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172
SSD/Samsung/MZ7/MZ7LN128HCHP-000L1/0652D8EEDA3E Normal file
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smartctl 7.2 2020-12-30 r5155 [FreeBSD 13.0-RELEASE-p1 amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG MZ7LN128HCHP-000L1
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EMT03L0Q
User Capacity: 128,035,676,160 bytes [128 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Fri May 28 22:30:31 2021 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 64) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 097 097 000 - 10840
12 Power_Cycle_Count -O--CK 097 097 000 - 2180
170 Unused_Rsvd_Blk_Ct_Chip -O--CK 100 100 010 - 0
171 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
172 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
173 Wear_Leveling_Count PO--CK 090 090 005 - 203
174 Unexpect_Power_Loss_Ct -O--CK 099 099 000 - 39
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 394
184 End-to-End_Error PO--CK 100 100 097 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
194 Temperature_Celsius -O--CK 062 050 000 - 38
199 CRC_Error_Count -OSRCK 100 100 000 - 0
233 Media_Wearout_Indicator PO--C- 089 089 000 - 15074327
241 Total_LBAs_Written -O--CK 099 099 000 - 9832
242 Total_LBAs_Read -O--CK 099 099 000 - 11377
249 NAND_Writes_1GiB -O--CK 099 099 000 - 25984
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xdf GPL,SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: SCT command executing in background (5)
Current Temperature: 37 Celsius
Power Cycle Min/Max Temperature: 34/40 Celsius
Lifetime Min/Max Temperature: 0/70 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 3 (Unknown, should be 2)
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (13)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 4 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 4 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

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smartctl 7.2 2020-12-30 r5155 [FreeBSD 13.0-STABLE amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG MZNTE128HMGR-000SO
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT25S0Q
User Capacity: 128,035,676,160 bytes [128 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sat May 29 10:51:38 2021 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 70) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 099 099 000 - 4
9 Power_On_Hours -O--CK 098 098 000 - 8829
12 Power_Cycle_Count -O--CK 081 081 000 - 19015
177 Wear_Leveling_Count PO--C- 089 089 000 - 89
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 099 099 010 - 99
181 Program_Fail_Cnt_Total -O--CK 100 100 000 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 000 - 0
183 Runtime_Bad_Block PO--C- 099 099 000 - 4
187 Reported_Uncorrect -O--CK 099 099 000 - 1
190 Airflow_Temperature_Cel -O--CK 062 040 000 - 38
195 Hardware_ECC_Recovered -O-RC- 199 199 000 - 1
199 UDMA_CRC_Error_Count -OSRCK 100 100 000 - 2
235 Unknown_Attribute -O--C- 099 099 000 - 172
241 Total_LBAs_Written -O--CK 099 099 000 - 28737092912
242 Total_LBAs_Read -O--CK 099 099 000 - 33175407863
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 16 Device vendor specific log
0xce GPL,SL VS 16 Device vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 38 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/52800
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (52)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 8 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 8 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

