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Andrey Ponomarenko
2025-01-05 01:57:11 +03:00
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smartctl 7.4 2023-08-01 r5530 [FreeBSD 14.1-RELEASE-p5 amd64] (local build)
Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: APPLE SSD SM128C
Serial Number: --
LU WWN Device Id: 5 0000f0 ...
Firmware Version: AXM0AA1Q
User Capacity: 121,332,826,112 bytes [121 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: Not in smartctl database 7.3/5528
ATA Version is: ATA8-ACS, ATA/ATAPI-7 T13/1532D revision 1
SATA Version is: SATA 2.6, 3.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Fri Oct 18 22:49:59 2024 +03
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Disabled
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 840) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 14) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate POSR-K 200 200 000 - 0
5 Reallocated_Sector_Ct PO--CK 100 100 000 - 0
9 Power_On_Hours -O--CK 090 090 000 - 46574
12 Power_Cycle_Count -O--CK 093 093 000 - 6755
169 Unknown_Attribute PO--C- 253 253 010 - 4020362022016
173 Unknown_Attribute -O--CK 176 176 100 - 2169007178327
175 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
176 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
177 Wear_Leveling_Count PO--C- 086 086 017 - 505
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 075 075 010 - 520
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 077 077 010 - 936
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 077 077 010 - 3224
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
192 Power-Off_Retract_Count -O--CK 098 098 000 - 6675
194 Temperature_Celsius -O---K 071 071 000 - 29 (Min/Max 15/62)
195 Hardware_ECC_Recovered -O-RC- 253 253 000 - 0
197 Current_Pending_Sector PO--C- 100 100 000 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 UDMA_CRC_Error_Count -OSRCK 253 253 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 0
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 GPL,SL R/O 1 Summary SMART error log
0x02 GPL,SL R/O 1 Comprehensive SMART error log
0x03 GPL,SL R/O 1 Ext. Comprehensive SMART error log
0x06 GPL,SL R/O 1 SMART self-test log
0x07 GPL,SL R/O 1 Extended self-test log
0x09 GPL,SL R/W 1 Selective self-test log
0x10 GPL,SL R/O 1 NCQ Command Error log
0x11 GPL,SL R/O 1 SATA Phy Event Counters log
0x80-0x9f GPL,SL R/W 1 Host vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
Warning! SMART Extended Self-test Log Structure error: invalid SMART checksum.
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 44760 -
# 2 Extended offline Completed without error 00% 43764 -
# 3 Short offline Completed without error 00% 43763 -
# 4 Short offline Completed without error 00% 36979 -
# 5 Short offline Completed without error 00% 36979 -
# 6 Short offline Completed without error 00% 36978 -
# 7 Short offline Completed without error 00% 36978 -
# 8 Extended offline Completed without error 00% 36978 -
# 9 Short offline Completed without error 00% 21313 -
#10 Short offline Completed without error 00% 21313 -
#11 Short offline Completed without error 00% 11857 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 21 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 21 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

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smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE amd64] (local build)
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: APPLE SSD SM128C
Serial Number: --
LU WWN Device Id: 5 0000f0 ...
Firmware Version: AXM09A1Q
User Capacity: 121,332,826,112 bytes [121 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: Not in smartctl database 7.3/5319
ATA Version is: ATA8-ACS, ATA/ATAPI-7 T13/1532D revision 1
SATA Version is: SATA 2.6, 3.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Sun Jan 14 02:44:15 2024 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Disabled
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 840) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 14) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate POSR-K 199 199 000 - 399
5 Reallocated_Sector_Ct PO--CK 092 092 000 - 234
9 Power_On_Hours -O--CK 098 098 000 - 8650
12 Power_Cycle_Count -O--CK 089 089 000 - 10314
169 Unknown_Attribute PO--C- 253 253 010 - 5669629463680
173 Unknown_Attribute -O--CK 177 177 100 - 2194775278175
175 Program_Fail_Count_Chip -O--CK 092 092 010 - 166
176 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
177 Wear_Leveling_Count PO--C- 085 085 017 - 511
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 064 064 010 - 742
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 068 068 010 - 1320
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 068 068 010 - 2840
181 Program_Fail_Cnt_Total -O--CK 094 094 010 - 234
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 094 094 010 - 234
187 Reported_Uncorrect -O--CK 099 099 000 - 399
192 Power-Off_Retract_Count -O--CK 097 097 000 - 10119
194 Temperature_Celsius -O---K 067 067 000 - 33 (Min/Max 9/61)
195 Hardware_ECC_Recovered -O-RC- 096 096 000 - 399
197 Current_Pending_Sector PO--C- 100 100 000 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 UDMA_CRC_Error_Count -OSRCK 253 253 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 0
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 GPL,SL R/O 1 Summary SMART error log
0x02 GPL,SL R/O 1 Comprehensive SMART error log
0x03 GPL,SL R/O 1 Ext. Comprehensive SMART error log
0x06 GPL,SL R/O 1 SMART self-test log
0x07 GPL,SL R/O 1 Extended self-test log
0x09 GPL,SL R/W 1 Selective self-test log
0x10 GPL,SL R/O 1 NCQ Command Error log
0x11 GPL,SL R/O 1 SATA Phy Event Counters log
0x80-0x9f GPL,SL R/W 1 Host vendor specific log
Warning! SMART Extended Comprehensive Error Log Structure error: invalid SMART checksum.
