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Andrey Ponomarenko
2022-03-18 23:39:11 +03:00
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smartctl 7.2 2021-09-14 r5236 [FreeBSD 13.0-RELEASE-p6 amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Hitachi/HGST Travelstar 5K750
Device Model: APPLE HDD HTS547550A9E384
Serial Number: --
LU WWN Device Id: 5 000cca ...
Firmware Version: JE3AD70F
User Capacity: 500,107,862,016 bytes [500 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 5400 rpm
Form Factor: 2.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS T13/1699-D revision 6
SATA Version is: SATA 2.6, 3.0 Gb/s
Local Time is: Sun Feb 6 02:02:48 2022 GMT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM level is: 128 (minimum power consumption without standby)
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 45) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 123) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate PO-R-- 100 100 062 - 0
2 Throughput_Performance P-S--- 100 100 040 - 0
3 Spin_Up_Time POS--- 166 166 033 - 1
4 Start_Stop_Count -O--C- 095 095 000 - 7991
5 Reallocated_Sector_Ct PO--CK 100 100 005 - 14
7 Seek_Error_Rate PO-R-- 100 100 067 - 0
8 Seek_Time_Performance P-S--- 100 100 040 - 0
9 Power_On_Hours -O--C- 095 095 000 - 2305
10 Spin_Retry_Count PO--C- 100 100 060 - 0
12 Power_Cycle_Count -O--CK 096 096 000 - 7415
160 Unknown_Attribute -O--CK 100 100 000 - 0
191 G-Sense_Error_Rate -O-R-- 100 100 000 - 1
192 Power-Off_Retract_Count -O--CK 093 093 000 - 6150393167956
193 Load_Cycle_Count -O--C- 089 089 000 - 119847
194 Temperature_Celsius -O---- 193 193 000 - 31 (Min/Max 10/45)
195 Hardware_ECC_Recovered -O-R-- 089 089 000 - 1048616
196 Reallocated_Event_Count -O--CK 100 100 000 - 14
197 Current_Pending_Sector -O---K 100 100 000 - 0
198 Offline_Uncorrectable ---R-- 100 100 000 - 0
199 UDMA_CRC_Error_Count -O-R-- 200 200 000 - 0
223 Load_Retry_Count -O-R-- 100 100 000 - 0
254 Free_Fall_Sensor -O--CK 043 043 000 - 12884916574
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: Active (0)
Current Temperature: 32 Celsius
Power Cycle Min/Max Temperature: 22/33 Celsius
Lifetime Min/Max Temperature: 10/45 Celsius
Specified Max Operating Temperature: 29 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 0/60 Celsius
Min/Max Temperature Limit: -40/65 Celsius
Temperature History Size (Index): 128 (59)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0009 2 0 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 0 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS

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smartctl 7.2 2020-12-30 r5155 [OpenBSD 7.0 amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Hitachi/HGST Travelstar 5K750
Device Model: APPLE HDD HTS547575A9E384
Serial Number: --
LU WWN Device Id: 5 000cca ...