31
SSD/Samsung/README.md
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@@ -27,20 +27,20 @@ MTBF — avg. MTBF in years per sample.
| Samsung | MMCRE28G5MXP-0VB | 128 GB | 1 | 1998 | 0 | 5.47 |
| Samsung | SSD 850 PRO | 128 GB | 5 | 1921 | 0 | 5.27 |
| Samsung | SSD PB22-JS3 TM | 64 GB | 1 | 1801 | 0 | 4.94 |
| Samsung | SSD 840 PRO Series | 128 GB | 8 | 1791 | 3 | 4.62 |
| Samsung | SSD 840 EVO | 120 GB | 11 | 1758 | 32 | 4.50 |
| Samsung | SSD 840 EVO | 120 GB | 12 | 1932 | 30 | 4.42 |
| Samsung | MZMTE512HMHP-000MV | 512 GB | 2 | 1593 | 0 | 4.36 |
| Samsung | SSD 840 PRO Series | 128 GB | 10 | 1584 | 2 | 4.11 |
| Samsung | MZMTD128HAFV-000L1 | 128 GB | 1 | 1487 | 0 | 4.08 |
| Samsung | MZ-5EA2000-0D3 | 200 GB | 4 | 1475 | 0 | 4.04 |
| Samsung | SSD PM830 2.5" 7mm | 256 GB | 2 | 1416 | 0 | 3.88 |
| Samsung | SSD PB22-JS3 2.5" | 128 GB | 1 | 1365 | 0 | 3.74 |
| Samsung | SSD 840 Series | 120 GB | 5 | 1364 | 0 | 3.74 |
| Samsung | SSD 840 Series | 250 GB | 2 | 1328 | 0 | 3.64 |
| Samsung | SSD 830 Series | 128 GB | 4 | 1312 | 0 | 3.60 |
| Samsung | MZ7LM240HCGR-0E003 | 240 GB | 2 | 1295 | 0 | 3.55 |
| Samsung | MZ7LN256HMJP-000H1 | 256 GB | 1 | 1283 | 0 | 3.52 |
| Samsung | MZ7TD256HAFV-000L7 | 256 GB | 2 | 1224 | 0 | 3.36 |
| Samsung | SSD RBX Series ... | 64 GB | 1 | 1182 | 0 | 3.24 |
| Samsung | SSD 830 Series | 128 GB | 5 | 1144 | 0 | 3.13 |
| Samsung | SSD 840 EVO 250... | 250 GB | 1 | 1131 | 0 | 3.10 |
| Samsung | MZ7LN256HMJP-00000 | 256 GB | 2 | 1117 | 0 | 3.06 |
| Samsung | SSD 850 EVO mSATA | 1 TB | 1 | 2157 | 1 | 2.96 |
@@ -52,24 +52,23 @@ MTBF — avg. MTBF in years per sample.
| Samsung | SSD 850 EVO M.2 | 500 GB | 4 | 987 | 0 | 2.71 |
| Samsung | SSD 750 EVO | 250 GB | 6 | 864 | 0 | 2.37 |
| Samsung | MZ7LN256HCHP-000H1 | 256 GB | 1 | 862 | 0 | 2.36 |
| Samsung | SSD 850 EVO M.2 | 120 GB | 1 | 831 | 0 | 2.28 |
| Samsung | SSD 830 Series | 64 GB | 2 | 812 | 0 | 2.23 |
| Samsung | SSD 850 EVO | 250 GB | 53 | 792 | 0 | 2.17 |
| Samsung | SSD 860 EVO mSATA | 250 GB | 3 | 787 | 0 | 2.16 |
| Samsung | SSD 850 PRO | 512 GB | 12 | 782 | 0 | 2.14 |
| Samsung | MZNLN128HCGR-000L1 | 128 GB | 1 | 781 | 0 | 2.14 |
| Samsung | SSD 850 EVO | 250 GB | 51 | 773 | 0 | 2.12 |
| Samsung | MZNLN256HCHP-000L7 | 256 GB | 4 | 768 | 0 | 2.11 |
| Samsung | SSD PM810 2.5" 7mm | 128 GB | 1 | 762 | 0 | 2.09 |
| Samsung | SSD CM871 2.5 7mm | 128 GB | 1 | 750 | 0 | 2.06 |
| Samsung | SSD 840 PRO Series | 256 GB | 9 | 963 | 1 | 2.04 |
| Samsung | SSD 850 EVO | 2 TB | 1 | 742 | 0 | 2.03 |
| Samsung | SSD 830 Series | 256 GB | 2 | 731 | 0 | 2.00 |
| Samsung | SSD 840 EVO | 250 GB | 16 | 725 | 0 | 1.99 |
| Samsung | SSD 850 PRO | 512 GB | 11 | 721 | 0 | 1.98 |
| Samsung | MZMPC032HBCD-00000 | 32 GB | 1 | 721 | 0 | 1.98 |
| Samsung | SSD 850 EVO M.2 | 250 GB | 6 | 719 | 0 | 1.97 |
| Samsung | SSD 860 EVO | 2 TB | 2 | 717 | 0 | 1.97 |
| Samsung | MZ7PC128HAFU-000L1 | 128 GB | 1 | 683 | 0 | 1.87 |
| Samsung | SSD 850 EVO | 1 TB | 8 | 875 | 1 | 1.84 |
| Samsung | MZ7KM240HMHQ-00005 | 240 GB | 2 | 669 | 0 | 1.83 |
| Samsung | SSD 840 PRO Series | 256 GB | 8 | 898 | 1 | 1.79 |
| Samsung | SG9MSM6D024GPM00 | 22 GB | 1 | 649 | 0 | 1.78 |
| Samsung | SSD 850 PRO | 256 GB | 9 | 642 | 0 | 1.76 |
| Samsung | MZ7TY128HDHP-000L1 | 128 GB | 1 | 642 | 0 | 1.76 |
@@ -80,8 +79,11 @@ MTBF — avg. MTBF in years per sample.
| Samsung | SSD 750 EVO | 120 GB | 3 | 540 | 0 | 1.48 |
| Samsung | MZ7KM960HMJP-00005 | 960 GB | 1 | 508 | 0 | 1.39 |
| Samsung | SSD PM830 2.5" 7mm | 128 GB | 1 | 505 | 0 | 1.38 |
| Samsung | SSD 850 EVO M.2 | 120 GB | 2 | 487 | 0 | 1.34 |
| Samsung | MZ7LN512HMJP-000L7 | 512 GB | 1 | 483 | 0 | 1.32 |
| Samsung | SSD 860 EVO | 2 TB | 3 | 480 | 0 | 1.32 |
| Samsung | SSD 750 EVO | 500 GB | 2 | 471 | 0 | 1.29 |
| Samsung | MZ7LN128HCHP-000L1 | 128 GB | 1 | 451 | 0 | 1.24 |
| Samsung | SSD 860 EVO mSATA | 1 TB | 3 | 446 | 0 | 1.22 |
| Samsung | SSD PM830 FDE 2... | 256 GB | 1 | 440 | 0 | 1.21 |
| Samsung | MZ7LN256HAJQ-000H1 | 256 GB | 1 | 400 | 0 | 1.10 |
@@ -93,7 +95,7 @@ MTBF — avg. MTBF in years per sample.
| Samsung | MZ7TY256HDHP-000L7 | 256 GB | 2 | 350 | 0 | 0.96 |
| Samsung | MZ7LF192HCGS-000L1 | 192 GB | 1 | 335 | 0 | 0.92 |
| Samsung | SSD 860 PRO | 1 TB | 3 | 333 | 0 | 0.91 |
| Samsung | SSD 860 EVO | 500 GB | 29 | 317 | 0 | 0.87 |
| Samsung | SSD 860 EVO | 500 GB | 31 | 306 | 0 | 0.84 |
| Samsung | MZ7TD128HAFV-000L1 | 128 GB | 1 | 306 | 0 | 0.84 |
| Samsung | MZ7TE128HMGR-00004 | 128 GB | 1 | 303 | 0 | 0.83 |
| Samsung | MZ7LN256HCHP-000L7 | 256 GB | 3 | 250 | 0 | 0.69 |
@@ -103,8 +105,8 @@ MTBF — avg. MTBF in years per sample.
| Samsung | MZHPV512HDGL-000L1 | 512 GB | 1 | 222 | 0 | 0.61 |
| Samsung | MZ7TY128HDHP-00000 | 128 GB | 1 | 218 | 0 | 0.60 |
| Samsung | SSD 860 EVO | 250 GB | 23 | 217 | 0 | 0.59 |
| Samsung | SSD 860 EVO | 1 TB | 13 | 211 | 0 | 0.58 |
| Samsung | SSD 860 EVO mSATA | 500 GB | 6 | 203 | 0 | 0.56 |
| Samsung | SSD 860 EVO | 1 TB | 12 | 202 | 0 | 0.55 |
| Samsung | SSD 860 PRO | 512 GB | 2 | 185 | 0 | 0.51 |
| Samsung | SSD 860 PRO | 256 GB | 10 | 185 | 0 | 0.51 |
| Samsung | MZ7LH1T9HMLT0D3 | 1.9 TB | 2 | 180 | 0 | 0.50 |
@@ -119,16 +121,19 @@ MTBF — avg. MTBF in years per sample.
| Samsung | MZMTE128HMGR-000MV | 128 GB | 1 | 94 | 0 | 0.26 |
| Samsung | SSD 860 QVO | 2 TB | 1 | 88 | 0 | 0.24 |
| Samsung | SSD 860 EVO | 4 TB | 1 | 68 | 0 | 0.19 |
| Samsung | MZNTE128HMGR-000SO | 128 GB | 1 | 367 | 5 | 0.17 |
| Samsung | MZMTE1T0HMJH-00000 | 1 TB | 1 | 59 | 0 | 0.16 |
| Samsung | SSD 870 QVO | 2 TB | 2 | 58 | 0 | 0.16 |
| Samsung | SSD 860 EVO M.2 | 1 TB | 2 | 53 | 0 | 0.15 |
| Samsung | SSD 650 | 120 GB | 1 | 50 | 0 | 0.14 |
| Samsung | SSD 870 EVO | 1 TB | 2 | 49 | 0 | 0.13 |
| Samsung | MZ7LN256HCHP-000F0 | 256 GB | 1 | 37 | 0 | 0.10 |
| Samsung | MZYTE256HMHP-000L2 | 256 GB | 1 | 36 | 0 | 0.10 |
| Samsung | SSD 870 QVO | 1 TB | 2 | 23 | 0 | 0.07 |
| Samsung | SSD PM810 2.5" 7mm | 256 GB | 1 | 362 | 24 | 0.04 |
| Samsung | MZNLN256HAJQ-000L7 | 256 GB | 1 | 14 | 0 | 0.04 |
| Samsung | SSD 850 PRO | 1 TB | 1 | 13 | 0 | 0.04 |
| Samsung | SSD 870 EVO | 250 GB | 5 | 10 | 0 | 0.03 |
| Samsung | SSD 870 EVO | 250 GB | 6 | 11 | 0 | 0.03 |
| Samsung | MZNLN256HMHQ-000 | 256 GB | 1 | 5 | 0 | 0.02 |
| Samsung | MZMTE128HMGR-000L2 | 128 GB | 1 | 4 | 0 | 0.01 |
| Samsung | MMCRE28GFMXP-MVB | 128 GB | 1 | 2 | 0 | 0.01 |
@@ -153,5 +158,5 @@ MTBF — avg. MTBF in years per sample.
| MFG | Family | Models | Samples | Days | Err | MTBF |
|-----------|------------------------|--------|---------|-------|-------|--------|
| Samsung | Samsung based SSDs | 101 | 387 | 680 | 4 | 1.80 |
| Samsung | Unknown | 15 | 26 | 386 | 1 | 1.05 |
| Samsung | Samsung based SSDs | 105 | 405 | 684 | 4 | 1.79 |
| Samsung | Unknown | 16 | 29 | 350 | 1 | 0.96 |

