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Update of reports (new: 3637, modified: 0)
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SSD/Delkin Devices/ME16/ME16TGPXQ-XN000-D/B6B900EDB48B
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SSD/Delkin Devices/ME16/ME16TGPXQ-XN000-D/B6B900EDB48B
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smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p12-HBSD amd64] (local build)
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Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
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=== START OF INFORMATION SECTION ===
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Device Model: ME16TGPXQ-XN000-D
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Serial Number: --
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Firmware Version: M0614BD
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User Capacity: 15,835,594,752 bytes [15.8 GB]
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Sector Size: 512 bytes logical/physical
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Rotation Rate: Solid State Device
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TRIM Command: Available, deterministic
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Device is: Not in smartctl database [for details use: -P showall]
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ATA Version is: ACS-2 (minor revision not indicated)
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Local Time is: Tue Feb 1 08:12:35 2022 EST
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SMART support is: Available - device has SMART capability.
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SMART support is: Enabled
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AAM feature is: Unavailable
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APM feature is: Unavailable
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Rd look-ahead is: Unavailable
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Write cache is: Enabled
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DSN feature is: Unavailable
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ATA Security is: Disabled, NOT FROZEN [SEC1]
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Wt Cache Reorder: Unavailable
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=== START OF READ SMART DATA SECTION ===
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SMART overall-health self-assessment test result: PASSED
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General SMART Values:
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Offline data collection status: (0x00) Offline data collection activity
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was never started.
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Auto Offline Data Collection: Disabled.
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Total time to complete Offline
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data collection: ( 0) seconds.
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Offline data collection
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capabilities: (0x00) Offline data collection not supported.
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SMART capabilities: (0x0002) Does not save SMART data before
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entering power-saving mode.
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Supports SMART auto save timer.
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Error logging capability: (0x00) Error logging NOT supported.
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General Purpose Logging supported.
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SMART Attributes Data Structure revision number: 1
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Vendor Specific SMART Attributes with Thresholds:
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ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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1 Raw_Read_Error_Rate ------ 100 100 000 - 0
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5 Reallocated_Sector_Ct ------ 100 100 000 - 0
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9 Power_On_Hours ------ 100 100 000 - 21995
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12 Power_Cycle_Count ------ 100 100 000 - 46
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160 Unknown_Attribute ------ 100 100 000 - 1
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161 Unknown_Attribute ------ 100 100 000 - 583
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163 Unknown_Attribute ------ 100 100 000 - 4
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164 Unknown_Attribute ------ 100 100 000 - 1960088
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165 Unknown_Attribute ------ 100 100 050 - 290
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166 Unknown_Attribute ------ 100 100 050 - 188
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167 Unknown_Attribute ------ 100 100 001 - 239
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192 Power-Off_Retract_Count ------ 100 100 000 - 0
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194 Temperature_Celsius ------ 100 100 000 - 27
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195 Hardware_ECC_Recovered ------ 100 100 000 - 0
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196 Reallocated_Event_Count ------ 100 100 016 - 0
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198 Offline_Uncorrectable ------ 100 100 050 - 0
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199 UDMA_CRC_Error_Count ------ 100 100 050 - 0
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241 Total_LBAs_Written ------ 100 100 000 - 6378907908
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242 Total_LBAs_Read ------ 100 100 000 - 685214671
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243 Unknown_Attribute ------ 100 100 000 - 0
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244 Unknown_Attribute ------ 100 100 000 - 0
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||||||_ K auto-keep
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|||||__ C event count
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||||___ R error rate
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|||____ S speed/performance
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||_____ O updated online
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|______ P prefailure warning
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Read SMART Log Directory failed: Input/output error
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General Purpose Log Directory Version 1
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Address Access R/W Size Description
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0x00 GPL R/O 1 Log Directory
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0x10 GPL R/O 1 NCQ Command Error log
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SMART Extended Comprehensive Error Log (GP Log 0x03) not supported
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SMART Error Log not supported
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SMART Extended Self-test Log (GP Log 0x07) not supported
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SMART Self-test Log not supported
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Selective Self-tests/Logging not supported
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SCT Commands not supported
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Device Statistics (GP/SMART Log 0x04) not supported
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Pending Defects log (GP Log 0x0c) not supported
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SATA Phy Event Counters (GP Log 0x11) not supported
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20
SSD/Delkin Devices/README.md
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SSD/Delkin Devices/README.md
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Delkin Devices Solid State Drives
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=================================
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This is a list of all tested Delkin Devices solid state drive models and their MTBFs. See
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more info on reliability test in the [README](https://github.com/bsdhw/SMART).
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SSD by Model
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------------
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Please take all columns into account when reading the table. Pay attention on the
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number of tested samples and power-on days. Simultaneous high values of both MTBF
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and errors are possible if only rare drives in the subset encounter errors.
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Days — avg. days per sample,
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Err — avg. errors per sample,
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MTBF — avg. MTBF in years per sample.
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| MFG | Model | Size | Samples | Days | Err | MTBF |
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|-----------|--------------------|--------|---------|-------|-------|------|
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| Delkin... | ME16TGPXQ-XN000-D | 16 GB | 1 | 916 | 1 | 1.26 |
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