# 1 Short offline Completed without error 00% 0 -
|
||||
|
||||
SMART Selective self-test log data structure revision number 1
|
||||
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
|
||||
1 0 0 Not_testing
|
||||
2 0 0 Not_testing
|
||||
3 0 0 Not_testing
|
||||
4 0 0 Not_testing
|
||||
5 0 0 Not_testing
|
||||
255 0 65535 Read_scanning was never started
|
||||
Selective self-test flags (0x0):
|
||||
After scanning selected spans, do NOT read-scan remainder of disk.
|
||||
If Selective self-test is pending on power-up, resume after 0 minute delay.
|
||||
|
||||
SCT Status Version: 3
|
||||
SCT Version (vendor specific): 256 (0x0100)
|
||||
Device State: Active (0)
|
||||
Current Temperature: 36 Celsius
|
||||
Power Cycle Min/Max Temperature: 29/36 Celsius
|
||||
Lifetime Min/Max Temperature: 21/43 Celsius
|
||||
Under/Over Temperature Limit Count: 0/0
|
||||
|
||||
SCT Temperature History Version: 2
|
||||
Temperature Sampling Period: 1 minute
|
||||
Temperature Logging Interval: 10 minutes
|
||||
Min/Max recommended Temperature: 0/70 Celsius
|
||||
Min/Max Temperature Limit: 0/70 Celsius
|
||||
Temperature History Size (Index): 128 (68)
|
||||
|
||||
SCT Error Recovery Control:
|
||||
Read: Disabled
|
||||
Write: Disabled
|
||||
|
||||
Device Statistics (GP/SMART Log 0x04) not supported
|
||||
|
||||
Pending Defects log (GP Log 0x0c) not supported
|
||||
|
||||
SATA Phy Event Counters (GP Log 0x11)
|
||||
ID Size Value Description
|
||||
0x0001 2 0 Command failed due to ICRC error
|
||||
0x0002 2 0 R_ERR response for data FIS
|
||||
0x0003 2 0 R_ERR response for device-to-host data FIS
|
||||
0x0004 2 0 R_ERR response for host-to-device data FIS
|
||||
0x0005 2 0 R_ERR response for non-data FIS
|
||||
0x0006 2 0 R_ERR response for device-to-host non-data FIS
|
||||
0x0007 2 0 R_ERR response for host-to-device non-data FIS
|
||||
0x0008 2 0 Device-to-host non-data FIS retries
|
||||
0x0009 2 2 Transition from drive PhyRdy to drive PhyNRdy
|
||||
0x000a 2 2 Device-to-host register FISes sent due to a COMRESET
|
||||
0x000b 2 0 CRC errors within host-to-device FIS
|
||||
0x000d 2 0 Non-CRC errors within host-to-device FIS
|
||||
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
|
||||
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
|
||||
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
|
||||
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
|
||||
|
||||
163
SSD/Samsung/MZ7/MZ7PC128HAFU-000H1/736225E49AE4
Normal file
163
SSD/Samsung/MZ7/MZ7PC128HAFU-000H1/736225E49AE4
Normal file
@@ -0,0 +1,163 @@
|
||||
smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE amd64] (local build)
|
||||
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
|
||||
|
||||
=== START OF INFORMATION SECTION ===
|
||||
Device Model: SAMSUNG MZ7PC128HAFU-000H1
|
||||
Serial Number: --
|
||||
LU WWN Device Id: 5 002538 ...
|
||||
Firmware Version: CXM05H1Q
|
||||
User Capacity: 128,035,676,160 bytes [128 GB]
|
||||
Sector Size: 512 bytes logical/physical
|
||||
Rotation Rate: Solid State Device
|
||||
TRIM Command: Available
|
||||
Device is: Not in smartctl database 7.3/5319
|
||||
ATA Version is: ACS-2 T13/2015-D revision 2
|
||||
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 3.0 Gb/s)
|
||||
Local Time is: Thu Oct 13 03:32:05 2022 NZDT
|
||||
SMART support is: Available - device has SMART capability.
|
||||
SMART support is: Enabled
|
||||
AAM feature is: Unavailable
|
||||
APM feature is: Unavailable
|
||||
Rd look-ahead is: Enabled
|
||||
Write cache is: Enabled
|
||||
DSN feature is: Unavailable
|
||||
ATA Security is: Disabled, NOT FROZEN [SEC1]
|
||||
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
|
||||
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
|
||||
|
||||
=== START OF READ SMART DATA SECTION ===
|
||||
SMART overall-health self-assessment test result: PASSED
|
||||
|
||||
General SMART Values:
|
||||
Offline data collection status: (0x02) Offline data collection activity
|
||||
was completed without error.
|
||||
Auto Offline Data Collection: Disabled.
|
||||
Self-test execution status: ( 0) The previous self-test routine completed
|
||||
without error or no self-test has ever
|
||||
been run.
|
||||
Total time to complete Offline
|
||||
data collection: ( 540) seconds.
|
||||
Offline data collection
|
||||
capabilities: (0x5b) SMART execute Offline immediate.
|
||||
Auto Offline data collection on/off support.
|
||||
Suspend Offline collection upon new
|
||||
command.
|
||||
Offline surface scan supported.
|
||||
Self-test supported.
|
||||
No Conveyance Self-test supported.
|
||||
Selective Self-test supported.
|
||||
SMART capabilities: (0x0003) Saves SMART data before entering
|
||||
power-saving mode.
|
||||
Supports SMART auto save timer.
|
||||
Error logging capability: (0x01) Error logging supported.
|
||||
General Purpose Logging supported.
|
||||
Short self-test routine
|
||||
recommended polling time: ( 2) minutes.
|
||||
Extended self-test routine
|
||||
recommended polling time: ( 9) minutes.
|
||||
SCT capabilities: (0x003d) SCT Status supported.
|
||||
SCT Error Recovery Control supported.
|
||||
SCT Feature Control supported.
|
||||
SCT Data Table supported.
|
||||
|
||||
SMART Attributes Data Structure revision number: 1
|
||||
Vendor Specific SMART Attributes with Thresholds:
|
||||
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
|
||||
1 Raw_Read_Error_Rate POSR-K 200 200 002 - 0
|
||||
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
|
||||
9 Power_On_Hours -O--CK 094 094 000 - 28983
|
||||
12 Power_Cycle_Count -O--CK 097 097 000 - 2733
|
||||
170 Unknown_Attribute PO--C- 094 094 010 - 1912
|
||||
171 Unknown_Attribute -O--CK 100 100 010 - 0
|
||||
172 Unknown_Attribute -O--CK 100 100 010 - 0
|
||||
173 Unknown_Attribute PO--C- 093 093 017 - 255
|
||||
174 Unknown_Attribute -O--CK 098 098 000 - 1093
|
||||
183 Runtime_Bad_Block -O--CK 099 099 001 - 3
|
||||
184 End-to-End_Error PO--CK 100 100 097 - 0
|
||||
187 Reported_Uncorrect -O--CK 100 100 000 - 0
|
||||
188 Command_Timeout -O--CK 100 100 000 - 0
|
||||
190 Airflow_Temperature_Cel -O---K 076 043 000 - 24
|
||||
196 Reallocated_Event_Count -O---- 253 253 000 - 0
|
||||
198 Offline_Uncorrectable ----CK 100 100 000 - 0
|
||||
199 UDMA_CRC_Error_Count -OSRCK 200 200 000 - 1
|
||||
||||||_ K auto-keep
|
||||
|||||__ C event count
|
||||
||||___ R error rate
|
||||
|||____ S speed/performance
|
||||
||_____ O updated online
|
||||
|______ P prefailure warning
|
||||
|
||||
General Purpose Log Directory Version 1
|
||||
SMART Log Directory Version 1 [multi-sector log support]
|
||||
Address Access R/W Size Description
|
||||
0x00 GPL,SL R/O 1 Log Directory
|
||||
0x01 GPL,SL R/O 1 Summary SMART error log
|
||||
0x02 GPL,SL R/O 2 Comprehensive SMART error log
|
||||
0x03 GPL,SL R/O 2 Ext. Comprehensive SMART error log
|
||||
0x06 GPL,SL R/O 1 SMART self-test log
|
||||
0x07 GPL,SL R/O 2 Extended self-test log
|
||||
0x09 GPL,SL R/W 1 Selective self-test log
|
||||
0x10 GPL,SL R/O 1 NCQ Command Error log
|
||||
0x11 GPL,SL R/O 1 SATA Phy Event Counters log
|
||||
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
|
||||
|
||||
SMART Extended Comprehensive Error Log Version: 1 (2 sectors)
|
||||
No Errors Logged
|
||||
|
||||
SMART Extended Self-test Log Version: 1 (2 sectors)
|
||||
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
|
||||
# 1 Short offline Completed without error 00% 1 -
|
||||
|
||||
SMART Selective self-test log data structure revision number 1
|
||||
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
|
||||
1 0 0 Not_testing
|
||||
2 0 0 Not_testing
|
||||
3 0 0 Not_testing
|
||||
4 0 0 Not_testing
|
||||
5 0 0 Not_testing
|
||||
Selective self-test flags (0x0):
|
||||
After scanning selected spans, do NOT read-scan remainder of disk.
|
||||
If Selective self-test is pending on power-up, resume after 0 minute delay.
|
||||
|
||||
SCT Status Version: 3
|
||||
SCT Version (vendor specific): 1 (0x0001)
|
||||
Device State: Active (0)
|
||||
Current Temperature: 24 Celsius
|
||||
Power Cycle Min/Max Temperature: 23/24 Celsius
|
||||
Lifetime Min/Max Temperature: 0/70 Celsius
|
||||
Under/Over Temperature Limit Count: 0/0
|
||||
|
||||
SCT Temperature History Version: 2
|
||||
Temperature Sampling Period: 15 minutes
|
||||
Temperature Logging Interval: 15 minutes
|
||||
Min/Max recommended Temperature: 0/70 Celsius
|
||||
Min/Max Temperature Limit: 0/70 Celsius
|
||||
Temperature History Size (Index): 128 (1)
|
||||
|
||||
SCT Error Recovery Control:
|
||||
Read: Disabled
|
||||
Write: Disabled
|
||||
|
||||
Device Statistics (GP/SMART Log 0x04) not supported
|
||||
|
||||
Pending Defects log (GP Log 0x0c) not supported
|
||||
|
||||
SATA Phy Event Counters (GP Log 0x11)
|
||||
ID Size Value Description
|
||||
0x0001 2 1 Command failed due to ICRC error
|
||||
0x0002 2 49152 R_ERR response for data FIS
|
||||
0x0003 2 53248 R_ERR response for device-to-host data FIS
|
||||
0x0004 2 57344 R_ERR response for host-to-device data FIS
|
||||
0x0005 2 7952 R_ERR response for non-data FIS
|
||||
0x0006 2 2562 R_ERR response for device-to-host non-data FIS
|
||||
0x0007 2 4096 R_ERR response for host-to-device non-data FIS
|
||||
0x0008 2 7952 Device-to-host non-data FIS retries
|
||||
0x0009 2 7953 Transition from drive PhyRdy to drive PhyNRdy
|
||||
0x000a 2 1641 Device-to-host register FISes sent due to a COMRESET
|
||||
0x000b 2 6145 CRC errors within host-to-device FIS
|
||||
0x000d 2 7953 Non-CRC errors within host-to-device FIS
|
||||
0x000f 2 8176 R_ERR response for host-to-device data FIS, CRC
|
||||
0x0010 2 15 R_ERR response for host-to-device data FIS, non-CRC
|
||||
0x0012 2 49153 R_ERR response for host-to-device non-data FIS, CRC
|
||||
0x0013 2 12112 R_ERR response for host-to-device non-data FIS, non-CRC
|
||||
|
||||
164
SSD/Samsung/MZ7/MZ7PD128HAFV-000H7/A392E670F257
Normal file
164
SSD/Samsung/MZ7/MZ7PD128HAFV-000H7/A392E670F257
Normal file
@@ -0,0 +1,164 @@
|
||||
smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.0-STABLE amd64] (local build)
|
||||
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
|
||||
|
||||
=== START OF INFORMATION SECTION ===
|
||||
Device Model: SAMSUNG MZ7PD128HAFV-000H7
|
||||
Serial Number: --
|
||||
LU WWN Device Id: 5 002538 ...
|
||||
Firmware Version: DXM05H6Q
|
||||
User Capacity: 128,035,676,160 bytes [128 GB]
|
||||
Sector Size: 512 bytes logical/physical
|
||||
Rotation Rate: Solid State Device
|
||||
TRIM Command: Available, deterministic, zeroed
|
||||
Device is: Not in smartctl database 7.3/5319
|
||||
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
|
||||
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
|
||||
Local Time is: Tue May 10 11:36:46 2022 UTC
|
||||
SMART support is: Available - device has SMART capability.
|
||||
SMART support is: Enabled
|
||||
AAM feature is: Unavailable
|
||||
APM feature is: Unavailable
|
||||
Rd look-ahead is: Enabled
|
||||
Write cache is: Enabled
|
||||
DSN feature is: Unavailable
|
||||
ATA Security is: Disabled, frozen [SEC2]
|
||||
Wt Cache Reorder: Enabled
|
||||
|
||||
=== START OF READ SMART DATA SECTION ===
|
||||
SMART overall-health self-assessment test result: PASSED
|
||||
|
||||
General SMART Values:
|
||||
Offline data collection status: (0x02) Offline data collection activity
|
||||
was completed without error.
|
||||
Auto Offline Data Collection: Disabled.
|
||||
Self-test execution status: ( 0) The previous self-test routine completed
|
||||
without error or no self-test has ever
|
||||
been run.
|
||||
Total time to complete Offline
|
||||
data collection: (65476) seconds.
|
||||
Offline data collection
|
||||
capabilities: (0x53) SMART execute Offline immediate.
|
||||
Auto Offline data collection on/off support.
|
||||
Suspend Offline collection upon new
|
||||
command.
|
||||
No Offline surface scan supported.
|
||||
Self-test supported.
|
||||
No Conveyance Self-test supported.
|
||||
Selective Self-test supported.
|
||||
SMART capabilities: (0x0003) Saves SMART data before entering
|
||||
power-saving mode.
|
||||
Supports SMART auto save timer.
|
||||
Error logging capability: (0x01) Error logging supported.
|
||||
General Purpose Logging supported.
