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Update of reports (new: 6895, modified: 16)
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Andrey Ponomarenko
185
HDD/IBM-Hitachi/IC25/IC25N040ATMR04-0/C3DEC3AAD4E6
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HDD/IBM-Hitachi/IC25/IC25N040ATMR04-0/C3DEC3AAD4E6
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smartctl 7.3 2022-02-28 r5338 [NetBSD 9.3 macppc] (local build)
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Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
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=== START OF INFORMATION SECTION ===
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Model Family: Hitachi Travelstar 80GN
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Device Model: IC25N040ATMR04-0
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Serial Number: --
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Firmware Version: MO2OAD4A
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User Capacity: 40,007,761,920 bytes [40.0 GB]
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Sector Size: 512 bytes logical/physical
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Device is: In smartctl database 7.3/5319
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ATA Version is: ATA/ATAPI-6 T13/1410D revision 3a
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Local Time is: Fri Oct 27 23:31:36 2023 JST
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SMART support is: Available - device has SMART capability.
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SMART support is: Enabled
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=== START OF READ SMART DATA SECTION ===
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SMART overall-health self-assessment test result: PASSED
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General SMART Values:
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Offline data collection status: (0x00) Offline data collection activity
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was never started.
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Auto Offline Data Collection: Disabled.
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Self-test execution status: ( 0) The previous self-test routine completed
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without error or no self-test has ever
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been run.
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Total time to complete Offline
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data collection: ( 645) seconds.
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Offline data collection
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capabilities: (0x5b) SMART execute Offline immediate.
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Auto Offline data collection on/off support.
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Suspend Offline collection upon new
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command.
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Offline surface scan supported.
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Self-test supported.
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No Conveyance Self-test supported.
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Selective Self-test supported.
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SMART capabilities: (0x0003) Saves SMART data before entering
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power-saving mode.
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Supports SMART auto save timer.
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Error logging capability: (0x01) Error logging supported.
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General Purpose Logging supported.
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Short self-test routine
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recommended polling time: ( 2) minutes.
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Extended self-test routine
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recommended polling time: ( 37) minutes.
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SMART Attributes Data Structure revision number: 16
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Vendor Specific SMART Attributes with Thresholds:
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ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
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1 Raw_Read_Error_Rate 0x000b 100 100 062 Pre-fail Always - 0
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2 Throughput_Performance 0x0005 100 100 040 Pre-fail Offline - 0
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3 Spin_Up_Time 0x0007 152 152 033 Pre-fail Always - 1
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4 Start_Stop_Count 0x0012 096 096 000 Old_age Always - 6559
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5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
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7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
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8 Seek_Time_Performance 0x0005 100 100 040 Pre-fail Offline - 0
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9 Power_On_Hours 0x0012 063 063 000 Old_age Always - 16290
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10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
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12 Power_Cycle_Count 0x0032 097 097 000 Old_age Always - 6184
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191 G-Sense_Error_Rate 0x000a 100 100 000 Old_age Always - 0
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192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 108
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193 Load_Cycle_Count 0x0012 001 001 000 Old_age Always - 1947274
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194 Temperature_Celsius 0x0002 127 127 000 Old_age Always - 43 (Min/Max 4/64)
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196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 82
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197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 2
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198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
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199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0
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SMART Error Log Version: 1
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ATA Error Count: 16 (device log contains only the most recent five errors)
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CR = Command Register [HEX]
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FR = Features Register [HEX]
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SC = Sector Count Register [HEX]
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SN = Sector Number Register [HEX]
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CL = Cylinder Low Register [HEX]
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CH = Cylinder High Register [HEX]
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DH = Device/Head Register [HEX]
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DC = Device Command Register [HEX]
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ER = Error register [HEX]
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ST = Status register [HEX]
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Powered_Up_Time is measured from power on, and printed as
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DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
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SS=sec, and sss=millisec. It "wraps" after 49.710 days.
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Error 16 occurred at disk power-on lifetime: 7258 hours (302 days + 10 hours)
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When the command that caused the error occurred, the device was active or idle.
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After command completion occurred, registers were:
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ER ST SC SN CL CH DH
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-- -- -- -- -- -- --
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10 59 01 01 00 00 a0 Error: IDNF at LBA = 0x00000001 = 1
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Commands leading to the command that caused the error were:
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CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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-- -- -- -- -- -- -- -- ---------------- --------------------
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24 ff 01 01 00 00 a0 00 00:04:11.800 READ SECTOR(S) EXT
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c8 ff 01 33 42 00 ae 00 00:04:11.700 READ DMA
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c8 ff 18 1b 42 00 ae 00 00:04:11.700 READ DMA
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ec ff 00 00 00 00 a0 00 00:04:05.500 IDENTIFY DEVICE
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c8 ff 07 0a 42 00 ad 00 00:04:02.300 READ DMA
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Error 15 occurred at disk power-on lifetime: 7258 hours (302 days + 10 hours)
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When the command that caused the error occurred, the device was active or idle.