143
SSD/Samsung/SSD 830/SSD 830 Series 128GB/4960799332E0 Normal file
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@@ -0,0 +1,143 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p16-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG SSD 830 Series
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: CXM03B1Q
User Capacity: 128,035,676,160 bytes [128 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2 T13/2015-D revision 2
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Thu May 20 21:56:51 2021 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 540) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 9) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 097 097 000 - 11302
12 Power_Cycle_Count -O--CK 097 097 000 - 2837
177 Wear_Leveling_Count PO--C- 081 081 000 - 683
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 073 051 000 - 27
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 253 253 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 131
241 Total_LBAs_Written -O--CK 099 099 000 - 36917724775
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 GPL,SL R/O 1 Summary SMART error log
0x02 GPL,SL R/O 2 Comprehensive SMART error log
0x03 GPL,SL R/O 2 Ext. Comprehensive SMART error log
0x06 GPL,SL R/O 1 SMART self-test log
0x07 GPL,SL R/O 2 Extended self-test log
0x09 GPL,SL R/W 1 Selective self-test log
0x10 GPL,SL R/O 1 NCQ Command Error log
0x11 GPL,SL R/O 1 SATA Phy Event Counters log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (2 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (2 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended captive Completed without error 00% 8987 -
# 2 Short offline Completed without error 00% 8987 -
# 3 Short offline Completed without error 00% 8987 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 49152 R_ERR response for data FIS
0x0003 2 53248 R_ERR response for device-to-host data FIS
0x0004 2 57344 R_ERR response for host-to-device data FIS
0x0005 2 7952 R_ERR response for non-data FIS
0x0006 2 2562 R_ERR response for device-to-host non-data FIS
0x0007 2 4096 R_ERR response for host-to-device non-data FIS
0x0008 2 7952 Device-to-host non-data FIS retries
0x0009 2 7953 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 9003 Device-to-host register FISes sent due to a COMRESET
0x000b 2 6145 CRC errors within host-to-device FIS
0x000d 2 7953 Non-CRC errors within host-to-device FIS
0x000f 2 8176 R_ERR response for host-to-device data FIS, CRC
0x0010 2 15 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 49153 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 12112 R_ERR response for host-to-device non-data FIS, non-CRC

184
SSD/Samsung/SSD 840/SSD 840 EVO 120GB/043248670C6A Normal file
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@@ -0,0 +1,184 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 13.0-RELEASE amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 840 EVO 120GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT0BB0Q
User Capacity: 120,034,123,776 bytes [120 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Fri May 28 09:36:55 2021 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 4200) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 70) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 099 099 010 - 2
9 Power_On_Hours -O--CK 081 081 000 - 92227
12 Power_Cycle_Count -O--CK 099 099 000 - 261
177 Wear_Leveling_Count PO--C- 001 001 000 - 1633
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 099 099 010 - 2
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 099 099 010 - 2
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 074 051 000 - 26
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 099 099 000 - 27
235 POR_Recovery_Count -O--C- 099 099 000 - 129
241 Total_LBAs_Written -O--CK 099 099 000 - 326499436495
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 16 Device vendor specific log
0xce GPL,SL VS 16 Device vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 399 -
# 2 Short offline Completed without error 00% 2487 -
# 3 Short offline Completed without error 00% 1744 -
# 4 Short offline Completed without error 00% 1072 -
# 5 Short offline Completed without error 00% 328 -
# 6 Short offline Completed without error 00% 1431 -
# 7 Short offline Completed without error 00% 711 -
# 8 Short offline Completed without error 00% 0 -
# 9 Short offline Completed without error 00% 0 -
#10 Short offline Completed without error 00% 11307 -
#11 Short offline Completed without error 00% 9394 -
#12 Short offline Completed without error 00% 8650 -
#13 Short offline Completed without error 00% 6712 -
#14 Short offline Completed without error 00% 5992 -
#15 Short offline Completed without error 00% 4055 -
#16 Short offline Completed without error 00% 2142 -
#17 Short offline Completed without error 00% 1398 -
#18 Short offline Completed without error 00% 2623 -
#19 Short offline Completed without error 00% 686 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 26 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/388684
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (2)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 11 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 11 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

