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Andrey Ponomarenko
2023-02-14 01:25:13 +03:00
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smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE amd64] (local build)
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Silicon Motion based SSDs
Device Model: TS256GSSD230S
Serial Number: --
LU WWN Device Id: 5 7c3548 ...
Firmware Version: R0427BNR
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic, zeroed
Device is: In smartctl database 7.3/5319
ATA Version is: ACS-3 T13/2161-D revision 5
SATA Version is: SATA 3.3, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Sat Jul 30 16:55:43 2022 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM level is: 254 (maximum performance)
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x85) Offline data collection activity
was aborted by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0002) Does not save SMART data before
entering power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 30) minutes.
Conveyance self-test routine
recommended polling time: ( 2) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate ------ 100 100 000 - 0
5 Reallocated_Sector_Ct ------ 100 100 000 - 0
9 Power_On_Hours ------ 100 100 000 - 2788
12 Power_Cycle_Count ------ 100 100 000 - 866
148 Total_SLC_Erase_Ct ------ 100 100 000 - 6686
149 Max_SLC_Erase_Ct ------ 100 100 000 - 490
150 Min_SLC_Erase_Ct ------ 100 100 000 - 383
151 Average_SLC_Erase_Ct ------ 100 100 000 - 445
159 DRAM_1_Bit_Error_Count ------ 100 100 000 - 0
160 Uncorrectable_Error_Cnt ------ 100 100 000 - 0
161 Valid_Spare_Block_Cnt ------ 100 100 000 - 49
163 Initial_Bad_Block_Count ------ 100 100 000 - 8
164 Total_Erase_Count ------ 100 100 000 - 46930
165 Max_Erase_Count ------ 100 100 000 - 122
166 Min_Erase_Count ------ 100 100 000 - 35
167 Average_Erase_Count ------ 100 100 000 - 98
168 Max_Erase_Count_of_Spec ------ 100 100 000 - 1500
169 Remaining_Lifetime_Perc ------ 100 100 000 - 94
177 Wear_Leveling_Count ------ 100 100 050 - 0
181 Program_Fail_Cnt_Total ------ 100 100 000 - 0
182 Erase_Fail_Count_Total ------ 100 100 000 - 0
192 Power-Off_Retract_Count ------ 100 100 000 - 73
194 Temperature_Celsius ------ 100 100 000 - 45
195 Hardware_ECC_Recovered ------ 100 100 000 - 0
196 Reallocated_Event_Count ------ 100 100 016 - 0
199 UDMA_CRC_Error_Count ------ 100 100 050 - 1
232 Available_Reservd_Space ------ 100 100 000 - 100
241 Host_Writes_32MiB ------ 100 100 000 - 182612
242 Host_Reads_32MiB ------ 100 100 000 - 294873
245 TLC_Writes_32MiB ------ 100 100 000 - 844740
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x24 GPL R/O 88 Current Device Internal Status Data log
0x25 GPL R/O 128 Saved Device Internal Status Data log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
Read SMART Selective Self-test Log failed: Input/output error
SCT Commands not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 866 --- Lifetime Power-On Resets
0x01 0x010 4 2788 --- Power-on Hours
0x01 0x018 6 3377761335 --- Logical Sectors Written
0x01 0x020 6 299277762 --- Number of Write Commands
0x01 0x028 6 2144930106 --- Logical Sectors Read
0x01 0x030 6 641129424 --- Number of Read Commands
0x01 0x038 6 4294967296 --- Date and Time TimeStamp
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 74 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 45 --- Current Temperature
0x05 0x010 1 41 --- Average Short Term Temperature
0x05 0x018 1 39 --- Average Long Term Temperature
0x05 0x020 1 72 --- Highest Temperature
0x05 0x028 1 0 --- Lowest Temperature
0x05 0x030 1 59 --- Highest Average Short Term Temperature
0x05 0x038 1 38 --- Lowest Average Short Term Temperature
0x05 0x040 1 57 --- Highest Average Long Term Temperature
0x05 0x048 1 38 --- Lowest Average Long Term Temperature
0x05 0x050 4 38 --- Time in Over-Temperature
0x05 0x058 1 70 --- Specified Maximum Operating Temperature
0x05 0x060 4 0 --- Time in Under-Temperature
0x05 0x068 1 0 --- Specified Minimum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 2407 --- Number of Hardware Resets
0x06 0x010 4 198 --- Number of ASR Events
0x06 0x018 4 1 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 6 --- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 0 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 5 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

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smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.0-STABLE amd64] (local build)
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Silicon Motion based SSDs
Device Model: TS256GSSD230S
Serial Number: --
LU WWN Device Id: 5 7c3548 ...
