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https://github.com/bsdhw/SMART.git
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Update of reports (new: 35, modified: 3308)
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@@ -15,7 +15,7 @@ TRIM Command: Available, deterministic, zeroed
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Device is: In smartctl database 7.3/5528
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ATA Version is: ACS-3 (minor revision not indicated)
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SATA Version is: SATA 3.3, 6.0 Gb/s (current: 3.0 Gb/s)
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Local Time is: Tue Oct 31 00:49:05 2023 CDT
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Local Time is: Tue Oct 31 02:16:09 2023 CDT
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SMART support is: Available - device has SMART capability.
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SMART support is: Enabled
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AAM feature is: Unavailable
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@@ -66,34 +66,34 @@ Vendor Specific SMART Attributes with Thresholds:
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ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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1 Raw_Read_Error_Rate POSR-K 100 100 050 - 0
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5 Retired_Block_Count PO--CK 100 100 005 - 0
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9 Power_On_Hours -O--CK 100 100 000 - 30211
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12 Power_Cycle_Count -O--CK 100 100 000 - 153
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100 Total_Erase_Count -O--CK 100 100 000 - 604698
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9 Power_On_Hours -O--CK 100 100 000 - 30212
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12 Power_Cycle_Count -O--CK 100 100 000 - 154
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100 Total_Erase_Count -O--CK 100 100 000 - 605018
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168 Min_Erase_Count -O--CK 100 100 000 - 4
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169 Max_Erase_Count -O--CK 099 099 000 - 25
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171 Program_Fail_Count -O--CK 100 100 000 - 0
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172 Erase_Fail_Count -O--CK 100 100 000 - 0
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173 Wear_Leveling_Count -O--CK 100 100 005 - 11
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174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 64
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174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 65
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175 Program_Fail_Count_Chip -O--CK 100 100 000 - 0
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176 Unused_Rsvd_Blk_Cnt_Tot -O---K 100 100 000 - 1507
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178 Used_Rsvd_Blk_Cnt_Chip -O--CK 100 100 000 - 0
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179 Used_Rsvd_Blk_Cnt_Tot -O--CK 100 100 000 - 0
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180 Erase_Fail_Count -O--CK 100 100 000 - 0
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181 Non4k_Aligned_Access -O---K 100 079 000 - 31653727
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181 Non4k_Aligned_Access -O---K 100 079 000 - 31653728
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183 SATA_Downshift_Count -O--CK 100 100 000 - 0
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184 End-to-End_Error PO-RCK 100 100 097 - 0
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187 Reported_Uncorrect -O--CK 100 100 000 - 0
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188 Command_Timeout -O--CK 100 100 000 - 0
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194 Temperature_Celsius -O---K 041 049 000 - 41 (Min/Max 21/49)
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194 Temperature_Celsius -O---K 043 049 000 - 43 (Min/Max 21/49)
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196 Reallocated_Event_Count -O--CK 100 100 036 - 0
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198 Offline_Uncorrectable ----CK 100 100 000 - 0
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199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0
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201 Percent_Lifetime_Remain PO---K 100 100 005 - 11
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212 Phy_Error_Count -O--CK 100 100 000 - 6012
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241 Total_Writes_GB -O--CK 100 100 000 - 1043678
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242 Total_Reads_GB -O--CK 100 100 000 - 998774
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243 Total_Media_Writes -O--CK 100 100 000 - 342198
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212 Phy_Error_Count -O--CK 100 100 000 - 6014
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241 Total_Writes_GB -O--CK 100 100 000 - 1043780
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242 Total_Reads_GB -O--CK 100 100 000 - 998815
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243 Total_Media_Writes -O--CK 100 100 000 - 342313
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||||||_ K auto-keep
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|||||__ C event count
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||||___ R error rate
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@@ -127,7 +127,7 @@ No Errors Logged
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Warning! SMART Extended Self-test Log Structure error: invalid SMART checksum.
