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Update of reports (new: 3637, modified: 0)
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SSD/G.Skill/FM-25/FM-25S3-120GBP3/534C5C889150
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smartctl 7.2 2021-09-14 r5236 [FreeBSD 13.0-RELEASE amd64] (local build)
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Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
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=== START OF INFORMATION SECTION ===
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Device Model: FM-25S3-120GBP3
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Serial Number: --
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LU WWN Device Id: 0 0232d0 ...
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Firmware Version: GS505
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User Capacity: 120,034,123,776 bytes [120 GB]
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Sector Size: 512 bytes logical/physical
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Rotation Rate: Solid State Device
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TRIM Command: Available, deterministic
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Device is: Not in smartctl database [for details use: -P showall]
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ATA Version is: ATA8-ACS, ACS-2 T13/2015-D revision 3
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SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
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Local Time is: Sat Jan 8 22:19:35 2022 PST
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SMART support is: Available - device has SMART capability.
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SMART support is: Enabled
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AAM feature is: Unavailable
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APM level is: 254 (maximum performance)
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Rd look-ahead is: Enabled
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Write cache is: Enabled
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DSN feature is: Unavailable
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ATA Security is: Disabled, frozen [SEC2]
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Wt Cache Reorder: Unavailable
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=== START OF READ SMART DATA SECTION ===
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SMART overall-health self-assessment test result: PASSED
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General SMART Values:
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Offline data collection status: (0x00) Offline data collection activity
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was never started.
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Auto Offline Data Collection: Disabled.
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Self-test execution status: ( 0) The previous self-test routine completed
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without error or no self-test has ever
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been run.
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Total time to complete Offline
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data collection: ( 0) seconds.
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Offline data collection
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capabilities: (0x7b) SMART execute Offline immediate.
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Auto Offline data collection on/off support.
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Suspend Offline collection upon new
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command.
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Offline surface scan supported.
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Self-test supported.
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Conveyance Self-test supported.
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Selective Self-test supported.
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SMART capabilities: (0x0003) Saves SMART data before entering
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power-saving mode.
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Supports SMART auto save timer.
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Error logging capability: (0x01) Error logging supported.
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General Purpose Logging supported.
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Short self-test routine
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recommended polling time: ( 1) minutes.
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Extended self-test routine
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recommended polling time: ( 48) minutes.
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Conveyance self-test routine
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recommended polling time: ( 2) minutes.
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SCT capabilities: (0x0021) SCT Status supported.
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SCT Data Table supported.
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SMART Attributes Data Structure revision number: 10
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Vendor Specific SMART Attributes with Thresholds:
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ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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1 Raw_Read_Error_Rate POSR-- 120 120 050 - 0
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5 Reallocated_Sector_Ct PO--CK 100 100 003 - 0
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9 Power_On_Hours -O--CK 031 031 000 - 60768 (169 240 0)
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12 Power_Cycle_Count -O--CK 100 100 000 - 74
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171 Unknown_Attribute -O--CK 000 000 000 - 0
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172 Unknown_Attribute -O--CK 000 000 000 - 0
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174 Unknown_Attribute ----CK 000 000 000 - 41
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177 Wear_Leveling_Count ------ 000 000 000 - 4
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181 Program_Fail_Cnt_Total -O--CK 000 000 000 - 0
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182 Erase_Fail_Count_Total -O--CK 000 000 000 - 0
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187 Reported_Uncorrect -O--CK 100 100 000 - 0
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194 Temperature_Celsius -O---K 030 030 000 - 30 (Min/Max 30/30)
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195 Hardware_ECC_Recovered --SRC- 100 100 000 - 0
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196 Reallocated_Event_Count PO--CK 100 100 003 - 0
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201 Unknown_SSD_Attribute --SRC- 100 100 000 - 0
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204 Soft_ECC_Correction --SRC- 100 100 000 - 0
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230 Unknown_SSD_Attribute PO--C- 100 100 000 - 100
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231 Unknown_SSD_Attribute PO--C- 100 100 010 - 0
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233 Media_Wearout_Indicator ------ 000 000 000 - 1684
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234 Unknown_Attribute -O--CK 000 000 000 - 2314
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241 Total_LBAs_Written -O--CK 000 000 000 - 2314
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242 Total_LBAs_Read -O--CK 000 000 000 - 66
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||||||_ K auto-keep
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|||||__ C event count
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||||___ R error rate
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|||____ S speed/performance
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||_____ O updated online
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|______ P prefailure warning
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General Purpose Log Directory Version 1
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SMART Log Directory Version 1 [multi-sector log support]
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Address Access R/W Size Description
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0x00 GPL,SL R/O 1 Log Directory
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0x04 GPL,SL R/O 1 Device Statistics log
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0x07 GPL R/O 1 Extended self-test log
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0x09 SL R/W 1 Selective self-test log
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0x10 GPL R/O 1 NCQ Command Error log
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0x11 GPL,SL R/O 1 SATA Phy Event Counters log
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0x80-0x9f GPL,SL R/W 16 Host vendor specific log
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0xb7 GPL,SL VS 16 Device vendor specific log
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0xe0 GPL,SL R/W 1 SCT Command/Status
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0xe1 GPL,SL R/W 1 SCT Data Transfer
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SMART Extended Comprehensive Error Log (GP Log 0x03) not supported
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SMART Error Log not supported
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SMART Extended Self-test Log Version: 1 (1 sectors)
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No self-tests have been logged. [To run self-tests, use: smartctl -t]
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SMART Selective self-test log data structure revision number 1
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SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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1 0 0 Not_testing
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2 0 0 Not_testing
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3 0 0 Not_testing
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4 0 0 Not_testing
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5 0 0 Not_testing
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Selective self-test flags (0x0):
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After scanning selected spans, do NOT read-scan remainder of disk.
