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Andrey Ponomarenko
2023-05-01 22:53:35 +03:00
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smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE-p7 amd64] (local build)
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Silicon Motion based SSDs
Device Model: TS32GMSA370
Serial Number: --
LU WWN Device Id: 5 7c3548 ...
Firmware Version: P1225CH1
User Capacity: 32,017,047,552 bytes [32.0 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available, deterministic, zeroed
Device is: In smartctl database 7.3/5319
ATA Version is: ACS-2 (minor revision not indicated)
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Fri Apr 21 10:58:42 2023 EDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Disabled
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x71) SMART execute Offline immediate.
No Auto Offline data collection support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0002) Does not save SMART data before
entering power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 1) minutes.
Conveyance self-test routine
recommended polling time: ( 1) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate ------ 100 100 000 - 0
5 Reallocated_Sector_Ct ------ 100 100 000 - 0
9 Power_On_Hours ------ 100 100 000 - 5354
12 Power_Cycle_Count ------ 100 100 000 - 39
160 Uncorrectable_Error_Cnt ------ 100 100 000 - 0
161 Valid_Spare_Block_Cnt ------ 100 100 000 - 149
163 Initial_Bad_Block_Count ------ 100 100 000 - 15
164 Total_Erase_Count ------ 100 100 000 - 521911
165 Max_Erase_Count ------ 100 100 000 - 323
166 Min_Erase_Count ------ 100 100 000 - 221
167 Average_Erase_Count ------ 100 100 000 - 250
168 Max_Erase_Count_of_Spec ------ 100 100 000 - 3000
169 Remaining_Lifetime_Perc ------ 100 100 000 - 92
175 Program_Fail_Count_Chip ------ 100 100 000 - 0
176 Erase_Fail_Count_Chip ------ 100 100 000 - 0
177 Wear_Leveling_Count ------ 100 100 050 - 1535
178 Runtime_Invalid_Blk_Cnt ------ 100 100 000 - 0
181 Program_Fail_Cnt_Total ------ 100 100 000 - 0
182 Erase_Fail_Count_Total ------ 100 100 000 - 0
192 Power-Off_Retract_Count ------ 100 100 000 - 18
194 Temperature_Celsius ------ 100 100 000 - 42
195 Hardware_ECC_Recovered ------ 100 100 000 - 0
196 Reallocated_Event_Count ------ 100 100 016 - 0
197 Current_Pending_Sector ------ 100 100 000 - 0
198 Offline_Uncorrectable ------ 100 100 000 - 0
199 UDMA_CRC_Error_Count ------ 100 100 050 - 0
232 Available_Reservd_Space ------ 100 100 000 - 100
241 Host_Writes_32MiB ------ 100 100 000 - 147450
242 Host_Reads_32MiB ------ 100 100 000 - 530
245 TLC_Writes_32MiB ------ 100 100 000 - 260955
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 GPL,SL R/O 1 Summary SMART error log
0x02 GPL,SL R/O 1 Comprehensive SMART error log
0x03 GPL,SL R/O 1 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 GPL,SL R/O 1 SMART self-test log
0x07 GPL,SL R/O 1 Extended self-test log
0x09 GPL,SL R/W 1 Selective self-test log
0x10 GPL,SL R/O 1 NCQ Command Error log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 5350 -
# 2 Short offline Completed without error 00% 5344 -
# 3 Short offline Completed without error 00% 5338 -
# 4 Short offline Completed without error 00% 5332 -
# 5 Extended offline Completed without error 00% 5329 -
# 6 Extended offline Completed without error 00% 5322 -
# 7 Short offline Completed without error 00% 5321 -
# 8 Short offline Completed without error 00% 5298 -
# 9 Short offline Completed without error 00% 623 -
#10 Short offline Self-test routine in progress 10% 326 -
#11 Short offline Completed without error 00% 122 -
#12 Extended offline Completed without error 00% 0 -
#13 Short offline Completed without error 00% 0 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
7 0 65535 Read_scanning was completed without error
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 2) ==
0x01 0x008 4 39 --- Lifetime Power-On Resets
0x01 0x010 4 5354 --- Power-on Hours
0x01 0x018 6 9663314872 --- Logical Sectors Written
0x01 0x020 6 216392027 --- Number of Write Commands
0x01 0x028 6 34774081 --- Logical Sectors Read
0x01 0x030 6 1464708 --- Number of Read Commands
0x02 ===== = = === == Free-Fall Statistics (empty) ==
0x03 ===== = = === == Rotating Media Statistics (empty) ==
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 18 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (empty) ==
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 11010853 --- Number of Hardware Resets
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 8 --- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11) not supported

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smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE-p7 amd64] (local build)
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Silicon Motion based SSDs
Device Model: TS32GMSA370
Serial Number: --
LU WWN Device Id: 5 7c3548 ...