|
||||
Short self-test routine
|
||||
recommended polling time: ( 2) minutes.
|
||||
Extended self-test routine
|
||||
recommended polling time: ( 9) minutes.
|
||||
SCT capabilities: (0x003d) SCT Status supported.
|
||||
SCT Error Recovery Control supported.
|
||||
SCT Feature Control supported.
|
||||
SCT Data Table supported.
|
||||
|
||||
SMART Attributes Data Structure revision number: 1
|
||||
Vendor Specific SMART Attributes with Thresholds:
|
||||
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
|
||||
1 Raw_Read_Error_Rate POSR-K 200 200 002 - 0
|
||||
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
|
||||
9 Power_On_Hours -O--CK 098 098 000 - 9295
|
||||
12 Power_Cycle_Count -O--CK 098 098 000 - 1521
|
||||
170 Unknown_Attribute PO--C- 100 100 010 - 2288
|
||||
171 Unknown_Attribute -O--CK 100 100 010 - 0
|
||||
172 Unknown_Attribute -O--CK 100 100 010 - 0
|
||||
173 Unknown_Attribute PO--C- 093 093 005 - 238
|
||||
174 Unknown_Attribute -O--CK 099 099 000 - 126
|
||||
183 Runtime_Bad_Block -O--CK 099 099 001 - 77
|
||||
184 End-to-End_Error PO--CK 100 100 097 - 0
|
||||
187 Reported_Uncorrect -O--CK 100 100 000 - 0
|
||||
188 Command_Timeout -O--CK 100 100 000 - 0
|
||||
190 Airflow_Temperature_Cel -O---K 069 056 000 - 31
|
||||
196 Reallocated_Event_Count -O---- 253 253 000 - 0
|
||||
198 Offline_Uncorrectable ----CK 100 100 000 - 0
|
||||
199 UDMA_CRC_Error_Count -OSRCK 099 099 000 - 1
|
||||
||||||_ K auto-keep
|
||||
|||||__ C event count
|
||||
||||___ R error rate
|
||||
|||____ S speed/performance
|
||||
||_____ O updated online
|
||||
|______ P prefailure warning
|
||||
|
||||
General Purpose Log Directory Version 1
|
||||
SMART Log Directory Version 1 [multi-sector log support]
|
||||
Address Access R/W Size Description
|
||||
0x00 GPL,SL R/O 1 Log Directory
|
||||
0x01 GPL,SL R/O 1 Summary SMART error log
|
||||
0x02 GPL,SL R/O 1 Comprehensive SMART error log
|
||||
0x03 GPL,SL R/O 1 Ext. Comprehensive SMART error log
|
||||
0x06 GPL,SL R/O 1 SMART self-test log
|
||||
0x07 GPL,SL R/O 1 Extended self-test log
|
||||
0x09 GPL,SL R/W 1 Selective self-test log
|
||||
0x10 GPL,SL R/O 1 NCQ Command Error log
|
||||
0x11 GPL,SL R/O 1 SATA Phy Event Counters log
|
||||
0x30 GPL,SL R/O 1 IDENTIFY DEVICE data log
|
||||
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
|
||||
0xa0 GPL,SL VS 16 Device vendor specific log
|
||||
|
||||
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
|
||||
No Errors Logged
|
||||
|
||||
SMART Extended Self-test Log Version: 1 (1 sectors)
|
||||
No self-tests have been logged. [To run self-tests, use: smartctl -t]
|
||||
|
||||
SMART Selective self-test log data structure revision number 1
|
||||
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
|
||||
1 0 0 Not_testing
|
||||
2 0 0 Not_testing
|
||||
3 0 0 Not_testing
|
||||
4 0 0 Not_testing
|
||||
5 0 0 Not_testing
|
||||
255 0 65535 Read_scanning was completed without error
|
||||
Selective self-test flags (0x0):
|
||||
After scanning selected spans, do NOT read-scan remainder of disk.
|
||||
If Selective self-test is pending on power-up, resume after 0 minute delay.
|
||||
|
||||
SCT Status Version: 3
|
||||
SCT Version (vendor specific): 256 (0x0100)
|
||||
Device State: SCT command executing in background (5)
|
||||
Current Temperature: 31 Celsius
|
||||
Power Cycle Min/Max Temperature: 30/40 Celsius
|
||||
Lifetime Min/Max Temperature: 0/70 Celsius
|
||||
Under/Over Temperature Limit Count: 0/0
|
||||
|
||||
SCT Temperature History Version: 3 (Unknown, should be 2)
|
||||
Temperature Sampling Period: 1 minute
|
||||
Temperature Logging Interval: 1 minute
|
||||
Min/Max recommended Temperature: 0/70 Celsius
|
||||
Min/Max Temperature Limit: 0/70 Celsius
|
||||
Temperature History Size (Index): 128 (10)
|
||||
|
||||
SCT Error Recovery Control:
|
||||
Read: Disabled
|
||||
Write: Disabled
|
||||
|
||||
Device Statistics (GP/SMART Log 0x04) not supported
|
||||
|
||||
Pending Defects log (GP Log 0x0c) not supported
|
||||
|
||||
SATA Phy Event Counters (GP Log 0x11)
|
||||
ID Size Value Description
|
||||
0x0001 2 0 Command failed due to ICRC error
|
||||
0x0002 2 0 R_ERR response for data FIS
|
||||
0x0003 2 0 R_ERR response for device-to-host data FIS
|
||||
0x0004 2 0 R_ERR response for host-to-device data FIS
|
||||
0x0005 2 0 R_ERR response for non-data FIS
|
||||
0x0006 2 0 R_ERR response for device-to-host non-data FIS
|
||||
0x0007 2 0 R_ERR response for host-to-device non-data FIS
|
||||
0x0008 2 0 Device-to-host non-data FIS retries
|
||||
0x0009 2 5 Transition from drive PhyRdy to drive PhyNRdy
|
||||
0x000a 2 5 Device-to-host register FISes sent due to a COMRESET
|
||||
0x000b 2 0 CRC errors within host-to-device FIS
|
||||
0x000d 2 0 Non-CRC errors within host-to-device FIS
|
||||
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
|
||||
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
|
||||
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
|
||||
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
|
||||
|
||||
167
SSD/Samsung/MZ7/MZ7PD128HCFV-000H1/541F9EB2B3F0
Normal file
167
SSD/Samsung/MZ7/MZ7PD128HCFV-000H1/541F9EB2B3F0
Normal file
@@ -0,0 +1,167 @@
|
||||
smartctl 7.2 2020-12-30 r5155 [FreeBSD 13.0-RELEASE amd64] (local build)
|
||||
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
|
||||
|
||||
=== START OF INFORMATION SECTION ===
|
||||
Device Model: SAMSUNG MZ7PD128HCFV-000H1
|
||||
Serial Number: --
|
||||
LU WWN Device Id: 5 002538 ...
|
||||
Firmware Version: DXM01H0Q
|
||||
User Capacity: 128,035,676,160 bytes [128 GB]
|
||||
Sector Size: 512 bytes logical/physical
|
||||
Rotation Rate: Solid State Device
|
||||
TRIM Command: Available, deterministic, zeroed
|
||||
Device is: Not in smartctl database [for details use: -P showall]
|
||||
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
|
||||
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
|
||||
Local Time is: Fri Aug 5 00:58:21 2022 EDT
|
||||
SMART support is: Available - device has SMART capability.
|
||||
SMART support is: Enabled
|
||||
AAM feature is: Unavailable
|
||||
APM feature is: Unavailable
|
||||
Rd look-ahead is: Enabled
|
||||
Write cache is: Enabled
|
||||
DSN feature is: Unavailable
|
||||
ATA Security is: Disabled, frozen [SEC2]
|
||||
Wt Cache Reorder: Enabled
|
||||
|
||||
=== START OF READ SMART DATA SECTION ===
|
||||
SMART overall-health self-assessment test result: PASSED
|
||||
|
||||
General SMART Values:
|
||||
Offline data collection status: (0x02) Offline data collection activity
|
||||
was completed without error.
|
||||
Auto Offline Data Collection: Disabled.
|
||||
Self-test execution status: ( 0) The previous self-test routine completed
|
||||
without error or no self-test has ever
|
||||
been run.
|
||||
Total time to complete Offline
|
||||
data collection: ( 0) seconds.
|
||||
Offline data collection
|
||||
capabilities: (0x53) SMART execute Offline immediate.
|
||||
Auto Offline data collection on/off support.
|
||||
Suspend Offline collection upon new
|
||||
command.
|
||||
No Offline surface scan supported.
|
||||
Self-test supported.
|
||||
No Conveyance Self-test supported.
|
||||
Selective Self-test supported.
|
||||
SMART capabilities: (0x0003) Saves SMART data before entering
|
||||
power-saving mode.
|
||||
Supports SMART auto save timer.
|
||||
Error logging capability: (0x01) Error logging supported.
|
||||
General Purpose Logging supported.
|
||||
Short self-test routine
|
||||
recommended polling time: ( 2) minutes.
|
||||
Extended self-test routine
|
||||
recommended polling time: ( 9) minutes.
|
||||
SCT capabilities: (0x003d) SCT Status supported.
|
||||
SCT Error Recovery Control supported.
|
||||
SCT Feature Control supported.
|
||||
SCT Data Table supported.
|
||||
|
||||
SMART Attributes Data Structure revision number: 1
|
||||
Vendor Specific SMART Attributes with Thresholds:
|
||||
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
|
||||
1 Raw_Read_Error_Rate POSR-K 200 200 002 - 0
|
||||
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
|
||||
9 Power_On_Hours -O--CK 095 095 000 - 23920
|
||||
12 Power_Cycle_Count -O--CK 097 097 000 - 2240
|
||||
170 Unknown_Attribute PO--C- 100 100 010 - 2288
|
||||
171 Unknown_Attribute -O--CK 100 100 010 - 0
|
||||
172 Unknown_Attribute -O--CK 100 100 010 - 0
|
||||
173 Unknown_Attribute PO--C- 088 088 005 - 412
|
||||
174 Unknown_Attribute -O--CK 099 099 000 - 226
|
||||
183 Runtime_Bad_Block -O--CK 099 099 001 - 1876
|
||||
184 End-to-End_Error PO--CK 100 100 097 - 0
|
||||
187 Reported_Uncorrect -O--CK 100 100 000 - 0
|
||||
188 Command_Timeout -O--CK 100 100 000 - 444
|
||||
190 Airflow_Temperature_Cel -O---K 068 001 000 - 32
|
||||
196 Reallocated_Event_Count -O---- 253 253 000 - 0
|
||||
198 Offline_Uncorrectable ----CK 100 100 000 - 0
|
||||
199 UDMA_CRC_Error_Count -OSRCK 099 099 000 - 154
|
||||
||||||_ K auto-keep
|
||||
|||||__ C event count
|
||||
||||___ R error rate
|
||||
|||____ S speed/performance
|
||||
||_____ O updated online
|
||||
|______ P prefailure warning
|
||||
|
||||
General Purpose Log Directory Version 1
|
||||
SMART Log Directory Version 1 [multi-sector log support]
|
||||
Address Access R/W Size Description
|
||||
0x00 GPL,SL R/O 1 Log Directory
|
||||
0x01 GPL,SL R/O 1 Summary SMART error log
|
||||
0x02 GPL,SL R/O 1 Comprehensive SMART error log
|
||||
0x03 GPL,SL R/O 1 Ext. Comprehensive SMART error log
|
||||
0x06 GPL,SL R/O 1 SMART self-test log
|
||||
0x07 GPL,SL R/O 1 Extended self-test log
|
||||
0x09 GPL,SL R/W 1 Selective self-test log
|
||||
0x10 GPL,SL R/O 1 NCQ Command Error log
|
||||
0x11 GPL,SL R/O 1 SATA Phy Event Counters log
|
||||
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
|
||||
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
|
||||
0xe0 GPL,SL R/W 1 SCT Command/Status
|
||||
0xe1 GPL,SL R/W 1 SCT Data Transfer
|
||||
|
||||
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
|
||||
No Errors Logged
|
||||
|
||||
SMART Extended Self-test Log Version: 1 (1 sectors)
|
||||
No self-tests have been logged. [To run self-tests, use: smartctl -t]
|
||||
|
||||
SMART Selective self-test log data structure revision number 1
|
||||
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
|
||||
1 0 0 Not_testing
|
||||
2 0 0 Not_testing
|
||||
3 0 0 Not_testing
|
||||
4 0 0 Not_testing
|
||||
5 0 0 Not_testing
|
||||
255 0 65535 Read_scanning was completed without error
|
||||
Selective self-test flags (0x0):
|
||||
After scanning selected spans, do NOT read-scan remainder of disk.
|
||||
If Selective self-test is pending on power-up, resume after 0 minute delay.
|
||||
|
||||
SCT Status Version: 3
|
||||
SCT Version (vendor specific): 256 (0x0100)
|
||||
Device State: SCT command executing in background (5)
|
||||
Current Temperature: 32 Celsius
|
||||
Power Cycle Min/Max Temperature: 28/40 Celsius
|
||||
Lifetime Min/Max Temperature: 0/70 Celsius
|
||||
Under/Over Temperature Limit Count: 0/0
|
||||
|
||||
SCT Temperature History Version: 3 (Unknown, should be 2)
|
||||
Temperature Sampling Period: 1 minute
|
||||
Temperature Logging Interval: 1 minute
|
||||
Min/Max recommended Temperature: 0/70 Celsius
|
||||
Min/Max Temperature Limit: 0/70 Celsius
|
||||
Temperature History Size (Index): 128 (25)
|
||||
|
||||
SCT Error Recovery Control:
|
||||
Read: Disabled
|
||||
Write: Disabled
|
||||
|
||||
Device Statistics (GP/SMART Log 0x04) not supported
|
||||
|
||||
Pending Defects log (GP Log 0x0c) not supported
|
||||
|
||||
SATA Phy Event Counters (GP Log 0x11)
|
||||
ID Size Value Description
|
||||
0x0001 2 0 Command failed due to ICRC error
|
||||
0x0002 2 0 R_ERR response for data FIS
|
||||
0x0003 2 0 R_ERR response for device-to-host data FIS
|
||||
0x0004 2 0 R_ERR response for host-to-device data FIS
|
||||
0x0005 2 0 R_ERR response for non-data FIS
|
||||
0x0006 2 0 R_ERR response for device-to-host non-data FIS
|
||||
0x0007 2 0 R_ERR response for host-to-device non-data FIS
|
||||
0x0008 2 0 Device-to-host non-data FIS retries
|
||||
0x0009 2 99 Transition from drive PhyRdy to drive PhyNRdy
|
||||
0x000a 2 99 Device-to-host register FISes sent due to a COMRESET
|
||||
0x000b 2 0 CRC errors within host-to-device FIS
|
||||
0x000d 2 0 Non-CRC errors within host-to-device FIS
|
||||
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
|
||||
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
|
||||
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
|
||||
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
|
||||
|
||||
|
||||
|
||||
165
SSD/Samsung/MZ7/MZ7PD128HCFV-000H1/CF3DD0BAA181
Normal file
165
SSD/Samsung/MZ7/MZ7PD128HCFV-000H1/CF3DD0BAA181
Normal file
@@ -0,0 +1,165 @@
|
||||
smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE amd64] (local build)
|
||||
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
|
||||
|
||||
=== START OF INFORMATION SECTION ===
|
||||
Device Model: SAMSUNG MZ7PD128HCFV-000H1
|
||||
Serial Number: --
|
||||
LU WWN Device Id: 5 002538 ...