Firmware Version: R0427GN1
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic, zeroed
Device is: In smartctl database 7.3/5319
ATA Version is: ACS-3 T13/2161-D revision 5
SATA Version is: SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Jul 5 22:58:07 2022 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM level is: 254 (maximum performance)
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x80) Offline data collection activity
was never started.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0002) Does not save SMART data before
entering power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 30) minutes.
Conveyance self-test routine
recommended polling time: ( 2) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate ------ 100 100 000 - 0
5 Reallocated_Sector_Ct ------ 100 100 000 - 0
9 Power_On_Hours ------ 100 100 000 - 135
12 Power_Cycle_Count ------ 100 100 000 - 12
148 Total_SLC_Erase_Ct ------ 100 100 000 - 4
149 Max_SLC_Erase_Ct ------ 100 100 000 - 1
150 Min_SLC_Erase_Ct ------ 100 100 000 - 0
151 Average_SLC_Erase_Ct ------ 100 100 000 - 0
159 DRAM_1_Bit_Error_Count ------ 100 100 000 - 0
160 Uncorrectable_Error_Cnt ------ 100 100 000 - 0
161 Valid_Spare_Block_Cnt ------ 100 100 000 - 28
163 Initial_Bad_Block_Count ------ 100 100 000 - 29
164 Total_Erase_Count ------ 100 100 000 - 11
165 Max_Erase_Count ------ 100 100 000 - 2
166 Min_Erase_Count ------ 100 100 000 - 0
167 Average_Erase_Count ------ 100 100 000 - 0
168 Max_Erase_Count_of_Spec ------ 100 100 000 - 1500
169 Remaining_Lifetime_Perc ------ 100 100 000 - 100
177 Wear_Leveling_Count ------ 100 100 050 - 0
181 Program_Fail_Cnt_Total ------ 100 100 000 - 0
182 Erase_Fail_Count_Total ------ 100 100 000 - 0
192 Power-Off_Retract_Count ------ 100 100 000 - 1
194 Temperature_Celsius ------ 100 100 000 - 30
195 Hardware_ECC_Recovered ------ 100 100 000 - 0
196 Reallocated_Event_Count ------ 100 100 016 - 0
199 UDMA_CRC_Error_Count ------ 100 100 050 - 92
232 Available_Reservd_Space ------ 100 100 000 - 100
241 Host_Writes_32MiB ------ 100 100 000 - 66
242 Host_Reads_32MiB ------ 100 100 000 - 33
245 TLC_Writes_32MiB ------ 100 100 000 - 198
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x24 GPL R/O 88 Current Device Internal Status Data log
0x25 GPL R/O 128 Saved Device Internal Status Data log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Completed [00% left] (0-65535)
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 12 --- Lifetime Power-On Resets
0x01 0x010 4 135 --- Power-on Hours
0x01 0x018 6 4348967 --- Logical Sectors Written
0x01 0x020 6 18286 --- Number of Write Commands
0x01 0x028 6 2201034 --- Logical Sectors Read
0x01 0x030 6 11787 --- Number of Read Commands
0x01 0x038 6 4294967296 --- Date and Time TimeStamp
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 1 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 30 --- Current Temperature
0x05 0x010 1 37 --- Average Short Term Temperature
0x05 0x018 1 36 --- Average Long Term Temperature
0x05 0x020 1 61 --- Highest Temperature
0x05 0x028 1 0 --- Lowest Temperature
0x05 0x030 1 39 --- Highest Average Short Term Temperature
0x05 0x038 1 0 --- Lowest Average Short Term Temperature
0x05 0x040 1 36 --- Highest Average Long Term Temperature
0x05 0x048 1 0 --- Lowest Average Long Term Temperature
0x05 0x050 4 0 --- Time in Over-Temperature
0x05 0x058 1 70 --- Specified Maximum Operating Temperature
0x05 0x060 4 0 --- Time in Under-Temperature
0x05 0x068 1 0 --- Specified Minimum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 145 --- Number of Hardware Resets
0x06 0x010 4 4 --- Number of ASR Events
0x06 0x018 4 92 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 0 --- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 0 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 4 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

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smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.0-STABLE amd64] (local build)
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Silicon Motion based SSDs
Device Model: TS256GSSD230S
Serial Number: --
LU WWN Device Id: 5 7c3548 ...
