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Update of reports (new: 3084, modified: 0)
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Andrey Ponomarenko
239
HDD/WDC/WD2000/WD2000JB-00GVC0/487A14FC8741
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HDD/WDC/WD2000/WD2000JB-00GVC0/487A14FC8741
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smartctl 6.6 2017-11-05 r4594 [FreeBSD 11.4-RELEASE-p5 i386] (local build)
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Copyright (C) 2002-17, Bruce Allen, Christian Franke, www.smartmontools.org
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=== START OF INFORMATION SECTION ===
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Model Family: Western Digital Caviar SE
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Device Model: WDC WD2000JB-00GVC0
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Serial Number: --
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Firmware Version: 08.02D08
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User Capacity: 200,049,647,616 bytes [200 GB]
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Sector Size: 512 bytes logical/physical
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Device is: In smartctl database [for details use: -P show]
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ATA Version is: ATA/ATAPI-6 (minor revision not indicated)
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Local Time is: Sun Dec 6 00:35:06 2020 +04
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SMART support is: Available - device has SMART capability.
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SMART support is: Enabled
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AAM feature is: Disabled
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APM feature is: Unavailable
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Rd look-ahead is: Enabled
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Write cache is: Enabled
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DSN feature is: Unavailable
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ATA Security is: Disabled, NOT FROZEN [SEC1]
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Write SCT (Get) Feature Control Command failed: Read of ATA output registers not implemented [JMicron]
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Wt Cache Reorder: Unknown (SCT Feature Control command failed)
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=== START OF READ SMART DATA SECTION ===
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SMART overall-health self-assessment test result: PASSED
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General SMART Values:
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Offline data collection status: (0x84) Offline data collection activity
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was suspended by an interrupting command from host.
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Auto Offline Data Collection: Enabled.
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Self-test execution status: ( 0) The previous self-test routine completed
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without error or no self-test has ever
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been run.
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Total time to complete Offline
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data collection: ( 5778) seconds.
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Offline data collection
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capabilities: (0x7b) SMART execute Offline immediate.
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Auto Offline data collection on/off support.
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Suspend Offline collection upon new
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command.
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Offline surface scan supported.
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Self-test supported.
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Conveyance Self-test supported.
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Selective Self-test supported.
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SMART capabilities: (0x0003) Saves SMART data before entering
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power-saving mode.
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Supports SMART auto save timer.
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Error logging capability: (0x01) Error logging supported.
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No General Purpose Logging support.
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Short self-test routine
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recommended polling time: ( 2) minutes.
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Extended self-test routine
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recommended polling time: ( 75) minutes.
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Conveyance self-test routine
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recommended polling time: ( 5) minutes.
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SCT capabilities: (0x003f) SCT Status supported.
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SCT Error Recovery Control supported.
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SCT Feature Control supported.
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SCT Data Table supported.
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SMART Attributes Data Structure revision number: 16
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Vendor Specific SMART Attributes with Thresholds:
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ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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1 Raw_Read_Error_Rate PO-R-- 200 200 051 - 0
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3 Spin_Up_Time POS--- 115 101 021 - 6791
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4 Start_Stop_Count -O--CK 092 092 040 - 8715
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5 Reallocated_Sector_Ct PO--CK 200 200 140 - 0
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7 Seek_Error_Rate PO-R-- 200 200 051 - 0
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9 Power_On_Hours -O--CK 001 001 000 - 84955
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10 Spin_Retry_Count PO--C- 100 100 051 - 0
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11 Calibration_Retry_Count PO--C- 100 100 051 - 0
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12 Power_Cycle_Count -O--CK 096 096 000 - 4140
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194 Temperature_Celsius -O---K 117 090 000 - 33
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196 Reallocated_Event_Count -O--CK 200 200 000 - 0
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197 Current_Pending_Sector -O--C- 200 200 000 - 0
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198 Offline_Uncorrectable -O--C- 200 200 000 - 0
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199 UDMA_CRC_Error_Count -O-R-- 200 253 000 - 10
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200 Multi_Zone_Error_Rate P--R-- 200 200 051 - 0
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||||||_ K auto-keep
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|||||__ C event count
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||||___ R error rate
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|||____ S speed/performance
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||_____ O updated online
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|______ P prefailure warning
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General Purpose Log Directory not supported
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SMART Log Directory Version 0
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Address Access R/W Size Description
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0x00 SL R/O 1 Log Directory
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SMART Extended Comprehensive Error Log (GP Log 0x03) not supported
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SMART Error Log Version: 1
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ATA Error Count: 14 (device log contains only the most recent five errors)
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CR = Command Register [HEX]
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FR = Features Register [HEX]
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SC = Sector Count Register [HEX]
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SN = Sector Number Register [HEX]
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CL = Cylinder Low Register [HEX]
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CH = Cylinder High Register [HEX]
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DH = Device/Head Register [HEX]
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DC = Device Command Register [HEX]
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ER = Error register [HEX]
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ST = Status register [HEX]
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Powered_Up_Time is measured from power on, and printed as
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DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
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SS=sec, and sss=millisec. It "wraps" after 49.710 days.
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Error 14 occurred at disk power-on lifetime: 10847 hours (451 days + 23 hours)
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When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
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After command completion occurred, registers were:
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ER ST SC SN CL CH DH
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-- -- -- -- -- -- --
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40 51 20 07 73 54 e0 Error: UNC 32 sectors at LBA = 0x00547307 = 5534471
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Commands leading to the command that caused the error were:
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CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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-- -- -- -- -- -- -- -- ---------------- --------------------
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25 d5 20 ff 72 54 02 00 12:10:19.750 READ DMA EXT
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25 d5 04 db 62 59 02 00 12:10:19.750 READ DMA EXT
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25 d5 04 8b b2 8a 01 00 12:10:19.750 READ DMA EXT
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25 d5 04 1f b4 8a 01 00 12:10:19.750 READ DMA EXT
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25 d5 04 2b b2 8a 01 00 12:10:19.750 READ DMA EXT
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Error 13 occurred at disk power-on lifetime: 10835 hours (451 days + 11 hours)
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When the command that caused the error occurred, the device was active or idle.