|
||||
Firmware Version: DXM01H0Q
|
||||
User Capacity: 128,035,676,160 bytes [128 GB]
|
||||
Sector Size: 512 bytes logical/physical
|
||||
Rotation Rate: Solid State Device
|
||||
TRIM Command: Available, deterministic, zeroed
|
||||
Device is: Not in smartctl database 7.3/5319
|
||||
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
|
||||
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
|
||||
Local Time is: Mon Aug 15 14:33:15 2022 EEST
|
||||
SMART support is: Available - device has SMART capability.
|
||||
SMART support is: Enabled
|
||||
AAM feature is: Unavailable
|
||||
APM feature is: Unavailable
|
||||
Rd look-ahead is: Enabled
|
||||
Write cache is: Enabled
|
||||
DSN feature is: Unavailable
|
||||
ATA Security is: Disabled, frozen [SEC2]
|
||||
Wt Cache Reorder: Enabled
|
||||
|
||||
=== START OF READ SMART DATA SECTION ===
|
||||
SMART overall-health self-assessment test result: PASSED
|
||||
|
||||
General SMART Values:
|
||||
Offline data collection status: (0x02) Offline data collection activity
|
||||
was completed without error.
|
||||
Auto Offline Data Collection: Disabled.
|
||||
Self-test execution status: ( 0) The previous self-test routine completed
|
||||
without error or no self-test has ever
|
||||
been run.
|
||||
Total time to complete Offline
|
||||
data collection: ( 0) seconds.
|
||||
Offline data collection
|
||||
capabilities: (0x53) SMART execute Offline immediate.
|
||||
Auto Offline data collection on/off support.
|
||||
Suspend Offline collection upon new
|
||||
command.
|
||||
No Offline surface scan supported.
|
||||
Self-test supported.
|
||||
No Conveyance Self-test supported.
|
||||
Selective Self-test supported.
|
||||
SMART capabilities: (0x0003) Saves SMART data before entering
|
||||
power-saving mode.
|
||||
Supports SMART auto save timer.
|
||||
Error logging capability: (0x01) Error logging supported.
|
||||
General Purpose Logging supported.
|
||||
Short self-test routine
|
||||
recommended polling time: ( 2) minutes.
|
||||
Extended self-test routine
|
||||
recommended polling time: ( 9) minutes.
|
||||
SCT capabilities: (0x003d) SCT Status supported.
|
||||
SCT Error Recovery Control supported.
|
||||
SCT Feature Control supported.
|
||||
SCT Data Table supported.
|
||||
|
||||
SMART Attributes Data Structure revision number: 1
|
||||
Vendor Specific SMART Attributes with Thresholds:
|
||||
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
|
||||
1 Raw_Read_Error_Rate POSR-K 200 200 002 - 0
|
||||
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
|
||||
9 Power_On_Hours -O--CK 094 094 000 - 26803
|
||||
12 Power_Cycle_Count -O--CK 099 099 000 - 856
|
||||
170 Unknown_Attribute PO--C- 100 100 010 - 2288
|
||||
171 Unknown_Attribute -O--CK 100 100 010 - 0
|
||||
172 Unknown_Attribute -O--CK 100 100 010 - 0
|
||||
173 Unknown_Attribute PO--C- 048 048 005 - 1883
|
||||
174 Unknown_Attribute -O--CK 099 099 000 - 57
|
||||
183 Runtime_Bad_Block -O--CK 099 099 001 - 225
|
||||
184 End-to-End_Error PO--CK 100 100 097 - 0
|
||||
187 Reported_Uncorrect -O--CK 100 100 000 - 0
|
||||
188 Command_Timeout -O--CK 100 100 000 - 0
|
||||
190 Airflow_Temperature_Cel -O---K 066 055 000 - 34
|
||||
196 Reallocated_Event_Count -O---- 253 253 000 - 0
|
||||
198 Offline_Uncorrectable ----CK 100 100 000 - 0
|
||||
199 UDMA_CRC_Error_Count -OSRCK 100 100 000 - 0
|
||||
||||||_ K auto-keep
|
||||
|||||__ C event count
|
||||
||||___ R error rate
|
||||
|||____ S speed/performance
|
||||
||_____ O updated online
|
||||
|______ P prefailure warning
|
||||
|
||||
General Purpose Log Directory Version 1
|
||||
SMART Log Directory Version 1 [multi-sector log support]
|
||||
Address Access R/W Size Description
|
||||
0x00 GPL,SL R/O 1 Log Directory
|
||||
0x01 GPL,SL R/O 1 Summary SMART error log
|
||||
0x02 GPL,SL R/O 1 Comprehensive SMART error log
|
||||
0x03 GPL,SL R/O 1 Ext. Comprehensive SMART error log
|
||||
0x06 GPL,SL R/O 1 SMART self-test log
|
||||
0x07 GPL,SL R/O 1 Extended self-test log
|
||||
0x09 GPL,SL R/W 1 Selective self-test log
|
||||
0x10 GPL,SL R/O 1 NCQ Command Error log
|
||||
0x11 GPL,SL R/O 1 SATA Phy Event Counters log
|
||||
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
|
||||
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
|
||||
0xe0 GPL,SL R/W 1 SCT Command/Status
|
||||
0xe1 GPL,SL R/W 1 SCT Data Transfer
|
||||
|
||||
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
|
||||
No Errors Logged
|
||||
|
||||
SMART Extended Self-test Log Version: 1 (1 sectors)
|
||||
No self-tests have been logged. [To run self-tests, use: smartctl -t]
|
||||
|
||||
SMART Selective self-test log data structure revision number 1
|
||||
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
|
||||
1 0 0 Not_testing
|
||||
2 0 0 Not_testing
|
||||
3 0 0 Not_testing
|
||||
4 0 0 Not_testing
|
||||
5 0 0 Not_testing
|
||||
255 0 65535 Read_scanning was completed without error
|
||||
Selective self-test flags (0x0):
|
||||
After scanning selected spans, do NOT read-scan remainder of disk.
|
||||
If Selective self-test is pending on power-up, resume after 0 minute delay.
|
||||
|
||||
SCT Status Version: 3
|
||||
SCT Version (vendor specific): 256 (0x0100)
|
||||
Device State: SCT command executing in background (5)
|
||||
Current Temperature: 34 Celsius
|
||||
Power Cycle Min/Max Temperature: 30/40 Celsius
|
||||
Lifetime Min/Max Temperature: 0/70 Celsius
|
||||
Under/Over Temperature Limit Count: 0/0
|
||||
|
||||
SCT Temperature History Version: 3 (Unknown, should be 2)
|
||||
Temperature Sampling Period: 1 minute
|
||||
Temperature Logging Interval: 1 minute
|
||||
Min/Max recommended Temperature: 0/70 Celsius
|
||||
Min/Max Temperature Limit: 0/70 Celsius
|
||||
Temperature History Size (Index): 128 (20)
|
||||
|
||||
SCT Error Recovery Control:
|
||||
Read: Disabled
|
||||
Write: Disabled
|
||||
|
||||
Device Statistics (GP/SMART Log 0x04) not supported
|
||||
|
||||
Pending Defects log (GP Log 0x0c) not supported
|
||||
|
||||
SATA Phy Event Counters (GP Log 0x11)
|
||||
ID Size Value Description
|
||||
0x0001 2 0 Command failed due to ICRC error
|
||||
0x0002 2 0 R_ERR response for data FIS
|
||||
0x0003 2 0 R_ERR response for device-to-host data FIS
|
||||
0x0004 2 0 R_ERR response for host-to-device data FIS
|
||||
0x0005 2 0 R_ERR response for non-data FIS
|
||||
0x0006 2 0 R_ERR response for device-to-host non-data FIS
|
||||
0x0007 2 0 R_ERR response for host-to-device non-data FIS
|
||||
0x0008 2 0 Device-to-host non-data FIS retries
|
||||
0x0009 2 4 Transition from drive PhyRdy to drive PhyNRdy
|
||||
0x000a 2 4 Device-to-host register FISes sent due to a COMRESET
|
||||
0x000b 2 0 CRC errors within host-to-device FIS
|
||||
0x000d 2 0 Non-CRC errors within host-to-device FIS
|
||||
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
|
||||
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
|
||||
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
|
||||
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
|
||||
|
||||
165
SSD/Samsung/MZ7/MZ7PD256HCGM-000H7/1529529D43F4
Normal file
165
SSD/Samsung/MZ7/MZ7PD256HCGM-000H7/1529529D43F4
Normal file
@@ -0,0 +1,165 @@
|
||||
smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE-p1 amd64] (local build)
|
||||
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
|
||||
|
||||
=== START OF INFORMATION SECTION ===
|
||||
Device Model: SAMSUNG MZ7PD256HCGM-000H7
|
||||
Serial Number: --
|
||||
LU WWN Device Id: 5 002538 ...
|
||||
Firmware Version: DXM06H6Q
|
||||
User Capacity: 256,060,514,304 bytes [256 GB]
|
||||
Sector Size: 512 bytes logical/physical
|
||||
Rotation Rate: Solid State Device
|
||||
TRIM Command: Available, deterministic, zeroed
|
||||
Device is: Not in smartctl database 7.3/5319
|
||||
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
|
||||
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
|
||||
Local Time is: Sun Aug 28 09:28:11 2022 NZST
|
||||
SMART support is: Available - device has SMART capability.
|
||||
SMART support is: Enabled
|
||||
AAM feature is: Unavailable
|
||||
APM feature is: Unavailable
|
||||
Rd look-ahead is: Enabled
|
||||
Write cache is: Enabled
|
||||
DSN feature is: Unavailable
|
||||
ATA Security is: Disabled, frozen [SEC2]
|
||||
Wt Cache Reorder: Enabled
|
||||
|
||||
=== START OF READ SMART DATA SECTION ===
|
||||
SMART overall-health self-assessment test result: PASSED
|
||||
|
||||
General SMART Values:
|
||||
Offline data collection status: (0x02) Offline data collection activity
|
||||
was completed without error.
|
||||
Auto Offline Data Collection: Disabled.
|
||||
Self-test execution status: ( 0) The previous self-test routine completed
|
||||
without error or no self-test has ever
|
||||
been run.
|
||||
Total time to complete Offline
|
||||
data collection: (65476) seconds.
|
||||
Offline data collection
|
||||
capabilities: (0x53) SMART execute Offline immediate.
|
||||
Auto Offline data collection on/off support.
|
||||
Suspend Offline collection upon new
|
||||
command.
|
||||
No Offline surface scan supported.
|
||||
Self-test supported.
|
||||
No Conveyance Self-test supported.
|
||||
Selective Self-test supported.
|
||||
SMART capabilities: (0x0003) Saves SMART data before entering
|
||||
power-saving mode.
|
||||
Supports SMART auto save timer.
|
||||
Error logging capability: (0x01) Error logging supported.
|
||||
General Purpose Logging supported.
|
||||
Short self-test routine
|
||||
recommended polling time: ( 2) minutes.
|
||||
Extended self-test routine
|
||||
recommended polling time: ( 17) minutes.
|
||||
SCT capabilities: (0x003d) SCT Status supported.
|
||||
SCT Error Recovery Control supported.
|
||||
SCT Feature Control supported.
|
||||
SCT Data Table supported.
|
||||
|
||||
SMART Attributes Data Structure revision number: 1
|
||||
Vendor Specific SMART Attributes with Thresholds:
|
||||
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
|
||||
1 Raw_Read_Error_Rate POSR-K 200 200 002 - 0
|
||||
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
|
||||
9 Power_On_Hours -O--CK 099 099 000 - 1917
|
||||
12 Power_Cycle_Count -O--CK 098 098 000 - 1375
|
||||
170 Unknown_Attribute PO--C- 100 100 010 - 4576
|
||||
171 Unknown_Attribute -O--CK 100 100 010 - 0
|
||||
172 Unknown_Attribute -O--CK 100 100 010 - 0
|
||||
173 Unknown_Attribute PO--C- 093 093 005 - 224
|
||||
174 Unknown_Attribute -O--CK 099 099 000 - 37
|
||||
183 Runtime_Bad_Block -O--CK 099 099 001 - 1
|
||||
184 End-to-End_Error PO--CK 100 100 097 - 0
|
||||
187 Reported_Uncorrect -O--CK 100 100 000 - 0
|
||||
188 Command_Timeout -O--CK 100 100 000 - 0
|
||||
190 Airflow_Temperature_Cel -O---K 059 052 000 - 41
|
||||
196 Reallocated_Event_Count -O---- 253 253 000 - 0
|
||||
198 Offline_Uncorrectable ----CK 100 100 000 - 0
|
||||
199 UDMA_CRC_Error_Count -OSRCK 100 100 000 - 0
|
||||
||||||_ K auto-keep
|
||||
|||||__ C event count
|
||||
||||___ R error rate
|
||||
|||____ S speed/performance
|
||||
||_____ O updated online
|
||||
|______ P prefailure warning
|
||||
|
||||
General Purpose Log Directory Version 1
|
||||
SMART Log Directory Version 1 [multi-sector log support]
|
||||
Address Access R/W Size Description
|
||||
0x00 GPL,SL R/O 1 Log Directory
|
||||
0x01 GPL,SL R/O 1 Summary SMART error log
|
||||
0x02 GPL,SL R/O 1 Comprehensive SMART error log
|
||||
0x03 GPL,SL R/O 1 Ext. Comprehensive SMART error log
|
||||
0x06 GPL,SL R/O 1 SMART self-test log
|
||||
0x07 GPL,SL R/O 1 Extended self-test log
|
||||
0x09 GPL,SL R/W 1 Selective self-test log
|
||||
0x10 GPL,SL R/O 1 NCQ Command Error log
|
||||
0x11 GPL,SL R/O 1 SATA Phy Event Counters log
|
||||
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
|
||||
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
|
||||
0xe0 GPL,SL R/W 1 SCT Command/Status
|
||||
0xe1 GPL,SL R/W 1 SCT Data Transfer
|
||||
|
||||
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
|
||||
No Errors Logged
|
||||
|
||||
SMART Extended Self-test Log Version: 1 (1 sectors)
|
||||
No self-tests have been logged. [To run self-tests, use: smartctl -t]
|
||||
|
||||
SMART Selective self-test log data structure revision number 1
|
||||
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
|
||||
1 0 0 Not_testing
|
||||
2 0 0 Not_testing
|
||||
3 0 0 Not_testing
|
||||
4 0 0 Not_testing
|
||||
5 0 0 Not_testing
|
||||
255 0 65535 Read_scanning was completed without error
|
||||
Selective self-test flags (0x0):
|
||||
After scanning selected spans, do NOT read-scan remainder of disk.
