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Update of reports (new: 3084, modified: 0)
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Andrey Ponomarenko
190
HDD/Toshiba/MK6006/MK6006GAH/3BF3AA2518C8
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HDD/Toshiba/MK6006/MK6006GAH/3BF3AA2518C8
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smartctl 7.1 2019-12-30 r5022 [i386-unknown-openbsd6.8] (local build)
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Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
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=== START OF INFORMATION SECTION ===
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Model Family: Toshiba 1.8" HDD
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Device Model: TOSHIBA MK6006GAH
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Serial Number: --
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Firmware Version: BZ003K
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User Capacity: 60,011,642,880 bytes [60.0 GB]
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Sector Size: 512 bytes logical/physical
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Device is: In smartctl database [for details use: -P show]
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ATA Version is: ATA/ATAPI-6 (minor revision not indicated)
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Local Time is: Sun Dec 6 19:23:06 2020 CST
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SMART support is: Available - device has SMART capability.
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SMART support is: Enabled
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=== START OF READ SMART DATA SECTION ===
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SMART overall-health self-assessment test result: PASSED
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General SMART Values:
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Offline data collection status: (0x00) Offline data collection activity
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was never started.
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Auto Offline Data Collection: Disabled.
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Self-test execution status: ( 0) The previous self-test routine completed
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without error or no self-test has ever
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been run.
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Total time to complete Offline
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data collection: ( 387) seconds.
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Offline data collection
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capabilities: (0x5b) SMART execute Offline immediate.
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Auto Offline data collection on/off support.
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Suspend Offline collection upon new
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command.
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Offline surface scan supported.
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Self-test supported.
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No Conveyance Self-test supported.
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Selective Self-test supported.
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SMART capabilities: (0x0003) Saves SMART data before entering
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power-saving mode.
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Supports SMART auto save timer.
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Error logging capability: (0x01) Error logging supported.
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General Purpose Logging supported.
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Short self-test routine
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recommended polling time: ( 2) minutes.
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Extended self-test routine
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recommended polling time: ( 76) minutes.
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SMART Attributes Data Structure revision number: 16
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Vendor Specific SMART Attributes with Thresholds:
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ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
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1 Raw_Read_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
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2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0
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3 Spin_Up_Time 0x0027 100 100 001 Pre-fail Always - 1781
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4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 2418
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5 Reallocated_Sector_Ct 0x0033 100 100 050 Pre-fail Always - 0
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7 Seek_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
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8 Seek_Time_Performance 0x0005 100 100 050 Pre-fail Offline - 0
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9 Power_On_Hours 0x0032 075 075 000 Old_age Always - 10243
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10 Spin_Retry_Count 0x0033 148 100 030 Pre-fail Always - 0
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12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 2384
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191 G-Sense_Error_Rate 0x0032 100 100 000 Old_age Always - 1360
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192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 229
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193 Load_Cycle_Count 0x0032 082 082 000 Old_age Always - 181904
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194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 38 (Min/Max 5/64)
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196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
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197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 0
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198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0
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199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
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220 Disk_Shift 0x0002 100 100 000 Old_age Always - 81
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222 Loaded_Hours 0x0032 077 077 000 Old_age Always - 9233
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223 Load_Retry_Count 0x0032 100 100 000 Old_age Always - 0
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224 Load_Friction 0x0022 100 100 000 Old_age Always - 0
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226 Load-in_Time 0x0026 100 100 000 Old_age Always - 297
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240 Head_Flying_Hours 0x0001 100 100 001 Pre-fail Offline - 0
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SMART Error Log Version: 1
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ATA Error Count: 167 (device log contains only the most recent five errors)
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CR = Command Register [HEX]
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FR = Features Register [HEX]
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SC = Sector Count Register [HEX]
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SN = Sector Number Register [HEX]
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CL = Cylinder Low Register [HEX]
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CH = Cylinder High Register [HEX]
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DH = Device/Head Register [HEX]
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DC = Device Command Register [HEX]
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ER = Error register [HEX]
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ST = Status register [HEX]
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Powered_Up_Time is measured from power on, and printed as
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DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
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SS=sec, and sss=millisec. It "wraps" after 49.710 days.
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Error 167 occurred at disk power-on lifetime: 4982 hours (207 days + 14 hours)
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When the command that caused the error occurred, the device was active or idle.
