80486DX2-66/SMART-open-study
1
0
Fork 0
mirror of https://github.com/bsdhw/SMART.git synced 2025-05-31 16:21:41 +05:30
Code Issues Activity

Update of reports (new: 0, modified: 424)

Browse Source
This commit is contained in:
Andrey Ponomarenko
2023-02-17 09:04:26 +03:00
parent 4aabefee83
commit 785ce3d324
424 changed files with 8726 additions and 8652 deletions
Download Patch File Download Diff File Expand all files Collapse all files

38
SSD/MyDigitalSSD/SB/SB2/11D63A03BFFF
View File

@@ -1,5 +1,5 @@
smartctl 7.2 2021-09-14 r5236 [FreeBSD 12.1-RELEASE-p21-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.0-STABLE amd64] (local build)
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: SB2
@@ -11,10 +11,10 @@ Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: M.2
TRIM Command: Available
Device is: Not in smartctl database [for details use: -P showall]
Device is: Not in smartctl database 7.3/5319
ATA Version is: ACS-4 (minor revision not indicated)
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sun Dec 19 02:12:25 2021 UTC
Local Time is: Wed May 18 23:32:46 2022 CDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
@@ -32,9 +32,8 @@ General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Self-test execution status: ( 16) The self-test routine was aborted by
the host.
Total time to complete Offline
data collection: (65535) seconds.
Offline data collection
@@ -62,16 +61,16 @@ SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate PO-R-- 100 100 050 - 25
9 Power_On_Hours -O--C- 100 100 000 - 24467
12 Power_Cycle_Count -O--C- 100 100 000 - 160
9 Power_On_Hours -O--C- 100 100 000 - 28091
12 Power_Cycle_Count -O--C- 100 100 000 - 203
168 Unknown_Attribute -O--C- 100 100 000 - 0
170 Unknown_Attribute PO---- 082 082 010 - 8589934707
173 Unknown_Attribute -O--C- 100 100 000 - 4522085
192 Power-Off_Retract_Count -O--C- 100 100 000 - 126
173 Unknown_Attribute -O--C- 100 100 000 - 7798930
192 Power-Off_Retract_Count -O--C- 100 100 000 - 143
194 Temperature_Celsius PO---K 067 067 000 - 33 (Min/Max 33/33)
218 Unknown_Attribute PO-R-- 100 100 050 - 0
231 Unknown_SSD_Attribute PO--C- 100 100 000 - 97
241 Total_LBAs_Written -O--C- 100 100 000 - 3310
231 Unknown_SSD_Attribute PO--C- 100 100 000 - 96
241 Total_LBAs_Written -O--C- 100 100 000 - 16906
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
@@ -249,7 +248,8 @@ Error 18 [17] occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
25 00 00 00 78 00 00 09 e1 2a 10 40 02 00:00:00.000 READ DMA EXT
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Aborted by host 00% 27349 -
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
@@ -268,10 +268,10 @@ SCT Commands not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 160 --- Lifetime Power-On Resets
0x01 0x010 4 24467 --- Power-on Hours
0x01 0x018 6 6942153682 --- Logical Sectors Written
0x01 0x028 6 14326799940 --- Logical Sectors Read
0x01 0x008 4 203 --- Lifetime Power-On Resets
0x01 0x010 4 28091 --- Power-on Hours
0x01 0x018 6 35456111069 --- Logical Sectors Written
0x01 0x028 6 16468689027 --- Logical Sectors Read
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 25 --- Number of Reported Uncorrectable Errors
0x05 ===== = = === == Temperature Statistics (rev 1) ==
@@ -281,7 +281,7 @@ Page Offset Size Value Flags Description
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 2 --- Percentage Used Endurance Indicator
0x07 0x008 1 3 --- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value