|
||||
If Selective self-test is pending on power-up, resume after 0 minute delay.
|
||||
|
||||
SCT Status Version: 3
|
||||
SCT Version (vendor specific): 256 (0x0100)
|
||||
Device State: SCT command executing in background (5)
|
||||
Current Temperature: 41 Celsius
|
||||
Power Cycle Min/Max Temperature: 40/48 Celsius
|
||||
Lifetime Min/Max Temperature: 0/70 Celsius
|
||||
Under/Over Temperature Limit Count: 0/0
|
||||
|
||||
SCT Temperature History Version: 3 (Unknown, should be 2)
|
||||
Temperature Sampling Period: 1 minute
|
||||
Temperature Logging Interval: 1 minute
|
||||
Min/Max recommended Temperature: 0/70 Celsius
|
||||
Min/Max Temperature Limit: 0/70 Celsius
|
||||
Temperature History Size (Index): 128 (98)
|
||||
|
||||
SCT Error Recovery Control:
|
||||
Read: Disabled
|
||||
Write: Disabled
|
||||
|
||||
Device Statistics (GP/SMART Log 0x04) not supported
|
||||
|
||||
Pending Defects log (GP Log 0x0c) not supported
|
||||
|
||||
SATA Phy Event Counters (GP Log 0x11)
|
||||
ID Size Value Description
|
||||
0x0001 2 0 Command failed due to ICRC error
|
||||
0x0002 2 0 R_ERR response for data FIS
|
||||
0x0003 2 0 R_ERR response for device-to-host data FIS
|
||||
0x0004 2 0 R_ERR response for host-to-device data FIS
|
||||
0x0005 2 0 R_ERR response for non-data FIS
|
||||
0x0006 2 0 R_ERR response for device-to-host non-data FIS
|
||||
0x0007 2 0 R_ERR response for host-to-device non-data FIS
|
||||
0x0008 2 0 Device-to-host non-data FIS retries
|
||||
0x0009 2 6 Transition from drive PhyRdy to drive PhyNRdy
|
||||
0x000a 2 5 Device-to-host register FISes sent due to a COMRESET
|
||||
0x000b 2 0 CRC errors within host-to-device FIS
|
||||
0x000d 2 0 Non-CRC errors within host-to-device FIS
|
||||
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
|
||||
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
|
||||
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
|
||||
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
|
||||
|
||||
172
SSD/Samsung/MZ7/MZ7TD128HAFV-000L1/2CE1A37FFB10
Normal file
172
SSD/Samsung/MZ7/MZ7TD128HAFV-000L1/2CE1A37FFB10
Normal file
@@ -0,0 +1,172 @@
|
||||
smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE-p5 amd64] (local build)
|
||||
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
|
||||
|
||||
=== START OF INFORMATION SECTION ===
|
||||
Model Family: Samsung based SSDs
|
||||
Device Model: SAMSUNG MZ7TD128HAFV-000L1
|
||||
Serial Number: --
|
||||
LU WWN Device Id: 5 002538 ...
|
||||
Add. Product Id: 00000000
|
||||
Firmware Version: DXT05L0Q
|
||||
User Capacity: 128,035,676,160 bytes [128 GB]
|
||||
Sector Size: 512 bytes logical/physical
|
||||
Rotation Rate: Solid State Device
|
||||
TRIM Command: Available, deterministic, zeroed
|
||||
Device is: In smartctl database 7.3/5319
|
||||
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
|
||||
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
|
||||
Local Time is: Sat Dec 10 14:58:31 2022 CET
|
||||
SMART support is: Available - device has SMART capability.
|
||||
SMART support is: Enabled
|
||||
AAM feature is: Unavailable
|
||||
APM feature is: Unavailable
|
||||
Rd look-ahead is: Enabled
|
||||
Write cache is: Enabled
|
||||
DSN feature is: Unavailable
|
||||
ATA Security is: Disabled, frozen [SEC2]
|
||||
Wt Cache Reorder: Enabled
|
||||
|
||||
=== START OF READ SMART DATA SECTION ===
|
||||
SMART overall-health self-assessment test result: PASSED
|
||||
|
||||
General SMART Values:
|
||||
Offline data collection status: (0x00) Offline data collection activity
|
||||
was never started.
|
||||
Auto Offline Data Collection: Disabled.
|
||||
Self-test execution status: ( 0) The previous self-test routine completed
|
||||
without error or no self-test has ever
|
||||
been run.
|
||||
Total time to complete Offline
|
||||
data collection: (65476) seconds.
|
||||
Offline data collection
|
||||
capabilities: (0x5b) SMART execute Offline immediate.
|
||||
Auto Offline data collection on/off support.
|
||||
Suspend Offline collection upon new
|
||||
command.
|
||||
Offline surface scan supported.
|
||||
Self-test supported.
|
||||
No Conveyance Self-test supported.
|
||||
Selective Self-test supported.
|
||||
SMART capabilities: (0x0003) Saves SMART data before entering
|
||||
power-saving mode.
|
||||
Supports SMART auto save timer.
|
||||
Error logging capability: (0x01) Error logging supported.
|
||||
General Purpose Logging supported.
|
||||
Short self-test routine
|
||||
recommended polling time: ( 2) minutes.
|
||||
Extended self-test routine
|
||||
recommended polling time: ( 30) minutes.
|
||||
SCT capabilities: (0x003d) SCT Status supported.
|
||||
SCT Error Recovery Control supported.
|
||||
SCT Feature Control supported.
|
||||
SCT Data Table supported.
|
||||
|
||||
SMART Attributes Data Structure revision number: 1
|
||||
Vendor Specific SMART Attributes with Thresholds:
|
||||
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
|
||||
9 Power_On_Hours -O--CK 096 096 000 - 19297
|
||||
12 Power_Cycle_Count -O--CK 099 099 000 - 424
|
||||
175 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
|
||||
176 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
|
||||
177 Wear_Leveling_Count PO--C- 085 085 005 - 174
|
||||
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
|
||||
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
|
||||
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 3120
|
||||
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
|
||||
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
|
||||
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
|
||||
184 End-to-End_Error PO--CK 100 100 097 - 0
|
||||
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
|
||||
190 Airflow_Temperature_Cel -O--CK 064 051 000 - 36
|
||||
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
|
||||
198 Offline_Uncorrectable ----CK 100 100 000 - 0
|
||||
199 CRC_Error_Count -OSRCK 253 253 000 - 0
|
||||
233 Media_Wearout_Indicator -O-RCK 199 199 000 - 39265096
|
||||
234 Unknown_Samsung_Attr -O--C- 100 100 000 - 0
|
||||
235 POR_Recovery_Count -O--C- 099 099 000 - 62
|
||||
236 Unknown_Samsung_Attr -O--C- 099 099 000 - 114
|
||||
237 Unknown_Samsung_Attr -O--C- 099 099 000 - 174
|
||||
238 Unknown_Samsung_Attr -O--C- 100 100 000 - 0
|
||||
||||||_ K auto-keep
|
||||
|||||__ C event count
|
||||
||||___ R error rate
|
||||
|||____ S speed/performance
|
||||
||_____ O updated online
|
||||
|______ P prefailure warning
|
||||
|
||||
General Purpose Log Directory Version 1
|
||||
SMART Log Directory Version 1 [multi-sector log support]
|
||||
Address Access R/W Size Description
|
||||
0x00 GPL,SL R/O 1 Log Directory
|
||||
0x01 GPL,SL R/O 1 Summary SMART error log
|
||||
0x02 GPL,SL R/O 1 Comprehensive SMART error log
|
||||
0x03 GPL,SL R/O 1 Ext. Comprehensive SMART error log
|
||||
0x06 GPL,SL R/O 1 SMART self-test log
|
||||
0x07 GPL,SL R/O 1 Extended self-test log
|
||||
0x09 GPL,SL R/W 1 Selective self-test log
|
||||
0x10 GPL,SL R/O 1 NCQ Command Error log
|
||||
0x11 GPL,SL R/O 1 SATA Phy Event Counters log
|
||||
0x30 GPL,SL R/O 1 IDENTIFY DEVICE data log
|
||||
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
|
||||
0xa0 GPL,SL VS 16 Device vendor specific log
|
||||
|
||||
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
|
||||
No Errors Logged
|
||||
|
||||
SMART Extended Self-test Log Version: 1 (1 sectors)
|
||||
No self-tests have been logged. [To run self-tests, use: smartctl -t]
|
||||
|
||||
SMART Selective self-test log data structure revision number 1
|
||||
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
|
||||
1 0 0 Not_testing
|
||||
2 0 0 Not_testing
|
||||
3 0 0 Not_testing
|
||||
4 0 0 Not_testing
|
||||
5 0 0 Not_testing
|
||||
255 0 65535 Read_scanning was never started
|
||||
Selective self-test flags (0x0):
|
||||
After scanning selected spans, do NOT read-scan remainder of disk.
|
||||
If Selective self-test is pending on power-up, resume after 0 minute delay.
|
||||
|
||||
SCT Status Version: 3
|
||||
SCT Version (vendor specific): 256 (0x0100)
|
||||
Device State: SCT command executing in background (5)
|
||||
Current Temperature: 36 Celsius
|
||||
Power Cycle Min/Max Temperature: 30/40 Celsius
|
||||
Lifetime Min/Max Temperature: 0/70 Celsius
|
||||
Under/Over Temperature Limit Count: 0/0
|
||||
|
||||
SCT Temperature History Version: 3 (Unknown, should be 2)
|
||||
Temperature Sampling Period: 1 minute
|
||||
Temperature Logging Interval: 1 minute
|
||||
Min/Max recommended Temperature: 0/70 Celsius
|
||||
Min/Max Temperature Limit: 0/70 Celsius
|
||||
Temperature History Size (Index): 128 (14)
|
||||
|
||||
SCT Error Recovery Control:
|
||||
Read: Disabled
|
||||
Write: Disabled
|
||||
|
||||
Device Statistics (GP/SMART Log 0x04) not supported
|
||||
|
||||
Pending Defects log (GP Log 0x0c) not supported
|
||||
|
||||
SATA Phy Event Counters (GP Log 0x11)
|
||||
ID Size Value Description
|
||||
0x0001 2 0 Command failed due to ICRC error
|
||||
0x0002 2 0 R_ERR response for data FIS
|
||||
0x0003 2 0 R_ERR response for device-to-host data FIS
|
||||
0x0004 2 0 R_ERR response for host-to-device data FIS
|
||||
0x0005 2 0 R_ERR response for non-data FIS
|
||||
0x0006 2 0 R_ERR response for device-to-host non-data FIS
|
||||
0x0007 2 0 R_ERR response for host-to-device non-data FIS
|
||||
0x0008 2 0 Device-to-host non-data FIS retries
|
||||
0x0009 2 5 Transition from drive PhyRdy to drive PhyNRdy
|
||||
0x000a 2 5 Device-to-host register FISes sent due to a COMRESET
|
||||
0x000b 2 0 CRC errors within host-to-device FIS
|
||||
0x000d 2 0 Non-CRC errors within host-to-device FIS
|
||||
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
|
||||
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
|
||||
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
|
||||
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
|
||||
|
||||
105
SSD/Samsung/MZ7/MZ7TD128HAFV-000L1/DA8E902D23EB
Normal file
105
SSD/Samsung/MZ7/MZ7TD128HAFV-000L1/DA8E902D23EB
Normal file
@@ -0,0 +1,105 @@
|
||||
smartctl 7.3 2022-02-28 r5338 [OpenBSD 7.2 amd64] (local build)
|
||||
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
|
||||
|
||||
=== START OF INFORMATION SECTION ===
|
||||
Model Family: Samsung based SSDs
|
||||
Device Model: SAMSUNG MZ7TD128HAFV-000L1
|
||||
Serial Number: --
|
||||
LU WWN Device Id: 5 002538 ...
|
||||
Add. Product Id: 00000000
|
||||
Firmware Version: DXT04L0Q
|
||||
User Capacity: 128,035,676,160 bytes [128 GB]
|
||||
Sector Size: 512 bytes logical/physical
|
||||
Rotation Rate: Solid State Device
|
||||
TRIM Command: Available, deterministic, zeroed
|
||||
Device is: In smartctl database 7.3/5319
|
||||
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
|
||||
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
|
||||
Local Time is: Mon Nov 21 01:05:18 2022 EST
|
||||
SMART support is: Available - device has SMART capability.
|
||||
SMART support is: Enabled
|
||||
|
||||
=== START OF READ SMART DATA SECTION ===
|
||||
SMART Status not supported: Incomplete response, ATA output registers missing
|
||||
SMART overall-health self-assessment test result: PASSED
|
||||
Warning: This result is based on an Attribute check.
|
||||
|
||||
General SMART Values:
|
||||
Offline data collection status: (0x00) Offline data collection activity
|
||||
was never started.
|
||||
Auto Offline Data Collection: Disabled.
|
||||
Self-test execution status: ( 0) The previous self-test routine completed
|
||||
without error or no self-test has ever
|
||||
been run.
