1
0
mirror of https://github.com/bsdhw/SMART.git synced 2025-05-31 16:21:41 +05:30

Update of reports (new: 6895, modified: 16)

This commit is contained in:
Andrey Ponomarenko
2025-01-05 01:57:11 +03:00
parent e3bee1f876
commit 2a811b67c1
6911 changed files with 1114213 additions and 734 deletions

View File

@@ -0,0 +1,182 @@
smartctl 7.3 2022-02-28 r5338 [NetBSD 9.3 macppc] (local build)
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: ST940110A
Serial Number: --
Firmware Version: 3.07
User Capacity: 40,007,761,920 bytes [40.0 GB]
Sector Size: 512 bytes logical/physical
Device is: Not in smartctl database 7.3/5319
ATA Version is: ATA/ATAPI-6 T13/1410D revision 2
Local Time is: Sat Dec 30 22:59:08 2023 MSK
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
No General Purpose Logging support.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 31) minutes.
SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 063 057 034 Pre-fail Always - 147890446
3 Spin_Up_Time 0x0003 099 098 000 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 100 100 020 Old_age Always - 187
5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 0
7 Seek_Error_Rate 0x000f 075 060 030 Pre-fail Always - 37398823
9 Power_On_Hours 0x0032 097 097 000 Old_age Always - 2834
10 Spin_Retry_Count 0x0013 100 100 034 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 020 Old_age Always - 944
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 362
193 Load_Cycle_Count 0x0032 009 009 000 Old_age Always - 183150
194 Temperature_Celsius 0x0022 039 049 000 Old_age Always - 39
195 Hardware_ECC_Recovered 0x001a 063 057 000 Old_age Always - 147890446
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 167 000 Old_age Always - 78
200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0
202 Data_Address_Mark_Errs 0x0032 100 253 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 23 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 23 occurred at disk power-on lifetime: 2378 hours (99 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 ae 36 04 40 Error: ICRC, ABRT 1 sectors at LBA = 0x000436ae = 276142
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 10 9f 36 04 40 00 00:00:31.258 READ DMA EXT
35 00 10 10 29 08 40 00 00:00:31.257 WRITE DMA EXT
25 00 10 10 29 08 40 00 00:00:31.241 READ DMA EXT
25 00 10 72 31 04 40 00 00:00:31.231 READ DMA EXT
35 00 10 80 28 08 40 00 00:00:31.229 WRITE DMA EXT
Error 22 occurred at disk power-on lifetime: 2318 hours (96 days + 14 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 77 32 63 40 Error: ICRC, ABRT 1 sectors at LBA = 0x00633277 = 6500983
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 70 32 63 40 00 00:45:34.034 READ DMA EXT
25 00 08 68 32 63 40 00 00:45:33.878 READ DMA EXT
35 00 08 f8 61 00 40 00 00:45:33.019 WRITE DMA EXT
25 00 08 98 6f dd 40 00 00:45:32.247 READ DMA EXT
25 00 08 70 26 28 40 00 00:45:31.531 READ DMA EXT
Error 21 occurred at disk power-on lifetime: 2318 hours (96 days + 14 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 6f 32 63 40 Error: ICRC, ABRT 1 sectors at LBA = 0x0063326f = 6500975
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 68 32 63 40 00 00:45:34.034 READ DMA EXT
35 00 08 f8 61 00 40 00 00:45:33.878 WRITE DMA EXT
25 00 08 98 6f dd 40 00 00:45:33.019 READ DMA EXT
25 00 08 70 26 28 40 00 00:45:32.247 READ DMA EXT
25 00 08 70 32 63 40 00 00:45:31.531 READ DMA EXT
Error 20 occurred at disk power-on lifetime: 2318 hours (96 days + 14 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 9f 6f dd 40 Error: ICRC, ABRT 1 sectors at LBA = 0x00dd6f9f = 14512031
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 98 6f dd 40 00 00:45:34.034 READ DMA EXT
25 00 08 70 26 28 40 00 00:45:33.878 READ DMA EXT
25 00 08 70 32 63 40 00 00:45:33.019 READ DMA EXT
25 00 08 68 32 63 40 00 00:45:32.247 READ DMA EXT
35 00 08 f8 61 00 40 00 00:45:31.531 WRITE DMA EXT
Error 19 occurred at disk power-on lifetime: 2318 hours (96 days + 14 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 77 26 28 40 Error: ICRC, ABRT 1 sectors at LBA = 0x00282677 = 2631287
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 70 26 28 40 00 00:45:34.034 READ DMA EXT
25 00 08 70 32 63 40 00 00:45:33.878 READ DMA EXT
25 00 08 68 32 63 40 00 00:45:33.019 READ DMA EXT
35 00 08 f8 61 00 40 00 00:45:32.247 WRITE DMA EXT
25 00 08 98 6f dd 40 00 00:45:31.531 READ DMA EXT
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

View File

@@ -0,0 +1,232 @@
smartctl 7.4 2023-08-01 r5530 [FreeBSD 13.2-RELEASE powerpc] (local build)
Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: ST940110A
Serial Number: --
Firmware Version: 3.07
User Capacity: 40,007,761,920 bytes [40.0 GB]
Sector Size: 512 bytes logical/physical
Device is: Not in smartctl database 7.3/5528
ATA Version is: ATA/ATAPI-6 T13/1410D revision 2
Local Time is: Fri Dec 29 10:22:04 2023 CST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM level is: 128 (minimum power consumption without standby)
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
No General Purpose Logging support.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 36) minutes.
SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate POSR-- 060 049 034 - 56907406
3 Spin_Up_Time PO---- 098 098 000 - 0
4 Start_Stop_Count -O--CK 094 094 020 - 6276
5 Reallocated_Sector_Ct PO--CK 100 100 036 - 0
7 Seek_Error_Rate POSR-- 083 060 030 - 204151999
9 Power_On_Hours -O--CK 092 092 000 - 7810
10 Spin_Retry_Count PO--C- 100 100 034 - 0
12 Power_Cycle_Count -O--CK 098 098 020 - 2707
192 Power-Off_Retract_Count -O--CK 100 100 000 - 1468
193 Load_Cycle_Count -O--CK 001 001 000 - 502644
194 Temperature_Celsius -O---K 030 049 000 - 30
195 Hardware_ECC_Recovered -O-RC- 060 049 000 - 56907406
197 Current_Pending_Sector -O--C- 100 100 000 - 0
198 Offline_Uncorrectable ----C- 100 100 000 - 0
199 UDMA_CRC_Error_Count -OSRCK 200 145 000 - 159
200 Multi_Zone_Error_Rate ------ 100 253 000 - 0
202 Data_Address_Mark_Errs -O--CK 100 253 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory not supported
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 5 Comprehensive SMART error log
0x03 SL R/O 5 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 SL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x20 SL R/O 1 Streaming performance log
0x21 SL R/O 1 Write stream error log
0x22 SL R/O 1 Read stream error log
0x23 SL R/O 1 Delayed sector log
0x80-0x9f SL R/W 16 Host vendor specific log
0xa0 SL VS 1 Device vendor specific log
0xa1 SL VS 20 Device vendor specific log
0xa2 SL VS 101 Device vendor specific log
0xa8 SL VS 20 Device vendor specific log
0xa9 SL VS 1 Device vendor specific log
0xb0 SL VS 1 Device vendor specific log
0xb4 SL VS 4 Device vendor specific log
0xbe-0xbf SL VS 1 Device vendor specific log
SMART Extended Comprehensive Error Log (GP Log 0x03) not supported
SMART Error Log Version: 1
ATA Error Count: 174 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 174 occurred at disk power-on lifetime: 7789 hours (324 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 c7 78 7e e1 Error: ICRC, ABRT 1 sectors at LBA = 0x017e78c7 = 25065671
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 30 98 78 7e e1 00 20:09:54.769 READ DMA
c8 00 30 98 78 7e e1 00 20:09:54.768 READ DMA
c8 00 30 98 78 7e e1 00 20:09:54.605 READ DMA
c8 00 30 98 78 7e e1 00 20:09:54.589 READ DMA
c8 00 30 98 78 7e e1 00 20:09:54.570 READ DMA
Error 173 occurred at disk power-on lifetime: 7789 hours (324 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 c7 78 7e e1 Error: ICRC, ABRT 1 sectors at LBA = 0x017e78c7 = 25065671
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 30 98 78 7e e1 00 20:09:54.769 READ DMA
c8 00 30 98 78 7e e1 00 20:09:54.768 READ DMA
c8 00 30 98 78 7e e1 00 20:09:54.605 READ DMA
c8 00 30 98 78 7e e1 00 20:09:54.589 READ DMA
ca 00 40 18 1c 39 e1 00 20:09:54.570 WRITE DMA
Error 172 occurred at disk power-on lifetime: 7789 hours (324 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 c7 78 7e e1 Error: ICRC, ABRT 1 sectors at LBA = 0x017e78c7 = 25065671
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 30 98 78 7e e1 00 20:09:54.769 READ DMA
c8 00 30 98 78 7e e1 00 20:09:54.768 READ DMA
c8 00 30 98 78 7e e1 00 20:09:54.605 READ DMA
ca 00 40 18 1c 39 e1 00 20:09:54.589 WRITE DMA
ca 00 08 e8 3f ae e2 00 20:09:54.570 WRITE DMA
Error 171 occurred at disk power-on lifetime: 7789 hours (324 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 c7 78 7e e1 Error: ICRC, ABRT 1 sectors at LBA = 0x017e78c7 = 25065671
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 30 98 78 7e e1 00 20:09:54.769 READ DMA
c8 00 30 98 78 7e e1 00 20:09:54.768 READ DMA
ca 00 40 18 1c 39 e1 00 20:09:54.605 WRITE DMA
ca 00 08 e8 3f ae e2 00 20:09:54.589 WRITE DMA
ca 00 08 e0 3f ae e2 00 20:09:54.570 WRITE DMA
Error 170 occurred at disk power-on lifetime: 7789 hours (324 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 c7 78 7e e1 Error: ICRC, ABRT 1 sectors at LBA = 0x017e78c7 = 25065671
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 30 98 78 7e e1 00 20:09:54.769 READ DMA
ca 00 40 18 1c 39 e1 00 20:09:54.768 WRITE DMA
ca 00 08 e8 3f ae e2 00 20:09:54.605 WRITE DMA
ca 00 08 e0 3f ae e2 00 20:09:54.589 WRITE DMA
ca 00 08 f8 68 d5 e2 00 20:09:54.570 WRITE DMA
SMART Extended Self-test Log (GP Log 0x07) not supported
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11) not supported