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SMART Extended Self-test Log Version: 1 (1 sectors)
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Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
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# 1 Vendor (0x50) Completed without error 00% 30211 -
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# 1 Vendor (0x50) Completed without error 00% 30212 -
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Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
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SMART Selective self-test log data structure revision number 0
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@@ -145,18 +145,18 @@ If Selective self-test is pending on power-up, resume after 0 minute delay.
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SCT Status Version: 3
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SCT Version (vendor specific): 1 (0x0001)
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Device State: Active (0)
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Current Temperature: 41 Celsius
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Power Cycle Min/Max Temperature: 34/41 Celsius
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Current Temperature: 43 Celsius
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Power Cycle Min/Max Temperature: 42/43 Celsius
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Lifetime Min/Max Temperature: 21/53 Celsius
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Specified Max Operating Temperature: 80 Celsius
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Under/Over Temperature Limit Count: 245/0
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Under/Over Temperature Limit Count: 54/0
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SCT Temperature History Version: 2
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Temperature Sampling Period: 1 minute
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Temperature Logging Interval: 1 minute
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Min/Max recommended Temperature: -20/80 Celsius
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Min/Max Temperature Limit: -20/125 Celsius
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Temperature History Size (Index): 192 (145)
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Temperature History Size (Index): 192 (28)
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SCT Error Recovery Control:
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Read: 80 (8.0 seconds)
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@@ -165,24 +165,24 @@ SCT Error Recovery Control:
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Device Statistics (GP Log 0x04)
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Page Offset Size Value Flags Description
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0x01 ===== = = === == General Statistics (rev 2) ==
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0x01 0x008 4 153 -D- Lifetime Power-On Resets
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0x01 0x010 4 30211 -D- Power-on Hours
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0x01 0x018 6 1043678 --- Logical Sectors Written
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0x01 0x020 6 1043678 --- Number of Write Commands
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0x01 0x028 6 998774 --- Logical Sectors Read
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0x01 0x030 6 342198 --- Number of Read Commands
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0x01 0x008 4 154 -D- Lifetime Power-On Resets
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0x01 0x010 4 30212 -D- Power-on Hours
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0x01 0x018 6 1043780 --- Logical Sectors Written
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0x01 0x020 6 1043780 --- Number of Write Commands
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0x01 0x028 6 998815 --- Logical Sectors Read
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0x01 0x030 6 342313 --- Number of Read Commands
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0x04 ===== = = === == General Errors Statistics (rev 1) ==
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0x04 0x008 4 0 -D- Number of Reported Uncorrectable Errors
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0x04 0x010 4 0 -D- Resets Between Cmd Acceptance and Completion
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0x05 ===== = = === == Temperature Statistics (rev 1) ==
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0x05 0x008 1 41 -D- Current Temperature
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0x05 0x008 1 43 -D- Current Temperature
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0x05 0x020 1 53 -D- Highest Temperature
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0x05 0x028 1 21 -D- Lowest Temperature
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0x05 0x038 1 0 -D- Lowest Average Short Term Temperature
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0x05 0x058 1 80 --- Specified Maximum Operating Temperature
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0x06 ===== = = === == Transport Statistics (rev 1) ==
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0x06 0x008 4 1074 -D- Number of Hardware Resets
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0x06 0x010 4 916 -D- Number of ASR Events
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0x06 0x008 4 1077 -D- Number of Hardware Resets
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0x06 0x010 4 918 -D- Number of ASR Events
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0x06 0x018 4 0 -D- Number of Interface CRC Errors
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0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
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0x07 0x008 1 11 -D- Percentage Used Endurance Indicator
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@@ -197,5 +197,5 @@ ID Size Value Description
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0x0001 2 0 Command failed due to ICRC error
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0x0002 2 0 R_ERR response for data FIS
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0x0005 2 0 R_ERR response for non-data FIS
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0x000a 2 6 Device-to-host register FISes sent due to a COMRESET
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0x000a 2 3 Device-to-host register FISes sent due to a COMRESET
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