80486DX2-66/SMART-open-study
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Update of reports (new: 0, modified: 1434)

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This commit is contained in:
Andrey Ponomarenko
2023-02-16 00:05:51 +03:00
parent 67063db0cd
commit 22f0da8c56
1434 changed files with 30433 additions and 28411 deletions
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43
SSD/Transcend/TS120/TS120GMTS420S/B6160CEC2EA8
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@@ -15,7 +15,7 @@ TRIM Command: Available
Device is: In smartctl database 7.3/5319
ATA Version is: ACS-2 T13/2015-D revision 3
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Wed Nov 16 09:33:05 2022 CET
Local Time is: Fri Nov 18 15:47:08 2022 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
@@ -30,8 +30,8 @@ Wt Cache Reorder: Unavailable
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
@@ -63,15 +63,15 @@ Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate -O--CK 100 100 050 - 0
5 Reallocated_Sector_Ct -O--CK 100 100 050 - 0
9 Power_On_Hours -O--CK 100 100 050 - 156
9 Power_On_Hours -O--CK 100 100 050 - 210
12 Power_Cycle_Count -O--CK 100 100 050 - 9
160 Uncorrectable_Error_Cnt -O--CK 100 100 050 - 0
161 Valid_Spare_Block_Cnt PO--CK 100 100 050 - 100
163 Initial_Bad_Block_Count -O--CK 100 100 050 - 5
164 Total_Erase_Count -O--CK 100 100 050 - 1100
165 Max_Erase_Count -O--CK 100 100 050 - 4
164 Total_Erase_Count -O--CK 100 100 050 - 2843
165 Max_Erase_Count -O--CK 100 100 050 - 11
166 Min_Erase_Count -O--CK 100 100 050 - 1
167 Average_Erase_Count -O--CK 100 100 050 - 2
167 Average_Erase_Count -O--CK 100 100 050 - 4
168 Max_Erase_Count_of_Spec -O--CK 100 100 050 - 3000
169 Remaining_Lifetime_Perc -O--CK 100 100 050 - 100
175 Program_Fail_Count_Chip -O--CK 100 100 050 - 0
@@ -81,16 +81,16 @@ ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
181 Program_Fail_Cnt_Total -O--CK 100 100 050 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 050 - 0
192 Power-Off_Retract_Count -O--CK 100 100 050 - 8
194 Temperature_Celsius -O---K 100 100 050 - 43
194 Temperature_Celsius -O---K 100 100 050 - 41
195 Hardware_ECC_Recovered -O--CK 100 100 050 - 0
196 Reallocated_Event_Count -O--CK 100 100 050 - 0
197 Current_Pending_Sector -O--CK 100 100 050 - 0
198 Offline_Uncorrectable -O--CK 100 100 050 - 0
199 UDMA_CRC_Error_Count -O--CK 100 100 050 - 0
232 Available_Reservd_Space -O--CK 100 100 050 - 100
241 Host_Writes_32MiB ----CK 100 100 050 - 2973
242 Host_Reads_32MiB ----CK 100 100 050 - 67
245 TLC_Writes_32MiB -O--CK 100 100 050 - 2588
241 Host_Writes_32MiB ----CK 100 100 050 - 5712
242 Host_Reads_32MiB ----CK 100 100 050 - 131
245 TLC_Writes_32MiB -O--CK 100 100 050 - 5811
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
@@ -119,16 +119,17 @@ SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 162 -
Selective Self-tests/Logging not supported
SCT Status Version: 3
SCT Version (vendor specific): 0 (0x0000)
Device State: Active (0)
Current Temperature: 43 Celsius
Power Cycle Min/Max Temperature: 43/43 Celsius
Lifetime Min/Max Temperature: 32/54 Celsius
Current Temperature: 41 Celsius
Power Cycle Min/Max Temperature: 41/41 Celsius
Lifetime Min/Max Temperature: 32/56 Celsius
Specified Max Operating Temperature: 100 Celsius
Under/Over Temperature Limit Count: 0/0
@@ -140,11 +141,11 @@ Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 9 --- Lifetime Power-On Resets
0x01 0x010 4 156 --- Power-on Hours
0x01 0x018 6 194893640 --- Logical Sectors Written
0x01 0x020 6 8319872 --- Number of Write Commands
0x01 0x028 6 4394808 --- Logical Sectors Read
0x01 0x030 6 73588 --- Number of Read Commands
0x01 0x010 4 210 --- Power-on Hours
0x01 0x018 6 374364920 --- Logical Sectors Written
0x01 0x020 6 12848930 --- Number of Write Commands
0x01 0x028 6 8624588 --- Logical Sectors Read
0x01 0x030 6 156043 --- Number of Read Commands
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 0 --- Percentage Used Endurance Indicator
|||_ C monitored condition met
@@ -158,7 +159,7 @@ ID Size Value Description
0x0001 4 0 Command failed due to ICRC error
0x0002 4 0 R_ERR response for data FIS
0x0005 4 0 R_ERR response for non-data FIS
0x000a 4 14 Device-to-host register FISes sent due to a COMRESET
0x000a 4 20 Device-to-host register FISes sent due to a COMRESET