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After command completion occurred, registers were:
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ER ST SC SN CL CH DH
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-- -- -- -- -- -- --
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40 51 20 07 73 54 e0 Error: UNC 32 sectors at LBA = 0x00547307 = 5534471
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Commands leading to the command that caused the error were:
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CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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-- -- -- -- -- -- -- -- ---------------- --------------------
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25 d5 20 ff 72 54 02 00 00:05:36.750 READ DMA EXT
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25 d5 20 df 72 54 02 00 00:05:36.750 READ DMA EXT
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25 d5 20 bf 72 54 02 00 00:05:36.750 READ DMA EXT
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25 d5 20 9f 72 54 02 00 00:05:36.750 READ DMA EXT
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25 d5 20 9f 9d 53 02 00 00:05:36.750 READ DMA EXT
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Error 12 occurred at disk power-on lifetime: 2829 hours (117 days + 21 hours)
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When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
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After command completion occurred, registers were:
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ER ST SC SN CL CH DH
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-- -- -- -- -- -- --
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40 51 f0 7f 46 ab e0 Error: UNC 240 sectors at LBA = 0x00ab467f = 11224703
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Commands leading to the command that caused the error were:
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CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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-- -- -- -- -- -- -- -- ---------------- --------------------
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25 00 f0 00 46 ab 06 00 03:58:03.050 READ DMA EXT
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25 00 f0 00 46 ab 06 00 03:58:03.050 READ DMA EXT
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25 00 f0 00 46 ab 06 00 03:58:03.050 READ DMA EXT
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25 00 f0 00 46 ab 06 00 03:58:03.050 READ DMA EXT
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25 00 f0 00 46 ab 06 00 03:58:03.050 READ DMA EXT
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Error 11 occurred at disk power-on lifetime: 2829 hours (117 days + 21 hours)
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When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
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After command completion occurred, registers were:
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ER ST SC SN CL CH DH
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-- -- -- -- -- -- --
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40 51 f0 7f 46 ab e0 Error: UNC 240 sectors at LBA = 0x00ab467f = 11224703
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Commands leading to the command that caused the error were:
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CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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-- -- -- -- -- -- -- -- ---------------- --------------------
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25 00 f0 00 46 ab 06 00 03:58:00.950 READ DMA EXT
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25 00 f0 00 46 ab 06 00 03:58:00.950 READ DMA EXT
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25 00 f0 00 46 ab 06 00 03:58:00.950 READ DMA EXT
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25 00 f0 00 46 ab 06 00 03:58:00.950 READ DMA EXT
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25 00 f0 00 46 ab 06 00 03:58:00.950 READ DMA EXT
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Error 10 occurred at disk power-on lifetime: 2829 hours (117 days + 21 hours)
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When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
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After command completion occurred, registers were:
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ER ST SC SN CL CH DH
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-- -- -- -- -- -- --
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40 51 f0 7f 46 ab e0 Error: UNC 240 sectors at LBA = 0x00ab467f = 11224703
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Commands leading to the command that caused the error were:
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CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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-- -- -- -- -- -- -- -- ---------------- --------------------
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25 00 f0 00 46 ab 06 00 03:57:58.900 READ DMA EXT
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25 00 f0 00 46 ab 06 00 03:57:58.900 READ DMA EXT
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25 00 f0 00 46 ab 06 00 03:57:58.900 READ DMA EXT
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25 00 f0 00 46 ab 06 00 03:57:58.900 READ DMA EXT
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25 00 10 f0 46 ab 06 00 03:57:58.900 READ DMA EXT
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SMART Extended Self-test Log (GP Log 0x07) not supported
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SMART Self-test log structure revision number 1
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Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
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# 1 Conveyance offline Completed without error 00% 5688 -
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# 2 Conveyance offline Completed without error 00% 2757 -
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SMART Selective self-test log data structure revision number 1
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SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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1 0 0 Not_testing
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2 0 0 Not_testing
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3 0 0 Not_testing
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4 0 0 Not_testing
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5 0 0 Not_testing
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Selective self-test flags (0x0):
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After scanning selected spans, do NOT read-scan remainder of disk.
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If Selective self-test is pending on power-up, resume after 0 minute delay.
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SCT Status Version: 2
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SCT Version (vendor specific): 258 (0x0102)
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SCT Support Level: 1
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Device State: SMART Off-line Data Collection executing in background (4)
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Current Temperature: 33 Celsius
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Power Cycle Max Temperature: 42 Celsius
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Lifetime Max Temperature: 60 Celsius
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SCT Temperature History Version: 2
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Temperature Sampling Period: 1 minute
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Temperature Logging Interval: 1 minute
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Min/Max recommended Temperature: 5/55 Celsius
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Min/Max Temperature Limit: 1/60 Celsius
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Temperature History Size (Index): 128 (116)
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Write SCT (Get) Error Recovery Control Command failed: Read of ATA output registers not implemented [JMicron]
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SCT (Get) Error Recovery Control command failed
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Device Statistics (GP/SMART Log 0x04) not supported
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Pending Defects log (GP Log 0x0c) not supported
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SATA Phy Event Counters (GP Log 0x11) not supported
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