|
||||
Total time to complete Offline
|
||||
data collection: (65476) seconds.
|
||||
Offline data collection
|
||||
capabilities: (0x5b) SMART execute Offline immediate.
|
||||
Auto Offline data collection on/off support.
|
||||
Suspend Offline collection upon new
|
||||
command.
|
||||
Offline surface scan supported.
|
||||
Self-test supported.
|
||||
No Conveyance Self-test supported.
|
||||
Selective Self-test supported.
|
||||
SMART capabilities: (0x0003) Saves SMART data before entering
|
||||
power-saving mode.
|
||||
Supports SMART auto save timer.
|
||||
Error logging capability: (0x01) Error logging supported.
|
||||
General Purpose Logging supported.
|
||||
Short self-test routine
|
||||
recommended polling time: ( 2) minutes.
|
||||
Extended self-test routine
|
||||
recommended polling time: ( 30) minutes.
|
||||
SCT capabilities: (0x003d) SCT Status supported.
|
||||
SCT Error Recovery Control supported.
|
||||
SCT Feature Control supported.
|
||||
SCT Data Table supported.
|
||||
|
||||
SMART Attributes Data Structure revision number: 1
|
||||
Vendor Specific SMART Attributes with Thresholds:
|
||||
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
|
||||
9 Power_On_Hours 0x0032 098 098 000 Old_age Always - 5635
|
||||
12 Power_Cycle_Count 0x0032 095 095 000 Old_age Always - 4513
|
||||
175 Program_Fail_Count_Chip 0x0032 100 100 010 Old_age Always - 0
|
||||
176 Erase_Fail_Count_Chip 0x0032 100 100 010 Old_age Always - 0
|
||||
177 Wear_Leveling_Count 0x0013 088 088 005 Pre-fail Always - 143
|
||||
178 Used_Rsvd_Blk_Cnt_Chip 0x0013 100 100 010 Pre-fail Always - 0
|
||||
179 Used_Rsvd_Blk_Cnt_Tot 0x0013 100 100 010 Pre-fail Always - 0
|
||||
180 Unused_Rsvd_Blk_Cnt_Tot 0x0013 100 100 010 Pre-fail Always - 3120
|
||||
181 Program_Fail_Cnt_Total 0x0032 100 100 010 Old_age Always - 0
|
||||
182 Erase_Fail_Count_Total 0x0032 100 100 010 Old_age Always - 0
|
||||
183 Runtime_Bad_Block 0x0013 100 100 010 Pre-fail Always - 0
|
||||
184 End-to-End_Error 0x0033 100 100 097 Pre-fail Always - 0
|
||||
187 Uncorrectable_Error_Cnt 0x0032 100 100 000 Old_age Always - 0
|
||||
190 Airflow_Temperature_Cel 0x0032 063 001 000 Old_age Always - 37
|
||||
195 ECC_Error_Rate 0x001a 200 200 000 Old_age Always - 0
|
||||
198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0
|
||||
199 CRC_Error_Count 0x003e 253 253 000 Old_age Always - 0
|
||||
233 Media_Wearout_Indicator 0x003a 199 199 000 Old_age Always - 5351922
|
||||
234 Unknown_Samsung_Attr 0x0012 100 100 000 Old_age Always - 0
|
||||
235 POR_Recovery_Count 0x0012 099 099 000 Old_age Always - 254
|
||||
236 Unknown_Samsung_Attr 0x0012 099 099 000 Old_age Always - 107
|
||||
237 Unknown_Samsung_Attr 0x0012 099 099 000 Old_age Always - 143
|
||||
238 Unknown_Samsung_Attr 0x0012 100 100 000 Old_age Always - 0
|
||||
|
||||
SMART Error Log Version: 1
|
||||
No Errors Logged
|
||||
|
||||
SMART Self-test log structure revision number 1
|
||||
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
|
||||
# 1 Short offline Completed without error 00% 0 -
|
||||
# 2 Short offline Completed without error 00% 0 -
|
||||
|
||||
SMART Selective self-test log data structure revision number 1
|
||||
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
|
||||
1 0 0 Not_testing
|
||||
2 0 0 Not_testing
|
||||
3 0 0 Not_testing
|
||||
4 0 0 Not_testing
|
||||
5 0 0 Not_testing
|
||||
255 0 65535 Read_scanning was never started
|
||||
Selective self-test flags (0x0):
|
||||
After scanning selected spans, do NOT read-scan remainder of disk.
|
||||
If Selective self-test is pending on power-up, resume after 0 minute delay.
|
||||
|
||||
171
SSD/Samsung/MZ7/MZ7TD256HAFV-000L9/452BCD7C097D
Normal file
171
SSD/Samsung/MZ7/MZ7TD256HAFV-000L9/452BCD7C097D
Normal file
@@ -0,0 +1,171 @@
|
||||
smartctl 7.2 2020-12-30 r5155 [FreeBSD 13.0-RELEASE amd64] (local build)
|
||||
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
|
||||
|
||||
=== START OF INFORMATION SECTION ===
|
||||
Model Family: Samsung based SSDs
|
||||
Device Model: SAMSUNG MZ7TD256HAFV-000L9
|
||||
Serial Number: --
|
||||
LU WWN Device Id: 5 002538 ...
|
||||
Firmware Version: DXT02L5Q
|
||||
User Capacity: 256,060,514,304 bytes [256 GB]
|
||||
Sector Size: 512 bytes logical/physical
|
||||
Rotation Rate: Solid State Device
|
||||
TRIM Command: Available, deterministic, zeroed
|
||||
Device is: In smartctl database [for details use: -P show]
|
||||
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
|
||||
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
|
||||
Local Time is: Mon Jan 23 04:46:29 2023 EST
|
||||
SMART support is: Available - device has SMART capability.
|
||||
SMART support is: Enabled
|
||||
AAM feature is: Unavailable
|
||||
APM feature is: Unavailable
|
||||
Rd look-ahead is: Enabled
|
||||
Write cache is: Enabled
|
||||
DSN feature is: Unavailable
|
||||
ATA Security is: Unavailable
|
||||
Wt Cache Reorder: Enabled
|
||||
|
||||
=== START OF READ SMART DATA SECTION ===
|
||||
SMART overall-health self-assessment test result: PASSED
|
||||
|
||||
General SMART Values:
|
||||
Offline data collection status: (0x00) Offline data collection activity
|
||||
was never started.
|
||||
Auto Offline Data Collection: Disabled.
|
||||
Self-test execution status: ( 0) The previous self-test routine completed
|
||||
without error or no self-test has ever
|
||||
been run.
|
||||
Total time to complete Offline
|
||||
data collection: (53956) seconds.
|
||||
Offline data collection
|
||||
capabilities: (0x5b) SMART execute Offline immediate.
|
||||
Auto Offline data collection on/off support.
|
||||
Suspend Offline collection upon new
|
||||
command.
|
||||
Offline surface scan supported.
|
||||
Self-test supported.
|
||||
No Conveyance Self-test supported.
|
||||
Selective Self-test supported.
|
||||
SMART capabilities: (0x0003) Saves SMART data before entering
|
||||
power-saving mode.
|
||||
Supports SMART auto save timer.
|
||||
Error logging capability: (0x01) Error logging supported.
|
||||
General Purpose Logging supported.
|
||||
Short self-test routine
|
||||
recommended polling time: ( 2) minutes.
|
||||
Extended self-test routine
|
||||
recommended polling time: ( 40) minutes.
|
||||
SCT capabilities: (0x003d) SCT Status supported.
|
||||
SCT Error Recovery Control supported.
|
||||
SCT Feature Control supported.
|
||||
SCT Data Table supported.
|
||||
|
||||
SMART Attributes Data Structure revision number: 1
|
||||
Vendor Specific SMART Attributes with Thresholds:
|
||||
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
|
||||
9 Power_On_Hours -O--CK 099 099 000 - 1807
|
||||
12 Power_Cycle_Count -O--CK 094 094 000 - 5726
|
||||
175 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
|
||||
176 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
|
||||
177 Wear_Leveling_Count PO--C- 095 095 005 - 54
|
||||
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
|
||||
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
|
||||
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 6240
|
||||
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
|
||||
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
|
||||
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
|
||||
184 End-to-End_Error PO--CK 100 100 097 - 0
|
||||
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
|
||||
190 Airflow_Temperature_Cel -O--CK 072 047 000 - 28
|
||||
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
|
||||
198 Offline_Uncorrectable ----CK 100 100 000 - 0
|
||||
199 CRC_Error_Count -OSRCK 253 253 000 - 2
|
||||
233 Media_Wearout_Indicator -O-RCK 199 199 000 - 259568
|
||||
234 Unknown_Samsung_Attr -O--C- 100 100 000 - 0
|
||||
235 POR_Recovery_Count -O--C- 099 099 000 - 114
|
||||
236 Unknown_Samsung_Attr -O--C- 099 099 000 - 23
|
||||
237 Unknown_Samsung_Attr -O--C- 099 099 000 - 54
|
||||
238 Unknown_Samsung_Attr -O--C- 100 100 000 - 0
|
||||
||||||_ K auto-keep
|
||||
|||||__ C event count
|
||||
||||___ R error rate
|
||||
|||____ S speed/performance
|
||||
||_____ O updated online
|
||||
|______ P prefailure warning
|
||||
|
||||
General Purpose Log Directory Version 1
|
||||
SMART Log Directory Version 1 [multi-sector log support]
|
||||
Address Access R/W Size Description
|
||||
0x00 GPL,SL R/O 1 Log Directory
|
||||
0x01 GPL,SL R/O 1 Summary SMART error log
|
||||
0x02 GPL,SL R/O 1 Comprehensive SMART error log
|
||||
0x03 GPL,SL R/O 1 Ext. Comprehensive SMART error log
|
||||
0x06 GPL,SL R/O 1 SMART self-test log
|
||||
0x07 GPL,SL R/O 1 Extended self-test log
|
||||
0x09 GPL,SL R/W 1 Selective self-test log
|
||||
0x10 GPL,SL R/O 1 NCQ Command Error log
|
||||
0x11 GPL,SL R/O 1 SATA Phy Event Counters log
|
||||
0x30 GPL,SL R/O 1 IDENTIFY DEVICE data log
|
||||
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
|
||||
0xa0 GPL,SL VS 16 Device vendor specific log
|
||||
|
||||
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
|
||||
No Errors Logged
|
||||
|
||||
SMART Extended Self-test Log Version: 1 (1 sectors)
|
||||
No self-tests have been logged. [To run self-tests, use: smartctl -t]
|
||||
|
||||
SMART Selective self-test log data structure revision number 1
|
||||
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
|
||||
1 0 0 Not_testing
|
||||
2 0 0 Not_testing
|
||||
3 0 0 Not_testing
|
||||
4 0 0 Not_testing
|
||||
5 0 0 Not_testing
|
||||
255 0 65535 Read_scanning was never started
|
||||
Selective self-test flags (0x0):
|
||||
After scanning selected spans, do NOT read-scan remainder of disk.
|
||||
If Selective self-test is pending on power-up, resume after 0 minute delay.
|
||||
|
||||
SCT Status Version: 3
|
||||
SCT Version (vendor specific): 256 (0x0100)
|
||||
Device State: SCT command executing in background (5)
|
||||
Current Temperature: 28 Celsius
|
||||
Power Cycle Min/Max Temperature: 25/40 Celsius
|
||||
Lifetime Min/Max Temperature: 0/70 Celsius
|
||||
Under/Over Temperature Limit Count: 0/0
|
||||
|
||||
SCT Temperature History Version: 3 (Unknown, should be 2)
|
||||
Temperature Sampling Period: 1 minute
|
||||
Temperature Logging Interval: 1 minute
|
||||
Min/Max recommended Temperature: 0/70 Celsius
|
||||
Min/Max Temperature Limit: 0/70 Celsius
|
||||
Temperature History Size (Index): 128 (3)
|
||||
|
||||
SCT Error Recovery Control:
|
||||
Read: Disabled
|
||||
Write: Disabled
|
||||
|
||||
Device Statistics (GP/SMART Log 0x04) not supported
|
||||
|
||||
Pending Defects log (GP Log 0x0c) not supported
|
||||
|
||||
SATA Phy Event Counters (GP Log 0x11)
|
||||
ID Size Value Description
|
||||
0x0001 2 0 Command failed due to ICRC error
|
||||
0x0002 2 0 R_ERR response for data FIS
|
||||
0x0003 2 0 R_ERR response for device-to-host data FIS
|
||||
0x0004 2 0 R_ERR response for host-to-device data FIS
|
||||
0x0005 2 0 R_ERR response for non-data FIS
|
||||
0x0006 2 0 R_ERR response for device-to-host non-data FIS
|
||||
0x0007 2 0 R_ERR response for host-to-device non-data FIS
|
||||
0x0008 2 0 Device-to-host non-data FIS retries
|
||||
0x0009 2 9 Transition from drive PhyRdy to drive PhyNRdy
|
||||
0x000a 2 9 Device-to-host register FISes sent due to a COMRESET
|
||||
0x000b 2 0 CRC errors within host-to-device FIS
|
||||
0x000d 2 0 Non-CRC errors within host-to-device FIS
|
||||
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
|
||||
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
|
||||
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
|
||||
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
|
||||
|
||||
163
SSD/Samsung/MZ7/MZ7TE128HMGR-00000/55F9B13C5FF0
Normal file
163
SSD/Samsung/MZ7/MZ7TE128HMGR-00000/55F9B13C5FF0
Normal file
@@ -0,0 +1,163 @@
|
||||
smartctl 7.3 2022-02-28 r5338 [FreeBSD 12.3-RELEASE-p5 amd64] (local build)
|
||||
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
|
||||
|
||||
=== START OF INFORMATION SECTION ===
|
||||
Device Model: SAMSUNG MZ7TE128HMGR-00000
|
||||
Serial Number: --
|
||||
LU WWN Device Id: 5 002538 ...
|
||||
Firmware Version: EXT0100Q
|
||||
User Capacity: 128,035,676,160 bytes [128 GB]
|
||||
Sector Size: 512 bytes logical/physical
|
||||
Rotation Rate: Solid State Device
|
||||
TRIM Command: Available
|
||||
Device is: Not in smartctl database 7.3/5319
|
||||
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
|
||||
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
|
||||
Local Time is: Sun Sep 25 17:06:36 2022 CEST
|
||||
SMART support is: Available - device has SMART capability.
