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Update of reports (new: 6895, modified: 16)

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Andrey Ponomarenko
2025-01-05 01:57:11 +03:00
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smartctl 7.2 2021-09-14 r5236 [FreeBSD 13.0-RELEASE amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Micron 5100 Pro / 52x0 / 5300 SSDs
Device Model: Micron_5300_MTFDDAK1T9TDS
Serial Number: --
LU WWN Device Id: 5 00a075 ...
Firmware Version: D3MU001
User Capacity: 1,920,383,410,176 bytes [1.92 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic, zeroed
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-4 (minor revision not indicated)
SATA Version is: SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sun Aug 20 02:37:22 2023 MSK
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM level is: 254 (maximum performance)
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 6697) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 14) minutes.
Conveyance self-test routine
recommended polling time: ( 3) minutes.
SCT capabilities: (0x0035) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate POSR-K 100 100 050 - 0
5 Reallocated_Sector_Ct -O--CK 100 100 001 - 0
9 Power_On_Hours -O--CK 100 100 000 - 18053
12 Power_Cycle_Count -O--CK 100 100 001 - 82
170 Reserved_Block_Pct PO--CK 100 100 010 - 0
171 Program_Fail_Count -O--CK 100 100 000 - 0
172 Erase_Fail_Count -O--CK 100 100 001 - 0
173 Avg_Block-Erase_Count -O--CK 100 100 000 - 1
174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 34
183 SATA_Int_Downshift_Ct -O--CK 100 100 000 - 0
184 End-to-End_Error -O--CK 100 100 000 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
188 Command_Timeout -O--CK 100 100 000 - 86
194 Temperature_Celsius -O---K 054 047 000 - 46 (Min/Max 15/53)
195 Hardware_ECC_Recovered -O--CK 100 100 000 - 0
196 Reallocated_Event_Count -O--CK 100 100 000 - 0
197 Current_Pending_Sector -O--CK 100 100 000 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 1713
202 Percent_Lifetime_Remain ----CK 100 100 001 - 0
206 Write_Error_Rate -OSR-- 100 100 000 - 0
246 Total_LBAs_Written -O--CK 100 100 000 - 2317982040
247 Host_Program_Page_Count -O--CK 100 100 000 - 73355597
248 Bckgnd_Program_Page_Cnt -O--CK 100 100 000 - 9095512
180 Unused_Rsvd_Blk_Cnt_Tot PO--CK 100 100 000 - 4800
210 RAIN_Success_Recovered -O--CK 100 100 000 - 0
211 Integ_Scan_Complete_Cnt -O--CK 100 100 000 - 182
212 Integ_Scan_Folding_Cnt -O--CK 100 100 000 - 3
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 51 Comprehensive SMART error log
0x03 GPL R/O 16383 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x24 GPL R/O 8000 Current Device Internal Status Data log
0x25 GPL R/O 8000 Saved Device Internal Status Data log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa0 GPL VS 35328 Device vendor specific log
0xa1 GPL,SL VS 4 Device vendor specific log
0xa3 GPL VS 13824 Device vendor specific log
0xa4 GPL VS 354 Device vendor specific log
0xa4 SL VS 98 Device vendor specific log
0xa5 GPL VS 8000 Device vendor specific log
0xa5 SL VS 64 Device vendor specific log
0xa6 GPL VS 8000 Device vendor specific log
0xa6 SL VS 64 Device vendor specific log
0xa7 GPL VS 32768 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (16383 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 46 Celsius
Power Cycle Min/Max Temperature: 39/49 Celsius
Lifetime Min/Max Temperature: 15/53 Celsius
Specified Max Operating Temperature: 70 Celsius
Under/Over Temperature Limit Count: 0/0
Minimum supported ERC Time Limit: 50 (5.0 seconds)
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: -5/75 Celsius
Temperature History Size (Index): 478 (322)
SCT Error Recovery Control command not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 3) ==
0x01 0x008 4 82 --- Lifetime Power-On Resets
0x01 0x010 4 18053 --- Power-on Hours
0x01 0x018 6 2317982040 --- Logical Sectors Written
0x01 0x020 6 14880785 --- Number of Write Commands
0x01 0x028 6 2835086228 --- Logical Sectors Read
0x01 0x030 6 34660266 --- Number of Read Commands
0x01 0x038 6 64990860000 --- Date and Time TimeStamp
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 86 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 46 --- Current Temperature
0x05 0x010 1 46 --- Average Short Term Temperature
0x05 0x018 1 44 --- Average Long Term Temperature
0x05 0x020 1 53 --- Highest Temperature
0x05 0x028 1 15 --- Lowest Temperature
0x05 0x030 1 48 --- Highest Average Short Term Temperature
0x05 0x038 1 30 --- Lowest Average Short Term Temperature
0x05 0x040 1 45 --- Highest Average Long Term Temperature
0x05 0x048 1 32 --- Lowest Average Long Term Temperature
0x05 0x050 4 0 --- Time in Over-Temperature
0x05 0x058 1 70 --- Specified Maximum Operating Temperature
0x05 0x060 4 0 --- Time in Under-Temperature
0x05 0x068 1 0 --- Specified Minimum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 390 --- Number of Hardware Resets
0x06 0x010 4 77 --- Number of ASR Events
0x06 0x018 4 1713 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 0 --- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 4 0 Command failed due to ICRC error
0x0003 4 0 R_ERR response for device-to-host data FIS
0x0004 4 0 R_ERR response for host-to-device data FIS
0x0006 4 0 R_ERR response for device-to-host non-data FIS
0x000a 4 7 Device-to-host register FISes sent due to a COMRESET
0x000b 4 0 CRC errors within host-to-device FIS
0x000d 4 0 Non-CRC errors within host-to-device FIS

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smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.2-RELEASE-p1 amd64] (local build)
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Micron 5100 Pro / 52x0 / 5300 SSDs
Device Model: Micron_5300_MTFDDAK240TDS
Serial Number: --
LU WWN Device Id: 5 00a075 ...