164
SSD/Samsung/SSD 840/SSD 840 PRO Series 128GB/AF2325BDA247 Normal file
View File

@@ -0,0 +1,164 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p16-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 840 PRO Series
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: DXM05B0Q
User Capacity: 128,035,676,160 bytes [128 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available, deterministic, zeroed
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sun May 23 14:31:18 2021 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (65476) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 15) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 097 097 000 - 12752
12 Power_Cycle_Count -O--CK 096 096 000 - 3795
177 Wear_Leveling_Count PO--C- 094 094 000 - 195
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 077 054 000 - 23
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 210
241 Total_LBAs_Written -O--CK 099 099 000 - 22732415406
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 GPL,SL R/O 1 Summary SMART error log
0x02 GPL,SL R/O 1 Comprehensive SMART error log
0x03 GPL,SL R/O 1 Ext. Comprehensive SMART error log
0x06 GPL,SL R/O 1 SMART self-test log
0x07 GPL,SL R/O 1 Extended self-test log
0x09 GPL,SL R/W 1 Selective self-test log
0x10 GPL,SL R/O 1 NCQ Command Error log
0x11 GPL,SL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 1 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa0 GPL,SL VS 16 Device vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: SCT command executing in background (5)
Current Temperature: 23 Celsius
Power Cycle Min/Max Temperature: 23/40 Celsius
Lifetime Min/Max Temperature: 0/70 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 3 (Unknown, should be 2)
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (7)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 8 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 8 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

163
SSD/Samsung/SSD 840/SSD 840 PRO Series 128GB/DB5F45802A10 Normal file
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smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p16-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 840 PRO Series
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: DXM06B0Q
User Capacity: 128,035,676,160 bytes [128 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available, deterministic, zeroed
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Mon May 24 13:56:32 2021 EDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x80) Offline data collection activity
was never started.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 1920) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 15) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 095 095 000 - 23598
12 Power_Cycle_Count -O--CK 093 093 000 - 6281
177 Wear_Leveling_Count PO--C- 075 075 000 - 888
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 072 061 000 - 28
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 4590
241 Total_LBAs_Written -O--CK 099 099 000 - 80993512696
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 GPL,SL R/O 1 Summary SMART error log
0x02 GPL,SL R/O 1 Comprehensive SMART error log
0x03 GPL,SL R/O 1 Ext. Comprehensive SMART error log
0x06 GPL,SL R/O 1 SMART self-test log
0x07 GPL,SL R/O 1 Extended self-test log
0x09 GPL,SL R/W 1 Selective self-test log
0x10 GPL,SL R/O 1 NCQ Command Error log
0x11 GPL,SL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 1 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa0 GPL,SL VS 16 Device vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 23570 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: SCT command executing in background (5)
Current Temperature: 29 Celsius
Power Cycle Min/Max Temperature: 25/40 Celsius
Lifetime Min/Max Temperature: 0/70 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 3 (Unknown, should be 2)
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (26)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 15 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 15 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

162
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smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p16-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 840 PRO Series
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: DXM06B0Q
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available, deterministic, zeroed
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue May 18 23:27:27 2021 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (53956) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 20) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 092 092 000 - 35572
12 Power_Cycle_Count -O--CK 096 096 000 - 3684
177 Wear_Leveling_Count PO--C- 083 083 000 - 588
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 069 055 000 - 31
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 099 099 000 - 779
235 POR_Recovery_Count -O--C- 099 099 000 - 607
241 Total_LBAs_Written -O--CK 099 099 000 - 157523019483
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 GPL,SL R/O 1 Summary SMART error log
0x02 GPL,SL R/O 1 Comprehensive SMART error log
0x03 GPL,SL R/O 1 Ext. Comprehensive SMART error log
0x06 GPL,SL R/O 1 SMART self-test log
0x07 GPL,SL R/O 1 Extended self-test log
0x09 GPL,SL R/W 1 Selective self-test log
0x10 GPL,SL R/O 1 NCQ Command Error log
0x11 GPL,SL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 1 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa0 GPL,SL VS 16 Device vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: SCT command executing in background (5)
Current Temperature: 32 Celsius
Power Cycle Min/Max Temperature: 31/40 Celsius
Lifetime Min/Max Temperature: 0/70 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 3 (Unknown, should be 2)
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (2)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 3 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 3 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

188
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smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.2-RELEASE-p6 amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 850 EVO 250GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EMT02B6Q
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Fri May 28 23:37:40 2021 EDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 133) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 094 094 000 - 29582
12 Power_Cycle_Count -O--CK 097 097 000 - 2132
177 Wear_Leveling_Count PO--C- 096 096 000 - 79
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 099 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 076 050 000 - 24
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 099 099 000 - 4
235 POR_Recovery_Count -O--C- 099 099 000 - 93
241 Total_LBAs_Written -O--CK 099 099 000 - 38241889167
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 SL VS 16 Device vendor specific log
0xa5 SL VS 16 Device vendor specific log
0xce SL VS 16 Device vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 0 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 29581 -
# 2 Short offline Completed without error 00% 29580 -
# 3 Short offline Completed without error 00% 29579 -
# 4 Short offline Completed without error 00% 29578 -
# 5 Short offline Completed without error 00% 29577 -
# 6 Short offline Completed without error 00% 29576 -
# 7 Short offline Completed without error 00% 29575 -
# 8 Short offline Completed without error 00% 29574 -
# 9 Short offline Completed without error 00% 29573 -
#10 Short offline Completed without error 00% 29572 -
#11 Short offline Completed without error 00% 29571 -
#12 Short offline Completed without error 00% 29570 -
#13 Short offline Completed without error 00% 29569 -
#14 Short offline Completed without error 00% 29568 -
#15 Short offline Completed without error 00% 29567 -
#16 Short offline Completed without error 00% 29566 -
#17 Short offline Completed without error 00% 29565 -
#18 Short offline Completed without error 00% 29564 -
#19 Short offline Completed without error 00% 29563 -
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0xff00):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: SCT command executing in background (5)
Current Temperature: 24 Celsius
Power Cycle Min/Max Temperature: 20/40 Celsius
Lifetime Min/Max Temperature: 0/70 Celsius
Under/Over Temperature Limit Count: 4294967295/4294901760
SMART Status: 0xffff (Reserved)
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (112)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 39 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 39 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

189
SSD/Samsung/SSD 850/SSD 850 EVO 250GB/69D6CD0D75E1 Normal file
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smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.2-RELEASE-p6 amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 850 EVO 250GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EMT02B6Q
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Fri May 28 23:37:40 2021 EDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 133) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 093 093 000 - 31665
12 Power_Cycle_Count -O--CK 099 099 000 - 131
177 Wear_Leveling_Count PO--C- 090 090 000 - 192
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 077 061 000 - 23
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 68
241 Total_LBAs_Written -O--CK 099 099 000 - 50960617433
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 SL VS 16 Device vendor specific log
0xa5 SL VS 16 Device vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 31664 -
# 2 Short offline Completed without error 00% 31663 -
# 3 Short offline Completed without error 00% 31662 -
# 4 Short offline Completed without error 00% 31661 -
# 5 Short offline Completed without error 00% 31660 -
# 6 Short offline Completed without error 00% 31659 -
# 7 Short offline Completed without error 00% 31658 -
# 8 Short offline Completed without error 00% 31657 -
# 9 Short offline Completed without error 00% 31656 -
#10 Short offline Completed without error 00% 31655 -
#11 Short offline Completed without error 00% 31654 -
#12 Short offline Completed without error 00% 31653 -
#13 Short offline Completed without error 00% 31652 -
#14 Short offline Completed without error 00% 31651 -
#15 Short offline Completed without error 00% 31650 -
#16 Short offline Completed without error 00% 31649 -
#17 Short offline Completed without error 00% 31648 -
#18 Short offline Completed without error 00% 31647 -
#19 Short offline Completed without error 00% 31646 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: Active (0)
Current Temperature: 23 Celsius
Power Cycle Min/Max Temperature: 19/37 Celsius
Lifetime Min/Max Temperature: 19/40 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (14)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 39 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 39 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

169
SSD/Samsung/SSD 850/SSD 850 EVO M.2 120GB/ED35D209ACB4 Normal file
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smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p16-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 850 EVO M.2 120GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EMT21B6Q
User Capacity: 120,034,123,776 bytes [120 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Wed May 26 16:10:30 2021 KST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 64) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 099 099 000 - 3461
12 Power_Cycle_Count -O--CK 099 099 000 - 343
177 Wear_Leveling_Count PO--C- 098 098 000 - 29
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 048 046 000 - 52
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 4
241 Total_LBAs_Written -O--CK 099 099 000 - 7013918067
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 SL VS 16 Device vendor specific log
0xa5 SL VS 16 Device vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: SCT command executing in background (5)
Current Temperature: 53 Celsius
Power Cycle Min/Max Temperature: 40/54 Celsius
Lifetime Min/Max Temperature: 0/70 Celsius
Under/Over Temperature Limit Count: 4294967295/4294901760
SMART Status: 0xffff (Reserved)
SCT Temperature History Version: 3 (Unknown, should be 2)
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (70)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 2 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 2 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

170
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smartctl 7.2 2020-12-30 r5155 [FreeBSD 13.0-RELEASE-p1 amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 850 PRO 512GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXM04B6Q
User Capacity: 512,110,190,592 bytes [512 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Mon May 31 20:45:17 2021 CDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 272) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 093 093 000 - 34866
12 Power_Cycle_Count -O--CK 095 095 000 - 4955
177 Wear_Leveling_Count PO--C- 090 090 000 - 546
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 072 028 000 - 28
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 301
241 Total_LBAs_Written -O--CK 099 099 000 - 61619880355
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 16 Device vendor specific log
0xa5 GPL,SL VS 16 Device vendor specific log
0xce GPL,SL VS 16 Device vendor specific log
0xde SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 28 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/208249
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (11)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 4 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 4 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

199
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smartctl 7.2 2020-12-30 r5155 [FreeBSD 13.0-RELEASE amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 860 EVO 1TB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: RVT03B6Q
User Capacity: 1,000,204,886,016 bytes [1.00 TB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic, zeroed
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Mon May 24 22:40:12 2021 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 85) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 098 098 000 - 7846
12 Power_Cycle_Count -O--CK 099 099 000 - 80
177 Wear_Leveling_Count PO--C- 099 099 000 - 7
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 074 058 000 - 26
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 099 099 000 - 2
235 POR_Recovery_Count -O--C- 099 099 000 - 47
241 Total_LBAs_Written -O--CK 099 099 000 - 21243744952
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 SL VS 16 Device vendor specific log
0xa5 SL VS 16 Device vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 7450 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: Active (0)
Current Temperature: 26 Celsius
Power Cycle Min/Max Temperature: 24/40 Celsius
Lifetime Min/Max Temperature: 13/42 Celsius
Specified Max Operating Temperature: 70 Celsius
Under/Over Temperature Limit Count: 0/0
SMART Status: 0xc24f (PASSED)
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (53)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 80 --- Lifetime Power-On Resets
0x01 0x010 4 7846 --- Power-on Hours
0x01 0x018 6 21243744952 --- Logical Sectors Written
0x01 0x020 6 578844111 --- Number of Write Commands
0x01 0x028 6 8385728745 --- Logical Sectors Read
0x01 0x030 6 44439201 --- Number of Read Commands
0x01 0x038 6 2718000 --- Date and Time TimeStamp
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 8 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 26 --- Current Temperature
0x05 0x020 1 42 --- Highest Temperature
0x05 0x028 1 13 --- Lowest Temperature
0x05 0x058 1 70 --- Specified Maximum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 797 --- Number of Hardware Resets
0x06 0x010 4 0 --- Number of ASR Events
0x06 0x018 4 2 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 0 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 35 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 35 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

199
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smartctl 7.2 2020-12-30 r5155 [FreeBSD 13.0-RELEASE amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 860 EVO 2TB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: RVT04B6Q
User Capacity: 2,000,398,934,016 bytes [2.00 TB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic, zeroed
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sun May 23 19:54:15 2021 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 160) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 099 099 000 - 193
12 Power_Cycle_Count -O--CK 099 099 000 - 90
177 Wear_Leveling_Count PO--C- 100 100 000 - 0
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 067 038 000 - 33
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 30
241 Total_LBAs_Written -O--CK 099 099 000 - 879136358
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 SL VS 16 Device vendor specific log
0xa5 SL VS 16 Device vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
256 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: Active (0)
Current Temperature: 33 Celsius
Power Cycle Min/Max Temperature: 29/29 Celsius
Lifetime Min/Max Temperature: 24/62 Celsius
Specified Max Operating Temperature: 70 Celsius
Under/Over Temperature Limit Count: 0/0
SMART Status: 0xc24f (PASSED)
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (104)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 90 --- Lifetime Power-On Resets
0x01 0x010 4 193 --- Power-on Hours
0x01 0x018 6 879136358 --- Logical Sectors Written
0x01 0x020 6 7178756 --- Number of Write Commands
0x01 0x028 6 425595753 --- Logical Sectors Read
0x01 0x030 6 3007559 --- Number of Read Commands
0x01 0x038 6 440000 --- Date and Time TimeStamp
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 33 --- Current Temperature
0x05 0x020 1 62 --- Highest Temperature
0x05 0x028 1 24 --- Lowest Temperature
0x05 0x058 1 70 --- Specified Maximum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 350 --- Number of Hardware Resets
0x06 0x010 4 0 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 0 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 5 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 5 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

198
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smartctl 6.6 2017-11-05 r4594 [FreeBSD 11.2-STABLE amd64] (local build)
Copyright (C) 2002-17, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 860 EVO 500GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: RVT04B6Q
User Capacity: 500,107,862,016 bytes [500 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Fri May 28 12:30:58 2021 PDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 85) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 099 099 000 - 3429
12 Power_Cycle_Count -O--CK 099 099 000 - 12
177 Wear_Leveling_Count PO--C- 097 097 000 - 38
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 066 059 000 - 34
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 8
241 Total_LBAs_Written -O--CK 099 099 000 - 37407824786
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 SL VS 16 Device vendor specific log
0xa5 SL VS 16 Device vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
256 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
SCT Support Level: 1
Device State: Active (0)
Current Temperature: 34 Celsius
Power Cycle Min/Max Temperature: 26/41 Celsius
Lifetime Min/Max Temperature: 21/41 Celsius
Under/Over Temperature Limit Count: 0/0
SMART Status: 0xc24f (PASSED)
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (115)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 12 --- Lifetime Power-On Resets
0x01 0x010 4 3429 --- Power-on Hours
0x01 0x018 6 37407824786 --- Logical Sectors Written
0x01 0x020 6 466234955 --- Number of Write Commands
0x01 0x028 6 7534950302 --- Logical Sectors Read
0x01 0x030 6 141219731 --- Number of Read Commands
0x01 0x038 6 467000 --- Date and Time TimeStamp
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 34 --- Current Temperature
0x05 0x020 1 41 --- Highest Temperature
0x05 0x028 1 21 --- Lowest Temperature
0x05 0x058 1 70 --- Specified Maximum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 44 --- Number of Hardware Resets
0x06 0x010 4 0 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 2 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 7 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 7 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

198
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smartctl 6.6 2017-11-05 r4594 [FreeBSD 11.2-STABLE amd64] (local build)
Copyright (C) 2002-17, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 860 EVO 500GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: RVT04B6Q
User Capacity: 500,107,862,016 bytes [500 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Fri May 28 12:31:02 2021 PDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 85) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 099 099 000 - 3428
12 Power_Cycle_Count -O--CK 099 099 000 - 12
177 Wear_Leveling_Count PO--C- 097 097 000 - 38
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 069 057 000 - 31
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 3
241 Total_LBAs_Written -O--CK 099 099 000 - 37264731776
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 SL VS 16 Device vendor specific log
0xa5 SL VS 16 Device vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
256 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
SCT Support Level: 1
Device State: Active (0)
Current Temperature: 31 Celsius
Power Cycle Min/Max Temperature: 25/39 Celsius
Lifetime Min/Max Temperature: 19/43 Celsius
Under/Over Temperature Limit Count: 0/0
SMART Status: 0xc24f (PASSED)
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (116)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 12 --- Lifetime Power-On Resets
0x01 0x010 4 3428 --- Power-on Hours
0x01 0x018 6 37264731776 --- Logical Sectors Written
0x01 0x020 6 450651535 --- Number of Write Commands
0x01 0x028 6 7495637253 --- Logical Sectors Read
0x01 0x030 6 139105360 --- Number of Read Commands
0x01 0x038 6 3283000 --- Date and Time TimeStamp
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 31 --- Current Temperature
0x05 0x020 1 43 --- Highest Temperature
0x05 0x028 1 19 --- Lowest Temperature
0x05 0x058 1 70 --- Specified Maximum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 4 --- Number of Hardware Resets
0x06 0x010 4 0 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 2 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 1 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 1 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

198
SSD/Samsung/SSD 870/SSD 870 EVO 1TB/0CB84231A510 Normal file
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smartctl 7.2 2020-12-30 r5155 [FreeBSD 13.0-RELEASE amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: Samsung SSD 870 EVO 1TB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: SVT01B6Q
User Capacity: 1,000,204,886,016 bytes [1.00 TB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic, zeroed
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5
SATA Version is: SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Wed May 26 06:18:45 2021 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 85) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 099 099 000 - 1
12 Power_Cycle_Count -O--CK 099 099 000 - 12
177 Wear_Leveling_Count PO--C- 100 100 000 - 0
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 069 067 000 - 31
195 Hardware_ECC_Recovered -O-RC- 200 200 000 - 0
199 UDMA_CRC_Error_Count -OSRCK 100 100 000 - 0
235 Unknown_Attribute -O--C- 099 099 000 - 2
241 Total_LBAs_Written -O--CK 099 099 000 - 147107936
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 SL VS 16 Device vendor specific log
0xa5 SL VS 16 Device vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
256 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: Active (0)
Current Temperature: 31 Celsius
Power Cycle Min/Max Temperature: 30/40 Celsius
Lifetime Min/Max Temperature: 25/40 Celsius
Specified Max Operating Temperature: 70 Celsius
Under/Over Temperature Limit Count: 0/0
SMART Status: 0xc24f (PASSED)
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (25)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 12 --- Lifetime Power-On Resets
0x01 0x010 4 1 --- Power-on Hours
0x01 0x018 6 147107936 --- Logical Sectors Written
0x01 0x020 6 829219 --- Number of Write Commands
0x01 0x028 6 47244283 --- Logical Sectors Read
0x01 0x030 6 270047 --- Number of Read Commands
0x01 0x038 6 1904000 --- Date and Time TimeStamp
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 31 --- Current Temperature
0x05 0x020 1 40 --- Highest Temperature
0x05 0x028 1 25 --- Lowest Temperature
0x05 0x058 1 70 --- Specified Maximum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 42 --- Number of Hardware Resets
0x06 0x010 4 0 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 0 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 3 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 3 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

