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Andrey Ponomarenko
2025-01-05 01:57:11 +03:00
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smartctl 7.4 2023-08-01 r5530 [FreeBSD 14.1-RELEASE amd64] (local build)
Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: SK hynix SATA SSDs
Device Model: SK hynix SC401 SATA 256GB
Serial Number: --
LU WWN Device Id: 5 ace42e ...
Firmware Version: 90000121
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic
Device is: In smartctl database 7.3/5528
ATA Version is: ACS-3 (minor revision not indicated)
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Mon Jul 29 21:59:19 2024 PDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 110) seconds.
Offline data collection
capabilities: (0x51) SMART execute Offline immediate.
No Auto Offline data collection support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0002) Does not save SMART data before
entering power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 40) minutes.
SMART Attributes Data Structure revision number: 0
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate -OSR-- 166 166 006 - 0
5 Retired_Block_Count PO--CK 100 100 036 - 0
9 Power_On_Hours -O--CK 099 099 000 - 1033
12 Power_Cycle_Count PO--CK 100 100 020 - 1934
100 Total_Erase_Count -O--CK 100 100 000 - 242890
168 Min_Erase_Count -O--CK 100 100 000 - 5
169 Max_Erase_Count -O--CK 098 098 000 - 64
174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 901
175 Program_Fail_Count_Chip PO--CK 100 100 010 - 0
176 Unused_Rsvd_Blk_Cnt_Tot PO--CK 100 100 010 - 0
177 Wear_Leveling_Count PO--CK 100 100 005 - 14
178 Used_Rsvd_Blk_Cnt_Chip PO--CK 100 100 010 - 0
179 Used_Rsvd_Blk_Cnt_Tot PO--CK 100 100 010 - 0
180 Erase_Fail_Count PO--CK 100 100 010 - 466
181 Non4k_Aligned_Access PO--CK 100 100 010 - 0
182 Erase_Fail_Count_Total PO--CK 100 100 010 - 0
184 End-to-End_Error -O--CK 100 100 000 - 0
187 Reported_Uncorrect PO--CK 100 100 001 - 0
188 Command_Timeout -O--CK 100 100 000 - 8
194 Temperature_Celsius -O---K 041 052 000 - 41 (Min/Max 16/52)
195 Hardware_ECC_Recovered PO-R-- 100 100 001 - 0
196 Reallocated_Event_Count -O--CK 100 100 036 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 UDMA_CRC_Error_Count PO--CK 100 100 001 - 0
204 Soft_ECC_Correction -OSR-- 095 001 000 - 416
212 Phy_Error_Count -O--CK 100 100 000 - 10265
234 Unknown_SK_hynix_Attrib -O--CK 100 100 000 - 6258473888
238 Unknown_SK_hynix_Attrib PO---K 100 100 001 - 100
241 Total_Writes_GB PO--CK 100 100 001 - 6178495566
242 Total_Reads_GB PO--CK 100 100 001 - 7766077676
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 4 Comprehensive SMART error log
0x03 GPL R/O 5 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 2 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (5 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (2 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 0 -
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 1934 --- Lifetime Power-On Resets
0x01 0x010 4 1033 --- Power-on Hours
0x01 0x018 6 6178495566 --- Logical Sectors Written
0x01 0x020 6 52959477 --- Number of Write Commands
0x01 0x028 6 7766077676 --- Logical Sectors Read
0x01 0x030 6 65704134 --- Number of Read Commands
0x01 0x038 6 1709775767894 --- Date and Time TimeStamp
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 8 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 41 --- Current Temperature
0x05 0x010 1 35 --- Average Short Term Temperature
0x05 0x018 1 - --- Average Long Term Temperature
0x05 0x020 1 52 --- Highest Temperature
0x05 0x028 1 16 --- Lowest Temperature
0x05 0x030 1 - --- Highest Average Short Term Temperature
0x05 0x038 1 26 --- Lowest Average Short Term Temperature
0x05 0x040 1 - --- Highest Average Long Term Temperature
0x05 0x048 1 - --- Lowest Average Long Term Temperature
0x05 0x050 4 0 --- Time in Over-Temperature
0x05 0x058 1 80 --- Specified Maximum Operating Temperature
0x05 0x060 4 46580 --- Time in Under-Temperature
0x05 0x068 1 -20 --- Specified Minimum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 4598 --- Number of Hardware Resets
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 0 --- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x000a 2 1 Device-to-host register FISes sent due to a COMRESET

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smartctl 7.4 2023-08-01 r5530 [FreeBSD 14.0-RELEASE amd64] (local build)
Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: SK hynix SATA SSDs
Device Model: SK hynix SC401 SATA 256GB
Serial Number: --
LU WWN Device Id: 5 ace42e ...
Firmware Version: 90000122
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: Solid State Device
Form Factor: M.2
TRIM Command: Available, deterministic
Device is: In smartctl database 7.3/5528
ATA Version is: ACS-3 (minor revision not indicated)
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sat Jan 13 02:25:26 2024 PST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 110) seconds.
Offline data collection
capabilities: (0x51) SMART execute Offline immediate.
No Auto Offline data collection support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0002) Does not save SMART data before
entering power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 40) minutes.
SMART Attributes Data Structure revision number: 0
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate -OSR-- 166 166 006 - 0
5 Retired_Block_Count PO--CK 100 100 036 - 0
9 Power_On_Hours -O--CK 085 085 000 - 13392
12 Power_Cycle_Count PO--CK 100 100 020 - 1446
100 Total_Erase_Count -O--CK 100 100 000 - 823350
168 Min_Erase_Count -O--CK 100 100 000 - 9
169 Max_Erase_Count -O--CK 098 098 000 - 73
174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 17
175 Program_Fail_Count_Chip PO--CK 100 100 010 - 0
176 Unused_Rsvd_Blk_Cnt_Tot PO--CK 100 100 010 - 0
177 Wear_Leveling_Count PO--CK 099 099 005 - 44
178 Used_Rsvd_Blk_Cnt_Chip PO--CK 100 100 010 - 8
179 Used_Rsvd_Blk_Cnt_Tot PO--CK 100 100 010 - 8
180 Erase_Fail_Count PO--CK 100 100 010 - 465
181 Non4k_Aligned_Access PO--CK 100 100 010 - 0
182 Erase_Fail_Count_Total PO--CK 100 100 010 - 0
184 End-to-End_Error -O--CK 100 100 000 - 5
187 Reported_Uncorrect PO--CK 100 100 001 - 9
188 Command_Timeout -O--CK 100 100 000 - 127
194 Temperature_Celsius -O---K 031 046 000 - 31 (Min/Max 11/46)
195 Hardware_ECC_Recovered PO-R-- 100 061 001 - 0
196 Reallocated_Event_Count -O--CK 100 100 036 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 40
199 UDMA_CRC_Error_Count PO--CK 100 100 001 - 0
204 Soft_ECC_Correction -OSR-- 001 001 000 - 4523
212 Phy_Error_Count -O--CK 100 100 000 - 13379
234 Unknown_SK_hynix_Attrib -O--CK 100 100 000 - 22755900320
238 Unknown_SK_hynix_Attrib PO---K 099 099 001 - 99
241 Total_Writes_GB PO--CK 100 100 001 - 25091179917
242 Total_Reads_GB PO--CK 100 100 001 - 25264325662
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 4 Comprehensive SMART error log
0x03 GPL R/O 5 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 2 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (5 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (2 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 1 -
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 1446 --- Lifetime Power-On Resets
0x01 0x010 4 13392 --- Power-on Hours
0x01 0x018 6 25091179917 --- Logical Sectors Written
0x01 0x020 6 500342548 --- Number of Write Commands
0x01 0x028 6 25264325662 --- Logical Sectors Read
0x01 0x030 6 411558570 --- Number of Read Commands
0x01 0x038 6 1524361093780 --- Date and Time TimeStamp
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 9 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 127 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 31 --- Current Temperature
0x05 0x010 1 30 --- Average Short Term Temperature
0x05 0x018 1 - --- Average Long Term Temperature
0x05 0x020 1 46 --- Highest Temperature
0x05 0x028 1 11 --- Lowest Temperature
0x05 0x030 1 - --- Highest Average Short Term Temperature
0x05 0x038 1 23 --- Lowest Average Short Term Temperature
0x05 0x040 1 - --- Highest Average Long Term Temperature
0x05 0x048 1 - --- Lowest Average Long Term Temperature
0x05 0x050 4 0 --- Time in Over-Temperature
0x05 0x058 1 80 --- Specified Maximum Operating Temperature
0x05 0x060 4 261400 --- Time in Under-Temperature
0x05 0x068 1 -20 --- Specified Minimum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 5317 --- Number of Hardware Resets
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 1 --- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x000a 2 14 Device-to-host register FISes sent due to a COMRESET

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smartctl 7.4 2023-08-01 r5530 [FreeBSD 13.2-RELEASE-p7 amd64] (local build)
Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: SK hynix SATA SSDs
Device Model: SK hynix SC401 SATA 256GB
Serial Number: --
LU WWN Device Id: 5 ace42e ...