|
||||
SMART support is: Enabled
|
||||
AAM feature is: Unavailable
|
||||
APM feature is: Unavailable
|
||||
Rd look-ahead is: Enabled
|
||||
Write cache is: Enabled
|
||||
DSN feature is: Unavailable
|
||||
ATA Security is: Disabled, frozen [SEC2]
|
||||
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
|
||||
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
|
||||
|
||||
=== START OF READ SMART DATA SECTION ===
|
||||
SMART overall-health self-assessment test result: PASSED
|
||||
|
||||
General SMART Values:
|
||||
Offline data collection status: (0x00) Offline data collection activity
|
||||
was never started.
|
||||
Auto Offline Data Collection: Disabled.
|
||||
Self-test execution status: ( 0) The previous self-test routine completed
|
||||
without error or no self-test has ever
|
||||
been run.
|
||||
Total time to complete Offline
|
||||
data collection: ( 0) seconds.
|
||||
Offline data collection
|
||||
capabilities: (0x53) SMART execute Offline immediate.
|
||||
Auto Offline data collection on/off support.
|
||||
Suspend Offline collection upon new
|
||||
command.
|
||||
No Offline surface scan supported.
|
||||
Self-test supported.
|
||||
No Conveyance Self-test supported.
|
||||
Selective Self-test supported.
|
||||
SMART capabilities: (0x0003) Saves SMART data before entering
|
||||
power-saving mode.
|
||||
Supports SMART auto save timer.
|
||||
Error logging capability: (0x01) Error logging supported.
|
||||
General Purpose Logging supported.
|
||||
Short self-test routine
|
||||
recommended polling time: ( 2) minutes.
|
||||
Extended self-test routine
|
||||
recommended polling time: ( 70) minutes.
|
||||
SCT capabilities: (0x003d) SCT Status supported.
|
||||
SCT Error Recovery Control supported.
|
||||
SCT Feature Control supported.
|
||||
SCT Data Table supported.
|
||||
|
||||
SMART Attributes Data Structure revision number: 1
|
||||
Vendor Specific SMART Attributes with Thresholds:
|
||||
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
|
||||
5 Reallocated_Sector_Ct PO--CK 100 100 000 - 0
|
||||
9 Power_On_Hours -O--CK 088 088 000 - 59624
|
||||
12 Power_Cycle_Count -O--CK 098 098 000 - 1366
|
||||
177 Wear_Leveling_Count PO--C- 094 094 000 - 94
|
||||
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 100
|
||||
181 Program_Fail_Cnt_Total -O--CK 100 100 000 - 0
|
||||
182 Erase_Fail_Count_Total -O--CK 100 100 000 - 0
|
||||
183 Runtime_Bad_Block PO--C- 100 100 000 - 0
|
||||
187 Reported_Uncorrect -O--CK 100 100 000 - 0
|
||||
190 Airflow_Temperature_Cel -O--CK 067 053 000 - 33
|
||||
195 Hardware_ECC_Recovered -O-RC- 200 200 000 - 0
|
||||
199 UDMA_CRC_Error_Count -OSRCK 100 100 000 - 0
|
||||
235 Unknown_Attribute -O--C- 099 099 000 - 17
|
||||
241 Total_LBAs_Written -O--CK 099 099 000 - 18029688285
|
||||
242 Total_LBAs_Read -O--CK 099 099 000 - 15870957300
|
||||
||||||_ K auto-keep
|
||||
|||||__ C event count
|
||||
||||___ R error rate
|
||||
|||____ S speed/performance
|
||||
||_____ O updated online
|
||||
|______ P prefailure warning
|
||||
|
||||
General Purpose Log Directory Version 1
|
||||
SMART Log Directory Version 1 [multi-sector log support]
|
||||
Address Access R/W Size Description
|
||||
0x00 GPL,SL R/O 1 Log Directory
|
||||
0x01 SL R/O 1 Summary SMART error log
|
||||
0x02 SL R/O 1 Comprehensive SMART error log
|
||||
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
|
||||
0x06 SL R/O 1 SMART self-test log
|
||||
0x07 GPL R/O 1 Extended self-test log
|
||||
0x09 SL R/W 1 Selective self-test log
|
||||
0x10 GPL R/O 1 NCQ Command Error log
|
||||
0x11 GPL R/O 1 SATA Phy Event Counters log
|
||||
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
|
||||
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
|
||||
0xe0 GPL,SL R/W 1 SCT Command/Status
|
||||
0xe1 GPL,SL R/W 1 SCT Data Transfer
|
||||
|
||||
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
|
||||
No Errors Logged
|
||||
|
||||
SMART Extended Self-test Log Version: 1 (1 sectors)
|
||||
No self-tests have been logged. [To run self-tests, use: smartctl -t]
|
||||
|
||||
SMART Selective self-test log data structure revision number 1
|
||||
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
|
||||
1 0 0 Not_testing
|
||||
2 0 0 Not_testing
|
||||
3 0 0 Not_testing
|
||||
4 0 0 Not_testing
|
||||
5 0 0 Not_testing
|
||||
Selective self-test flags (0x0):
|
||||
After scanning selected spans, do NOT read-scan remainder of disk.
|
||||
If Selective self-test is pending on power-up, resume after 0 minute delay.
|
||||
|
||||
SCT Status Version: 3
|
||||
SCT Version (vendor specific): 1 (0x0001)
|
||||
Device State: Active (0)
|
||||
Current Temperature: 33 Celsius
|
||||
Power Cycle Min/Max Temperature: ?/ ? Celsius
|
||||
Lifetime Min/Max Temperature: ?/ ? Celsius
|
||||
Under/Over Temperature Limit Count: 0/221751
|
||||
|
||||
SCT Temperature History Version: 2
|
||||
Temperature Sampling Period: 10 minutes
|
||||
Temperature Logging Interval: 10 minutes
|
||||
Min/Max recommended Temperature: ?/ ? Celsius
|
||||
Min/Max Temperature Limit: ?/ ? Celsius
|
||||
Temperature History Size (Index): 128 (67)
|
||||
|
||||
SCT Error Recovery Control:
|
||||
Read: Disabled
|
||||
Write: Disabled
|
||||
|
||||
Device Statistics (GP/SMART Log 0x04) not supported
|
||||
|
||||
Pending Defects log (GP Log 0x0c) not supported
|
||||
|
||||
SATA Phy Event Counters (GP Log 0x11)
|
||||
ID Size Value Description
|
||||
0x0001 2 0 Command failed due to ICRC error
|
||||
0x0002 2 0 R_ERR response for data FIS
|
||||
0x0003 2 0 R_ERR response for device-to-host data FIS
|
||||
0x0004 2 0 R_ERR response for host-to-device data FIS
|
||||
0x0005 2 0 R_ERR response for non-data FIS
|
||||
0x0006 2 0 R_ERR response for device-to-host non-data FIS
|
||||
0x0007 2 0 R_ERR response for host-to-device non-data FIS
|
||||
0x0008 2 0 Device-to-host non-data FIS retries
|
||||
0x0009 2 94 Transition from drive PhyRdy to drive PhyNRdy
|
||||
0x000a 2 4 Device-to-host register FISes sent due to a COMRESET
|
||||
0x000b 2 0 CRC errors within host-to-device FIS
|
||||
0x000d 2 0 Non-CRC errors within host-to-device FIS
|
||||
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
|
||||
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
|
||||
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
|
||||
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
|
||||
|
||||
172
SSD/Samsung/MZ7/MZ7TE128HMGR-000L1/A9CBC205BF8F
Normal file
172
SSD/Samsung/MZ7/MZ7TE128HMGR-000L1/A9CBC205BF8F
Normal file
@@ -0,0 +1,172 @@
|
||||
smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE-p5 amd64] (local build)
|
||||
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
|
||||
|
||||
=== START OF INFORMATION SECTION ===
|
||||
Device Model: SAMSUNG MZ7TE128HMGR-000L1
|
||||
Serial Number: --
|
||||
LU WWN Device Id: 5 002538 ...
|
||||
Firmware Version: EXT06L0Q
|
||||
User Capacity: 128,035,676,160 bytes [128 GB]
|
||||
Sector Size: 512 bytes logical/physical
|
||||
Rotation Rate: Solid State Device
|
||||
TRIM Command: Available
|
||||
Device is: Not in smartctl database 7.3/5319
|
||||
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
|
||||
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s)
|
||||
Local Time is: Sat Feb 11 00:04:39 2023 EET
|
||||
SMART support is: Available - device has SMART capability.
|
||||
SMART support is: Enabled
|
||||
AAM feature is: Unavailable
|
||||
APM feature is: Unavailable
|
||||
Rd look-ahead is: Enabled
|
||||
Write cache is: Enabled
|
||||
DSN feature is: Unavailable
|
||||
ATA Security is: Disabled, frozen [SEC2]
|
||||
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
|
||||
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
|
||||
|
||||
=== START OF READ SMART DATA SECTION ===
|
||||
SMART overall-health self-assessment test result: PASSED
|
||||
|
||||
General SMART Values:
|
||||
Offline data collection status: (0x00) Offline data collection activity
|
||||
was never started.
|
||||
Auto Offline Data Collection: Disabled.
|
||||
Self-test execution status: ( 0) The previous self-test routine completed
|
||||
without error or no self-test has ever
|
||||
been run.
|
||||
Total time to complete Offline
|
||||
data collection: ( 0) seconds.
|
||||
Offline data collection
|
||||
capabilities: (0x53) SMART execute Offline immediate.
|
||||
Auto Offline data collection on/off support.
|
||||
Suspend Offline collection upon new
|
||||
command.
|
||||
No Offline surface scan supported.
|
||||
Self-test supported.
|
||||
No Conveyance Self-test supported.
|
||||
Selective Self-test supported.
|
||||
SMART capabilities: (0x0003) Saves SMART data before entering
|
||||
power-saving mode.
|
||||
Supports SMART auto save timer.
|
||||
Error logging capability: (0x01) Error logging supported.
|
||||
General Purpose Logging supported.
|
||||
Short self-test routine
|
||||
recommended polling time: ( 2) minutes.
|
||||
Extended self-test routine
|
||||
recommended polling time: ( 70) minutes.
|
||||
SCT capabilities: (0x003d) SCT Status supported.
|
||||
SCT Error Recovery Control supported.
|
||||
SCT Feature Control supported.
|
||||
SCT Data Table supported.
|
||||
|
||||
SMART Attributes Data Structure revision number: 1
|
||||
Vendor Specific SMART Attributes with Thresholds:
|
||||
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
|
||||
9 Power_On_Hours -O--CK 094 094 000 - 27705
|
||||
12 Power_Cycle_Count -O--CK 098 098 000 - 1735
|
||||
175 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
|
||||
176 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
|
||||
177 Wear_Leveling_Count PO--C- 089 089 005 - 126
|
||||
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
|
||||
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
|
||||
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 2188
|
||||
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
|
||||
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
|
||||
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
|
||||
184 End-to-End_Error PO--CK 100 100 097 - 0
|
||||
187 Reported_Uncorrect -O--CK 100 100 000 - 0
|
||||
190 Airflow_Temperature_Cel -O--CK 085 049 000 - 15
|
||||
195 Hardware_ECC_Recovered -O-RC- 200 200 000 - 0
|
||||
198 Offline_Uncorrectable ----CK 100 100 000 - 0
|
||||
199 UDMA_CRC_Error_Count -OSRCK 100 100 000 - 0
|
||||
233 Media_Wearout_Indicator -O-RCK 200 199 000 - 0
|
||||
234 Unknown_Attribute -O--C- 100 100 000 - 0
|
||||
235 Unknown_Attribute -O--C- 099 099 000 - 48
|
||||
236 Unknown_Attribute -O--C- 099 099 000 - 78
|
||||
237 Unknown_Attribute -O--C- 099 099 000 - 126
|
||||
238 Unknown_Attribute -O--C- 100 100 000 - 0
|
||||
||||||_ K auto-keep
|
||||
|||||__ C event count
|
||||
||||___ R error rate
|
||||
|||____ S speed/performance
|
||||
||_____ O updated online
|
||||
|______ P prefailure warning
|
||||
|
||||
General Purpose Log Directory Version 1
|
||||
SMART Log Directory Version 1 [multi-sector log support]
|
||||
Address Access R/W Size Description
|
||||
0x00 GPL,SL R/O 1 Log Directory
|
||||
0x01 SL R/O 1 Summary SMART error log
|
||||
0x02 SL R/O 1 Comprehensive SMART error log
|
||||
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
|
||||
0x06 SL R/O 1 SMART self-test log
|
||||
0x07 GPL R/O 1 Extended self-test log
|
||||
0x09 SL R/W 1 Selective self-test log
|
||||
0x10 GPL R/O 1 NCQ Command Error log
|
||||
0x11 GPL R/O 1 SATA Phy Event Counters log
|
||||
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
|
||||
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
|
||||
0xdf GPL,SL VS 1 Device vendor specific log
|
||||
0xe0 GPL,SL R/W 1 SCT Command/Status
|
||||
0xe1 GPL,SL R/W 1 SCT Data Transfer
|
||||
|
||||
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
|
||||
No Errors Logged
|
||||
|
||||
SMART Extended Self-test Log Version: 1 (1 sectors)
|
||||
No self-tests have been logged. [To run self-tests, use: smartctl -t]
|
||||
|
||||
SMART Selective self-test log data structure revision number 1
|
||||
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
|
||||
1 0 0 Not_testing
|
||||
2 0 0 Not_testing
|
||||
3 0 0 Not_testing
|
||||
4 0 0 Not_testing
|
||||
5 0 0 Not_testing
|
||||
Selective self-test flags (0x0):
|
||||
After scanning selected spans, do NOT read-scan remainder of disk.
|
||||
If Selective self-test is pending on power-up, resume after 0 minute delay.
