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mirror of https://github.com/bsdhw/SMART.git synced 2025-05-31 16:21:41 +05:30

Update of reports (new: 3637, modified: 0)

This commit is contained in:
Andrey Ponomarenko
2022-03-18 23:39:11 +03:00
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smartctl 7.2 2021-09-14 r5236 [FreeBSD 13.0-RELEASE amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: FM-25S3-120GBP3
Serial Number: --
LU WWN Device Id: 0 0232d0 ...
Firmware Version: GS505
User Capacity: 120,034,123,776 bytes [120 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available, deterministic
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ATA8-ACS, ACS-2 T13/2015-D revision 3
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sat Jan 8 22:19:35 2022 PST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM level is: 254 (maximum performance)
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 48) minutes.
Conveyance self-test routine
recommended polling time: ( 2) minutes.
SCT capabilities: (0x0021) SCT Status supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate POSR-- 120 120 050 - 0
5 Reallocated_Sector_Ct PO--CK 100 100 003 - 0
9 Power_On_Hours -O--CK 031 031 000 - 60768 (169 240 0)
12 Power_Cycle_Count -O--CK 100 100 000 - 74
171 Unknown_Attribute -O--CK 000 000 000 - 0
172 Unknown_Attribute -O--CK 000 000 000 - 0
174 Unknown_Attribute ----CK 000 000 000 - 41
177 Wear_Leveling_Count ------ 000 000 000 - 4
181 Program_Fail_Cnt_Total -O--CK 000 000 000 - 0
182 Erase_Fail_Count_Total -O--CK 000 000 000 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
194 Temperature_Celsius -O---K 030 030 000 - 30 (Min/Max 30/30)
195 Hardware_ECC_Recovered --SRC- 100 100 000 - 0
196 Reallocated_Event_Count PO--CK 100 100 003 - 0
201 Unknown_SSD_Attribute --SRC- 100 100 000 - 0
204 Soft_ECC_Correction --SRC- 100 100 000 - 0
230 Unknown_SSD_Attribute PO--C- 100 100 000 - 100
231 Unknown_SSD_Attribute PO--C- 100 100 010 - 0
233 Media_Wearout_Indicator ------ 000 000 000 - 1684
234 Unknown_Attribute -O--CK 000 000 000 - 2314
241 Total_LBAs_Written -O--CK 000 000 000 - 2314
242 Total_LBAs_Read -O--CK 000 000 000 - 66
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x04 GPL,SL R/O 1 Device Statistics log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL,SL R/O 1 SATA Phy Event Counters log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xb7 GPL,SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log (GP Log 0x03) not supported
SMART Error Log not supported
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 0 (0x0000)
Device State: Active (0)
Current Temperature: 30 Celsius
Power Cycle Min/Max Temperature: 30/30 Celsius
Lifetime Min/Max Temperature: 30/30 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 0 minutes
Temperature Logging Interval: 0 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 478 (1)
SCT Error Recovery Control command not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 2) ==
0x01 0x008 4 74 --- Lifetime Power-On Resets
0x01 0x010 4 60768 --- Power-on Hours
0x01 0x018 6 4853032090 --- Logical Sectors Written
0x01 0x028 6 139309837 --- Logical Sectors Read
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 1138 --- Resets Between Cmd Acceptance and Completion
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 1138 --- Number of Hardware Resets
0x06 0x010 4 490 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 255 --- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 43 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 44 Device-to-host register FISes sent due to a COMRESET
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
0x0002 2 0 R_ERR response for data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS

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SSD/G.Skill/README.md Normal file
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G.Skill Solid State Drives
==========================
This is a list of all tested G.Skill solid state drive models and their MTBFs. See
more info on reliability test in the [README](https://github.com/bsdhw/SMART).
SSD by Model
------------
Please take all columns into account when reading the table. Pay attention on the
number of tested samples and power-on days. Simultaneous high values of both MTBF
and errors are possible if only rare drives in the subset encounter errors.
Days — avg. days per sample,
Err — avg. errors per sample,
MTBF — avg. MTBF in years per sample.
| MFG | Model | Size | Samples | Days | Err | MTBF |
|-----------|--------------------|--------|---------|-------|-------|------|
| G.Skill | FM-25S3-120GBP3 | 120 GB | 1 | 2532 | 0 | 6.94 |