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Andrey Ponomarenko
2021-05-18 23:01:35 +03:00
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smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p12-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Caviar SE
Device Model: WDC WD2000JB-00FUA0
Serial Number: --
Firmware Version: 15.05R15
User Capacity: 200,049,647,616 bytes [200 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA/ATAPI-6 (minor revision not indicated)
Local Time is: Tue Jan 19 21:23:59 2021 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM level is: 254 (maximum performance), recommended: 128
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 6325) seconds.
Offline data collection
capabilities: (0x79) SMART execute Offline immediate.
No Auto Offline data collection support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
No General Purpose Logging support.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 81) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate PO-R-- 200 200 051 - 0
3 Spin_Up_Time POS--- 108 106 021 - 5125
4 Start_Stop_Count -O--CK 095 095 040 - 5241
5 Reallocated_Sector_Ct PO--CK 200 200 140 - 0
7 Seek_Error_Rate PO-R-- 200 200 051 - 0
9 Power_On_Hours -O--CK 067 067 000 - 24575
10 Spin_Retry_Count PO--C- 100 100 051 - 0
11 Calibration_Retry_Count PO--C- 100 100 051 - 0
12 Power_Cycle_Count -O--CK 096 096 000 - 4854
194 Temperature_Celsius -O---K 111 253 000 - 39
196 Reallocated_Event_Count -O--CK 200 200 000 - 0
197 Current_Pending_Sector -O--C- 200 200 000 - 0
198 Offline_Uncorrectable -O--C- 200 200 000 - 0
199 UDMA_CRC_Error_Count -O-R-- 200 253 000 - 0
200 Multi_Zone_Error_Rate P--R-- 200 155 051 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
Read SMART Log Directory failed: Input/output error
General Purpose Log Directory not supported
SMART Extended Comprehensive Error Log (GP Log 0x03) not supported
SMART Error Log Version: 1
No Errors Logged
SMART Extended Self-test Log (GP Log 0x07) not supported
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11) not supported

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smartctl 6.6 2017-11-05 r4594 [FreeBSD 11.4-RELEASE-p5 i386] (local build)
Copyright (C) 2002-17, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Caviar SE
Device Model: WDC WD2000JB-00GVC0
Serial Number: --
Firmware Version: 08.02D08
User Capacity: 200,049,647,616 bytes [200 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA/ATAPI-6 (minor revision not indicated)
Local Time is: Sun Dec 6 00:35:06 2020 +04
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Disabled
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Write SCT (Get) Feature Control Command failed: Read of ATA output registers not implemented [JMicron]
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 5778) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
No General Purpose Logging support.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 75) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x003f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate PO-R-- 200 200 051 - 0
3 Spin_Up_Time POS--- 115 101 021 - 6791
4 Start_Stop_Count -O--CK 092 092 040 - 8715
5 Reallocated_Sector_Ct PO--CK 200 200 140 - 0
7 Seek_Error_Rate PO-R-- 200 200 051 - 0
9 Power_On_Hours -O--CK 001 001 000 - 84955
10 Spin_Retry_Count PO--C- 100 100 051 - 0
11 Calibration_Retry_Count PO--C- 100 100 051 - 0
12 Power_Cycle_Count -O--CK 096 096 000 - 4140
194 Temperature_Celsius -O---K 117 090 000 - 33
196 Reallocated_Event_Count -O--CK 200 200 000 - 0
197 Current_Pending_Sector -O--C- 200 200 000 - 0
198 Offline_Uncorrectable -O--C- 200 200 000 - 0
199 UDMA_CRC_Error_Count -O-R-- 200 253 000 - 10
200 Multi_Zone_Error_Rate P--R-- 200 200 051 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory not supported
SMART Log Directory Version 0
Address Access R/W Size Description
0x00 SL R/O 1 Log Directory
SMART Extended Comprehensive Error Log (GP Log 0x03) not supported
SMART Error Log Version: 1
