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Update of reports (new: 0, modified: 110)
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@@ -1,4 +1,4 @@
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smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p19-HBSD amd64] (local build)
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smartctl 7.2 2021-09-14 r5236 [FreeBSD 12.1-RELEASE-p21-HBSD amd64] (local build)
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Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
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=== START OF INFORMATION SECTION ===
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@@ -14,7 +14,7 @@ TRIM Command: Available, deterministic, zeroed
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Device is: In smartctl database [for details use: -P show]
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ATA Version is: ACS-2 (minor revision not indicated)
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SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
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Local Time is: Wed Jul 21 00:19:25 2021 PDT
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Local Time is: Tue Nov 23 15:36:40 2021 PST
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SMART support is: Available - device has SMART capability.
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SMART support is: Enabled
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AAM feature is: Unavailable
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@@ -29,11 +29,12 @@ Wt Cache Reorder: Unavailable
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SMART overall-health self-assessment test result: PASSED
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General SMART Values:
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Offline data collection status: (0x05) Offline data collection activity
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was aborted by an interrupting command from host.
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Offline data collection status: (0x02) Offline data collection activity
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was completed without error.
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Auto Offline Data Collection: Disabled.
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Self-test execution status: ( 16) The self-test routine was aborted by
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the host.
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Self-test execution status: ( 0) The previous self-test routine completed
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without error or no self-test has ever
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been run.
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Total time to complete Offline
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data collection: ( 60) seconds.
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Offline data collection
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@@ -62,34 +63,34 @@ Vendor Specific SMART Attributes with Thresholds:
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ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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1 Raw_Read_Error_Rate ------ 100 100 000 - 0
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5 Reallocated_Sector_Ct ------ 100 100 000 - 0
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9 Power_On_Hours ------ 100 100 000 - 7195
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12 Power_Cycle_Count ------ 100 100 000 - 35
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148 Total_SLC_Erase_Ct ------ 100 100 000 - 438141
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149 Max_SLC_Erase_Ct ------ 100 100 000 - 8288
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150 Min_SLC_Erase_Ct ------ 100 100 000 - 8204
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151 Average_SLC_Erase_Ct ------ 100 100 000 - 8266
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164 Total_Erase_Count ------ 100 100 000 - 92106
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165 Max_Erase_Count ------ 100 100 000 - 124
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166 Min_Erase_Count ------ 100 100 000 - 88
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167 Average_Erase_Count ------ 100 100 000 - 100
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9 Power_On_Hours ------ 100 100 000 - 8591
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12 Power_Cycle_Count ------ 100 100 000 - 37
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148 Total_SLC_Erase_Ct ------ 100 100 000 - 625433
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149 Max_SLC_Erase_Ct ------ 100 100 000 - 11817
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150 Min_SLC_Erase_Ct ------ 100 100 000 - 11658
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151 Average_SLC_Erase_Ct ------ 100 100 000 - 11800
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164 Total_Erase_Count ------ 100 100 000 - 130338
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165 Max_Erase_Count ------ 100 100 000 - 169
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166 Min_Erase_Count ------ 100 100 000 - 94
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167 Average_Erase_Count ------ 100 100 000 - 141
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159 DRAM_1_Bit_Error_Count ------ 100 100 000 - 0
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160 Uncorrectable_Error_Cnt ------ 100 100 000 - 0
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161 Valid_Spare_Block_Cnt ------ 100 100 000 - 67
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163 Initial_Bad_Block_Count ------ 100 100 000 - 11
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168 Max_Erase_Count_of_Spec ------ 100 100 000 - 3000
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169 Remaining_Lifetime_Perc ------ 100 100 000 - 97
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177 Wear_Leveling_Count ------ 100 100 050 - 190
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169 Remaining_Lifetime_Perc ------ 100 100 000 - 96
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177 Wear_Leveling_Count ------ 100 100 050 - 257
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181 Program_Fail_Cnt_Total ------ 100 100 000 - 0
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182 Erase_Fail_Count_Total ------ 100 100 000 - 0
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192 Power-Off_Retract_Count ------ 100 100 000 - 17
