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Update of reports (new: 6895, modified: 16)

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Andrey Ponomarenko
2025-01-05 01:57:11 +03:00
parent e3bee1f876
commit 2a811b67c1
6911 changed files with 1114213 additions and 734 deletions
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smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE amd64] (local build)
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: faspeed M3-360G
Serial Number: --
LU WWN Device Id: 5 000000 ...
Firmware Version: 02000004
User Capacity: 360,080,695,296 bytes [360 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available
Device is: Not in smartctl database 7.3/5319
ATA Version is: ACS-4 (minor revision not indicated)
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Sep 10 12:32:51 2024 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (65535) seconds.
Offline data collection
capabilities: (0x79) SMART execute Offline immediate.
No Auto Offline data collection support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 30) minutes.
Conveyance self-test routine
recommended polling time: ( 6) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate PO-R-- 100 100 050 - 0
5 Reallocated_Sector_Ct PO--C- 100 100 050 - 3
9 Power_On_Hours -O--C- 100 100 000 - 10438
12 Power_Cycle_Count -O--C- 100 100 000 - 4230
161 Unknown_Attribute -O--C- 100 100 000 - 233
163 Unknown_Attribute PO---- 100 100 050 - 157
165 Unknown_Attribute ------ 100 100 000 - 186
166 Unknown_Attribute ------ 100 100 000 - 0
167 Unknown_Attribute ------ 100 100 000 - 126
172 Unknown_Attribute -O--C- 100 100 000 - 0
173 Unknown_Attribute -O---K 100 100 000 - 0
192 Power-Off_Retract_Count -O--C- 100 100 000 - 714
194 Temperature_Celsius PO---K 060 060 000 - 40
196 Reallocated_Event_Count ------ 100 100 000 - 0
198 Offline_Uncorrectable -O--C- 100 100 000 - 0
199 UDMA_CRC_Error_Count PO-R-- 100 100 050 - 0
241 Total_LBAs_Written -O--C- 100 100 000 - 38304
242 Total_LBAs_Read -O--C- 100 100 000 - 47759
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 51 Comprehensive SMART error log
0x03 GPL R/O 64 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (64 sectors)
Device Error Count: 1
CR = Command Register
FEATR = Features Register
COUNT = Count (was: Sector Count) Register
LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8
LH = LBA High (was: Cylinder High) Register ] LBA
LM = LBA Mid (was: Cylinder Low) Register ] Register
LL = LBA Low (was: Sector Number) Register ]
DV = Device (was: Device/Head) Register
DC = Device Control Register
ER = Error register
ST = Status register
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1 [0] occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER -- ST COUNT LBA_48 LH LM LL DV DC
-- -- -- == -- == == == -- -- -- -- --
84 -- 51 00 00 00 22 ea 00 23 ea 40 00 Error: ABRT at LBA = 0x22ea0023ea = 149954765802
Commands leading to the command that caused the error were:
CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name
-- == -- == -- == == == -- -- -- -- -- --------------- --------------------
20 ff 00 00 00 00 22 ea 00 23 ea 40 00 00:00:00.000 READ SECTOR(S)
20 ff 00 01 00 00 08 00 00 22 ea 40 00 00:00:00.000 READ SECTOR(S)
20 ff 00 01 01 00 00 02 00 08 00 40 00 00:00:00.000 READ SECTOR(S)
20 ff 00 01 01 00 00 01 00 00 02 40 00 00:00:00.000 READ SECTOR(S)
20 ff 00 01 01 00 00 00 00 00 01 40 00 00:00:00.000 READ SECTOR(S)
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 4230 --- Lifetime Power-On Resets
0x01 0x010 4 10438 --- Power-on Hours
0x01 0x018 6 80329534424 --- Logical Sectors Written
0x01 0x028 6 100159106269 --- Logical Sectors Read
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 40 --- Current Temperature
0x05 0x020 1 40 --- Highest Temperature
0x05 0x028 1 40 --- Lowest Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x018 4 2 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 12 --- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 4 11 Transition from drive PhyRdy to drive PhyNRdy
0x000a 4 12 Device-to-host register FISes sent due to a COMRESET
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

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smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE amd64] (local build)
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: faspeed ZSM-256G-SI
Serial Number: --
LU WWN Device Id: 0 000000 ...
