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Update of reports (new: 3084, modified: 0)
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Andrey Ponomarenko
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SSD/MidasForce/README.md
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SSD/MidasForce/README.md
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MidasForce Solid State Drives
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=============================
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This is a list of all tested MidasForce solid state drive models and their MTBFs. See
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more info on reliability test in the [README](https://github.com/bsdhw/SMART).
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SSD by Model
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------------
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Please take all columns into account when reading the table. Pay attention on the
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number of tested samples and power-on days. Simultaneous high values of both MTBF
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and errors are possible if only rare drives in the subset encounter errors.
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Days — avg. days per sample,
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Err — avg. errors per sample,
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MTBF — avg. MTBF in years per sample.
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| MFG | Model | Size | Samples | Days | Err | MTBF |
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|-----------|--------------------|--------|---------|-------|-------|--------|
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| MidasF... | SSD | 256 GB | 1 | 32 | 0 | 0.09 |
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155
SSD/MidasForce/SSD/SSD 256GB/7B3BA66544B0
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SSD/MidasForce/SSD/SSD 256GB/7B3BA66544B0
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smartctl 7.1 2019-12-30 r5022 [x86_64-unknown-openbsd6.8] (local build)
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Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
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=== START OF INFORMATION SECTION ===
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Device Model: MidasForce SSD 256GB
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Serial Number: --
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Firmware Version: S1114A0
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User Capacity: 256,060,514,304 bytes [256 GB]
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Sector Size: 512 bytes logical/physical
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Rotation Rate: Solid State Device
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Form Factor: M.2
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Device is: Not in smartctl database [for details use: -P showall]
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ATA Version is: ACS-2 T13/2015-D revision 3
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SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
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Local Time is: Thu Mar 11 05:48:05 2021 WIB
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SMART support is: Available - device has SMART capability.
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SMART support is: Enabled
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=== START OF READ SMART DATA SECTION ===
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SMART Status not supported: Incomplete response, ATA output registers missing
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SMART overall-health self-assessment test result: PASSED
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Warning: This result is based on an Attribute check.
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General SMART Values:
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Offline data collection status: (0x00) Offline data collection activity
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was never started.
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Auto Offline Data Collection: Disabled.
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Self-test execution status: ( 0) The previous self-test routine completed
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without error or no self-test has ever
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been run.
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Total time to complete Offline
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data collection: ( 120) seconds.
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Offline data collection
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capabilities: (0x11) SMART execute Offline immediate.
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No Auto Offline data collection support.
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Suspend Offline collection upon new
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command.
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No Offline surface scan supported.
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Self-test supported.
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No Conveyance Self-test supported.
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No Selective Self-test supported.
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SMART capabilities: (0x0002) Does not save SMART data before
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entering power-saving mode.
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Supports SMART auto save timer.
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Error logging capability: (0x01) Error logging supported.
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General Purpose Logging supported.
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Short self-test routine
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recommended polling time: ( 2) minutes.
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Extended self-test routine
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recommended polling time: ( 10) minutes.
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SMART Attributes Data Structure revision number: 1
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Vendor Specific SMART Attributes with Thresholds:
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ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
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1 Raw_Read_Error_Rate 0x0032 100 100 050 Old_age Always - 0
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5 Reallocated_Sector_Ct 0x0032 100 100 050 Old_age Always - 0
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9 Power_On_Hours 0x0032 100 100 050 Old_age Always - 783
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12 Power_Cycle_Count 0x0032 100 100 050 Old_age Always - 591
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160 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 0
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161 Unknown_Attribute 0x0033 100 100 050 Pre-fail Always - 100
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163 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 38
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164 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 20456
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165 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 12
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166 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 5
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167 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 10
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168 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 7000
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169 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 100
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175 Program_Fail_Count_Chip 0x0032 100 100 050 Old_age Always - 0
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176 Erase_Fail_Count_Chip 0x0032 100 100 050 Old_age Always - 0
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177 Wear_Leveling_Count 0x0032 100 100 050 Old_age Always - 0
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178 Used_Rsvd_Blk_Cnt_Chip 0x0032 100 100 050 Old_age Always - 0
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181 Program_Fail_Cnt_Total 0x0032 100 100 050 Old_age Always - 0
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182 Erase_Fail_Count_Total 0x0032 100 100 050 Old_age Always - 0
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192 Power-Off_Retract_Count 0x0032 100 100 050 Old_age Always - 90
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194 Temperature_Celsius 0x0022 100 100 050 Old_age Always - 30
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195 Hardware_ECC_Recovered 0x0032 100 100 050 Old_age Always - 0
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196 Reallocated_Event_Count 0x0032 100 100 050 Old_age Always - 0
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197 Current_Pending_Sector 0x0032 100 100 050 Old_age Always - 0
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198 Offline_Uncorrectable 0x0032 100 100 050 Old_age Always - 0
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199 UDMA_CRC_Error_Count 0x0032 100 100 050 Old_age Always - 0
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232 Available_Reservd_Space 0x0032 100 100 050 Old_age Always - 100
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241 Total_LBAs_Written 0x0030 100 100 050 Old_age Offline - 37097
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242 Total_LBAs_Read 0x0030 100 100 050 Old_age Offline - 27639
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245 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 3660
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SMART Error Log Version: 1
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Warning: ATA error count 0 inconsistent with error log pointer 3
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ATA Error Count: 0
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CR = Command Register [HEX]
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FR = Features Register [HEX]
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SC = Sector Count Register [HEX]
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SN = Sector Number Register [HEX]
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CL = Cylinder Low Register [HEX]
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CH = Cylinder High Register [HEX]
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DH = Device/Head Register [HEX]
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DC = Device Command Register [HEX]
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ER = Error register [HEX]
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ST = Status register [HEX]
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Powered_Up_Time is measured from power on, and printed as
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DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
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SS=sec, and sss=millisec. It "wraps" after 49.710 days.
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Error -1 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
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When the command that caused the error occurred, the device was active or idle.
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After command completion occurred, registers were:
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ER ST SC SN CL CH DH
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-- -- -- -- -- -- --
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00 00 00 00 00 00 00
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Commands leading to the command that caused the error were:
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CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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-- -- -- -- -- -- -- -- ---------------- --------------------
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ea 00 00 00 00 00 a0 08 00:00:00.000 FLUSH CACHE EXT
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b0 da 00 00 4f c2 00 08 00:00:00.000 SMART RETURN STATUS
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b0 d0 01 00 4f c2 00 08 00:00:00.000 SMART READ DATA
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b0 d5 01 06 4f c2 00 08 00:00:00.000 SMART READ LOG
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b0 d5 01 01 4f c2 00 08 00:00:00.000 SMART READ LOG
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Error -4 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
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When the command that caused the error occurred, the device was active or idle.
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After command completion occurred, registers were:
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ER ST SC SN CL CH DH
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-- -- -- -- -- -- --
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00 00 00 00 00 00 00
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Commands leading to the command that caused the error were:
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CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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-- -- -- -- -- -- -- -- ---------------- --------------------
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b0 d0 01 00 4f c2 00 00 00:00:00.000 SMART READ DATA
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b0 d1 01 01 4f c2 00 00 00:00:00.000 SMART READ ATTRIBUTE THRESHOLDS [OBS-4]
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b0 da 00 00 4f c2 00 00 00:00:00.000 SMART RETURN STATUS
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b0 d5 01 00 4f c2 00 00 00:00:00.000 SMART READ LOG
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b0 d5 01 01 4f c2 00 00 00:00:00.000 SMART READ LOG
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SMART Self-test log structure revision number 1
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Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
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# 1 Short offline Completed without error 00% 144 -
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# 2 Short offline Completed without error 00% 138 -
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# 3 Short offline Completed without error 00% 135 -
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# 4 Short offline Completed without error 00% 131 -
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# 5 Extended offline Completed without error 00% 124 -
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# 6 Short offline Completed without error 00% 118 -
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# 7 Short offline Completed without error 00% 111 -
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# 8 Short offline Completed without error 00% 109 -
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# 9 Short offline Completed without error 00% 100 -
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#10 Short offline Completed without error 00% 88 -
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#11 Short offline Completed without error 00% 84 -
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#12 Short offline Interrupted (host reset) 90% 81 -
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#13 Short offline Completed without error 00% 78 -
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Selective Self-tests/Logging not supported
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