199
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smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p16-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: Samsung SSD 870 EVO 1TB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: SVT01B6Q
User Capacity: 1,000,204,886,016 bytes [1.00 TB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic, zeroed
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5
SATA Version is: SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Wed May 26 18:42:22 2021 JST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 85) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 099 099 000 - 2351
12 Power_Cycle_Count -O--CK 099 099 000 - 561
177 Wear_Leveling_Count PO--C- 099 099 000 - 7
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 061 057 000 - 39
195 Hardware_ECC_Recovered -O-RC- 200 200 000 - 0
199 UDMA_CRC_Error_Count -OSRCK 100 100 000 - 0
235 Unknown_Attribute -O--C- 099 099 000 - 37
241 Total_LBAs_Written -O--CK 099 099 000 - 8048654379
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 SL VS 16 Device vendor specific log
0xa5 SL VS 16 Device vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 2096 -
# 2 Short offline Completed without error 00% 709 -
# 3 Short offline Completed without error 00% 200 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
256 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: Active (0)
Current Temperature: 39 Celsius
Power Cycle Min/Max Temperature: 36/40 Celsius
Lifetime Min/Max Temperature: 12/42 Celsius
Specified Max Operating Temperature: 70 Celsius
Under/Over Temperature Limit Count: 0/0
SMART Status: 0xc24f (PASSED)
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (14)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 561 --- Lifetime Power-On Resets
0x01 0x010 4 2351 --- Power-on Hours
0x01 0x018 6 8048654379 --- Logical Sectors Written
0x01 0x020 6 42073779 --- Number of Write Commands
0x01 0x028 6 18412061224 --- Logical Sectors Read
0x01 0x030 6 69463438 --- Number of Read Commands
0x01 0x038 6 3453000 --- Date and Time TimeStamp
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 39 --- Current Temperature
0x05 0x020 1 42 --- Highest Temperature
0x05 0x028 1 12 --- Lowest Temperature
0x05 0x058 1 70 --- Specified Maximum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 546 --- Number of Hardware Resets
0x06 0x010 4 0 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 0 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 4 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 4 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

196
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smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p16-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: Samsung SSD 870 EVO 250GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: SVT01B6Q
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic, zeroed
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5
SATA Version is: SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue May 25 14:00:54 2021 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 85) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 099 099 000 - 481
12 Power_Cycle_Count -O--CK 099 099 000 - 11
177 Wear_Leveling_Count PO--C- 100 100 000 - 0
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 075 071 000 - 25
195 Hardware_ECC_Recovered -O-RC- 200 200 000 - 0
199 UDMA_CRC_Error_Count -OSRCK 100 100 000 - 0
235 Unknown_Attribute -O--C- 099 099 000 - 5
241 Total_LBAs_Written -O--CK 099 099 000 - 212545235
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 SL VS 16 Device vendor specific log
0xa5 SL VS 16 Device vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
256 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: Active (0)
Current Temperature: 25 Celsius
Power Cycle Min/Max Temperature: 23/40 Celsius
Lifetime Min/Max Temperature: 23/40 Celsius
Specified Max Operating Temperature: 70 Celsius
Under/Over Temperature Limit Count: 0/0
SMART Status: 0xc24f (PASSED)
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (90)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 11 --- Lifetime Power-On Resets
0x01 0x010 4 481 --- Power-on Hours
0x01 0x018 6 212545235 --- Logical Sectors Written
0x01 0x020 6 3238368 --- Number of Write Commands
0x01 0x028 6 4640350 --- Logical Sectors Read
0x01 0x030 6 119884 --- Number of Read Commands
0x01 0x038 6 968000 --- Date and Time TimeStamp
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 25 --- Current Temperature
0x05 0x020 1 40 --- Highest Temperature
0x05 0x028 1 23 --- Lowest Temperature
0x05 0x058 1 70 --- Specified Maximum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 70 --- Number of Hardware Resets
0x06 0x010 4 0 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 0 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 8 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 8 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

200
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smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.2-RELEASE-p4 amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 870 QVO 1TB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: SVQ01B6Q
User Capacity: 1,000,204,886,016 bytes [1.00 TB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic, zeroed
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5
SATA Version is: SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Thu May 20 20:36:53 2021 PDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Unknown
=== START OF READ SMART DATA SECTION ===
SMART Status not supported: Incomplete response, ATA output registers missing
SMART overall-health self-assessment test result: PASSED
Warning: This result is based on an Attribute check.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 85) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 099 099 000 - 574
12 Power_Cycle_Count -O--CK 099 099 000 - 21
177 Wear_Leveling_Count PO--C- 100 100 000 - 0
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 068 061 000 - 32
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 15
241 Total_LBAs_Written -O--CK 099 099 000 - 1779927454
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 SL VS 16 Device vendor specific log
0xa5 SL VS 16 Device vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
256 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: Active (0)
Current Temperature: 32 Celsius
Power Cycle Min/Max Temperature: 32/35 Celsius
Lifetime Min/Max Temperature: 32/40 Celsius
Specified Max Operating Temperature: 70 Celsius
Under/Over Temperature Limit Count: 0/0
SMART Status: 0xc24f (PASSED)
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (21)
SMART WRITE LOG does not return COUNT and LBA_LOW register
SCT (Get) Error Recovery Control command failed
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 21 --- Lifetime Power-On Resets
0x01 0x010 4 574 --- Power-on Hours
0x01 0x018 6 1779927454 --- Logical Sectors Written
0x01 0x020 6 40509322 --- Number of Write Commands
0x01 0x028 6 79298472 --- Logical Sectors Read
0x01 0x030 6 773253 --- Number of Read Commands
0x01 0x038 6 701000 --- Date and Time TimeStamp
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 32 --- Current Temperature
0x05 0x020 1 40 --- Highest Temperature
0x05 0x028 1 32 --- Lowest Temperature
0x05 0x058 1 70 --- Specified Maximum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 13 --- Number of Hardware Resets
0x06 0x010 4 0 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 0 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 3 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 3 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

200
SSD/Samsung/SSD 870/SSD 870 QVO 1TB/F38749D5715F Normal file
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smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.2-RELEASE-p4 amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 870 QVO 1TB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: SVQ01B6Q
User Capacity: 1,000,204,886,016 bytes [1.00 TB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic, zeroed
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5
SATA Version is: SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Thu May 20 20:36:53 2021 PDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Unknown
=== START OF READ SMART DATA SECTION ===
SMART Status not supported: Incomplete response, ATA output registers missing
SMART overall-health self-assessment test result: PASSED
Warning: This result is based on an Attribute check.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 85) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 099 099 000 - 574
12 Power_Cycle_Count -O--CK 099 099 000 - 22
177 Wear_Leveling_Count PO--C- 100 100 000 - 0
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 067 061 000 - 33
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 11
241 Total_LBAs_Written -O--CK 099 099 000 - 1784247017
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 SL VS 16 Device vendor specific log
0xa5 SL VS 16 Device vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
256 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: Active (0)
Current Temperature: 33 Celsius
Power Cycle Min/Max Temperature: 33/35 Celsius
Lifetime Min/Max Temperature: 29/40 Celsius
Specified Max Operating Temperature: 70 Celsius
Under/Over Temperature Limit Count: 0/0
SMART Status: 0xc24f (PASSED)
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (24)
SMART WRITE LOG does not return COUNT and LBA_LOW register
SCT (Get) Error Recovery Control command failed
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 22 --- Lifetime Power-On Resets
0x01 0x010 4 574 --- Power-on Hours
0x01 0x018 6 1784247017 --- Logical Sectors Written
0x01 0x020 6 41050541 --- Number of Write Commands
0x01 0x028 6 78056272 --- Logical Sectors Read
0x01 0x030 6 762885 --- Number of Read Commands
0x01 0x038 6 489000 --- Date and Time TimeStamp
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 33 --- Current Temperature
0x05 0x020 1 40 --- Highest Temperature
0x05 0x028 1 29 --- Lowest Temperature
0x05 0x058 1 70 --- Specified Maximum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 5 --- Number of Hardware Resets
0x06 0x010 4 0 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 0 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 1 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 1 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

145
SSD/Samsung/SSD PM810/SSD PM810 2.5-inch 7mm 128GB/F84EBD820987 Normal file
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@@ -0,0 +1,145 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p16-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG SSD PM810 2.5" 7mm 128GB
Serial Number: --
LU WWN Device Id: 5 0000f0 ...
Firmware Version: AXM08D1Q
User Capacity: 128,035,676,160 bytes [128 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS, ATA/ATAPI-7 T13/1532D revision 1
SATA Version is: SATA 2.6, 3.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Tue May 25 19:57:41 2021 CDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Disabled
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 41) The self-test routine was interrupted
by the host with a hard or soft reset.
Total time to complete Offline
data collection: ( 840) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 14) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 --- - 0
9 Power_On_Hours -O--CK 096 096 --- - 18301
12 Power_Cycle_Count -O--CK 094 094 --- - 5132
175 Program_Fail_Count_Chip -O--CK 100 100 --- - 0
176 Erase_Fail_Count_Chip -O--CK 100 100 --- - 0
177 Wear_Leveling_Count PO--C- 095 095 --- - 166
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 078 078 --- - 444
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 078 078 --- - 864
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 078 078 --- - 3168
181 Program_Fail_Cnt_Total -O--CK 100 100 --- - 0
182 Erase_Fail_Count_Total -O--CK 100 100 --- - 0
183 Runtime_Bad_Block PO--C- 100 100 --- - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 --- - 0
195 ECC_Error_Rate -O-RC- 200 200 --- - 0
198 Offline_Uncorrectable ----CK 100 100 --- - 0
199 CRC_Error_Count -OSRCK 253 253 --- - 1
232 Available_Reservd_Space PO--C- 078 078 --- - 1572
241 Total_LBAs_Written -O--CK 035 035 --- - 2812364680
242 Total_LBAs_Read -O--CK 093 093 --- - 298628531
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 0
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 GPL,SL R/O 1 Summary SMART error log
0x02 GPL,SL R/O 1 Comprehensive SMART error log
0x03 GPL,SL R/O 1 Ext. Comprehensive SMART error log
0x06 GPL,SL R/O 1 SMART self-test log
0x07 GPL,SL R/O 1 Extended self-test log
0x09 GPL,SL R/W 1 Selective self-test log
0x10 GPL,SL R/O 1 NCQ Command Error log
0x11 GPL,SL R/O 1 SATA Phy Event Counters log
0x80-0x9f GPL,SL R/W 1 Host vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
Warning! SMART Extended Self-test Log Structure error: invalid SMART checksum.
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Interrupted (host reset) 90% 5481 -
# 2 Short offline Completed without error 00% 2 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 14 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 14 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

166
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@@ -0,0 +1,166 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p16-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG SSD PM871 2.5 7mm 512GB SED
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EMT02D6Q
User Capacity: 512,110,190,592 bytes [512 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sat May 22 11:26:30 2021 EDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Write SCT (Get) Feature Control Command failed: Input/output error
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 265) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
12 Power_Cycle_Count PO--CK 099 099 000 - 855
175 Program_Fail_Count_Chip PO--CK 100 100 010 - 0
176 Erase_Fail_Count_Chip PO--CK 100 100 010 - 0
177 Wear_Leveling_Count PO--C- 098 098 005 - 23
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 1547
181 Program_Fail_Cnt_Total PO--CK 100 100 010 - 0
182 Erase_Fail_Count_Total PO--CK 100 100 010 - 0
187 Uncorrectable_Error_Cnt PO--CK 100 100 000 - 0
195 ECC_Error_Rate PO-RC- 200 200 000 - 0
241 Total_LBAs_Written PO--CK 099 099 000 - 6759771452
242 Total_LBAs_Read PO--CK 099 099 000 - 25975652141
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa5 SL VS 16 Device vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: Active (0)
Current Temperature: 30 Celsius
Power Cycle Min/Max Temperature: 27/40 Celsius
Lifetime Min/Max Temperature: 0/70 Celsius
Under/Over Temperature Limit Count: 4294967295/4294901760
SMART Status: 0xffff (Reserved)
Write SCT Data Table failed: Input/output error
Read SCT Temperature History failed
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 11 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 11 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

162
SSD/Samsung/SSD SM841/SSD SM841 2.5-inch 7mm 128GB/D58167914A17 Normal file
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smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p16-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG SSD SM841 2.5" 7mm 128GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: DXM01D0Q
User Capacity: 128,035,676,160 bytes [128 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available, deterministic, zeroed
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Wed May 19 18:38:01 2021 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (65476) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 15) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
12 Power_Cycle_Count -O--CK 098 098 000 - 1415
175 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
176 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
177 Wear_Leveling_Count PO--C- 093 093 005 - 251
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 4576
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
241 Total_LBAs_Written -O--CK 099 099 000 - 5525656453
242 Total_LBAs_Read -O--CK 099 099 000 - 4500855189
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 GPL,SL R/O 1 Summary SMART error log
0x02 GPL,SL R/O 1 Comprehensive SMART error log
0x03 GPL,SL R/O 1 Ext. Comprehensive SMART error log
0x06 GPL,SL R/O 1 SMART self-test log
0x07 GPL,SL R/O 1 Extended self-test log
0x09 GPL,SL R/W 1 Selective self-test log
0x10 GPL,SL R/O 1 NCQ Command Error log
0x11 GPL,SL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 1 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa0 GPL,SL VS 16 Device vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
Warning! SMART Extended Self-test Log Structure error: invalid SMART checksum.
SMART Extended Self-test Log Version: 1 (1 sectors)
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: SCT command executing in background (5)
Current Temperature: 31 Celsius
Power Cycle Min/Max Temperature: 30/40 Celsius
Lifetime Min/Max Temperature: 0/70 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 3 (Unknown, should be 2)
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (8)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 22 Command failed due to ICRC error
0x0002 2 22 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 22 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 44 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 44 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 22 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 22 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC