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mirror of https://github.com/bsdhw/SMART.git synced 2025-05-31 16:21:41 +05:30

Update of reports (new: 0, modified: 48)

This commit is contained in:
Andrey Ponomarenko
2023-05-01 23:26:24 +03:00
parent 148f8e6cc7
commit 390d502665
48 changed files with 958 additions and 960 deletions

View File

@@ -1,4 +1,4 @@
smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.0-STABLE amd64] (local build)
smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE amd64] (local build)
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
@@ -14,7 +14,7 @@ TRIM Command: Available, deterministic, zeroed
Device is: In smartctl database 7.3/5319
ATA Version is: ACS-2 (minor revision not indicated)
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Fri Apr 15 17:13:07 2022 PDT
Local Time is: Thu Aug 11 14:52:50 2022 PDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
@@ -29,12 +29,11 @@ Wt Cache Reorder: Unavailable
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Offline data collection status: (0x05) Offline data collection activity
was aborted by an interrupting command from host.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Self-test execution status: ( 16) The self-test routine was aborted by
the host.
Total time to complete Offline
data collection: ( 60) seconds.
Offline data collection
@@ -63,34 +62,34 @@ Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate ------ 100 100 000 - 0
5 Reallocated_Sector_Ct ------ 100 100 000 - 0
9 Power_On_Hours ------ 100 100 000 - 10363
12 Power_Cycle_Count ------ 100 100 000 - 39
148 Total_SLC_Erase_Ct ------ 100 100 000 - 692689
149 Max_SLC_Erase_Ct ------ 100 100 000 - 13084
150 Min_SLC_Erase_Ct ------ 100 100 000 - 12961
151 Average_SLC_Erase_Ct ------ 100 100 000 - 13069
164 Total_Erase_Count ------ 100 100 000 - 143607
165 Max_Erase_Count ------ 100 100 000 - 170
166 Min_Erase_Count ------ 100 100 000 - 114
167 Average_Erase_Count ------ 100 100 000 - 156
9 Power_On_Hours ------ 100 100 000 - 11524
12 Power_Cycle_Count ------ 100 100 000 - 44
148 Total_SLC_Erase_Ct ------ 100 100 000 - 858630
149 Max_SLC_Erase_Ct ------ 100 100 000 - 16215
150 Min_SLC_Erase_Ct ------ 100 100 000 - 16049
151 Average_SLC_Erase_Ct ------ 100 100 000 - 16200
164 Total_Erase_Count ------ 100 100 000 - 290781
165 Max_Erase_Count ------ 100 100 000 - 358
166 Min_Erase_Count ------ 100 100 000 - 258
167 Average_Erase_Count ------ 100 100 000 - 316
159 DRAM_1_Bit_Error_Count ------ 100 100 000 - 0
160 Uncorrectable_Error_Cnt ------ 100 100 000 - 0
161 Valid_Spare_Block_Cnt ------ 100 100 000 - 67
163 Initial_Bad_Block_Count ------ 100 100 000 - 11
168 Max_Erase_Count_of_Spec ------ 100 100 000 - 3000
169 Remaining_Lifetime_Perc ------ 100 100 000 - 95
177 Wear_Leveling_Count ------ 100 100 050 - 317
169 Remaining_Lifetime_Perc ------ 100 100 000 - 90
177 Wear_Leveling_Count ------ 100 100 050 - 420
181 Program_Fail_Cnt_Total ------ 100 100 000 - 0
182 Erase_Fail_Count_Total ------ 100 100 000 - 0
192 Power-Off_Retract_Count ------ 100 100 000 - 21
194 Temperature_Celsius ------ 100 100 000 - 63
192 Power-Off_Retract_Count ------ 100 100 000 - 26
194 Temperature_Celsius ------ 100 100 000 - 66
195 Hardware_ECC_Recovered ------ 100 100 000 - 0
196 Reallocated_Event_Count ------ 100 100 016 - 0
199 UDMA_CRC_Error_Count ------ 100 100 050 - 0
232 Available_Reservd_Space ------ 100 100 000 - 100
241 Host_Writes_32MiB ------ 100 100 000 - 809944
242 Host_Reads_32MiB ------ 100 100 000 - 10573
245 TLC_Writes_32MiB ------ 100 100 000 - 574428
241 Host_Writes_32MiB ------ 100 100 000 - 1323336
242 Host_Reads_32MiB ------ 100 100 000 - 11560
245 TLC_Writes_32MiB ------ 100 100 000 - 1163124
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
@@ -133,7 +132,7 @@ SMART Selective self-test log data structure revision number 1
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
7 0 65535 Read_scanning was completed without error
6 0 65535 Read_scanning was aborted by an interrupting command from host
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
@@ -143,20 +142,20 @@ SCT Commands not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 39 --- Lifetime Power-On Resets
0x01 0x010 4 10363 --- Power-on Hours
0x01 0x018 6 1540937517 --- Logical Sectors Written
0x01 0x020 6 600049625 --- Number of Write Commands
0x01 0x028 6 692940991 --- Logical Sectors Read
0x01 0x030 6 16227324 --- Number of Read Commands
0x01 0x008 4 44 --- Lifetime Power-On Resets
0x01 0x010 4 11524 --- Power-on Hours
0x01 0x018 6 826833805 --- Logical Sectors Written
0x01 0x020 6 1036280678 --- Number of Write Commands
0x01 0x028 6 757596999 --- Logical Sectors Read
0x01 0x030 6 17885225 --- Number of Read Commands
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 21 --- Resets Between Cmd Acceptance and Completion
0x04 0x010 4 26 --- Resets Between Cmd Acceptance and Completion
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 604 --- Number of Hardware Resets
0x06 0x008 4 671 --- Number of Hardware Resets
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 5 --- Percentage Used Endurance Indicator
0x07 0x008 1 10 --- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value