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If Selective self-test is pending on power-up, resume after 0 minute delay.
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SCT Status Version: 3
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SCT Version (vendor specific): 0 (0x0000)
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Device State: Active (0)
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Current Temperature: 30 Celsius
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Power Cycle Min/Max Temperature: 30/30 Celsius
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Lifetime Min/Max Temperature: 30/30 Celsius
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Under/Over Temperature Limit Count: 0/0
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SCT Temperature History Version: 2
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Temperature Sampling Period: 0 minutes
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Temperature Logging Interval: 0 minutes
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Min/Max recommended Temperature: ?/ ? Celsius
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Min/Max Temperature Limit: ?/ ? Celsius
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Temperature History Size (Index): 478 (1)
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SCT Error Recovery Control command not supported
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Device Statistics (GP Log 0x04)
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Page Offset Size Value Flags Description
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0x01 ===== = = === == General Statistics (rev 2) ==
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0x01 0x008 4 74 --- Lifetime Power-On Resets
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0x01 0x010 4 60768 --- Power-on Hours
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0x01 0x018 6 4853032090 --- Logical Sectors Written
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0x01 0x028 6 139309837 --- Logical Sectors Read
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0x04 ===== = = === == General Errors Statistics (rev 1) ==
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0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
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0x04 0x010 4 1138 --- Resets Between Cmd Acceptance and Completion
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0x06 ===== = = === == Transport Statistics (rev 1) ==
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0x06 0x008 4 1138 --- Number of Hardware Resets
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0x06 0x010 4 490 --- Number of ASR Events
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0x06 0x018 4 0 --- Number of Interface CRC Errors
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0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
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0x07 0x008 1 255 --- Percentage Used Endurance Indicator
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|||_ C monitored condition met
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||__ D supports DSN
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|___ N normalized value
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Pending Defects log (GP Log 0x0c) not supported
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SATA Phy Event Counters (GP Log 0x11)
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ID Size Value Description
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0x0001 2 0 Command failed due to ICRC error
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0x0003 2 0 R_ERR response for device-to-host data FIS
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0x0004 2 0 R_ERR response for host-to-device data FIS
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0x0006 2 0 R_ERR response for device-to-host non-data FIS
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0x0007 2 0 R_ERR response for host-to-device non-data FIS
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0x0008 2 0 Device-to-host non-data FIS retries
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0x0009 2 43 Transition from drive PhyRdy to drive PhyNRdy
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0x000a 2 44 Device-to-host register FISes sent due to a COMRESET
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0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
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0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
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0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
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0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
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0x0002 2 0 R_ERR response for data FIS
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0x0005 2 0 R_ERR response for non-data FIS
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0x000b 2 0 CRC errors within host-to-device FIS
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0x000d 2 0 Non-CRC errors within host-to-device FIS
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20
SSD/G.Skill/README.md
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20
SSD/G.Skill/README.md
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@@ -0,0 +1,20 @@
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G.Skill Solid State Drives
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==========================
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This is a list of all tested G.Skill solid state drive models and their MTBFs. See
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more info on reliability test in the [README](https://github.com/bsdhw/SMART).
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SSD by Model
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------------
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Please take all columns into account when reading the table. Pay attention on the
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number of tested samples and power-on days. Simultaneous high values of both MTBF
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and errors are possible if only rare drives in the subset encounter errors.
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Days — avg. days per sample,
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Err — avg. errors per sample,
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MTBF — avg. MTBF in years per sample.
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| MFG | Model | Size | Samples | Days | Err | MTBF |
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|-----------|--------------------|--------|---------|-------|-------|------|
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| G.Skill | FM-25S3-120GBP3 | 120 GB | 1 | 2532 | 0 | 6.94 |
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