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mirror of https://github.com/bsdhw/SMART.git synced 2025-05-31 16:21:41 +05:30

Update of reports (new: 3637, modified: 0)

This commit is contained in:
Andrey Ponomarenko
2022-03-18 23:39:11 +03:00
parent 9495463568
commit b1c41e7edc
3830 changed files with 648855 additions and 4579 deletions

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smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p12-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: ME16TGPXQ-XN000-D
Serial Number: --
Firmware Version: M0614BD
User Capacity: 15,835,594,752 bytes [15.8 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available, deterministic
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2 (minor revision not indicated)
Local Time is: Tue Feb 1 08:12:35 2022 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Unavailable
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x00) Offline data collection not supported.
SMART capabilities: (0x0002) Does not save SMART data before
entering power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x00) Error logging NOT supported.
General Purpose Logging supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate ------ 100 100 000 - 0
5 Reallocated_Sector_Ct ------ 100 100 000 - 0
9 Power_On_Hours ------ 100 100 000 - 21995
12 Power_Cycle_Count ------ 100 100 000 - 46
160 Unknown_Attribute ------ 100 100 000 - 1
161 Unknown_Attribute ------ 100 100 000 - 583
163 Unknown_Attribute ------ 100 100 000 - 4
164 Unknown_Attribute ------ 100 100 000 - 1960088
165 Unknown_Attribute ------ 100 100 050 - 290
166 Unknown_Attribute ------ 100 100 050 - 188
167 Unknown_Attribute ------ 100 100 001 - 239
192 Power-Off_Retract_Count ------ 100 100 000 - 0
194 Temperature_Celsius ------ 100 100 000 - 27
195 Hardware_ECC_Recovered ------ 100 100 000 - 0
196 Reallocated_Event_Count ------ 100 100 016 - 0
198 Offline_Uncorrectable ------ 100 100 050 - 0
199 UDMA_CRC_Error_Count ------ 100 100 050 - 0
241 Total_LBAs_Written ------ 100 100 000 - 6378907908
242 Total_LBAs_Read ------ 100 100 000 - 685214671
243 Unknown_Attribute ------ 100 100 000 - 0
244 Unknown_Attribute ------ 100 100 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
Read SMART Log Directory failed: Input/output error
General Purpose Log Directory Version 1
Address Access R/W Size Description
0x00 GPL R/O 1 Log Directory
0x10 GPL R/O 1 NCQ Command Error log
SMART Extended Comprehensive Error Log (GP Log 0x03) not supported
SMART Error Log not supported
SMART Extended Self-test Log (GP Log 0x07) not supported
SMART Self-test Log not supported
Selective Self-tests/Logging not supported
SCT Commands not supported
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11) not supported

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Delkin Devices Solid State Drives
=================================
This is a list of all tested Delkin Devices solid state drive models and their MTBFs. See
more info on reliability test in the [README](https://github.com/bsdhw/SMART).
SSD by Model
------------
Please take all columns into account when reading the table. Pay attention on the
number of tested samples and power-on days. Simultaneous high values of both MTBF
and errors are possible if only rare drives in the subset encounter errors.
Days — avg. days per sample,
Err — avg. errors per sample,
MTBF — avg. MTBF in years per sample.
| MFG | Model | Size | Samples | Days | Err | MTBF |
|-----------|--------------------|--------|---------|-------|-------|------|
| Delkin... | ME16TGPXQ-XN000-D | 16 GB | 1 | 916 | 1 | 1.26 |