Firmware Version: JE4AD70F
User Capacity: 750,156,374,016 bytes [750 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 5400 rpm
Form Factor: 2.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS T13/1699-D revision 6
SATA Version is: SATA 2.6, 3.0 Gb/s
Local Time is: Mon Nov 15 09:19:45 2021 PST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART Status not supported: Incomplete response, ATA output registers missing
SMART overall-health self-assessment test result: PASSED
Warning: This result is based on an Attribute check.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 45) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 208) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 062 Pre-fail Always - 0
2 Throughput_Performance 0x0005 100 100 040 Pre-fail Offline - 0
3 Spin_Up_Time 0x0007 176 176 033 Pre-fail Always - 1
4 Start_Stop_Count 0x0012 091 091 000 Old_age Always - 14785
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 040 Pre-fail Offline - 0
9 Power_On_Hours 0x0012 089 089 000 Old_age Always - 5220
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 091 091 000 Old_age Always - 14488
160 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0
191 G-Sense_Error_Rate 0x000a 100 100 000 Old_age Always - 0
192 Power-Off_Retract_Count 0x0032 099 099 000 Old_age Always - 807453851706
193 Load_Cycle_Count 0x0012 062 062 000 Old_age Always - 384577
194 Temperature_Celsius 0x0002 214 214 000 Old_age Always - 28 (Min/Max 2/45)
195 Hardware_ECC_Recovered 0x000a 071 071 000 Old_age Always - 25690272
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 10
223 Load_Retry_Count 0x000a 100 100 000 Old_age Always - 0
254 Free_Fall_Sensor 0x0032 085 085 000 Old_age Always - 4004
SMART Error Log Version: 1
ATA Error Count: 10 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 10 occurred at disk power-on lifetime: 5198 hours (216 days + 14 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 a1 5f a6 8a 00 Error: ICRC, ABRT 161 sectors at LBA = 0x008aa65f = 9086559
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 02 00 00 a6 8a 40 00 00:11:47.598 READ DMA EXT
25 02 00 00 a5 8a 40 00 00:11:47.594 READ DMA EXT
25 02 00 00 a4 8a 40 00 00:11:47.591 READ DMA EXT
25 02 00 00 a3 8a 40 00 00:11:47.588 READ DMA EXT
25 02 00 00 a2 8a 40 00 00:11:47.584 READ DMA EXT
Error 9 occurred at disk power-on lifetime: 5198 hours (216 days + 14 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 11 77 37 04 00 Error: ICRC, ABRT 17 sectors at LBA = 0x00043777 = 276343
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 02 40 48 37 04 40 00 00:00:41.411 READ DMA EXT
25 02 40 08 37 04 40 00 00:00:41.409 READ DMA EXT
25 02 40 c8 36 04 40 00 00:00:41.408 READ DMA EXT
25 02 40 88 36 04 40 00 00:00:41.407 READ DMA EXT
25 02 40 48 36 04 40 00 00:00:41.405 READ DMA EXT
Error 8 occurred at disk power-on lifetime: 5198 hours (216 days + 14 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 21 27 2e 04 00 Error: ICRC, ABRT 33 sectors at LBA = 0x00042e27 = 273959
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 02 40 08 2e 04 40 00 00:00:07.794 READ DMA EXT
25 02 40 c8 2d 04 40 00 00:00:07.793 READ DMA EXT
25 02 40 88 2d 04 40 00 00:00:07.791 READ DMA EXT
25 02 40 48 2d 04 40 00 00:00:07.790 READ DMA EXT
25 02 40 08 2d 04 40 00 00:00:07.789 READ DMA EXT
Error 7 occurred at disk power-on lifetime: 5196 hours (216 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 21 b7 bf 08 00 Error: ICRC, ABRT 33 sectors at LBA = 0x0008bfb7 = 573367
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 02 40 98 bf 08 40 00 00:03:51.245 READ DMA EXT
25 02 40 58 bf 08 40 00 00:03:51.244 READ DMA EXT
25 02 40 18 bf 08 40 00 00:03:51.242 READ DMA EXT
25 02 40 d8 be 08 40 00 00:03:51.240 READ DMA EXT
25 02 40 98 be 08 40 00 00:03:51.239 READ DMA EXT
Error 6 occurred at disk power-on lifetime: 5196 hours (216 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 17 b6 08 00 Error: ICRC, ABRT 1 sectors at LBA = 0x0008b617 = 570903
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 02 40 d8 b5 08 40 00 00:03:17.533 READ DMA EXT
35 02 10 88 26 09 40 00 00:03:17.511 WRITE DMA EXT
ea 02 00 d8 b5 04 a0 00 00:03:17.489 FLUSH CACHE EXT
35 02 01 d8 b5 04 40 00 00:03:17.488 WRITE DMA EXT
ea 02 00 af 2a 05 a0 00 00:03:17.486 FLUSH CACHE EXT
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.