80486DX2-66/SMART-open-study
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Update of reports (new: 0, modified: 424)

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Andrey Ponomarenko
2023-02-17 09:04:26 +03:00
parent 4aabefee83
commit 785ce3d324
424 changed files with 8726 additions and 8652 deletions
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53
SSD/Transcend/TS32/TS32GSSD370S/836BB60BE5A0
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@@ -1,4 +1,4 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p16-HBSD amd64] (local build)
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p20-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
@@ -13,7 +13,7 @@ TRIM Command: Available, deterministic, zeroed
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2 (minor revision not indicated)
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sat Apr 24 23:56:34 2021 IDT
Local Time is: Wed Nov 17 01:13:11 2021 IST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Disabled
@@ -28,8 +28,8 @@ Wt Cache Reorder: Unavailable
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
@@ -62,34 +62,34 @@ Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate ------ 100 100 000 - 0
5 Reallocated_Sector_Ct ------ 100 100 000 - 0
9 Power_On_Hours ------ 100 100 000 - 135
12 Power_Cycle_Count ------ 100 100 000 - 448
9 Power_On_Hours ------ 100 100 000 - 136
12 Power_Cycle_Count ------ 100 100 000 - 466
160 Uncorrectable_Error_Cnt ------ 100 100 000 - 0
161 Valid_Spare_Block_Cnt ------ 100 100 000 - 48
163 Initial_Bad_Block_Count ------ 100 100 000 - 20
164 Total_Erase_Count ------ 100 100 000 - 118533
165 Max_Erase_Count ------ 100 100 000 - 152
166 Min_Erase_Count ------ 100 100 000 - 51
167 Average_Erase_Count ------ 100 100 000 - 116
164 Total_Erase_Count ------ 100 100 000 - 120602
165 Max_Erase_Count ------ 100 100 000 - 153
166 Min_Erase_Count ------ 100 100 000 - 53
167 Average_Erase_Count ------ 100 100 000 - 118
168 Max_Erase_Count_of_Spec ------ 100 100 000 - 3000
169 Remaining_Lifetime_Perc ------ 100 100 000 - 97
175 Program_Fail_Count_Chip ------ 100 100 000 - 0
176 Erase_Fail_Count_Chip ------ 100 100 000 - 0
177 Wear_Leveling_Count ------ 100 100 050 - 12
177 Wear_Leveling_Count ------ 100 100 050 - 14
178 Runtime_Invalid_Blk_Cnt ------ 100 100 000 - 0
181 Program_Fail_Cnt_Total ------ 100 100 000 - 0
182 Erase_Fail_Count_Total ------ 100 100 000 - 0
192 Power-Off_Retract_Count ------ 100 100 000 - 97
194 Temperature_Celsius ------ 100 100 000 - 32
192 Power-Off_Retract_Count ------ 100 100 000 - 104
194 Temperature_Celsius ------ 100 100 000 - 30
195 Hardware_ECC_Recovered ------ 100 100 000 - 0
196 Reallocated_Event_Count ------ 100 100 016 - 0
197 Current_Pending_Sector ------ 100 100 000 - 0
198 Offline_Uncorrectable ------ 100 100 000 - 0
199 UDMA_CRC_Error_Count ------ 100 100 050 - 0
232 Available_Reservd_Space ------ 100 100 000 - 100
241 Host_Writes_32MiB ------ 100 100 000 - 62296
242 Host_Reads_32MiB ------ 100 100 000 - 40092
245 TLC_Writes_32MiB ------ 100 100 000 - 118533
241 Host_Writes_32MiB ------ 100 100 000 - 63268
242 Host_Reads_32MiB ------ 100 100 000 - 40961
245 TLC_Writes_32MiB ------ 100 100 000 - 120602
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
@@ -116,7 +116,8 @@ SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 136 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
@@ -125,7 +126,7 @@ SMART Selective self-test log data structure revision number 1
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
6 0 65535 Read_scanning was never started
7 0 65535 Read_scanning was completed without error
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
@@ -135,20 +136,20 @@ SCT Commands not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 2) ==
0x01 0x008 4 448 --- Lifetime Power-On Resets
0x01 0x010 4 135 --- Power-on Hours
0x01 0x018 6 4082687117 --- Logical Sectors Written
0x01 0x020 6 79642517 --- Number of Write Commands
0x01 0x028 6 2627515366 --- Logical Sectors Read
0x01 0x030 6 45512969 --- Number of Read Commands
0x01 0x008 4 466 --- Lifetime Power-On Resets
0x01 0x010 4 136 --- Power-on Hours
0x01 0x018 6 4146396707 --- Logical Sectors Written
0x01 0x020 6 80762205 --- Number of Write Commands
0x01 0x028 6 2684454237 --- Logical Sectors Read
0x01 0x030 6 47283177 --- Number of Read Commands
0x02 ===== = = === == Free-Fall Statistics (empty) ==
0x03 ===== = = === == Rotating Media Statistics (empty) ==
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 97 --- Resets Between Cmd Acceptance and Completion
0x04 0x010 4 104 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (empty) ==
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 59607 --- Number of Hardware Resets
0x06 0x008 4 59699 --- Number of Hardware Resets
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 3 --- Percentage Used Endurance Indicator