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
Device Error Count: 366 (device log contains only the most recent 4 errors)
CR = Command Register
FEATR = Features Register
COUNT = Count (was: Sector Count) Register
LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8
LH = LBA High (was: Cylinder High) Register ] LBA
LM = LBA Mid (was: Cylinder Low) Register ] Register
LL = LBA Low (was: Sector Number) Register ]
DV = Device (was: Device/Head) Register
DC = Device Control Register
ER = Error register
ST = Status register
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 366 [1] occurred at disk power-on lifetime: 8570 hours (357 days + 2 hours)
When the command that caused the error occurred, the device was sleeping.
After command completion occurred, registers were:
ER -- ST COUNT LBA_48 LH LM LL DV DC
-- -- -- == -- == == == -- -- -- -- --
40 -- 51 00 10 00 00 00 02 33 f0 e0 00 Error: UNC 16 sectors at LBA = 0x000233f0 = 144368
Commands leading to the command that caused the error were:
CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name
-- == -- == -- == == == -- -- -- -- -- --------------- --------------------
25 00 00 04 00 00 00 00 02 2c 00 00 00 00:01:23.000 READ DMA EXT
25 00 00 04 00 00 00 00 02 28 00 00 00 00:01:23.000 READ DMA EXT
25 00 00 04 00 00 00 00 02 24 00 00 00 00:01:23.000 READ DMA EXT
25 00 00 04 00 00 00 00 02 20 00 00 00 00:01:23.000 READ DMA EXT
25 00 00 04 00 00 00 00 02 1c 00 00 00 00:01:23.000 READ DMA EXT
Error 365 [0] occurred at disk power-on lifetime: 8570 hours (357 days + 2 hours)
When the command that caused the error occurred, the device was sleeping.
After command completion occurred, registers were:
ER -- ST COUNT LBA_48 LH LM LL DV DC
-- -- -- == -- == == == -- -- -- -- --
40 -- 51 00 10 00 00 00 02 33 f0 e0 00 Error: UNC 16 sectors at LBA = 0x000233f0 = 144368
Commands leading to the command that caused the error were:
CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name
-- == -- == -- == == == -- -- -- -- -- --------------- --------------------
25 00 00 04 00 00 00 00 02 2c 00 00 00 00:00:13.000 READ DMA EXT
25 00 00 04 00 00 00 00 02 28 00 00 00 00:00:13.000 READ DMA EXT
25 00 00 04 00 00 00 00 02 24 00 00 00 00:00:13.000 READ DMA EXT
25 00 00 04 00 00 00 00 02 20 00 00 00 00:00:13.000 READ DMA EXT
25 00 00 04 00 00 00 00 02 1c 00 00 00 00:00:13.000 READ DMA EXT
Error 364 [3] occurred at disk power-on lifetime: 8570 hours (357 days + 2 hours)
When the command that caused the error occurred, the device was sleeping.
After command completion occurred, registers were:
ER -- ST COUNT LBA_48 LH LM LL DV DC
-- -- -- == -- == == == -- -- -- -- --
40 -- 51 00 10 00 00 00 02 33 f0 e0 00 Error: UNC 16 sectors at LBA = 0x000233f0 = 144368
Commands leading to the command that caused the error were:
CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name
-- == -- == -- == == == -- -- -- -- -- --------------- --------------------
25 00 00 04 00 00 00 00 02 2c 00 00 00 00:00:13.000 READ DMA EXT
25 00 00 04 00 00 00 00 02 28 00 00 00 00:00:13.000 READ DMA EXT
25 00 00 04 00 00 00 00 02 24 00 00 00 00:00:13.000 READ DMA EXT
25 00 00 04 00 00 00 00 02 20 00 00 00 00:00:13.000 READ DMA EXT
25 00 00 04 00 00 00 00 02 1c 00 00 00 00:00:13.000 READ DMA EXT
Error 363 [2] occurred at disk power-on lifetime: 8570 hours (357 days + 2 hours)
When the command that caused the error occurred, the device was sleeping.
After command completion occurred, registers were:
ER -- ST COUNT LBA_48 LH LM LL DV DC
-- -- -- == -- == == == -- -- -- -- --
40 -- 51 00 10 00 00 00 02 33 f0 e0 00 Error: UNC 16 sectors at LBA = 0x000233f0 = 144368
Commands leading to the command that caused the error were:
CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name
-- == -- == -- == == == -- -- -- -- -- --------------- --------------------
25 00 00 04 00 00 00 00 02 2c 00 00 00 00:00:13.000 READ DMA EXT
25 00 00 04 00 00 00 00 02 28 00 00 00 00:00:13.000 READ DMA EXT
25 00 00 04 00 00 00 00 02 24 00 00 00 00:00:13.000 READ DMA EXT
25 00 00 04 00 00 00 00 02 20 00 00 00 00:00:13.000 READ DMA EXT
25 00 00 04 00 00 00 00 02 1c 00 00 00 00:00:12.000 READ DMA EXT
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 7 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 7 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC