80486DX2-66/SMART-open-study
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Update of reports (new: 0, modified: 706)

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This commit is contained in:
Andrey Ponomarenko
2023-05-01 23:00:07 +03:00
parent 6760e6c317
commit 23ed3f49e3
706 changed files with 14188 additions and 13649 deletions
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31
SSD/Silicon/SATA3/SATA3 240GB SSD/D5680E2D83B7
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@@ -14,7 +14,7 @@ TRIM Command: Available
Device is: In smartctl database 7.3/5319
ATA Version is: ACS-3 T13/2161-D revision 4
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Mon Apr 17 20:07:45 2023 CEST
Local Time is: Wed Apr 19 20:19:26 2023 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
@@ -29,8 +29,8 @@ Wt Cache Reorder: Unavailable
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
@@ -61,15 +61,15 @@ Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate -O--CK 100 100 050 - 0
5 Reallocated_Sector_Ct -O--CK 100 100 050 - 0
9 Power_On_Hours -O--CK 100 100 050 - 325
9 Power_On_Hours -O--CK 100 100 050 - 373
12 Power_Cycle_Count -O--CK 100 100 050 - 142
160 Uncorrectable_Error_Cnt -O--CK 100 100 050 - 0
161 Valid_Spare_Block_Cnt PO--CK 100 100 050 - 100
163 Initial_Bad_Block_Count -O--CK 100 100 050 - 16
164 Total_Erase_Count -O--CK 100 100 050 - 5063
165 Max_Erase_Count -O--CK 100 100 050 - 24
164 Total_Erase_Count -O--CK 100 100 050 - 5402
165 Max_Erase_Count -O--CK 100 100 050 - 26
166 Min_Erase_Count -O--CK 100 100 050 - 4
167 Average_Erase_Count -O--CK 100 100 050 - 10
167 Average_Erase_Count -O--CK 100 100 050 - 11
168 Max_Erase_Count_of_Spec -O--CK 100 100 050 - 1500
169 Remaining_Lifetime_Perc -O--CK 100 100 050 - 100
175 Program_Fail_Count_Chip -O--CK 100 100 050 - 0
@@ -86,9 +86,9 @@ ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
198 Offline_Uncorrectable -O--CK 100 100 050 - 0
199 UDMA_CRC_Error_Count -O--CK 100 100 050 - 0
232 Available_Reservd_Space -O--CK 100 100 050 - 100
241 Host_Writes_32MiB ----CK 100 100 050 - 16518
241 Host_Writes_32MiB ----CK 100 100 050 - 17657
242 Host_Reads_32MiB ----CK 100 100 050 - 9198
245 TLC_Writes_32MiB -O--CK 100 100 050 - 11494
245 TLC_Writes_32MiB -O--CK 100 100 050 - 12124
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
@@ -116,7 +116,8 @@ SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 325 -
Selective Self-tests/Logging not supported
@@ -126,11 +127,11 @@ Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 142 --- Lifetime Power-On Resets
0x01 0x010 4 325 --- Power-on Hours
0x01 0x018 6 1082557721 --- Logical Sectors Written
0x01 0x020 6 7091769 --- Number of Write Commands
0x01 0x028 6 602829294 --- Logical Sectors Read
0x01 0x030 6 2486778 --- Number of Read Commands
0x01 0x010 4 373 --- Power-on Hours
0x01 0x018 6 1157187951 --- Logical Sectors Written
0x01 0x020 6 8034763 --- Number of Write Commands
0x01 0x028 6 602835958 --- Logical Sectors Read
0x01 0x030 6 2488916 --- Number of Read Commands
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 0 --- Percentage Used Endurance Indicator
|||_ C monitored condition met