|
||||
|
||||
SCT Status Version: 3
|
||||
SCT Version (vendor specific): 1 (0x0001)
|
||||
Device State: Active (0)
|
||||
Current Temperature: 15 Celsius
|
||||
Power Cycle Min/Max Temperature: ?/ ? Celsius
|
||||
Lifetime Min/Max Temperature: ?/ ? Celsius
|
||||
Under/Over Temperature Limit Count: 0/166218
|
||||
|
||||
SCT Temperature History Version: 2
|
||||
Temperature Sampling Period: 10 minutes
|
||||
Temperature Logging Interval: 10 minutes
|
||||
Min/Max recommended Temperature: ?/ ? Celsius
|
||||
Min/Max Temperature Limit: ?/ ? Celsius
|
||||
Temperature History Size (Index): 128 (0)
|
||||
|
||||
SCT Error Recovery Control:
|
||||
Read: Disabled
|
||||
Write: Disabled
|
||||
|
||||
Device Statistics (GP/SMART Log 0x04) not supported
|
||||
|
||||
Pending Defects log (GP Log 0x0c) not supported
|
||||
|
||||
SATA Phy Event Counters (GP Log 0x11)
|
||||
ID Size Value Description
|
||||
0x0001 2 0 Command failed due to ICRC error
|
||||
0x0002 2 0 R_ERR response for data FIS
|
||||
0x0003 2 0 R_ERR response for device-to-host data FIS
|
||||
0x0004 2 0 R_ERR response for host-to-device data FIS
|
||||
0x0005 2 0 R_ERR response for non-data FIS
|
||||
0x0006 2 0 R_ERR response for device-to-host non-data FIS
|
||||
0x0007 2 0 R_ERR response for host-to-device non-data FIS
|
||||
0x0008 2 0 Device-to-host non-data FIS retries
|
||||
0x0009 2 2 Transition from drive PhyRdy to drive PhyNRdy
|
||||
0x000a 2 2 Device-to-host register FISes sent due to a COMRESET
|
||||
0x000b 2 0 CRC errors within host-to-device FIS
|
||||
0x000d 2 0 Non-CRC errors within host-to-device FIS
|
||||
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
|
||||
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
|
||||
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
|
||||
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
|
||||
|
||||
172
SSD/Samsung/MZ7/MZ7TY128HDHP-000L1/19D95E0150D4
Normal file
172
SSD/Samsung/MZ7/MZ7TY128HDHP-000L1/19D95E0150D4
Normal file
@@ -0,0 +1,172 @@
|
||||
smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE amd64] (local build)
|
||||
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
|
||||
|
||||
=== START OF INFORMATION SECTION ===
|
||||
Model Family: Samsung based SSDs
|
||||
Device Model: SAMSUNG MZ7TY128HDHP-000L1
|
||||
Serial Number: --
|
||||
LU WWN Device Id: 5 002538 ...
|
||||
Firmware Version: MAT04L0Q
|
||||
User Capacity: 128,035,676,160 bytes [128 GB]
|
||||
Sector Size: 512 bytes logical/physical
|
||||
Rotation Rate: Solid State Device
|
||||
Form Factor: 2.5 inches
|
||||
TRIM Command: Available
|
||||
Device is: In smartctl database 7.3/5319
|
||||
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
|
||||
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
|
||||
Local Time is: Fri Jul 29 12:14:18 2022 MDT
|
||||
SMART support is: Available - device has SMART capability.
|
||||
SMART support is: Enabled
|
||||
AAM feature is: Unavailable
|
||||
APM feature is: Unavailable
|
||||
Rd look-ahead is: Enabled
|
||||
Write cache is: Enabled
|
||||
DSN feature is: Unavailable
|
||||
ATA Security is: Disabled, frozen [SEC2]
|
||||
Wt Cache Reorder: Enabled
|
||||
|
||||
=== START OF READ SMART DATA SECTION ===
|
||||
SMART overall-health self-assessment test result: PASSED
|
||||
|
||||
General SMART Values:
|
||||
Offline data collection status: (0x00) Offline data collection activity
|
||||
was never started.
|
||||
Auto Offline Data Collection: Disabled.
|
||||
Self-test execution status: ( 0) The previous self-test routine completed
|
||||
without error or no self-test has ever
|
||||
been run.
|
||||
Total time to complete Offline
|
||||
data collection: ( 0) seconds.
|
||||
Offline data collection
|
||||
capabilities: (0x53) SMART execute Offline immediate.
|
||||
Auto Offline data collection on/off support.
|
||||
Suspend Offline collection upon new
|
||||
command.
|
||||
No Offline surface scan supported.
|
||||
Self-test supported.
|
||||
No Conveyance Self-test supported.
|
||||
Selective Self-test supported.
|
||||
SMART capabilities: (0x0003) Saves SMART data before entering
|
||||
power-saving mode.
|
||||
Supports SMART auto save timer.
|
||||
Error logging capability: (0x01) Error logging supported.
|
||||
General Purpose Logging supported.
|
||||
Short self-test routine
|
||||
recommended polling time: ( 2) minutes.
|
||||
Extended self-test routine
|
||||
recommended polling time: ( 64) minutes.
|
||||
SCT capabilities: (0x003d) SCT Status supported.
|
||||
SCT Error Recovery Control supported.
|
||||
SCT Feature Control supported.
|
||||
SCT Data Table supported.
|
||||
|
||||
SMART Attributes Data Structure revision number: 1
|
||||
Vendor Specific SMART Attributes with Thresholds:
|
||||
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
|
||||
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
|
||||
9 Power_On_Hours -O--CK 098 098 000 - 5875
|
||||
12 Power_Cycle_Count -O--CK 099 099 000 - 257
|
||||
170 Unused_Rsvd_Blk_Ct_Chip -O--CK 100 100 010 - 0
|
||||
171 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
|
||||
172 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
|
||||
173 Wear_Leveling_Count PO--CK 089 089 005 - 88
|
||||
174 Unexpect_Power_Loss_Ct -O--CK 099 099 000 - 125
|
||||
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
|
||||
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 829
|
||||
184 End-to-End_Error PO--CK 100 100 097 - 0
|
||||
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
|
||||
194 Temperature_Celsius -O--CK 074 043 000 - 26 (Min/Max 18/57)
|
||||
199 CRC_Error_Count -OSRCK 100 100 000 - 0
|
||||
233 Media_Wearout_Indicator PO--C- 089 089 001 - 14931721
|
||||
241 Total_LBAs_Written -O--CK 099 099 000 - 3491
|
||||
242 Total_LBAs_Read -O--CK 099 099 000 - 589
|
||||
249 NAND_Writes_1GiB -O--CK 099 099 000 - 11296
|
||||
||||||_ K auto-keep
|
||||
|||||__ C event count
|
||||
||||___ R error rate
|
||||
|||____ S speed/performance
|
||||
||_____ O updated online
|
||||
|______ P prefailure warning
|
||||
|
||||
General Purpose Log Directory Version 1
|
||||
SMART Log Directory Version 1 [multi-sector log support]
|
||||
Address Access R/W Size Description
|
||||
0x00 GPL,SL R/O 1 Log Directory
|
||||
0x01 SL R/O 1 Summary SMART error log
|
||||
0x02 SL R/O 1 Comprehensive SMART error log
|
||||
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
|
||||
0x06 SL R/O 1 SMART self-test log
|
||||
0x07 GPL R/O 1 Extended self-test log
|
||||
0x09 SL R/W 1 Selective self-test log
|
||||
0x10 GPL R/O 1 NCQ Command Error log
|
||||
0x11 GPL R/O 1 SATA Phy Event Counters log
|
||||
0x13 GPL R/O 1 SATA NCQ Send and Receive log
|
||||
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
|
||||
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
|
||||
0xdf GPL,SL VS 1 Device vendor specific log
|
||||
0xe0 GPL,SL R/W 1 SCT Command/Status
|
||||
0xe1 GPL,SL R/W 1 SCT Data Transfer
|
||||
|
||||
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
|
||||
No Errors Logged
|
||||
|
||||
SMART Extended Self-test Log Version: 1 (1 sectors)
|
||||
No self-tests have been logged. [To run self-tests, use: smartctl -t]
|
||||
|
||||
SMART Selective self-test log data structure revision number 1
|
||||
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
|
||||
1 0 0 Not_testing
|
||||
2 0 0 Not_testing
|
||||
3 0 0 Not_testing
|
||||
4 0 0 Not_testing
|
||||
5 0 0 Not_testing
|
||||
255 0 65535 Read_scanning was never started
|
||||
Selective self-test flags (0x0):
|
||||
After scanning selected spans, do NOT read-scan remainder of disk.
|
||||
If Selective self-test is pending on power-up, resume after 0 minute delay.
|
||||
|
||||
SCT Status Version: 3
|
||||
SCT Version (vendor specific): 256 (0x0100)
|
||||
Device State: Active (0)
|
||||
Current Temperature: 26 Celsius
|
||||
Power Cycle Min/Max Temperature: 25/27 Celsius
|
||||
Lifetime Min/Max Temperature: 23/56 Celsius
|
||||
Under/Over Temperature Limit Count: 0/0
|
||||
|
||||
SCT Temperature History Version: 2
|
||||
Temperature Sampling Period: 1 minute
|
||||
Temperature Logging Interval: 10 minutes
|
||||
Min/Max recommended Temperature: 0/70 Celsius
|
||||
Min/Max Temperature Limit: 0/70 Celsius
|
||||
Temperature History Size (Index): 128 (91)
|
||||
|
||||
SCT Error Recovery Control:
|
||||
Read: Disabled
|
||||
Write: Disabled
|
||||
|
||||
Device Statistics (GP/SMART Log 0x04) not supported
|
||||
|
||||
Pending Defects log (GP Log 0x0c) not supported
|
||||
|
||||
SATA Phy Event Counters (GP Log 0x11)
|
||||
ID Size Value Description
|
||||
0x0001 2 0 Command failed due to ICRC error
|
||||
0x0002 2 0 R_ERR response for data FIS
|
||||
0x0003 2 0 R_ERR response for device-to-host data FIS
|
||||
0x0004 2 0 R_ERR response for host-to-device data FIS
|
||||
0x0005 2 0 R_ERR response for non-data FIS
|
||||
0x0006 2 0 R_ERR response for device-to-host non-data FIS
|
||||
0x0007 2 0 R_ERR response for host-to-device non-data FIS
|
||||
0x0008 2 0 Device-to-host non-data FIS retries
|
||||
0x0009 2 2 Transition from drive PhyRdy to drive PhyNRdy
|
||||
0x000a 2 2 Device-to-host register FISes sent due to a COMRESET
|
||||
0x000b 2 0 CRC errors within host-to-device FIS
|
||||
0x000d 2 0 Non-CRC errors within host-to-device FIS
|
||||
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
|
||||
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
|
||||
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
|
||||
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
|
||||
|
||||
|
||||
|
||||
182
SSD/Samsung/MZ7/MZ7TY128HDHP-000L1/1CDDC523FEF9
Normal file
182
SSD/Samsung/MZ7/MZ7TY128HDHP-000L1/1CDDC523FEF9
Normal file
@@ -0,0 +1,182 @@
|
||||
smartctl 7.2 2020-12-30 r5155 [FreeBSD 13.0-RELEASE amd64] (local build)
|
||||
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
|
||||
|
||||
=== START OF INFORMATION SECTION ===
|
||||
Device Model: SAMSUNG MZ7TY128HDHP-000L1
|
||||
Serial Number: --
|
||||
LU WWN Device Id: 5 002538 ...
|
||||
Firmware Version: MAT03L0Q
|
||||
User Capacity: 128,035,676,160 bytes [128 GB]
|
||||
Sector Size: 512 bytes logical/physical
|
||||
Rotation Rate: Solid State Device
|
||||
Form Factor: 2.5 inches
|
||||
TRIM Command: Available
|
||||
Device is: Not in smartctl database [for details use: -P showall]
|
||||
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
|
||||
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
|
||||
Local Time is: Sat Jan 28 02:38:59 2023 EST
|
||||
SMART support is: Available - device has SMART capability.
|
||||
SMART support is: Enabled
|
||||
AAM feature is: Unavailable
|
||||
APM feature is: Unavailable
|
||||
Rd look-ahead is: Enabled
|
||||
Write cache is: Enabled
|
||||
DSN feature is: Unavailable
|
||||
ATA Security is: Disabled, frozen [SEC2]
|
||||
Wt Cache Reorder: Enabled
|
||||
|
||||
=== START OF READ SMART DATA SECTION ===
|
||||
SMART overall-health self-assessment test result: PASSED
|
||||
|
||||
General SMART Values:
|
||||
Offline data collection status: (0x00) Offline data collection activity
|
||||
was never started.
|
||||
Auto Offline Data Collection: Disabled.
|
||||
Self-test execution status: ( 0) The previous self-test routine completed
|
||||
without error or no self-test has ever
|
||||
been run.
|
||||
Total time to complete Offline
|
||||
data collection: ( 0) seconds.
|
||||
Offline data collection
|
||||
capabilities: (0x53) SMART execute Offline immediate.
|
||||
Auto Offline data collection on/off support.
|
||||
Suspend Offline collection upon new
|
||||
command.
|
||||
No Offline surface scan supported.
|
||||
Self-test supported.
|
||||
No Conveyance Self-test supported.
|
||||
Selective Self-test supported.
|
||||
SMART capabilities: (0x0003) Saves SMART data before entering
|
||||
power-saving mode.
|
||||
Supports SMART auto save timer.
|
||||
Error logging capability: (0x01) Error logging supported.
|
||||
General Purpose Logging supported.
|
||||
Short self-test routine
|
||||
recommended polling time: ( 2) minutes.
|
||||
Extended self-test routine
|
||||
recommended polling time: ( 64) minutes.
|
||||
SCT capabilities: (0x003d) SCT Status supported.
|
||||
SCT Error Recovery Control supported.
|
||||
SCT Feature Control supported.
|
||||
SCT Data Table supported.