Firmware Version: V1103A4P
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available
Device is: Not in smartctl database 7.3/5319
ATA Version is: ACS-4 (minor revision not indicated)
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Fri Dec 1 13:58:42 2023 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM level is: 254 (maximum performance)
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 120) seconds.
Offline data collection
capabilities: (0x11) SMART execute Offline immediate.
No Auto Offline data collection support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
No Selective Self-test supported.
SMART capabilities: (0x0002) Does not save SMART data before
entering power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 10) minutes.
SCT capabilities: (0x0001) SCT Status supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate -O--CK 100 100 050 - 0
5 Reallocated_Sector_Ct -O--CK 100 100 050 - 0
9 Power_On_Hours -O--CK 100 100 050 - 7
12 Power_Cycle_Count -O--CK 100 100 050 - 52
160 Unknown_Attribute -O--CK 100 100 050 - 0
161 Unknown_Attribute PO--CK 100 100 050 - 100
163 Unknown_Attribute -O--CK 100 100 050 - 3
164 Unknown_Attribute -O--CK 100 100 050 - 0
165 Unknown_Attribute -O--CK 100 100 050 - 0
166 Unknown_Attribute -O--CK 100 100 050 - 0
167 Unknown_Attribute -O--CK 100 100 050 - 1
168 Unknown_Attribute -O--CK 100 100 050 - 5050
169 Unknown_Attribute -O--CK 100 100 050 - 100
175 Program_Fail_Count_Chip -O--CK 100 100 050 - 0
176 Erase_Fail_Count_Chip -O--CK 100 100 050 - 0
177 Wear_Leveling_Count -O--CK 100 100 050 - 0
178 Used_Rsvd_Blk_Cnt_Chip -O--CK 100 100 050 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 050 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 050 - 0
192 Power-Off_Retract_Count -O--CK 100 100 050 - 38
194 Temperature_Celsius -O---K 100 100 050 - 40
195 Hardware_ECC_Recovered -O--CK 100 100 050 - 0
196 Reallocated_Event_Count -O--CK 100 100 050 - 0
197 Current_Pending_Sector -O--CK 100 100 050 - 0
198 Offline_Uncorrectable -O--CK 100 100 050 - 0
199 UDMA_CRC_Error_Count -O--CK 100 100 050 - 0
232 Available_Reservd_Space -O--CK 100 100 050 - 100
241 Total_LBAs_Written ----CK 100 100 050 - 4587
242 Total_LBAs_Read ----CK 100 100 050 - 3159
245 Unknown_Attribute -O--CK 100 100 050 - 240
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x24 GPL R/O 88 Current Device Internal Status Data log
0x25 GPL R/O 32 Saved Device Internal Status Data log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
Selective Self-tests/Logging not supported
SCT Status Version: 3
SCT Version (vendor specific): 0 (0x0000)
Device State: Active (0)
Current Temperature: 40 Celsius
Power Cycle Min/Max Temperature: 40/40 Celsius
Lifetime Min/Max Temperature: 26/40 Celsius
Specified Max Operating Temperature: 100 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Data Table command not supported
SCT Error Recovery Control command not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 52 --- Lifetime Power-On Resets
0x01 0x010 4 7 --- Power-on Hours
0x01 0x018 6 300623472 --- Logical Sectors Written
0x01 0x020 6 1819322 --- Number of Write Commands
0x01 0x028 6 207044422 --- Logical Sectors Read
0x01 0x030 6 2259980 --- Number of Read Commands
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 0 --- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 4 0 Command failed due to ICRC error
0x0002 4 0 R_ERR response for data FIS
0x0005 4 0 R_ERR response for non-data FIS
0x000a 4 9 Device-to-host register FISes sent due to a COMRESET