mirror of
https://github.com/bsdhw/SMART.git
synced 2025-05-31 16:21:41 +05:30
Update of reports (new: 194, modified: 0)
This commit is contained in:
172
SSD/Samsung/MZ7/MZ7LN128HCHP-000L1/0652D8EEDA3E
Normal file
172
SSD/Samsung/MZ7/MZ7LN128HCHP-000L1/0652D8EEDA3E
Normal file
@@ -0,0 +1,172 @@
|
||||
smartctl 7.2 2020-12-30 r5155 [FreeBSD 13.0-RELEASE-p1 amd64] (local build)
|
||||
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
|
||||
|
||||
=== START OF INFORMATION SECTION ===
|
||||
Model Family: Samsung based SSDs
|
||||
Device Model: SAMSUNG MZ7LN128HCHP-000L1
|
||||
Serial Number: --
|
||||
LU WWN Device Id: 5 002538 ...
|
||||
Firmware Version: EMT03L0Q
|
||||
User Capacity: 128,035,676,160 bytes [128 GB]
|
||||
Sector Size: 512 bytes logical/physical
|
||||
Rotation Rate: Solid State Device
|
||||
TRIM Command: Available
|
||||
Device is: In smartctl database [for details use: -P show]
|
||||
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
|
||||
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
|
||||
Local Time is: Fri May 28 22:30:31 2021 CEST
|
||||
SMART support is: Available - device has SMART capability.
|
||||
SMART support is: Enabled
|
||||
AAM feature is: Unavailable
|
||||
APM feature is: Unavailable
|
||||
Rd look-ahead is: Enabled
|
||||
Write cache is: Enabled
|
||||
DSN feature is: Unavailable
|
||||
ATA Security is: Disabled, frozen [SEC2]
|
||||
Wt Cache Reorder: Enabled
|
||||
|
||||
=== START OF READ SMART DATA SECTION ===
|
||||
SMART overall-health self-assessment test result: PASSED
|
||||
|
||||
General SMART Values:
|
||||
Offline data collection status: (0x00) Offline data collection activity
|
||||
was never started.
|
||||
Auto Offline Data Collection: Disabled.
|
||||
Self-test execution status: ( 0) The previous self-test routine completed
|
||||
without error or no self-test has ever
|
||||
been run.
|
||||
Total time to complete Offline
|
||||
data collection: ( 0) seconds.
|
||||
Offline data collection
|
||||
capabilities: (0x53) SMART execute Offline immediate.
|
||||
Auto Offline data collection on/off support.
|
||||
Suspend Offline collection upon new
|
||||
command.
|
||||
No Offline surface scan supported.
|
||||
Self-test supported.
|
||||
No Conveyance Self-test supported.
|
||||
Selective Self-test supported.
|
||||
SMART capabilities: (0x0003) Saves SMART data before entering
|
||||
power-saving mode.
|
||||
Supports SMART auto save timer.
|
||||
Error logging capability: (0x01) Error logging supported.
|
||||
General Purpose Logging supported.
|
||||
Short self-test routine
|
||||
recommended polling time: ( 2) minutes.
|
||||
Extended self-test routine
|
||||
recommended polling time: ( 64) minutes.
|
||||
SCT capabilities: (0x003d) SCT Status supported.
|
||||
SCT Error Recovery Control supported.
|
||||
SCT Feature Control supported.
|
||||
SCT Data Table supported.