|
||||
|
||||
SMART Attributes Data Structure revision number: 1
|
||||
Vendor Specific SMART Attributes with Thresholds:
|
||||
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
|
||||
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
|
||||
9 Power_On_Hours -O--CK 096 096 000 - 15192
|
||||
12 Power_Cycle_Count -O--CK 095 095 000 - 4174
|
||||
170 Unknown_Attribute -O--CK 100 100 010 - 0
|
||||
171 Unknown_Attribute -O--CK 100 100 010 - 0
|
||||
172 Unknown_Attribute -O--CK 100 100 010 - 0
|
||||
173 Unknown_Attribute PO--CK 039 039 005 - 513
|
||||
174 Unknown_Attribute -O--CK 099 099 000 - 220
|
||||
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
|
||||
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 894
|
||||
184 End-to-End_Error PO--CK 100 100 097 - 0
|
||||
187 Reported_Uncorrect -O--CK 100 100 000 - 0
|
||||
194 Temperature_Celsius -O--CK 064 037 000 - 36 (Min/Max 19/63)
|
||||
199 UDMA_CRC_Error_Count -OSRCK 100 100 000 - 0
|
||||
233 Media_Wearout_Indicator PO--C- 036 036 001 - 6018825
|
||||
241 Total_LBAs_Written -O--CK 099 099 000 - 17136
|
||||
242 Total_LBAs_Read -O--CK 099 099 000 - 16191
|
||||
249 Unknown_Attribute -O--CK 099 099 000 - 65680
|
||||
||||||_ K auto-keep
|
||||
|||||__ C event count
|
||||
||||___ R error rate
|
||||
|||____ S speed/performance
|
||||
||_____ O updated online
|
||||
|______ P prefailure warning
|
||||
|
||||
General Purpose Log Directory Version 1
|
||||
SMART Log Directory Version 1 [multi-sector log support]
|
||||
Address Access R/W Size Description
|
||||
0x00 GPL,SL R/O 1 Log Directory
|
||||
0x01 SL R/O 1 Summary SMART error log
|
||||
0x02 SL R/O 1 Comprehensive SMART error log
|
||||
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
|
||||
0x06 SL R/O 1 SMART self-test log
|
||||
0x07 GPL R/O 1 Extended self-test log
|
||||
0x09 SL R/W 1 Selective self-test log
|
||||
0x10 GPL R/O 1 NCQ Command Error log
|
||||
0x11 GPL R/O 1 SATA Phy Event Counters log
|
||||
0x13 GPL R/O 1 SATA NCQ Send and Receive log
|
||||
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
|
||||
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
|
||||
0xdf GPL,SL VS 1 Device vendor specific log
|
||||
0xe0 GPL,SL R/W 1 SCT Command/Status
|
||||
0xe1 GPL,SL R/W 1 SCT Data Transfer
|
||||
|
||||
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
|
||||
No Errors Logged
|
||||
|
||||
SMART Extended Self-test Log Version: 1 (1 sectors)
|
||||
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
|
||||
# 1 Short offline Aborted by host 90% 5807 -
|
||||
# 2 Short offline Aborted by host 90% 5807 -
|
||||
# 3 Short offline Aborted by host 90% 5806 -
|
||||
# 4 Short offline Aborted by host 90% 5806 -
|
||||
# 5 Short offline Aborted by host 90% 5805 -
|
||||
# 6 Short offline Aborted by host 90% 5805 -
|
||||
# 7 Short offline Aborted by host 90% 5805 -
|
||||
# 8 Short offline Aborted by host 90% 5805 -
|
||||
# 9 Short offline Completed without error 00% 4150 -
|
||||
#10 Short offline Completed without error 00% 4149 -
|
||||
#11 Short offline Completed without error 00% 4148 -
|
||||
#12 Short offline Completed without error 00% 3770 -
|
||||
#13 Short offline Completed without error 00% 0 -
|
||||
|
||||
SMART Selective self-test log data structure revision number 1
|
||||
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
|
||||
1 0 0 Not_testing
|
||||
2 0 0 Not_testing
|
||||
3 0 0 Not_testing
|
||||
4 0 0 Not_testing
|
||||
5 0 0 Not_testing
|
||||
255 0 65535 Read_scanning was never started
|
||||
Selective self-test flags (0x0):
|
||||
After scanning selected spans, do NOT read-scan remainder of disk.
|
||||
If Selective self-test is pending on power-up, resume after 0 minute delay.
|
||||
|
||||
SCT Status Version: 3
|
||||
SCT Version (vendor specific): 256 (0x0100)
|
||||
Device State: Active (0)
|
||||
Current Temperature: 36 Celsius
|
||||
Power Cycle Min/Max Temperature: 30/36 Celsius
|
||||
Lifetime Min/Max Temperature: 22/60 Celsius
|
||||
Under/Over Temperature Limit Count: 0/0
|
||||
|
||||
SCT Temperature History Version: 2
|
||||
Temperature Sampling Period: 1 minute
|
||||
Temperature Logging Interval: 10 minutes
|
||||
Min/Max recommended Temperature: 0/70 Celsius
|
||||
Min/Max Temperature Limit: 0/70 Celsius
|
||||
Temperature History Size (Index): 128 (56)
|
||||
|
||||
SCT Error Recovery Control:
|
||||
Read: Disabled
|
||||
Write: Disabled
|
||||
|
||||
Device Statistics (GP/SMART Log 0x04) not supported
|
||||
|
||||
Pending Defects log (GP Log 0x0c) not supported
|
||||
|
||||
SATA Phy Event Counters (GP Log 0x11)
|
||||
ID Size Value Description
|
||||
0x0001 2 0 Command failed due to ICRC error
|
||||
0x0002 2 0 R_ERR response for data FIS
|
||||
0x0003 2 0 R_ERR response for device-to-host data FIS
|
||||
0x0004 2 0 R_ERR response for host-to-device data FIS
|
||||
0x0005 2 0 R_ERR response for non-data FIS
|
||||
0x0006 2 0 R_ERR response for device-to-host non-data FIS
|
||||
0x0007 2 0 R_ERR response for host-to-device non-data FIS
|
||||
0x0008 2 0 Device-to-host non-data FIS retries
|
||||
0x0009 2 4934 Transition from drive PhyRdy to drive PhyNRdy
|
||||
0x000a 2 9 Device-to-host register FISes sent due to a COMRESET
|
||||
0x000b 2 0 CRC errors within host-to-device FIS
|
||||
0x000d 2 0 Non-CRC errors within host-to-device FIS
|
||||
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
|
||||
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
|
||||
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
|
||||
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
|
||||
|
||||
173
SSD/Samsung/MZ7/MZ7TY128HDHP-000L1/C7EEF211759F
Normal file
173
SSD/Samsung/MZ7/MZ7TY128HDHP-000L1/C7EEF211759F
Normal file
@@ -0,0 +1,173 @@
|
||||
smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.0-STABLE amd64] (local build)
|
||||
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
|
||||
|
||||
=== START OF INFORMATION SECTION ===
|
||||
Model Family: Samsung based SSDs
|
||||
Device Model: SAMSUNG MZ7TY128HDHP-000L1
|
||||
Serial Number: --
|
||||
LU WWN Device Id: 5 002538 ...
|
||||
Firmware Version: MAT04L0Q
|
||||
User Capacity: 128,035,676,160 bytes [128 GB]
|
||||
Sector Size: 512 bytes logical/physical
|
||||
Rotation Rate: Solid State Device
|
||||
Form Factor: 2.5 inches
|
||||
TRIM Command: Available
|
||||
Device is: In smartctl database 7.3/5319
|
||||
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
|
||||
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
|
||||
Local Time is: Sun Jul 3 09:17:55 2022 CEST
|
||||
SMART support is: Available - device has SMART capability.
|
||||
SMART support is: Enabled
|
||||
AAM feature is: Unavailable
|
||||
APM feature is: Unavailable
|
||||
Rd look-ahead is: Enabled
|
||||
Write cache is: Enabled
|
||||
DSN feature is: Unavailable
|
||||
ATA Security is: Disabled, frozen [SEC2]
|
||||
Wt Cache Reorder: Enabled
|
||||
|
||||
=== START OF READ SMART DATA SECTION ===
|
||||
SMART overall-health self-assessment test result: PASSED
|
||||
|
||||
General SMART Values:
|
||||
Offline data collection status: (0x00) Offline data collection activity
|
||||
was never started.
|
||||
Auto Offline Data Collection: Disabled.
|
||||
Self-test execution status: ( 0) The previous self-test routine completed
|
||||
without error or no self-test has ever
|
||||
been run.
|
||||
Total time to complete Offline
|
||||
data collection: ( 0) seconds.
|
||||
Offline data collection
|
||||
capabilities: (0x53) SMART execute Offline immediate.
|
||||
Auto Offline data collection on/off support.
|
||||
Suspend Offline collection upon new
|
||||
command.
|
||||
No Offline surface scan supported.
|
||||
Self-test supported.
|
||||
No Conveyance Self-test supported.
|
||||
Selective Self-test supported.
|
||||
SMART capabilities: (0x0003) Saves SMART data before entering
|
||||
power-saving mode.
|
||||
Supports SMART auto save timer.
|
||||
Error logging capability: (0x01) Error logging supported.
|
||||
General Purpose Logging supported.
|
||||
Short self-test routine
|
||||
recommended polling time: ( 2) minutes.
|
||||
Extended self-test routine
|
||||
recommended polling time: ( 64) minutes.
|
||||
SCT capabilities: (0x003d) SCT Status supported.
|
||||
SCT Error Recovery Control supported.
|
||||
SCT Feature Control supported.
|
||||
SCT Data Table supported.
|
||||
|
||||
SMART Attributes Data Structure revision number: 1
|
||||
Vendor Specific SMART Attributes with Thresholds:
|
||||
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
|
||||
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
|
||||
9 Power_On_Hours -O--CK 097 097 000 - 12145
|
||||
12 Power_Cycle_Count -O--CK 097 097 000 - 2751
|
||||
170 Unused_Rsvd_Blk_Ct_Chip -O--CK 100 100 010 - 0
|
||||
171 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
|
||||
172 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
|
||||
173 Wear_Leveling_Count PO--CK 089 089 005 - 92
|
||||
174 Unexpect_Power_Loss_Ct -O--CK 099 099 000 - 107
|
||||
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
|
||||
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 913
|
||||
184 End-to-End_Error PO--CK 100 100 097 - 0
|
||||
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
|
||||
194 Temperature_Celsius -O--CK 067 045 000 - 33 (Min/Max 14/55)
|
||||
199 CRC_Error_Count -OSRCK 099 099 000 - 1
|
||||
233 Media_Wearout_Indicator PO--C- 088 088 001 - 14847835
|
||||
241 Total_LBAs_Written -O--CK 099 099 000 - 9847
|
||||
242 Total_LBAs_Read -O--CK 099 099 000 - 13754
|
||||
249 NAND_Writes_1GiB -O--CK 099 099 000 - 11808
|
||||
||||||_ K auto-keep
|
||||
|||||__ C event count
|
||||
||||___ R error rate
|
||||
|||____ S speed/performance
|
||||
||_____ O updated online
|
||||
|______ P prefailure warning
|
||||
|
||||
General Purpose Log Directory Version 1
|
||||
SMART Log Directory Version 1 [multi-sector log support]
|
||||
Address Access R/W Size Description
|
||||
0x00 GPL,SL R/O 1 Log Directory
|
||||
0x01 SL R/O 1 Summary SMART error log
|
||||
0x02 SL R/O 1 Comprehensive SMART error log
|
||||
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
|
||||
0x06 SL R/O 1 SMART self-test log
|
||||
0x07 GPL R/O 1 Extended self-test log
|
||||
0x09 SL R/W 1 Selective self-test log
|
||||
0x10 GPL R/O 1 NCQ Command Error log
|
||||
0x11 GPL R/O 1 SATA Phy Event Counters log
|
||||
0x13 GPL R/O 1 SATA NCQ Send and Receive log
|
||||
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
|
||||
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
|
||||
0xdf GPL,SL VS 1 Device vendor specific log
|
||||
0xe0 GPL,SL R/W 1 SCT Command/Status
|
||||
0xe1 GPL,SL R/W 1 SCT Data Transfer
|
||||
|
||||
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
|
||||
No Errors Logged
|
||||
|
||||
SMART Extended Self-test Log Version: 1 (1 sectors)
|
||||
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
|
||||
# 1 Short offline Completed without error 00% 919 -
|
||||
# 2 Short offline Completed without error 00% 271 -
|
||||
# 3 Short offline Completed without error 00% 237 -
|
||||
|
||||
SMART Selective self-test log data structure revision number 1
|
||||
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
|
||||
1 0 0 Not_testing
|
||||
2 0 0 Not_testing
|
||||
3 0 0 Not_testing
|
||||
4 0 0 Not_testing
|
||||
5 0 0 Not_testing
|
||||
255 0 65535 Read_scanning was never started
|
||||
Selective self-test flags (0x0):
|
||||
After scanning selected spans, do NOT read-scan remainder of disk.
|
||||
If Selective self-test is pending on power-up, resume after 0 minute delay.
|
||||
|
||||
SCT Status Version: 3
|
||||
SCT Version (vendor specific): 256 (0x0100)
|
||||
Device State: Active (0)
|
||||
Current Temperature: 32 Celsius
|
||||
Power Cycle Min/Max Temperature: 29/35 Celsius
|
||||
Lifetime Min/Max Temperature: 17/53 Celsius
|
||||
Under/Over Temperature Limit Count: 0/0
|
||||
|
||||
SCT Temperature History Version: 2
|
||||
Temperature Sampling Period: 1 minute
|
||||
Temperature Logging Interval: 10 minutes
|
||||
Min/Max recommended Temperature: 0/70 Celsius
|
||||
Min/Max Temperature Limit: 0/70 Celsius
|
||||
Temperature History Size (Index): 128 (74)
|
||||
|
||||
SCT Error Recovery Control:
|
||||
Read: Disabled
|
||||
Write: Disabled
|
||||
|
||||
Device Statistics (GP/SMART Log 0x04) not supported
|
||||
|
||||
Pending Defects log (GP Log 0x0c) not supported
|
||||
|
||||
SATA Phy Event Counters (GP Log 0x11)
|
||||
ID Size Value Description
|
||||
0x0001 2 0 Command failed due to ICRC error
|
||||
0x0002 2 0 R_ERR response for data FIS
|
||||
0x0003 2 0 R_ERR response for device-to-host data FIS
|
||||
0x0004 2 0 R_ERR response for host-to-device data FIS
|
||||
0x0005 2 0 R_ERR response for non-data FIS
|
||||
0x0006 2 0 R_ERR response for device-to-host non-data FIS
|
||||
0x0007 2 0 R_ERR response for host-to-device non-data FIS
|
||||
0x0008 2 0 Device-to-host non-data FIS retries
|
||||
0x0009 2 20 Transition from drive PhyRdy to drive PhyNRdy
|
||||
0x000a 2 20 Device-to-host register FISes sent due to a COMRESET
|
||||
0x000b 2 0 CRC errors within host-to-device FIS
|
||||
0x000d 2 0 Non-CRC errors within host-to-device FIS
|
||||
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
|
||||
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
|
||||
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
|
||||
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
|
||||
|
||||
Reference in New Issue
Block a user