ATA Error Count: 14 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 14 occurred at disk power-on lifetime: 10847 hours (451 days + 23 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 20 07 73 54 e0 Error: UNC 32 sectors at LBA = 0x00547307 = 5534471
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 d5 20 ff 72 54 02 00 12:10:19.750 READ DMA EXT
25 d5 04 db 62 59 02 00 12:10:19.750 READ DMA EXT
25 d5 04 8b b2 8a 01 00 12:10:19.750 READ DMA EXT
25 d5 04 1f b4 8a 01 00 12:10:19.750 READ DMA EXT
25 d5 04 2b b2 8a 01 00 12:10:19.750 READ DMA EXT
Error 13 occurred at disk power-on lifetime: 10835 hours (451 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 20 07 73 54 e0 Error: UNC 32 sectors at LBA = 0x00547307 = 5534471
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 d5 20 ff 72 54 02 00 00:05:36.750 READ DMA EXT
25 d5 20 df 72 54 02 00 00:05:36.750 READ DMA EXT
25 d5 20 bf 72 54 02 00 00:05:36.750 READ DMA EXT
25 d5 20 9f 72 54 02 00 00:05:36.750 READ DMA EXT
25 d5 20 9f 9d 53 02 00 00:05:36.750 READ DMA EXT
Error 12 occurred at disk power-on lifetime: 2829 hours (117 days + 21 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 f0 7f 46 ab e0 Error: UNC 240 sectors at LBA = 0x00ab467f = 11224703
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 f0 00 46 ab 06 00 03:58:03.050 READ DMA EXT
25 00 f0 00 46 ab 06 00 03:58:03.050 READ DMA EXT
25 00 f0 00 46 ab 06 00 03:58:03.050 READ DMA EXT
25 00 f0 00 46 ab 06 00 03:58:03.050 READ DMA EXT
25 00 f0 00 46 ab 06 00 03:58:03.050 READ DMA EXT
Error 11 occurred at disk power-on lifetime: 2829 hours (117 days + 21 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 f0 7f 46 ab e0 Error: UNC 240 sectors at LBA = 0x00ab467f = 11224703
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 f0 00 46 ab 06 00 03:58:00.950 READ DMA EXT
25 00 f0 00 46 ab 06 00 03:58:00.950 READ DMA EXT
25 00 f0 00 46 ab 06 00 03:58:00.950 READ DMA EXT
25 00 f0 00 46 ab 06 00 03:58:00.950 READ DMA EXT
25 00 f0 00 46 ab 06 00 03:58:00.950 READ DMA EXT
Error 10 occurred at disk power-on lifetime: 2829 hours (117 days + 21 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 f0 7f 46 ab e0 Error: UNC 240 sectors at LBA = 0x00ab467f = 11224703
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 f0 00 46 ab 06 00 03:57:58.900 READ DMA EXT
25 00 f0 00 46 ab 06 00 03:57:58.900 READ DMA EXT
25 00 f0 00 46 ab 06 00 03:57:58.900 READ DMA EXT
25 00 f0 00 46 ab 06 00 03:57:58.900 READ DMA EXT
25 00 10 f0 46 ab 06 00 03:57:58.900 READ DMA EXT
SMART Extended Self-test Log (GP Log 0x07) not supported
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Conveyance offline Completed without error 00% 5688 -
# 2 Conveyance offline Completed without error 00% 2757 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 2
SCT Version (vendor specific): 258 (0x0102)
SCT Support Level: 1
Device State: SMART Off-line Data Collection executing in background (4)
Current Temperature: 33 Celsius
Power Cycle Max Temperature: 42 Celsius
Lifetime Max Temperature: 60 Celsius
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 5/55 Celsius
Min/Max Temperature Limit: 1/60 Celsius
Temperature History Size (Index): 128 (116)
Write SCT (Get) Error Recovery Control Command failed: Read of ATA output registers not implemented [JMicron]
SCT (Get) Error Recovery Control command failed
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11) not supported

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smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.2-STABLE amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Caviar SE Serial ATA
Device Model: WDC WD2000JS-55MHB0
Serial Number: --
Firmware Version: 02.01C03
User Capacity: 188,376,452,096 bytes [188 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA/ATAPI-7 (minor revision not indicated)
Local Time is: Sat Mar 6 14:57:01 2021 MSK
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM level is: 254 (maximum performance), recommended: 128
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Write SCT (Get) Feature Control Command failed: Input/output error
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
See vendor-specific Attribute list for marginal Attributes.
General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 6300) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 74) minutes.
Conveyance self-test routine
recommended polling time: ( 6) minutes.
SCT capabilities: (0x103f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate POSR-- 200 200 051 - 0
3 Spin_Up_Time PO---- 253 195 021 - 2108
4 Start_Stop_Count -O--CK 098 098 000 - 2501
5 Reallocated_Sector_Ct PO--CK 200 200 140 - 0
7 Seek_Error_Rate POSR-- 200 200 051 - 0
9 Power_On_Hours -O--CK 086 086 000 - 10549
10 Spin_Retry_Count PO--C- 100 100 051 - 0
11 Calibration_Retry_Count -O--C- 100 100 051 - 0
12 Power_Cycle_Count -O--CK 098 098 000 - 2494
190 Airflow_Temperature_Cel -O---K 024 022 045 NOW 76
194 Temperature_Celsius -O---K 074 072 000 - 76
196 Reallocated_Event_Count -O--CK 200 200 000 - 0
197 Current_Pending_Sector -O--C- 200 200 000 - 0
198 Offline_Uncorrectable ----C- 200 200 000 - 0
199 UDMA_CRC_Error_Count -OSRCK 200 200 000 - 2
200 Multi_Zone_Error_Rate P--R-- 200 200 051 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 6 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa0-0xa7 GPL,SL VS 16 Device vendor specific log
0xa8-0xb7 GPL,SL VS 1 Device vendor specific log
0xc0 SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (6 sectors)
Device Error Count: 1
CR = Command Register
FEATR = Features Register
COUNT = Count (was: Sector Count) Register
LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8
LH = LBA High (was: Cylinder High) Register ] LBA
LM = LBA Mid (was: Cylinder Low) Register ] Register
LL = LBA Low (was: Sector Number) Register ]
DV = Device (was: Device/Head) Register
DC = Device Control Register
ER = Error register
ST = Status register
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1 [0] occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
When the command that caused the error occurred, the device was in an unknown state.
After command completion occurred, registers were:
ER -- ST COUNT LBA_48 LH LM LL DV DC
-- -- -- == -- == == == -- -- -- -- --
04 -- 00 00 0d 00 53 00 00 40 01 00 00
Commands leading to the command that caused the error were:
CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name
-- == -- == -- == == == -- -- -- -- -- --------------- --------------------
00 1c b0 0c b6 00 00 00 00 00 00 00 00 00:00:00.000 NOP [Reserved subcommand] [OBS-ACS-2]
00 01 d5 00 e0 0c 1c 00 b6 b0 00 00 00 00:00:57.345 NOP [Reserved subcommand] [OBS-ACS-2]
00 de c8 0c b4 00 01 00 00 00 00 00 07 00:13:53.047 NOP [Reserved subcommand] [OBS-ACS-2]
00 00 00 00 f0 0c d4 07 b4 c8 00 00 00 00:01:01.440 NOP [Abort queued commands]
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 2
SCT Version (vendor specific): 258 (0x0102)
Device State: SMART Off-line Data Collection executing in background (4)
Current Temperature: 76 Celsius
Power Cycle Min/Max Temperature: --/76 Celsius
Lifetime Min/Max Temperature: --/78 Celsius
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 5/65 Celsius
Min/Max Temperature Limit: 1/60 Celsius
Temperature History Size (Index): 128 (26)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x000a 2 6 Device-to-host register FISes sent due to a COMRESET
0x8000 4 833 Vendor specific