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Update of reports (new: 3637, modified: 0)
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NVMe/Lexar/250/250GB SSD/0542E50459D2
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NVMe/Lexar/250/250GB SSD/0542E50459D2
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smartctl 7.2 2021-09-14 r5236 [FreeBSD 13.0-RELEASE amd64] (local build)
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Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
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=== START OF INFORMATION SECTION ===
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Model Number: Lexar 250GB SSD
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Serial Number: --
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Firmware Version: V2.11.0
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PCI Vendor ID: 0x2263
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PCI Vendor Subsystem ID: 0x1d97
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IEEE OUI Identifier: 0x000000
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Controller ID: 1
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NVMe Version: 1.3
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Number of Namespaces: 1
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Namespace 1 Size/Capacity: 250,059,350,016 [250 GB]
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Namespace 1 Formatted LBA Size: 512
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Local Time is: Thu Feb 10 05:59:21 2022 EST
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Firmware Updates (0x02): 1 Slot
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Optional Admin Commands (0x0007): Security Format Frmw_DL
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Optional NVM Commands (0x0015): Comp DS_Mngmt Sav/Sel_Feat
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Log Page Attributes (0x0a): Cmd_Eff_Lg Telmtry_Lg
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Maximum Data Transfer Size: 32 Pages
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Warning Comp. Temp. Threshold: 81 Celsius
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Critical Comp. Temp. Threshold: 90 Celsius
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Supported Power States
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St Op Max Active Idle RL RT WL WT Ent_Lat Ex_Lat
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0 + 5.00W - - 0 0 0 0 0 0
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Supported LBA Sizes (NSID 0x1)
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Id Fmt Data Metadt Rel_Perf
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0 + 512 0 0
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=== START OF SMART DATA SECTION ===
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SMART overall-health self-assessment test result: PASSED
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SMART/Health Information (NVMe Log 0x02)
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Critical Warning: 0x00
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Temperature: 39 Celsius
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Available Spare: 100%
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Available Spare Threshold: 10%
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Percentage Used: 0%
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Data Units Read: 6,168 [3.15 GB]
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Data Units Written: 35,248 [18.0 GB]
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Host Read Commands: 65,812
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Host Write Commands: 176,513
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Controller Busy Time: 0
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Power Cycles: 60
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Power On Hours: 23
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Unsafe Shutdowns: 0
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Media and Data Integrity Errors: 0
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Error Information Log Entries: 0
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Warning Comp. Temperature Time: 0
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Critical Comp. Temperature Time: 0
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Temperature Sensor 1: 39 Celsius
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Thermal Temp. 2 Transition Count: 2
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Error Information (NVMe Log 0x01, 16 of 64 entries)
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No Errors Logged
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NVMe/Lexar/README.md
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NVMe/Lexar/README.md
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Lexar NVMe Drives
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=================
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This is a list of all tested Lexar NVMe drive models and their MTBFs. See more
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info on reliability test in the [README](https://github.com/bsdhw/SMART).
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NVME by Model
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------------
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Please take all columns into account when reading the table. Pay attention on the
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number of tested samples and power-on days. Simultaneous high values of both MTBF
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and errors are possible if only rare drives in the subset encounter errors.
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Days — avg. days per sample,
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Err — avg. errors per sample,
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MTBF — avg. MTBF in years per sample.
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| MFG | Model | Size | Samples | Days | Err | MTBF |
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|-----------|--------------------|--------|---------|-------|-------|------|
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| Lexar | 250GB SSD | 250 GB | 1 | 0 | 0 | 0.00 |
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