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Update of reports (new: 3637, modified: 0)
This commit is contained in:
Andrey Ponomarenko
106
SSD/Samsung/MZ7/MZ7PC128HAFU-000L1/DEA13AD5192A
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SSD/Samsung/MZ7/MZ7PC128HAFU-000L1/DEA13AD5192A
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smartctl 7.2 2020-12-30 r5155 [OpenBSD 7.0 amd64] (local build)
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Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
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=== START OF INFORMATION SECTION ===
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Device Model: SAMSUNG MZ7PC128HAFU-000L1
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Serial Number: --
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Firmware Version: CXM04L1Q
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User Capacity: 128,035,676,160 bytes [128 GB]
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Sector Size: 512 bytes logical/physical
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Rotation Rate: Solid State Device
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TRIM Command: Available
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Device is: Not in smartctl database [for details use: -P showall]
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ATA Version is: ATA8-ACS T13/1699-D revision 4c
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SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
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Local Time is: Fri Nov 26 01:28:55 2021 EST
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SMART support is: Available - device has SMART capability.
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SMART support is: Enabled
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=== START OF READ SMART DATA SECTION ===
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SMART overall-health self-assessment test result: PASSED
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General SMART Values:
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Offline data collection status: (0x02) Offline data collection activity
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was completed without error.
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Auto Offline Data Collection: Disabled.
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Self-test execution status: ( 0) The previous self-test routine completed
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without error or no self-test has ever
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been run.
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Total time to complete Offline
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data collection: ( 540) seconds.
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Offline data collection
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capabilities: (0x5b) SMART execute Offline immediate.
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Auto Offline data collection on/off support.
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Suspend Offline collection upon new
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command.
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Offline surface scan supported.
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Self-test supported.
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No Conveyance Self-test supported.
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Selective Self-test supported.
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SMART capabilities: (0x0003) Saves SMART data before entering
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power-saving mode.
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Supports SMART auto save timer.
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Error logging capability: (0x01) Error logging supported.
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General Purpose Logging supported.
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Short self-test routine
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recommended polling time: ( 2) minutes.
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Extended self-test routine
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recommended polling time: ( 9) minutes.
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SMART Attributes Data Structure revision number: 1
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Vendor Specific SMART Attributes with Thresholds:
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ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
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9 Power_On_Hours 0x0032 096 096 000 Old_age Always - 15194
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12 Power_Cycle_Count 0x0032 093 093 000 Old_age Always - 6779
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175 Program_Fail_Count_Chip 0x0032 100 100 010 Old_age Always - 0
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176 Erase_Fail_Count_Chip 0x0032 100 100 010 Old_age Always - 0
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177 Wear_Leveling_Count 0x0013 089 089 017 Pre-fail Always - 397
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178 Used_Rsvd_Blk_Cnt_Chip 0x0013 094 094 010 Pre-fail Always - 102
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179 Used_Rsvd_Blk_Cnt_Tot 0x0013 095 095 010 Pre-fail Always - 200
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180 Unused_Rsvd_Blk_Cnt_Tot 0x0013 095 095 010 Pre-fail Always - 3832
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181 Program_Fail_Cnt_Total 0x0032 100 100 010 Old_age Always - 0
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182 Erase_Fail_Count_Total 0x0032 100 100 010 Old_age Always - 0
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183 Runtime_Bad_Block 0x0013 100 100 010 Pre-fail Always - 0
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184 End-to-End_Error 0x0033 100 100 097 Pre-fail Always - 0
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187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
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190 Airflow_Temperature_Cel 0x0032 067 046 000 Old_age Always - 33
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195 Hardware_ECC_Recovered 0x001a 200 200 000 Old_age Always - 0
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198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0
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199 UDMA_CRC_Error_Count 0x003e 253 253 000 Old_age Always - 0
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233 Media_Wearout_Indicator 0x003a 200 200 000 Old_age Always - 0
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234 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 0
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235 Unknown_Attribute 0x0012 099 099 000 Old_age Always - 118
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236 Unknown_Attribute 0x0012 099 099 000 Old_age Always - 267
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237 Unknown_Attribute 0x0012 099 099 000 Old_age Always - 397
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238 Unknown_Attribute 0x0012 099 099 000 Old_age Always - 200
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SMART Error Log Version: 1
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No Errors Logged
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SMART Self-test log structure revision number 1
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Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
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# 1 Short offline Completed without error 00% 15175 -
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# 2 Short offline Completed without error 00% 15174 -
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# 3 Short offline Completed without error 00% 15171 -
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# 4 Short offline Completed without error 00% 15169 -
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# 5 Short offline Completed without error 00% 15169 -
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# 6 Short offline Completed without error 00% 15167 -
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# 7 Short offline Completed without error 00% 15162 -
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# 8 Short offline Completed without error 00% 15161 -
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# 9 Short offline Completed without error 00% 15158 -
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#10 Short offline Completed without error 00% 15157 -
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#11 Short offline Completed without error 00% 15157 -
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#12 Short offline Completed without error 00% 15157 -
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#13 Short offline Completed without error 00% 15156 -
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SMART Selective self-test log data structure revision number 1
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SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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1 0 0 Not_testing
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2 0 0 Not_testing
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3 0 0 Not_testing
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4 0 0 Not_testing
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5 0 0 Not_testing
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Selective self-test flags (0x0):
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After scanning selected spans, do NOT read-scan remainder of disk.
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If Selective self-test is pending on power-up, resume after 0 minute delay.
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