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mirror of https://github.com/bsdhw/SMART.git synced 2025-05-31 16:21:41 +05:30

Update of reports (new: 35, modified: 3308)

This commit is contained in:
Andrey Ponomarenko
2025-01-05 02:37:11 +03:00
parent f68c38aa35
commit 8c515ea896
3343 changed files with 73552 additions and 65384 deletions

View File

@@ -1,5 +1,5 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p18-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
smartctl 7.4 2023-08-01 r5530 [FreeBSD 13.2-RELEASE-p10 amd64] (local build)
Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: MK0400GCTZA
@@ -11,10 +11,10 @@ Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic, zeroed
Device is: Not in smartctl database [for details use: -P showall]
Device is: Not in smartctl database 7.3/5528
ATA Version is: ATA8-ACS T13/1699-D revision 4
SATA Version is: SATA 2.6, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Thu Jun 17 15:42:06 2021 EDT
Local Time is: Fri Mar 22 11:39:22 2024 EDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
@@ -36,7 +36,7 @@ Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 60) seconds.
data collection: ( 2) seconds.
Offline data collection
capabilities: (0x79) SMART execute Offline immediate.
No Auto Offline data collection support.
@@ -65,13 +65,13 @@ SCT capabilities: (0x0039) SCT Status supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate POSR-- 130 130 039 - 2935373177
1 Raw_Read_Error_Rate POSR-- 130 130 039 - 4294967295
5 Reallocated_Sector_Ct PO--CK 100 100 001 - 0
9 Power_On_Hours -O--CK 100 100 000 - 41980
173 Unknown_Attribute PO--CK 099 099 001 - 0
175 Program_Fail_Count_Chip PO--CK 100 100 010 - 1013757772427
9 Power_On_Hours -O--CK 100 100 000 - 66069
173 Unknown_Attribute PO--CK 098 098 001 - 0
175 Program_Fail_Count_Chip PO--CK 100 100 010 - 1619702645379
180 Unused_Rsvd_Blk_Cnt_Tot PO-RCK 130 130 039 - 4294967295
194 Temperature_Celsius -O---K 100 100 000 - 32
194 Temperature_Celsius -O---K 100 100 000 - 25
196 Reallocated_Event_Count PO--CK 100 100 010 - 0
||||||_ K auto-keep
|||||__ C event count
@@ -110,11 +110,12 @@ No Errors Logged
SMART Extended Self-test Log Version: 1 (2 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 32169 -
# 2 Extended offline Completed without error 00% 30990 -
# 3 Short offline Completed without error 00% 30938 -
# 4 Short offline Completed without error 00% 19258 -
# 5 Short offline Completed without error 00% 15724 -
# 1 Short offline Completed without error 00% 64981 -
# 2 Extended offline Completed without error 00% 32169 -
# 3 Extended offline Completed without error 00% 30990 -
# 4 Short offline Completed without error 00% 30938 -
# 5 Short offline Completed without error 00% 19258 -
# 6 Short offline Completed without error 00% 15724 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
@@ -130,8 +131,8 @@ If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 32 Celsius
Power Cycle Min/Max Temperature: 8/38 Celsius
Current Temperature: 25 Celsius
Power Cycle Min/Max Temperature: 15/33 Celsius
Lifetime Min/Max Temperature: 8/44 Celsius
Specified Max Operating Temperature: 55 Celsius
Under/Over Temperature Limit Count: 0/0
@@ -141,7 +142,7 @@ Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 0/55 Celsius
Min/Max Temperature Limit: 0/55 Celsius
Temperature History Size (Index): 478 (412)
Temperature History Size (Index): 478 (339)
SCT Error Recovery Control:
Read: Disabled
@@ -150,34 +151,34 @@ SCT Error Recovery Control:
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 118 --- Lifetime Power-On Resets
0x01 0x018 6 235086950959 --- Logical Sectors Written
0x01 0x020 6 2215886265 --- Number of Write Commands
0x01 0x028 6 37257063481 --- Logical Sectors Read
0x01 0x030 6 272615627 --- Number of Read Commands
0x01 0x008 4 127 --- Lifetime Power-On Resets
0x01 0x018 6 607550329427 --- Logical Sectors Written
0x01 0x020 6 4844487627 --- Number of Write Commands
0x01 0x028 6 58272474363 --- Logical Sectors Read
0x01 0x030 6 423633600 --- Number of Read Commands
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 32 --- Current Temperature
0x05 0x010 1 32 --- Average Short Term Temperature
0x05 0x018 1 31 --- Average Long Term Temperature
0x05 0x008 1 25 --- Current Temperature
0x05 0x010 1 24 --- Average Short Term Temperature
0x05 0x018 1 23 --- Average Long Term Temperature
0x05 0x020 1 44 --- Highest Temperature
0x05 0x028 1 10 --- Lowest Temperature
0x05 0x030 1 34 --- Highest Average Short Term Temperature
0x05 0x030 1 36 --- Highest Average Short Term Temperature
0x05 0x038 1 10 --- Lowest Average Short Term Temperature
0x05 0x040 1 31 --- Highest Average Long Term Temperature
0x05 0x040 1 34 --- Highest Average Long Term Temperature
0x05 0x048 1 11 --- Lowest Average Long Term Temperature
0x05 0x050 4 0 --- Time in Over-Temperature
0x05 0x058 1 55 --- Specified Maximum Operating Temperature
0x05 0x060 4 0 --- Time in Under-Temperature
0x05 0x068 1 0 --- Specified Minimum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 38977 --- Number of Hardware Resets
0x06 0x010 4 572 --- Number of ASR Events
0x06 0x008 4 39308 --- Number of Hardware Resets
0x06 0x010 4 818 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 1 --- Percentage Used Endurance Indicator
0x07 0x008 1 2 --- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
@@ -190,7 +191,7 @@ ID Size Value Description
0x0003 4 0 R_ERR response for device-to-host data FIS
0x0004 4 0 R_ERR response for host-to-device data FIS
0x0006 4 0 R_ERR response for device-to-host non-data FIS
0x000a 4 123 Device-to-host register FISes sent due to a COMRESET
0x000a 4 33 Device-to-host register FISes sent due to a COMRESET
0x000b 4 0 CRC errors within host-to-device FIS
0x000d 4 0 Non-CRC errors within host-to-device FIS