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Update of reports (new: 3637, modified: 0)
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Andrey Ponomarenko
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SSD/GLOWAY/FER60/FER60GS3-S7/2C9B7EA6BBBB
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smartctl 7.1 2019-12-30 r5022 [x86_64-unknown-openbsd6.9] (local build)
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Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
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=== START OF INFORMATION SECTION ===
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Device Model: GLOWAY FER60GS3-S7
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Serial Number: --
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LU WWN Device Id: 0 000000 ...
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Firmware Version: 20150818
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User Capacity: 60,022,480,896 bytes [60.0 GB]
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Sector Size: 512 bytes logical/physical
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Rotation Rate: Solid State Device
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Form Factor: 2.5 inches
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Device is: Not in smartctl database [for details use: -P showall]
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ATA Version is: ACS-2 (minor revision not indicated)
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SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
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Local Time is: Tue Oct 26 09:17:14 2021 EST
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SMART support is: Available - device has SMART capability.
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SMART support is: Enabled
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=== START OF READ SMART DATA SECTION ===
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SMART Status not supported: Incomplete response, ATA output registers missing
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SMART overall-health self-assessment test result: PASSED
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Warning: This result is based on an Attribute check.
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General SMART Values:
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Offline data collection status: (0x00) Offline data collection activity
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was never started.
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Auto Offline Data Collection: Disabled.
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Self-test execution status: ( 0) The previous self-test routine completed
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without error or no self-test has ever
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been run.
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Total time to complete Offline
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data collection: ( 0) seconds.
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Offline data collection
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capabilities: (0x11) SMART execute Offline immediate.
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No Auto Offline data collection support.
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Suspend Offline collection upon new
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command.
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No Offline surface scan supported.
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Self-test supported.
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No Conveyance Self-test supported.
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No Selective Self-test supported.
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SMART capabilities: (0x0002) Does not save SMART data before
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entering power-saving mode.
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Supports SMART auto save timer.
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Error logging capability: (0x01) Error logging supported.
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General Purpose Logging supported.
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Short self-test routine
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recommended polling time: ( 2) minutes.
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Extended self-test routine
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recommended polling time: ( 10) minutes.
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SMART Attributes Data Structure revision number: 1
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Vendor Specific SMART Attributes with Thresholds:
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ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
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1 Raw_Read_Error_Rate 0x0000 100 100 050 Old_age Offline - 0
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5 Reallocated_Sector_Ct 0x0002 100 100 050 Old_age Always - 158
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9 Power_On_Hours 0x0000 100 100 050 Old_age Offline - 54
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12 Power_Cycle_Count 0x0000 100 100 050 Old_age Offline - 266
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160 Unknown_Attribute 0x0000 100 100 050 Old_age Offline - 11144
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161 Unknown_Attribute 0x0000 100 100 050 Old_age Offline - 119
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162 Unknown_Attribute 0x0000 100 100 050 Old_age Offline - 1
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163 Unknown_Attribute 0x0000 100 100 050 Old_age Offline - 18
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164 Unknown_Attribute 0x0000 100 100 050 Old_age Offline - 5439
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165 Unknown_Attribute 0x0000 100 100 050 Old_age Offline - 3
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166 Unknown_Attribute 0x0000 100 100 050 Old_age Offline - 1
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167 Unknown_Attribute 0x0000 100 100 050 Old_age Offline - 2
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192 Power-Off_Retract_Count 0x0000 100 100 050 Old_age Offline - 95
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194 Temperature_Celsius 0x0000 100 100 050 Old_age Offline - 34
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195 Hardware_ECC_Recovered 0x0000 100 100 050 Old_age Offline - 4874
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196 Reallocated_Event_Count 0x0000 100 100 050 Old_age Offline - 0
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199 UDMA_CRC_Error_Count 0x0000 100 100 050 Old_age Offline - 5
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241 Total_LBAs_Written 0x0000 100 100 050 Old_age Offline - 3747
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242 Total_LBAs_Read 0x0000 100 100 050 Old_age Offline - 3224
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245 Unknown_Attribute 0x0000 100 100 050 Old_age Offline - 4552
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Warning! SMART ATA Error Log Structure error: invalid SMART checksum.
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SMART Error Log Version: 1
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No Errors Logged
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SMART Self-test log structure revision number 1
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No self-tests have been logged. [To run self-tests, use: smartctl -t]
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Selective Self-tests/Logging not supported
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20
SSD/GLOWAY/README.md
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SSD/GLOWAY/README.md
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GLOWAY Solid State Drives
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=========================
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This is a list of all tested GLOWAY solid state drive models and their MTBFs. See
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more info on reliability test in the [README](https://github.com/bsdhw/SMART).
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SSD by Model
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------------
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Please take all columns into account when reading the table. Pay attention on the
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number of tested samples and power-on days. Simultaneous high values of both MTBF
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and errors are possible if only rare drives in the subset encounter errors.
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Days — avg. days per sample,
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Err — avg. errors per sample,
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MTBF — avg. MTBF in years per sample.
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| MFG | Model | Size | Samples | Days | Err | MTBF |
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|-----------|--------------------|--------|---------|-------|-------|------|
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| GLOWAY | FER60GS3-S7 | 64 GB | 1 | 2 | 1168 | 0.00 |
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