Firmware Version: D3MU001
User Capacity: 240,057,409,536 bytes [240 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic, zeroed
Device is: In smartctl database 7.3/5319
ATA Version is: ACS-4 (minor revision not indicated)
SATA Version is: SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sun Aug 6 07:33:11 2023 PDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM level is: 254 (maximum performance)
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 837) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 5) minutes.
Conveyance self-test routine
recommended polling time: ( 3) minutes.
SCT capabilities: (0x0035) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate POSR-K 100 100 050 - 0
5 Reallocated_Sector_Ct -O--CK 100 100 001 - 0
9 Power_On_Hours -O--CK 100 100 000 - 2628
12 Power_Cycle_Count -O--CK 100 100 001 - 10
170 Reserved_Block_Pct PO--CK 100 100 010 - 0
171 Program_Fail_Count -O--CK 100 100 000 - 0
172 Erase_Fail_Count -O--CK 100 100 001 - 0
173 Avg_Block-Erase_Count -O--CK 100 100 000 - 7
174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 7
183 SATA_Int_Downshift_Ct -O--CK 100 100 000 - 0
184 End-to-End_Error -O--CK 100 100 000 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
188 Command_Timeout -O--CK 100 100 000 - 8
194 Temperature_Celsius -O---K 070 058 000 - 30 (Min/Max 17/42)
195 Hardware_ECC_Recovered -O--CK 100 100 000 - 0
196 Reallocated_Event_Count -O--CK 100 100 000 - 0
197 Current_Pending_Sector -O--CK 100 100 000 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0
202 Percent_Lifetime_Remain ----CK 100 100 001 - 0
206 Write_Error_Rate -OSR-- 100 100 000 - 0
246 Total_LBAs_Written -O--CK 100 100 000 - 4257036530
247 Host_Program_Page_Count -O--CK 100 100 000 - 133032411
248 Bckgnd_Program_Page_Cnt -O--CK 100 100 000 - 77156479
180 Unused_Rsvd_Blk_Cnt_Tot PO--CK 100 100 000 - 2305
210 RAIN_Success_Recovered -O--CK 100 100 000 - 0
211 Integ_Scan_Complete_Cnt -O--CK 100 100 000 - 23
212 Integ_Scan_Folding_Cnt -O--CK 100 100 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 51 Comprehensive SMART error log
0x03 GPL R/O 16383 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x24 GPL R/O 8000 Current Device Internal Status Data log
0x25 GPL R/O 8000 Saved Device Internal Status Data log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa0 GPL VS 35328 Device vendor specific log
0xa1 GPL,SL VS 4 Device vendor specific log
0xa3 GPL VS 13824 Device vendor specific log
0xa4 GPL VS 354 Device vendor specific log
0xa4 SL VS 98 Device vendor specific log
0xa5 GPL VS 8000 Device vendor specific log
0xa5 SL VS 64 Device vendor specific log
0xa6 GPL VS 8000 Device vendor specific log
0xa6 SL VS 64 Device vendor specific log
0xa7 GPL VS 32768 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (16383 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 30 Celsius
Power Cycle Min/Max Temperature: 20/42 Celsius
Lifetime Min/Max Temperature: 17/42 Celsius
Specified Max Operating Temperature: 70 Celsius
Under/Over Temperature Limit Count: 0/0
Minimum supported ERC Time Limit: 50 (5.0 seconds)
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: -5/75 Celsius
Temperature History Size (Index): 478 (291)
SCT Error Recovery Control command not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 3) ==
0x01 0x008 4 10 --- Lifetime Power-On Resets
0x01 0x010 4 2628 --- Power-on Hours
0x01 0x018 6 4257036530 --- Logical Sectors Written
0x01 0x020 6 188318542 --- Number of Write Commands
0x01 0x028 6 470737337 --- Logical Sectors Read
0x01 0x030 6 55209433 --- Number of Read Commands
0x01 0x038 6 9462120000 --- Date and Time TimeStamp
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 8 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 30 --- Current Temperature
0x05 0x010 1 30 --- Average Short Term Temperature
0x05 0x018 1 31 --- Average Long Term Temperature
0x05 0x020 1 42 --- Highest Temperature
0x05 0x028 1 17 --- Lowest Temperature
0x05 0x030 1 34 --- Highest Average Short Term Temperature
0x05 0x038 1 25 --- Lowest Average Short Term Temperature
0x05 0x040 1 31 --- Highest Average Long Term Temperature
0x05 0x048 1 31 --- Lowest Average Long Term Temperature
0x05 0x050 4 0 --- Time in Over-Temperature
0x05 0x058 1 70 --- Specified Maximum Operating Temperature
0x05 0x060 4 0 --- Time in Under-Temperature
0x05 0x068 1 0 --- Specified Minimum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 65 --- Number of Hardware Resets
0x06 0x010 4 19 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 0 --- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 4 0 Command failed due to ICRC error
0x0003 4 0 R_ERR response for device-to-host data FIS
0x0004 4 0 R_ERR response for host-to-device data FIS
0x0006 4 0 R_ERR response for device-to-host non-data FIS
0x000a 4 55 Device-to-host register FISes sent due to a COMRESET
0x000b 4 0 CRC errors within host-to-device FIS
0x000d 4 0 Non-CRC errors within host-to-device FIS