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After command completion occurred, registers were:
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ER ST SC SN CL CH DH
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-- -- -- -- -- -- --
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10 59 01 01 00 00 a0 Error: IDNF at LBA = 0x00000001 = 1
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Commands leading to the command that caused the error were:
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CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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-- -- -- -- -- -- -- -- ---------------- --------------------
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24 ff 01 01 00 00 a0 00 00:06:05.600 READ SECTOR(S) EXT
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c8 ff 01 0c cb 00 a7 00 00:06:05.600 READ DMA
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c8 ff 18 33 cb 00 a6 00 00:06:05.500 READ DMA
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ec ff 00 00 00 00 a0 00 00:05:54.600 IDENTIFY DEVICE
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c8 ff 07 22 cb 00 a5 00 00:05:51.500 READ DMA
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Error 14 occurred at disk power-on lifetime: 7258 hours (302 days + 10 hours)
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When the command that caused the error occurred, the device was active or idle.
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After command completion occurred, registers were:
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ER ST SC SN CL CH DH
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-- -- -- -- -- -- --
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10 59 01 01 00 00 a0 Error: IDNF at LBA = 0x00000001 = 1
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Commands leading to the command that caused the error were:
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CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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-- -- -- -- -- -- -- -- ---------------- --------------------
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24 ff 01 01 00 00 a0 00 00:16:07.400 READ SECTOR(S) EXT
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c8 ff 18 1b 42 00 ae 00 00:16:07.400 READ DMA
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c8 ff 18 1b 42 00 ae 00 00:10:14.000 READ DMA
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24 ff 01 9f 5f 06 e0 00 00:10:01.100 READ SECTOR(S) EXT
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24 ff 01 ba 5f 06 e0 00 00:10:01.000 READ SECTOR(S) EXT
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Error 13 occurred at disk power-on lifetime: 7258 hours (302 days + 10 hours)
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When the command that caused the error occurred, the device was active or idle.
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After command completion occurred, registers were:
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ER ST SC SN CL CH DH
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-- -- -- -- -- -- --
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10 59 01 01 00 00 a0 Error: IDNF at LBA = 0x00000001 = 1
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Commands leading to the command that caused the error were:
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CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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-- -- -- -- -- -- -- -- ---------------- --------------------
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24 ff 01 01 00 00 a0 00 00:02:59.700 READ SECTOR(S) EXT
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c8 ff 01 33 42 00 ae 00 00:02:59.700 READ DMA
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c8 ff 18 1b 42 00 ae 00 00:02:59.400 READ DMA
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ec ff 00 00 00 00 a0 00 00:02:53.100 IDENTIFY DEVICE
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c8 ff 07 0a 42 00 ad 00 00:02:50.000 READ DMA
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Error 12 occurred at disk power-on lifetime: 7235 hours (301 days + 11 hours)
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When the command that caused the error occurred, the device was active or idle.
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After command completion occurred, registers were:
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ER ST SC SN CL CH DH
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-- -- -- -- -- -- --
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10 59 01 3f 53 a8 e4 Error: IDNF at LBA = 0x04a8533f = 78140223
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Commands leading to the command that caused the error were:
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CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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-- -- -- -- -- -- -- -- ---------------- --------------------
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21 ff 01 3f 53 a8 e4 00 00:00:17.300 READ SECTOR(S) [OBS-5]
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10 ff 3f 01 fe 3f af 00 00:00:17.300 RECALIBRATE [OBS-4]
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91 ff 3f 01 fe 3f af 00 00:00:17.300 INITIALIZE DEVICE PARAMETERS [OBS-6]
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21 ff 01 3f 53 a8 e4 04 00:00:17.200 READ SECTOR(S) [OBS-5]
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21 ff 01 3f 53 a8 e4 00 00:00:17.200 READ SECTOR(S) [OBS-5]
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SMART Self-test log structure revision number 1
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No self-tests have been logged. [To run self-tests, use: smartctl -t]
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Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
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SMART Selective self-test log data structure revision number 1
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SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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1 0 0 Not_testing
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2 0 0 Not_testing
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3 0 0 Not_testing
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4 0 0 Not_testing
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5 0 0 Not_testing
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Selective self-test flags (0x0):
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After scanning selected spans, do NOT read-scan remainder of disk.
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If Selective self-test is pending on power-up, resume after 0 minute delay.
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