Firmware Version: 02K0S861
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available, deterministic, zeroed
Device is: In smartctl database 7.3/5319
ATA Version is: ACS-2 (minor revision not indicated)
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Fri Jul 22 11:29:12 2022 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Disabled
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x71) SMART execute Offline immediate.
No Auto Offline data collection support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 2) minutes.
Conveyance self-test routine
recommended polling time: ( 1) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate ------ 100 100 000 - 0
5 Reallocated_Sector_Ct ------ 100 100 000 - 0
9 Power_On_Hours ------ 100 100 000 - 4
12 Power_Cycle_Count ------ 100 100 000 - 12
148 Total_SLC_Erase_Ct ------ 100 100 000 - 101
149 Max_SLC_Erase_Ct ------ 100 100 000 - 3
150 Min_SLC_Erase_Ct ------ 100 100 000 - 0
151 Average_SLC_Erase_Ct ------ 100 100 000 - 1
164 Total_Erase_Count ------ 100 100 000 - 28
165 Max_Erase_Count ------ 100 100 000 - 1
166 Min_Erase_Count ------ 100 100 000 - 0
167 Average_Erase_Count ------ 100 100 000 - 0
159 DRAM_1_Bit_Error_Count ------ 100 100 000 - 0
160 Uncorrectable_Error_Cnt ------ 100 100 000 - 0
161 Valid_Spare_Block_Cnt ------ 100 100 000 - 51
163 Initial_Bad_Block_Count ------ 100 100 000 - 4
168 Max_Erase_Count_of_Spec ------ 100 100 000 - 3000
169 Remaining_Lifetime_Perc ------ 100 100 000 - 100
177 Wear_Leveling_Count ------ 100 100 050 - 0
181 Program_Fail_Cnt_Total ------ 100 100 000 - 0
182 Erase_Fail_Count_Total ------ 100 100 000 - 0
192 Power-Off_Retract_Count ------ 100 100 000 - 2
194 Temperature_Celsius ------ 100 100 000 - 31
195 Hardware_ECC_Recovered ------ 100 100 000 - 0
196 Reallocated_Event_Count ------ 100 100 016 - 0
199 UDMA_CRC_Error_Count ------ 100 100 050 - 0
232 Available_Reservd_Space ------ 100 100 000 - 100
241 Host_Writes_32MiB ------ 100 100 000 - 179
242 Host_Reads_32MiB ------ 100 100 000 - 49
245 TLC_Writes_32MiB ------ 100 100 000 - 112
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x0a GPL R/W 8 Device Statistics Notification
0x10 GPL R/O 1 NCQ Command Error log
0x24 GPL R/O 88 Current Device Internal Status Data log
0x25 GPL R/O 64 Saved Device Internal Status Data log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 0 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
Read SMART Selective Self-test Log failed: Input/output error
SCT Commands not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 12 --- Lifetime Power-On Resets
0x01 0x010 4 4 --- Power-on Hours
0x01 0x018 6 11740689 --- Logical Sectors Written
0x01 0x020 6 154862 --- Number of Write Commands
0x01 0x028 6 3260655 --- Logical Sectors Read
0x01 0x030 6 53028 --- Number of Read Commands
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 2 --- Resets Between Cmd Acceptance and Completion
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 27 --- Number of Hardware Resets
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 0 --- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11) not supported