Firmware Version: 90000122
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: Solid State Device
Form Factor: M.2
TRIM Command: Available, deterministic
Device is: In smartctl database 7.3/5528
ATA Version is: ACS-3 (minor revision not indicated)
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Dec 12 13:59:06 2023 GMT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 110) seconds.
Offline data collection
capabilities: (0x51) SMART execute Offline immediate.
No Auto Offline data collection support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0002) Does not save SMART data before
entering power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 40) minutes.
SMART Attributes Data Structure revision number: 0
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate -OSR-- 166 166 006 - 0
5 Retired_Block_Count PO--CK 100 100 036 - 0
9 Power_On_Hours -O--CK 077 077 000 - 21142
12 Power_Cycle_Count PO--CK 100 100 020 - 274
100 Total_Erase_Count -O--CK 100 100 000 - 3557616
168 Min_Erase_Count -O--CK 095 095 000 - 157
169 Max_Erase_Count -O--CK 093 093 000 - 224
174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 68
175 Program_Fail_Count_Chip PO--CK 100 100 010 - 0
176 Unused_Rsvd_Blk_Cnt_Tot PO--CK 100 100 010 - 0
177 Wear_Leveling_Count PO--CK 094 094 005 - 187
178 Used_Rsvd_Blk_Cnt_Chip PO--CK 100 100 010 - 0
179 Used_Rsvd_Blk_Cnt_Tot PO--CK 100 100 010 - 0
180 Erase_Fail_Count PO--CK 100 100 010 - 473
181 Non4k_Aligned_Access PO--CK 100 100 010 - 0
182 Erase_Fail_Count_Total PO--CK 100 100 010 - 0
184 End-to-End_Error -O--CK 100 100 000 - 0
187 Reported_Uncorrect PO--CK 100 100 001 - 0
188 Command_Timeout -O--CK 100 100 000 - 91
194 Temperature_Celsius -O---K 032 043 000 - 32 (Min/Max 9/43)
195 Hardware_ECC_Recovered PO-R-- 100 100 001 - 0
196 Reallocated_Event_Count -O--CK 100 100 036 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 UDMA_CRC_Error_Count PO--CK 100 100 001 - 0
204 Soft_ECC_Correction -OSR-- 001 001 000 - 4790
212 Phy_Error_Count -O--CK 100 100 000 - 12075
234 Unknown_SK_hynix_Attrib -O--CK 100 100 000 - 98331819136
238 Unknown_SK_hynix_Attrib PO---K 094 094 001 - 94
241 Total_Writes_GB PO--CK 100 100 001 - 68817494526
242 Total_Reads_GB PO--CK 100 100 001 - 190208864840
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 4 Comprehensive SMART error log
0x03 GPL R/O 5 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 2 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (5 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (2 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 21142 -
# 2 Short offline Completed without error 00% 0 -
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 274 --- Lifetime Power-On Resets
0x01 0x010 4 21142 --- Power-on Hours
0x01 0x018 6 68817494526 --- Logical Sectors Written
0x01 0x020 6 1671401842 --- Number of Write Commands
0x01 0x028 6 190208864840 --- Logical Sectors Read
0x01 0x030 6 5407645527 --- Number of Read Commands
0x01 0x038 6 1701778860599 --- Date and Time TimeStamp
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 91 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 32 --- Current Temperature
0x05 0x010 1 25 --- Average Short Term Temperature
0x05 0x018 1 18 --- Average Long Term Temperature
0x05 0x020 1 43 --- Highest Temperature
0x05 0x028 1 9 --- Lowest Temperature
0x05 0x030 1 - --- Highest Average Short Term Temperature
0x05 0x038 1 10 --- Lowest Average Short Term Temperature
0x05 0x040 1 - --- Highest Average Long Term Temperature
0x05 0x048 1 15 --- Lowest Average Long Term Temperature
0x05 0x050 4 0 --- Time in Over-Temperature
0x05 0x058 1 80 --- Specified Maximum Operating Temperature
0x05 0x060 4 1265060 --- Time in Under-Temperature
0x05 0x068 1 -20 --- Specified Minimum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 1287 --- Number of Hardware Resets
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 6 --- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x000a 2 11 Device-to-host register FISes sent due to a COMRESET