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194 Temperature_Celsius ------ 100 100 000 - 66
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192 Power-Off_Retract_Count ------ 100 100 000 - 19
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194 Temperature_Celsius ------ 100 100 000 - 73
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195 Hardware_ECC_Recovered ------ 100 100 000 - 0
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196 Reallocated_Event_Count ------ 100 100 016 - 0
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199 UDMA_CRC_Error_Count ------ 100 100 050 - 0
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232 Available_Reservd_Space ------ 100 100 000 - 100
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241 Host_Writes_32MiB ------ 100 100 000 - 525487
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242 Host_Reads_32MiB ------ 100 100 000 - 7334
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245 TLC_Writes_32MiB ------ 100 100 000 - 368424
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241 Host_Writes_32MiB ------ 100 100 000 - 731359
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242 Host_Reads_32MiB ------ 100 100 000 - 9214
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245 TLC_Writes_32MiB ------ 100 100 000 - 521352
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||||||_ K auto-keep
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|||||__ C event count
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||||___ R error rate
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@@ -120,8 +121,10 @@ No Errors Logged
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SMART Extended Self-test Log Version: 1 (1 sectors)
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Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
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# 1 Short offline Completed without error 00% 3991 -
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# 2 Short offline Completed without error 00% 2415 -
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# 1 Short offline Completed without error 00% 7497 -
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# 2 Short offline Completed without error 00% 7497 -
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# 3 Short offline Completed without error 00% 3991 -
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# 4 Short offline Completed without error 00% 2415 -
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SMART Selective self-test log data structure revision number 1
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SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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@@ -130,7 +133,7 @@ SMART Selective self-test log data structure revision number 1
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3 0 0 Not_testing
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4 0 0 Not_testing
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5 0 0 Not_testing
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6 0 65535 Read_scanning was aborted by an interrupting command from host
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7 0 65535 Read_scanning was completed without error
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Selective self-test flags (0x0):
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After scanning selected spans, do NOT read-scan remainder of disk.
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If Selective self-test is pending on power-up, resume after 0 minute delay.
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@@ -140,20 +143,20 @@ SCT Commands not supported
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Device Statistics (GP Log 0x04)
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Page Offset Size Value Flags Description
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0x01 ===== = = === == General Statistics (rev 1) ==
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0x01 0x008 4 35 --- Lifetime Power-On Resets
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0x01 0x010 4 7195 --- Power-on Hours
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0x01 0x018 6 78599552 --- Logical Sectors Written
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0x01 0x020 6 406995420 --- Number of Write Commands
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0x01 0x028 6 480665730 --- Logical Sectors Read
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0x01 0x030 6 10732365 --- Number of Read Commands
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0x01 0x008 4 37 --- Lifetime Power-On Resets
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0x01 0x010 4 8591 --- Power-on Hours
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0x01 0x018 6 685730763 --- Logical Sectors Written
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0x01 0x020 6 539635360 --- Number of Write Commands
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0x01 0x028 6 603896225 --- Logical Sectors Read
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0x01 0x030 6 13607934 --- Number of Read Commands
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0x04 ===== = = === == General Errors Statistics (rev 1) ==
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0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
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0x04 0x010 4 17 --- Resets Between Cmd Acceptance and Completion
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0x04 0x010 4 19 --- Resets Between Cmd Acceptance and Completion
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0x06 ===== = = === == Transport Statistics (rev 1) ==
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0x06 0x008 4 420 --- Number of Hardware Resets
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0x06 0x008 4 503 --- Number of Hardware Resets
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0x06 0x018 4 0 --- Number of Interface CRC Errors
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0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
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0x07 0x008 1 3 --- Percentage Used Endurance Indicator
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0x07 0x008 1 4 --- Percentage Used Endurance Indicator
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|||_ C monitored condition met
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||__ D supports DSN
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|___ N normalized value
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