Firmware Version: P1225CH1
User Capacity: 32,017,047,552 bytes [32.0 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available, deterministic, zeroed
Device is: In smartctl database 7.3/5319
ATA Version is: ACS-2 (minor revision not indicated)
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Thu Apr 20 13:30:14 2023 +0530
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Disabled
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x71) SMART execute Offline immediate.
No Auto Offline data collection support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0002) Does not save SMART data before
entering power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 1) minutes.
Conveyance self-test routine
recommended polling time: ( 1) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate ------ 100 100 000 - 0
5 Reallocated_Sector_Ct ------ 100 100 000 - 0
9 Power_On_Hours ------ 100 100 000 - 1220
12 Power_Cycle_Count ------ 100 100 000 - 29
160 Uncorrectable_Error_Cnt ------ 100 100 000 - 0
161 Valid_Spare_Block_Cnt ------ 100 100 000 - 159
163 Initial_Bad_Block_Count ------ 100 100 000 - 5
164 Total_Erase_Count ------ 100 100 000 - 502847
165 Max_Erase_Count ------ 100 100 000 - 297
166 Min_Erase_Count ------ 100 100 000 - 196
167 Average_Erase_Count ------ 100 100 000 - 240
168 Max_Erase_Count_of_Spec ------ 100 100 000 - 3000
169 Remaining_Lifetime_Perc ------ 100 100 000 - 92
175 Program_Fail_Count_Chip ------ 100 100 000 - 0
176 Erase_Fail_Count_Chip ------ 100 100 000 - 0
177 Wear_Leveling_Count ------ 100 100 050 - 787
178 Runtime_Invalid_Blk_Cnt ------ 100 100 000 - 0
181 Program_Fail_Cnt_Total ------ 100 100 000 - 0
182 Erase_Fail_Count_Total ------ 100 100 000 - 0
192 Power-Off_Retract_Count ------ 100 100 000 - 9
194 Temperature_Celsius ------ 100 100 000 - 40
195 Hardware_ECC_Recovered ------ 100 100 000 - 0
196 Reallocated_Event_Count ------ 100 100 016 - 0
197 Current_Pending_Sector ------ 100 100 000 - 0
198 Offline_Uncorrectable ------ 100 100 000 - 0
199 UDMA_CRC_Error_Count ------ 100 100 050 - 0
232 Available_Reservd_Space ------ 100 100 000 - 100
241 Host_Writes_32MiB ------ 100 100 000 - 180037
242 Host_Reads_32MiB ------ 100 100 000 - 1599
245 TLC_Writes_32MiB ------ 100 100 000 - 251423
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 GPL,SL R/O 1 Summary SMART error log
0x02 GPL,SL R/O 1 Comprehensive SMART error log
0x03 GPL,SL R/O 1 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 GPL,SL R/O 1 SMART self-test log
0x07 GPL,SL R/O 1 Extended self-test log
0x09 GPL,SL R/W 1 Selective self-test log
0x10 GPL,SL R/O 1 NCQ Command Error log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
6 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 2) ==
0x01 0x008 4 29 --- Lifetime Power-On Resets
0x01 0x010 4 1220 --- Power-on Hours
0x01 0x018 6 11798914095 --- Logical Sectors Written
0x01 0x020 6 171550318 --- Number of Write Commands
0x01 0x028 6 104804342 --- Logical Sectors Read
0x01 0x030 6 7481366 --- Number of Read Commands
0x02 ===== = = === == Free-Fall Statistics (empty) ==
0x03 ===== = = === == Rotating Media Statistics (empty) ==
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 9 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (empty) ==
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 96 --- Number of Hardware Resets
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 8 --- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11) not supported

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smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE-p7 amd64] (local build)
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Silicon Motion based SSDs
Device Model: TS32GSSD370S
Serial Number: --
LU WWN Device Id: 5 7c3548 ...