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After command completion occurred, registers were:
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ER ST SC SN CL CH DH
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-- -- -- -- -- -- --
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40 51 05 ea 3b bf e1 Error: UNC 5 sectors at LBA = 0x01bf3bea = 29309930
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Commands leading to the command that caused the error were:
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CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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-- -- -- -- -- -- -- -- ---------------- --------------------
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c8 00 08 e7 3b bf e1 00 11:17:31.783 READ DMA
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c8 00 01 00 00 00 e0 00 11:17:31.768 READ DMA
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c8 00 08 ff db 3a e3 00 11:17:31.763 READ DMA
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c8 00 08 ff a4 38 e3 00 11:17:31.748 READ DMA
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c8 00 08 e7 0a 38 e3 00 11:17:31.743 READ DMA
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Error 166 occurred at disk power-on lifetime: 4982 hours (207 days + 14 hours)
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When the command that caused the error occurred, the device was active or idle.
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After command completion occurred, registers were:
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ER ST SC SN CL CH DH
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-- -- -- -- -- -- --
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40 51 05 ea 3b bf e1 Error: UNC 5 sectors at LBA = 0x01bf3bea = 29309930
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Commands leading to the command that caused the error were:
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CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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-- -- -- -- -- -- -- -- ---------------- --------------------
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c8 00 08 e7 3b bf e1 00 11:17:23.150 READ DMA
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c8 00 07 07 7f 05 e0 00 11:17:23.140 READ DMA
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c8 00 01 00 00 00 e0 00 11:17:23.119 READ DMA
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c8 00 08 df 0a 38 e3 00 11:17:23.107 READ DMA
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c8 00 08 57 a3 36 e3 00 11:17:23.101 READ DMA
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Error 165 occurred at disk power-on lifetime: 4982 hours (207 days + 14 hours)
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When the command that caused the error occurred, the device was active or idle.
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After command completion occurred, registers were:
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ER ST SC SN CL CH DH
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-- -- -- -- -- -- --
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40 51 05 ea 3b bf e1 Error: UNC 5 sectors at LBA = 0x01bf3bea = 29309930
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Commands leading to the command that caused the error were:
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CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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-- -- -- -- -- -- -- -- ---------------- --------------------
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c8 00 08 e7 3b bf e1 00 11:17:14.570 READ DMA
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ca 00 18 67 70 ad e0 00 11:17:14.569 WRITE DMA
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ca 00 01 27 40 09 e0 00 11:17:14.569 WRITE DMA
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ec 00 00 00 00 00 a0 00 11:17:14.528 IDENTIFY DEVICE
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c8 03 08 67 ac 38 e3 00 11:17:14.519 READ DMA
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Error 164 occurred at disk power-on lifetime: 4982 hours (207 days + 14 hours)
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When the command that caused the error occurred, the device was active or idle.
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After command completion occurred, registers were:
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ER ST SC SN CL CH DH
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-- -- -- -- -- -- --
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40 51 28 ea 3b bf e1 Error: UNC at LBA = 0x01bf3bea = 29309930
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Commands leading to the command that caused the error were:
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CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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-- -- -- -- -- -- -- -- ---------------- --------------------
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c4 03 38 e7 3b bf e1 00 11:17:06.020 READ MULTIPLE
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c8 03 38 67 3b bf e1 00 11:17:06.001 READ DMA
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ef 03 45 01 00 00 a0 02 11:17:06.000 SET FEATURES [Set transfer mode]
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ef 03 0c 01 00 00 a0 02 11:17:06.000 SET FEATURES [Set transfer mode]
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c6 00 10 01 00 00 a0 02 11:17:06.000 SET MULTIPLE MODE
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Error 163 occurred at disk power-on lifetime: 4960 hours (206 days + 16 hours)
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When the command that caused the error occurred, the device was active or idle.
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After command completion occurred, registers were:
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ER ST SC SN CL CH DH
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-- -- -- -- -- -- --
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40 51 05 ea 3b bf e1 Error: UNC 5 sectors at LBA = 0x01bf3bea = 29309930
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Commands leading to the command that caused the error were:
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CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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-- -- -- -- -- -- -- -- ---------------- --------------------
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c8 00 08 e7 3b bf e1 00 04:02:34.183 READ DMA
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ca 00 80 b7 86 a6 e1 00 04:02:34.182 WRITE DMA
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ca 00 08 27 dd 00 e0 00 04:02:34.182 WRITE DMA
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c8 00 08 c0 d4 95 e3 00 04:02:34.164 READ DMA
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c8 00 08 87 26 37 e3 00 04:02:34.156 READ DMA
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SMART Self-test log structure revision number 1
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No self-tests have been logged. [To run self-tests, use: smartctl -t]
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SMART Selective self-test log data structure revision number 1
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SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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1 0 0 Not_testing
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2 0 0 Not_testing
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3 0 0 Not_testing
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4 0 0 Not_testing
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5 0 0 Not_testing
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Selective self-test flags (0x0):
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After scanning selected spans, do NOT read-scan remainder of disk.
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If Selective self-test is pending on power-up, resume after 0 minute delay.
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