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Andrey Ponomarenko
2022-03-18 23:39:11 +03:00
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smartctl 7.2 2021-09-14 r5236 [FreeBSD 12.1-RELEASE-p21-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: VK0800GDJYA
Serial Number: --
LU WWN Device Id: 5 5cd2e4 ...
Firmware Version: 4IWVHPG1
User Capacity: 800,166,076,416 bytes [800 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic, zeroed
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ATA8-ACS T13/1699-D revision 4
SATA Version is: SATA 2.6, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Wed Jan 5 16:35:22 2022 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Unavailable
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x79) SMART execute Offline immediate.
No Auto Offline data collection support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 2) minutes.
Conveyance self-test routine
recommended polling time: ( 2) minutes.
SCT capabilities: (0x0039) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate POSR-- 130 130 039 - 1202946
5 Reallocated_Sector_Ct PO--CK 096 096 001 - 0
9 Power_On_Hours -O--CK 100 100 000 - 47679
173 Unknown_Attribute PO--CK 080 080 001 - 0
175 Program_Fail_Count_Chip PO--CK 100 100 010 - 1112399544990
180 Unused_Rsvd_Blk_Cnt_Tot PO-RCK 130 130 039 - 16205769
194 Temperature_Celsius -O---K 100 100 000 - 20
196 Reallocated_Event_Count PO--CK 100 100 010 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 GPL,SL R/O 1 Summary SMART error log
0x02 GPL,SL R/O 8 Comprehensive SMART error log
0x03 GPL,SL R/O 20 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 GPL,SL R/O 1 SMART self-test log
0x07 GPL,SL R/O 2 Extended self-test log
0x09 GPL,SL R/W 1 Selective self-test log
0x10 GPL,SL R/O 1 NCQ Command Error log
0x11 GPL,SL R/O 1 SATA Phy Event Counters log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xb0 GPL,SL VS 1 Device vendor specific log
0xb1 GPL,SL VS 33 Device vendor specific log
0xb5 GPL,SL VS 1 Device vendor specific log
0xb6 GPL,SL VS 127 Device vendor specific log
0xd0 GPL,SL VS 1 Device vendor specific log
0xd1 GPL VS 13056 Device vendor specific log
0xdf GPL VS 1152 Device vendor specific log
0xdf SL VS 128 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (20 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (2 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 20 Celsius
Power Cycle Min/Max Temperature: 16/23 Celsius
Lifetime Min/Max Temperature: 10/29 Celsius
Specified Max Operating Temperature: 55 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 0/55 Celsius
Min/Max Temperature Limit: 0/55 Celsius
Temperature History Size (Index): 478 (154)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 146 --- Lifetime Power-On Resets
0x01 0x018 6 363825712691 --- Logical Sectors Written
0x01 0x020 6 10641953742 --- Number of Write Commands
0x01 0x028 6 255799596672 --- Logical Sectors Read
0x01 0x030 6 11762434686 --- Number of Read Commands
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 20 --- Current Temperature
0x05 0x010 1 16 --- Average Short Term Temperature
0x05 0x018 1 14 --- Average Long Term Temperature
0x05 0x020 1 28 --- Highest Temperature
0x05 0x028 1 11 --- Lowest Temperature
0x05 0x030 1 18 --- Highest Average Short Term Temperature
0x05 0x038 1 12 --- Lowest Average Short Term Temperature
0x05 0x040 1 16 --- Highest Average Long Term Temperature
0x05 0x048 1 12 --- Lowest Average Long Term Temperature
0x05 0x050 4 0 --- Time in Over-Temperature
0x05 0x058 1 55 --- Specified Maximum Operating Temperature
0x05 0x060 4 0 --- Time in Under-Temperature
0x05 0x068 1 0 --- Specified Minimum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 43776 --- Number of Hardware Resets
0x06 0x010 4 539 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 20 --- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 4 0 Command failed due to ICRC error
0x0003 4 0 R_ERR response for device-to-host data FIS
0x0004 4 0 R_ERR response for host-to-device data FIS
0x0006 4 0 R_ERR response for device-to-host non-data FIS
0x000a 4 13 Device-to-host register FISes sent due to a COMRESET
0x000b 4 0 CRC errors within host-to-device FIS
0x000d 4 0 Non-CRC errors within host-to-device FIS