80486DX2-66/SMART-open-study
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Update of reports (new: 0, modified: 1434)

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This commit is contained in:
Andrey Ponomarenko
2023-02-16 00:05:51 +03:00
parent 67063db0cd
commit 22f0da8c56
1434 changed files with 30433 additions and 28411 deletions
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63
SSD/Silicon Power/SP128/SP128GISSD301SV0/4D1A7A49C234
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@@ -12,7 +12,7 @@ TRIM Command: Available, deterministic, zeroed
Device is: Not in smartctl database 7.3/5319
ATA Version is: ACS-2 (minor revision not indicated)
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Mon Jan 16 00:33:42 2023 EST
Local Time is: Wed Feb 8 04:37:28 2023 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Disabled
@@ -27,14 +27,14 @@ Wt Cache Reorder: Unknown
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 57) seconds.
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x71) SMART execute Offline immediate.
No Auto Offline data collection support.
@@ -65,34 +65,34 @@ Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate ------ 100 100 000 - 0
5 Reallocated_Sector_Ct ------ 100 100 000 - 0
9 Power_On_Hours ------ 100 100 000 - 2819
12 Power_Cycle_Count ------ 100 100 000 - 205
9 Power_On_Hours ------ 100 100 000 - 3205
12 Power_Cycle_Count ------ 100 100 000 - 211
160 Unknown_Attribute ------ 100 100 000 - 0
161 Unknown_Attribute ------ 100 100 000 - 58
163 Unknown_Attribute ------ 100 100 000 - 12
164 Unknown_Attribute ------ 100 100 000 - 85219
165 Unknown_Attribute ------ 100 100 000 - 148
166 Unknown_Attribute ------ 100 100 000 - 45
167 Unknown_Attribute ------ 100 100 000 - 82
164 Unknown_Attribute ------ 100 100 000 - 93159
165 Unknown_Attribute ------ 100 100 000 - 150
166 Unknown_Attribute ------ 100 100 000 - 47
167 Unknown_Attribute ------ 100 100 000 - 90
168 Unknown_Attribute ------ 100 100 000 - 3000
169 Unknown_Attribute ------ 100 100 000 - 98
169 Unknown_Attribute ------ 100 100 000 - 97
175 Program_Fail_Count_Chip ------ 100 100 000 - 0
176 Erase_Fail_Count_Chip ------ 100 100 000 - 0
177 Wear_Leveling_Count ------ 100 100 050 - 67
177 Wear_Leveling_Count ------ 100 100 050 - 84
178 Used_Rsvd_Blk_Cnt_Chip ------ 100 100 000 - 0
181 Program_Fail_Cnt_Total ------ 100 100 000 - 0
182 Erase_Fail_Count_Total ------ 100 100 000 - 0
192 Power-Off_Retract_Count ------ 100 100 000 - 21
194 Temperature_Celsius ------ 100 100 000 - 38
195 Hardware_ECC_Recovered ------ 100 100 000 - 252259
192 Power-Off_Retract_Count ------ 100 100 000 - 22
194 Temperature_Celsius ------ 100 100 000 - 40
195 Hardware_ECC_Recovered ------ 100 100 000 - 344843
196 Reallocated_Event_Count ------ 100 100 016 - 0
197 Current_Pending_Sector ------ 100 100 000 - 0
198 Offline_Uncorrectable ------ 100 100 000 - 0
199 UDMA_CRC_Error_Count ------ 100 100 050 - 1
232 Available_Reservd_Space ------ 100 100 000 - 100
241 Total_LBAs_Written ------ 100 100 000 - 221017
242 Total_LBAs_Read ------ 100 100 000 - 190021
245 Unknown_Attribute ------ 100 100 000 - 340876
241 Total_LBAs_Written ------ 100 100 000 - 239476
242 Total_LBAs_Read ------ 100 100 000 - 191291
245 Unknown_Attribute ------ 100 100 000 - 372636
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
@@ -122,8 +122,7 @@ SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 2578 -
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
@@ -132,7 +131,7 @@ SMART Selective self-test log data structure revision number 1
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
7 0 65535 Read_scanning was completed without error
6 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
@@ -150,7 +149,7 @@ Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 0/100 Celsius
Min/Max Temperature Limit: 0/100 Celsius
Temperature History Size (Index): 128 (53)
Temperature History Size (Index): 128 (14)
SCT Error Recovery Control:
Read: Disabled
@@ -159,23 +158,23 @@ SCT Error Recovery Control:
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 2) ==
0x01 0x008 4 205 --- Lifetime Power-On Resets
0x01 0x010 4 2819 --- Power-on Hours
0x01 0x018 6 1599705842 --- Logical Sectors Written
0x01 0x020 6 198562386 --- Number of Write Commands
0x01 0x028 6 3863313316 --- Logical Sectors Read
0x01 0x030 6 27448374 --- Number of Read Commands
0x01 0x008 4 211 --- Lifetime Power-On Resets
0x01 0x010 4 3205 --- Power-on Hours
0x01 0x018 6 2809462552 --- Logical Sectors Written
0x01 0x020 6 210816641 --- Number of Write Commands
0x01 0x028 6 3946574592 --- Logical Sectors Read
0x01 0x030 6 28416225 --- Number of Read Commands
0x02 ===== = = === == Free-Fall Statistics (empty) ==
0x03 ===== = = === == Rotating Media Statistics (empty) ==
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 21 --- Resets Between Cmd Acceptance and Completion
0x04 0x010 4 22 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (empty) ==
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 1089 --- Number of Hardware Resets
0x06 0x008 4 1194 --- Number of Hardware Resets
0x06 0x018 4 1 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 2 --- Percentage Used Endurance Indicator
0x07 0x008 1 3 --- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
@@ -193,7 +192,7 @@ ID Size Value Description
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 0 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 3 Device-to-host register FISes sent due to a COMRESET
0x000a 2 51 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC