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Update of reports (new: 0, modified: 181)

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This commit is contained in:
Andrey Ponomarenko
2023-02-20 11:37:17 +03:00
parent 2ebb2890c1
commit 50023efe62
181 changed files with 3659 additions and 3568 deletions
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26
SSD/Samsung/MZYLN256/MZYLN256HCHP-000L2/CF876C66AE14
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@@ -14,7 +14,7 @@ TRIM Command: Available
Device is: In smartctl database 7.3/5319
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sat Jul 16 11:37:45 2022 EDT
Local Time is: Wed Jul 20 17:53:49 2022 EDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
@@ -26,7 +26,9 @@ ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
See vendor-specific Attribute list for failed Attributes.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
@@ -64,12 +66,12 @@ SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 098 098 000 - 8886
9 Power_On_Hours -O--CK 098 098 000 - 8988
12 Power_Cycle_Count -O--CK 098 098 000 - 2005
170 Unused_Rsvd_Blk_Ct_Chip -O--CK 100 100 010 - 0
171 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
172 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
173 Wear_Leveling_Count PO--CK 006 006 005 - 1994
173 Wear_Leveling_Count PO--CK 005 005 005 NOW 2009
174 Unexpect_Power_Loss_Ct -O--CK 099 099 000 - 55
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 768
@@ -77,10 +79,10 @@ ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
194 Temperature_Celsius -O--CK 076 059 000 - 24
199 CRC_Error_Count -OSRCK 100 100 000 - 0
233 Media_Wearout_Indicator PO--C- 001 001 000 - 50331
241 Total_LBAs_Written -O--CK 099 099 000 - 54739
242 Total_LBAs_Read -O--CK 099 099 000 - 6068
249 NAND_Writes_1GiB -O--CK 099 099 000 - 510672
233 Media_Wearout_Indicator PO--C- 001 001 000 - 216172782038286
241 Total_LBAs_Written -O--CK 099 099 000 - 55047
242 Total_LBAs_Read -O--CK 099 099 000 - 6074
249 NAND_Writes_1GiB -O--CK 099 099 000 - 514480
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
@@ -129,7 +131,7 @@ If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: SCT command executing in background (5)
Current Temperature: 23 Celsius
Current Temperature: 24 Celsius
Power Cycle Min/Max Temperature: 21/40 Celsius
Lifetime Min/Max Temperature: 0/70 Celsius
Under/Over Temperature Limit Count: 4294967295/4294901760
@@ -140,7 +142,7 @@ Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (93)
Temperature History Size (Index): 128 (67)
SCT Error Recovery Control:
Read: Disabled
@@ -160,8 +162,8 @@ ID Size Value Description
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 71 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 71 Device-to-host register FISes sent due to a COMRESET
0x0009 2 89 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 89 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC