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Update of reports (new: 3633, modified: 0)
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SSD/Team/TEAML5/TEAML5Lite3D120G/A424FD6B5B86
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SSD/Team/TEAML5/TEAML5Lite3D120G/A424FD6B5B86
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smartctl 7.3 2022-02-28 r5338 [OpenBSD 7.2 amd64] (local build)
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Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
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=== START OF INFORMATION SECTION ===
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Model Family: Silicon Motion based SSDs
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Device Model: TEAML5Lite3D120G
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Serial Number: --
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Firmware Version: Q0410A
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User Capacity: 120,034,123,776 bytes [120 GB]
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Sector Size: 512 bytes logical/physical
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Rotation Rate: Solid State Device
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TRIM Command: Available, deterministic, zeroed
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Device is: In smartctl database 7.3/5319
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ATA Version is: ACS-2 (minor revision not indicated)
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SATA Version is: SATA 3.2, 6.0 Gb/s (current: 3.0 Gb/s)
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Local Time is: Sun Dec 18 23:40:21 2022 CST
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SMART support is: Available - device has SMART capability.
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SMART support is: Enabled
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=== START OF READ SMART DATA SECTION ===
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SMART Status not supported: Incomplete response, ATA output registers missing
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SMART overall-health self-assessment test result: PASSED
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Warning: This result is based on an Attribute check.
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General SMART Values:
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Offline data collection status: (0x02) Offline data collection activity
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was completed without error.
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Auto Offline Data Collection: Disabled.
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Self-test execution status: ( 0) The previous self-test routine completed
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without error or no self-test has ever
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been run.
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Total time to complete Offline
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data collection: ( 60) seconds.
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Offline data collection
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capabilities: (0x71) SMART execute Offline immediate.
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No Auto Offline data collection support.
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Suspend Offline collection upon new
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command.
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No Offline surface scan supported.
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Self-test supported.
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Conveyance Self-test supported.
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Selective Self-test supported.
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SMART capabilities: (0x0003) Saves SMART data before entering
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power-saving mode.
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Supports SMART auto save timer.
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Error logging capability: (0x01) Error logging supported.
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General Purpose Logging supported.
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Short self-test routine
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recommended polling time: ( 1) minutes.
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Extended self-test routine
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recommended polling time: ( 2) minutes.
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Conveyance self-test routine
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recommended polling time: ( 1) minutes.
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SCT capabilities: (0x0035) SCT Status supported.
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SCT Feature Control supported.
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SCT Data Table supported.
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SMART Attributes Data Structure revision number: 1
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Vendor Specific SMART Attributes with Thresholds:
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ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
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1 Raw_Read_Error_Rate 0x0000 100 100 000 Old_age Offline - 0
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5 Reallocated_Sector_Ct 0x0000 100 100 000 Old_age Offline - 0
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9 Power_On_Hours 0x0000 100 100 000 Old_age Offline - 3461
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12 Power_Cycle_Count 0x0000 100 100 000 Old_age Offline - 2461
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160 Uncorrectable_Error_Cnt 0x0000 100 100 000 Old_age Offline - 0
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161 Valid_Spare_Block_Cnt 0x0000 100 100 000 Old_age Offline - 84
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163 Initial_Bad_Block_Count 0x0000 100 100 000 Old_age Offline - 4
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164 Total_Erase_Count 0x0000 100 100 000 Old_age Offline - 81129
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165 Max_Erase_Count 0x0000 100 100 000 Old_age Offline - 115
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166 Min_Erase_Count 0x0000 100 100 000 Old_age Offline - 15
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167 Average_Erase_Count 0x0000 100 100 000 Old_age Offline - 62
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168 Max_Erase_Count_of_Spec 0x0000 100 100 000 Old_age Offline - 1000
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169 Remaining_Lifetime_Perc 0x0000 100 100 000 Old_age Offline - 94
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175 Program_Fail_Count_Chip 0x0000 100 100 000 Old_age Offline - 0
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176 Erase_Fail_Count_Chip 0x0000 100 100 000 Old_age Offline - 0
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177 Wear_Leveling_Count 0x0000 100 100 050 Old_age Offline - 26
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178 Runtime_Invalid_Blk_Cnt 0x0000 100 100 000 Old_age Offline - 0
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181 Program_Fail_Cnt_Total 0x0000 100 100 000 Old_age Offline - 0
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182 Erase_Fail_Count_Total 0x0000 100 100 000 Old_age Offline - 0
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192 Power-Off_Retract_Count 0x0000 100 100 000 Old_age Offline - 133
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194 Temperature_Celsius 0x0000 100 100 000 Old_age Offline - 35
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195 Hardware_ECC_Recovered 0x0000 100 100 000 Old_age Offline - 0
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196 Reallocated_Event_Count 0x0000 100 100 016 Old_age Offline - 0
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197 Current_Pending_Sector 0x0000 100 100 000 Old_age Offline - 0
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198 Offline_Uncorrectable 0x0000 100 100 000 Old_age Offline - 0
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199 UDMA_CRC_Error_Count 0x0003 100 100 050 Pre-fail Always - 0
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232 Available_Reservd_Space 0x0000 100 100 000 Old_age Offline - 100
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241 Host_Writes_32MiB 0x0000 100 100 000 Old_age Offline - 97700
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242 Host_Reads_32MiB 0x0000 100 100 000 Old_age Offline - 78722
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245 TLC_Writes_32MiB 0x0000 100 100 000 Old_age Offline - 162258
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SMART Error Log Version: 1
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Warning: ATA error count 0 inconsistent with error log pointer 1
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ATA Error Count: 0
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CR = Command Register [HEX]
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FR = Features Register [HEX]
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SC = Sector Count Register [HEX]
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SN = Sector Number Register [HEX]
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CL = Cylinder Low Register [HEX]
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CH = Cylinder High Register [HEX]
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DH = Device/Head Register [HEX]
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DC = Device Command Register [HEX]
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ER = Error register [HEX]
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ST = Status register [HEX]
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Powered_Up_Time is measured from power on, and printed as
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DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
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SS=sec, and sss=millisec. It "wraps" after 49.710 days.
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Error 0 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
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When the command that caused the error occurred, the device was in an unknown state.
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After command completion occurred, registers were:
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ER ST SC SN CL CH DH
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-- -- -- -- -- -- --
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00 ec 00 00 00 00 00 Device Fault
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Commands leading to the command that caused the error were:
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CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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-- -- -- -- -- -- -- -- ---------------- --------------------
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c8 00 00 00 00 00 00 00 00:00:00.000 READ DMA
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Warning! SMART Self-Test Log Structure error: invalid SMART checksum.
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SMART Self-test log structure revision number 1
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Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
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# 1 Short offline Completed without error 00% 23 -
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SMART Selective self-test log data structure revision number 1
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SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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1 0 0 Not_testing
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2 0 0 Not_testing
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3 0 0 Not_testing
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4 0 0 Not_testing
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5 0 0 Not_testing
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7 0 65535 Read_scanning was completed without error
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Selective self-test flags (0x0):
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After scanning selected spans, do NOT read-scan remainder of disk.
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If Selective self-test is pending on power-up, resume after 0 minute delay.
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