Firmware Version: S0903D
User Capacity: 32,017,047,552 bytes [32.0 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available, deterministic, zeroed
Device is: In smartctl database 7.3/5319
ATA Version is: ACS-2 (minor revision not indicated)
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Mar 7 08:33:21 2023 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Disabled
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x71) SMART execute Offline immediate.
No Auto Offline data collection support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0002) Does not save SMART data before
entering power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 1) minutes.
Conveyance self-test routine
recommended polling time: ( 1) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate ------ 100 100 000 - 0
5 Reallocated_Sector_Ct ------ 100 100 010 - 0
9 Power_On_Hours ------ 100 100 000 - 0
12 Power_Cycle_Count ------ 100 100 000 - 8
160 Uncorrectable_Error_Cnt ------ 100 100 000 - 0
161 Valid_Spare_Block_Cnt ------ 100 100 012 - 28
163 Initial_Bad_Block_Count ------ 100 100 000 - 4
164 Total_Erase_Count ------ 100 100 000 - 227
165 Max_Erase_Count ------ 100 100 000 - 2
166 Min_Erase_Count ------ 100 100 000 - 0
167 Average_Erase_Count ------ 100 100 027 - 0
168 Max_Erase_Count_of_Spec ------ 100 100 000 - 3000
169 Remaining_Lifetime_Perc ------ 100 100 000 - 100
175 Program_Fail_Count_Chip ------ 100 100 000 - 0
176 Erase_Fail_Count_Chip ------ 100 100 000 - 0
177 Wear_Leveling_Count ------ 100 100 000 - 0
178 Runtime_Invalid_Blk_Cnt ------ 100 100 000 - 0
181 Program_Fail_Cnt_Total ------ 100 100 000 - 0
182 Erase_Fail_Count_Total ------ 100 100 000 - 0
192 Power-Off_Retract_Count ------ 100 100 000 - 1
194 Temperature_Celsius ------ 100 100 000 - 39
195 Hardware_ECC_Recovered ------ 100 100 000 - 116
196 Reallocated_Event_Count ------ 100 100 000 - 0
197 Current_Pending_Sector ------ 100 100 000 - 0
198 Offline_Uncorrectable ------ 100 100 000 - 0
199 UDMA_CRC_Error_Count ------ 100 100 000 - 0
232 Available_Reservd_Space ------ 100 100 000 - 100
241 Host_Writes_32MiB ------ 100 100 000 - 312
242 Host_Reads_32MiB ------ 100 100 000 - 1000
245 TLC_Writes_32MiB ------ 100 100 000 - 351
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 GPL,SL R/O 1 Summary SMART error log
0x02 GPL,SL R/O 1 Comprehensive SMART error log
0x03 GPL,SL R/O 1 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 GPL,SL R/O 1 SMART self-test log
0x07 GPL,SL R/O 1 Extended self-test log
0x09 GPL,SL R/W 1 Selective self-test log
0x10 GPL,SL R/O 1 NCQ Command Error log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 0 -
# 2 Short offline Completed without error 00% 0 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
7 0 65535 Read_scanning was completed without error
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 2) ==
0x01 0x008 4 8 --- Lifetime Power-On Resets
0x01 0x010 4 0 --- Power-on Hours
0x01 0x018 6 20485905 --- Logical Sectors Written
0x01 0x020 6 315518 --- Number of Write Commands
0x01 0x028 6 65560196 --- Logical Sectors Read
0x01 0x030 6 577186 --- Number of Read Commands
0x02 ===== = = === == Free-Fall Statistics (empty) ==
0x03 ===== = = === == Rotating Media Statistics (empty) ==
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 1 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (empty) ==
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 27 --- Number of Hardware Resets
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 0 --- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11) not supported