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Andrey Ponomarenko
2023-02-14 01:25:13 +03:00
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smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE amd64] (local build)
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG SSD PM851 2.5 7mm 128GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT08D0Q
User Capacity: 128,035,676,160 bytes [128 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: Not in smartctl database 7.3/5319
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sun Aug 14 02:41:02 2022 EDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 70) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
12 Power_Cycle_Count -O--CK 099 099 000 - 222
175 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
176 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
177 Wear_Leveling_Count PO--C- 063 063 005 - 437
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 2201
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
195 Hardware_ECC_Recovered -O-RC- 200 200 000 - 0
241 Total_LBAs_Written -O--CK 099 099 000 - 58296026190
242 Total_LBAs_Read -O--CK 099 099 000 - 55269454298
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 16 Device vendor specific log
0xce GPL,SL VS 16 Device vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 0 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 33 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/244712
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (105)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 50 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 50 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

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smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE-p5 amd64] (local build)
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG SSD PM851 2.5 7mm 256GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT08D0Q
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: Not in smartctl database 7.3/5319
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Thu Jan 5 17:56:47 2023 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
See vendor-specific Attribute list for marginal Attributes.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 80) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
12 Power_Cycle_Count -O--CK 097 097 000 - 2262
175 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
176 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
177 Wear_Leveling_Count PO--C- 086 086 005 - 160
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 001 010 Past 0
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 001 010 Past 0
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 4414
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
195 Hardware_ECC_Recovered -O-RC- 200 200 000 - 0
241 Total_LBAs_Written -O--CK 099 099 000 - 66049035424
242 Total_LBAs_Read -O--CK 099 099 000 - 16989615960
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 16 Device vendor specific log
0xce GPL,SL VS 16 Device vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 0 -
# 2 Extended offline Completed without error 00% 0 -
# 3 Short offline Completed without error 00% 0 -
# 4 Extended offline Completed without error 00% 0 -
# 5 Short offline Completed without error 00% 0 -
# 6 Short offline Completed without error 00% 0 -
# 7 Short offline Completed without error 00% 0 -
# 8 Short offline Completed without error 00% 0 -
# 9 Short offline Completed without error 00% 0 -
#10 Short offline Completed without error 00% 0 -
#11 Short offline Completed without error 00% 0 -
#12 Extended offline Completed without error 00% 0 -
#13 Short offline Completed without error 00% 0 -
#14 Short offline Completed without error 00% 0 -
#15 Short offline Completed without error 00% 0 -
#16 Short offline Completed without error 00% 0 -
#17 Short offline Completed without error 00% 0 -
#18 Short offline Completed without error 00% 0 -
#19 Short offline Completed without error 00% 0 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 41 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/130231
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (42)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 23 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 23 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

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smartctl 7.3 2022-02-28 r5338 [FreeBSD 14.0-CURRENT amd64] (local build)
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG SSD PM851 mSATA 256GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT48D0Q
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database 7.3/5319
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sat Nov 12 13:52:12 2022 MST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 80) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 099 099 010 - 1
12 Power_Cycle_Count -O--CK 099 099 000 - 911
175 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
176 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
177 Wear_Leveling_Count PO--C- 080 080 005 - 236
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 099 099 010 - 1
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 099 099 010 - 1
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 099 100 010 - 4284
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
241 Total_LBAs_Written -O--CK 099 099 000 - 75677867090
242 Total_LBAs_Read -O--CK 099 099 000 - 54583766864
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 16 Device vendor specific log
0xce GPL,SL VS 16 Device vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 0 -
# 2 Short offline Completed without error 00% 0 -
# 3 Short offline Completed without error 00% 0 -
# 4 Short offline Completed without error 00% 0 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 27 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/171760
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (0)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 3 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 3 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

169
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smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE amd64] (local build)
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG SSD PM851 mSATA 256GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT48D0Q
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database 7.3/5319
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Mon Feb 6 03:56:28 2023 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART Status not supported: Incomplete response, ATA output registers missing
SMART overall-health self-assessment test result: PASSED
Warning: This result is based on an Attribute check.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 80) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
12 Power_Cycle_Count -O--CK 097 097 000 - 2355
175 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
176 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
177 Wear_Leveling_Count PO--C- 091 091 005 - 97
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 4365
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
241 Total_LBAs_Written -O--CK 099 099 000 - 29257239200
242 Total_LBAs_Read -O--CK 099 099 000 - 136285372403
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 16 Device vendor specific log
0xce GPL,SL VS 16 Device vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 0 -
# 2 Short offline Completed without error 00% 0 -
# 3 Short offline Completed without error 00% 0 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 33 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/130703
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (0)
SMART WRITE LOG does not return COUNT and LBA_LOW register
SCT (Get) Error Recovery Control command failed
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 3 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 3 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

169
SSD/Samsung/SSD PM851/SSD PM851 mSATA 512GB/FAE207BD299B Normal file
View File

@@ -0,0 +1,169 @@
smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE amd64] (local build)
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG SSD PM851 mSATA 512GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT48D0Q
User Capacity: 512,110,190,592 bytes [512 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database 7.3/5319
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sun May 22 12:49:13 2022 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
See vendor-specific Attribute list for marginal Attributes.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 110) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
12 Power_Cycle_Count -O--CK 099 099 000 - 962
175 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
176 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
177 Wear_Leveling_Count PO--C- 098 098 005 - 15
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 001 010 Past 8615
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
241 Total_LBAs_Written -O--CK 099 099 000 - 8319479680
242 Total_LBAs_Read -O--CK 099 099 000 - 11893022030
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 16 Device vendor specific log
0xce GPL,SL VS 16 Device vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 0 -
# 2 Short offline Completed without error 00% 0 -
# 3 Short offline Completed without error 00% 0 -
# 4 Short offline Completed without error 00% 0 -
# 5 Short offline Completed without error 00% 0 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 38 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/12936
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (25)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 25 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 25 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC