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Update of reports (new: 1329, modified: 0)

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Andrey Ponomarenko
2023-05-01 22:53:35 +03:00
parent 52e1a865b7
commit 6760e6c317
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smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE-p7 amd64] (local build)
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: Micron C400 RealSSD mSATA 32GB
Serial Number: --
LU WWN Device Id: 5 00a075 ...
Firmware Version: 07MH
User Capacity: 32,017,047,552 bytes [32.0 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: < 1.8 inches
TRIM Command: Available, deterministic
Device is: Not in smartctl database 7.3/5319
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 6
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Mon Apr 3 15:20:43 2023 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM level is: 254 (maximum performance)
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (10235) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 2) minutes.
Conveyance self-test routine
recommended polling time: ( 3) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
12 Power_Cycle_Count PO--CK 100 100 001 - 4114
175 Program_Fail_Count_Chip PO--CK 100 100 000 - 0
176 Erase_Fail_Count_Chip PO--CK 100 100 000 - 0
177 Wear_Leveling_Count PO--CK 087 087 010 - 410
178 Used_Rsvd_Blk_Cnt_Chip PO--CK 099 099 000 - 2
179 Used_Rsvd_Blk_Cnt_Tot PO--CK 100 100 000 - 0
180 Unused_Rsvd_Blk_Cnt_Tot PO--CK 002 002 000 - 2160
181 Program_Fail_Cnt_Total PO--CK 100 100 001 - 0
182 Erase_Fail_Count_Total PO--CK 100 100 001 - 0
187 Reported_Uncorrect PO--CK 100 100 001 - 0
195 Hardware_ECC_Recovered POSR-K 100 100 050 - 0
241 Total_LBAs_Written PO--CK 100 100 000 - 24280738532
242 Total_LBAs_Read PO--CK 100 100 000 - 25089167804
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 51 Comprehensive SMART error log
0x03 GPL R/O 16383 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 255 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 3449 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa0 GPL VS 2000 Device vendor specific log
0xa0 SL VS 208 Device vendor specific log
0xa1-0xbf GPL,SL VS 1 Device vendor specific log
0xc0 GPL VS 80 Device vendor specific log
0xc1-0xdf GPL,SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (16383 sectors)
No Errors Logged
SMART Extended Self-test Log size 3449 not supported
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Vendor (0xff) Completed without error 00% 11463 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: SMART Off-line Data Collection executing in background (4)
Current Temperature: 56 Celsius
Power Cycle Min/Max Temperature: 55/59 Celsius
Lifetime Min/Max Temperature: 17/75 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: -5/75 Celsius
Temperature History Size (Index): 478 (397)
SCT Error Recovery Control:
Read: 40 (4.0 seconds)
Write: 40 (4.0 seconds)
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 2) ==
0x01 0x008 4 4114 --- Lifetime Power-On Resets
0x01 0x010 4 11476 --- Power-on Hours
0x01 0x018 6 24280738532 --- Logical Sectors Written
0x01 0x020 6 1540328128 --- Number of Write Commands
0x01 0x028 6 25089167804 --- Logical Sectors Read
0x01 0x030 6 1515131946 --- Number of Read Commands
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 56 --- Current Temperature
0x05 0x010 1 56 --- Average Short Term Temperature
0x05 0x018 1 41 --- Average Long Term Temperature
0x05 0x020 1 76 --- Highest Temperature
0x05 0x028 1 26 --- Lowest Temperature
0x05 0x030 1 59 --- Highest Average Short Term Temperature
0x05 0x038 1 36 --- Lowest Average Short Term Temperature
0x05 0x040 1 44 --- Highest Average Long Term Temperature
0x05 0x048 1 40 --- Lowest Average Long Term Temperature
0x05 0x050 4 10 --- Time in Over-Temperature
0x05 0x058 1 70 --- Specified Maximum Operating Temperature
0x05 0x060 4 - --- Time in Under-Temperature
0x05 0x068 1 0 --- Specified Minimum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 2555 --- Number of Hardware Resets
0x06 0x010 4 0 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 2 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 4 0 Command failed due to ICRC error
0x000a 4 12 Device-to-host register FISes sent due to a COMRESET