|
||||
|
||||
SMART Attributes Data Structure revision number: 1
|
||||
Vendor Specific SMART Attributes with Thresholds:
|
||||
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
|
||||
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
|
||||
9 Power_On_Hours -O--CK 097 097 000 - 10840
|
||||
12 Power_Cycle_Count -O--CK 097 097 000 - 2180
|
||||
170 Unused_Rsvd_Blk_Ct_Chip -O--CK 100 100 010 - 0
|
||||
171 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
|
||||
172 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
|
||||
173 Wear_Leveling_Count PO--CK 090 090 005 - 203
|
||||
174 Unexpect_Power_Loss_Ct -O--CK 099 099 000 - 39
|
||||
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
|
||||
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 394
|
||||
184 End-to-End_Error PO--CK 100 100 097 - 0
|
||||
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
|
||||
194 Temperature_Celsius -O--CK 062 050 000 - 38
|
||||
199 CRC_Error_Count -OSRCK 100 100 000 - 0
|
||||
233 Media_Wearout_Indicator PO--C- 089 089 000 - 15074327
|
||||
241 Total_LBAs_Written -O--CK 099 099 000 - 9832
|
||||
242 Total_LBAs_Read -O--CK 099 099 000 - 11377
|
||||
249 NAND_Writes_1GiB -O--CK 099 099 000 - 25984
|
||||
||||||_ K auto-keep
|
||||
|||||__ C event count
|
||||
||||___ R error rate
|
||||
|||____ S speed/performance
|
||||
||_____ O updated online
|
||||
|______ P prefailure warning
|
||||
|
||||
General Purpose Log Directory Version 1
|
||||
SMART Log Directory Version 1 [multi-sector log support]
|
||||
Address Access R/W Size Description
|
||||
0x00 GPL,SL R/O 1 Log Directory
|
||||
0x01 SL R/O 1 Summary SMART error log
|
||||
0x02 SL R/O 1 Comprehensive SMART error log
|
||||
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
|
||||
0x06 SL R/O 1 SMART self-test log
|
||||
0x07 GPL R/O 1 Extended self-test log
|
||||
0x09 SL R/W 1 Selective self-test log
|
||||
0x10 GPL R/O 1 NCQ Command Error log
|
||||
0x11 GPL R/O 1 SATA Phy Event Counters log
|
||||
0x13 GPL R/O 1 SATA NCQ Send and Receive log
|
||||
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
|
||||
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
|
||||
0xdf GPL,SL VS 1 Device vendor specific log
|
||||
0xe0 GPL,SL R/W 1 SCT Command/Status
|
||||
0xe1 GPL,SL R/W 1 SCT Data Transfer
|
||||
|
||||
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
|
||||
No Errors Logged
|
||||
|
||||
SMART Extended Self-test Log Version: 1 (1 sectors)
|
||||
No self-tests have been logged. [To run self-tests, use: smartctl -t]
|
||||
|
||||
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
|
||||
SMART Selective self-test log data structure revision number 1
|
||||
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
|
||||
1 0 0 Not_testing
|
||||
2 0 0 Not_testing
|
||||
3 0 0 Not_testing
|
||||
4 0 0 Not_testing
|
||||
5 0 0 Not_testing
|
||||
255 0 65535 Read_scanning was never started
|
||||
Selective self-test flags (0x0):
|
||||
After scanning selected spans, do NOT read-scan remainder of disk.
|
||||
If Selective self-test is pending on power-up, resume after 0 minute delay.
|
||||
|
||||
SCT Status Version: 3
|
||||
SCT Version (vendor specific): 256 (0x0100)
|
||||
Device State: SCT command executing in background (5)
|
||||
Current Temperature: 37 Celsius
|
||||
Power Cycle Min/Max Temperature: 34/40 Celsius
|
||||
Lifetime Min/Max Temperature: 0/70 Celsius
|
||||
Under/Over Temperature Limit Count: 0/0
|
||||
|
||||
SCT Temperature History Version: 3 (Unknown, should be 2)
|
||||
Temperature Sampling Period: 1 minute
|
||||
Temperature Logging Interval: 10 minutes
|
||||
Min/Max recommended Temperature: 0/70 Celsius
|
||||
Min/Max Temperature Limit: 0/70 Celsius
|
||||
Temperature History Size (Index): 128 (13)
|
||||
|
||||
SCT Error Recovery Control:
|
||||
Read: Disabled
|
||||
Write: Disabled
|
||||
|
||||
Device Statistics (GP/SMART Log 0x04) not supported
|
||||
|
||||
Pending Defects log (GP Log 0x0c) not supported
|
||||
|
||||
SATA Phy Event Counters (GP Log 0x11)
|
||||
ID Size Value Description
|
||||
0x0001 2 0 Command failed due to ICRC error
|
||||
0x0002 2 0 R_ERR response for data FIS
|
||||
0x0003 2 0 R_ERR response for device-to-host data FIS
|
||||
0x0004 2 0 R_ERR response for host-to-device data FIS
|
||||
0x0005 2 0 R_ERR response for non-data FIS
|
||||
0x0006 2 0 R_ERR response for device-to-host non-data FIS
|
||||
0x0007 2 0 R_ERR response for host-to-device non-data FIS
|
||||
0x0008 2 0 Device-to-host non-data FIS retries
|
||||
0x0009 2 4 Transition from drive PhyRdy to drive PhyNRdy
|
||||
0x000a 2 4 Device-to-host register FISes sent due to a COMRESET
|
||||
0x000b 2 0 CRC errors within host-to-device FIS
|
||||
0x000d 2 0 Non-CRC errors within host-to-device FIS
|
||||
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
|
||||
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
|
||||
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
|
||||
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
|
||||
|
||||
|
||||
|
Reference in New Issue
Block a user