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https://github.com/bsdhw/SMART.git
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Update of reports (new: 0, modified: 707)
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@@ -13,7 +13,7 @@ TRIM Command: Available, deterministic, zeroed
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Device is: Not in smartctl database 7.3/5319
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ATA Version is: ACS-2 T13/2015-D revision 3
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SATA Version is: SATA 3.2, 6.0 Gb/s (current: 3.0 Gb/s)
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Local Time is: Sun Sep 18 15:20:20 2022 WIB
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Local Time is: Sun Oct 2 17:55:32 2022 WIB
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SMART support is: Available - device has SMART capability.
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SMART support is: Enabled
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AAM feature is: Unavailable
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@@ -28,8 +28,8 @@ Wt Cache Reorder: Unavailable
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SMART overall-health self-assessment test result: PASSED
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General SMART Values:
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Offline data collection status: (0x00) Offline data collection activity
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was never started.
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Offline data collection status: (0x02) Offline data collection activity
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was completed without error.
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Auto Offline Data Collection: Disabled.
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Self-test execution status: ( 0) The previous self-test routine completed
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without error or no self-test has ever
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@@ -60,15 +60,15 @@ Vendor Specific SMART Attributes with Thresholds:
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ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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1 Raw_Read_Error_Rate -O--CK 100 100 050 - 0
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5 Reallocated_Sector_Ct -O--CK 100 100 050 - 0
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9 Power_On_Hours -O--CK 100 100 050 - 26036
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9 Power_On_Hours -O--CK 100 100 050 - 26371
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12 Power_Cycle_Count -O--CK 100 100 050 - 445
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160 Unknown_Attribute -O--CK 100 100 050 - 0
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161 Unknown_Attribute PO--CK 100 100 050 - 100
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163 Unknown_Attribute -O--CK 100 100 050 - 24
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164 Unknown_Attribute -O--CK 100 100 050 - 4050702
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165 Unknown_Attribute -O--CK 100 100 050 - 18353
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166 Unknown_Attribute -O--CK 100 100 050 - 976
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167 Unknown_Attribute -O--CK 100 100 050 - 2330
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164 Unknown_Attribute -O--CK 100 100 050 - 4063281
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165 Unknown_Attribute -O--CK 100 100 050 - 18397
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166 Unknown_Attribute -O--CK 100 100 050 - 978
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167 Unknown_Attribute -O--CK 100 100 050 - 2337
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168 Unknown_Attribute -O--CK 100 100 050 - 7000
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169 Unknown_Attribute -O--CK 100 100 050 - 67
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175 Program_Fail_Count_Chip -O--CK 100 100 050 - 0
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@@ -79,15 +79,15 @@ ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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182 Erase_Fail_Count_Total -O--CK 100 100 050 - 0
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192 Power-Off_Retract_Count -O--CK 100 100 050 - 252
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194 Temperature_Celsius -O---K 100 100 050 - 40
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195 Hardware_ECC_Recovered -O--CK 100 100 050 - 3121
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195 Hardware_ECC_Recovered -O--CK 100 100 050 - 3634
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196 Reallocated_Event_Count -O--CK 100 100 050 - 0
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197 Current_Pending_Sector -O--CK 100 100 050 - 0
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198 Offline_Uncorrectable -O--CK 100 100 050 - 0
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199 UDMA_CRC_Error_Count -O--CK 100 100 050 - 1
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232 Available_Reservd_Space -O--CK 100 100 050 - 100
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241 Total_LBAs_Written ----CK 100 100 050 - 1578618
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242 Total_LBAs_Read ----CK 100 100 050 - 42216
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245 Unknown_Attribute -O--CK 100 100 050 - 2969955
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241 Total_LBAs_Written ----CK 100 100 050 - 1582493
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242 Total_LBAs_Read ----CK 100 100 050 - 42219
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245 Unknown_Attribute -O--CK 100 100 050 - 2985980
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||||||_ K auto-keep
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|||||__ C event count
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||||___ R error rate
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@@ -114,7 +114,8 @@ Address Access R/W Size Description
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SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
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Invalid Error Log index = 0x0000 (reserved = 0x00)
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SMART Extended Self-test Log Version: 1 (1 sectors)
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No self-tests have been logged. [To run self-tests, use: smartctl -t]
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Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
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# 1 Short offline Completed without error 00% 26037 -
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Selective Self-tests/Logging not supported
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@@ -124,11 +125,11 @@ Device Statistics (GP Log 0x04)
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Page Offset Size Value Flags Description
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0x01 ===== = = === == General Statistics (rev 1) ==
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0x01 0x008 4 445 --- Lifetime Power-On Resets
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0x01 0x010 4 26036 --- Power-on Hours
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0x01 0x018 6 377133235 --- Logical Sectors Written
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0x01 0x020 6 15320610 --- Number of Write Commands
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0x01 0x028 6 2766706339 --- Logical Sectors Read
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0x01 0x030 6 328502 --- Number of Read Commands
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0x01 0x010 4 26371 --- Power-on Hours
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0x01 0x018 6 631056737 --- Logical Sectors Written
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0x01 0x020 6 19413613 --- Number of Write Commands
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0x01 0x028 6 2766877356 --- Logical Sectors Read
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0x01 0x030 6 350605 --- Number of Read Commands
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0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
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0x07 0x008 1 33 --- Percentage Used Endurance Indicator
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|||_ C monitored condition met
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