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mirror of https://github.com/bsdhw/SMART.git synced 2025-05-31 16:21:41 +05:30

Update of reports (new: 3084, modified: 0)

This commit is contained in:
Andrey Ponomarenko
2021-05-18 23:01:35 +03:00
parent 8bb6808886
commit d96e63400c
3224 changed files with 547026 additions and 1866 deletions

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smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p14-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG MMCRE28G5MXP-0VB
Serial Number: --
LU WWN Device Id: 5 0000f0 ...
Firmware Version: VBM1901Q
User Capacity: 128,035,676,160 bytes [128 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ATA/ATAPI-7 T13/1532D revision 1
Local Time is: Mon Mar 15 04:46:40 2021 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Disabled
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 240) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 4) minutes.
Extended self-test routine
recommended polling time: ( 24) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
9 Power_On_Hours -O--CK 090 090 000 - 47953
12 Power_Cycle_Count -O--CK 098 098 000 - 1437
175 Program_Fail_Count_Chip -O--CK 090 090 010 - 6
176 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
177 Wear_Leveling_Count PO--C- 085 085 017 - 881
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 055 055 010 - 27
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 097 097 010 - 98
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 097 097 010 - 3742
181 Program_Fail_Cnt_Total -O--CK 099 099 010 - 6
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 099 099 010 - 6
187 Reported_Uncorrect -O--CK 100 100 000 - 0
195 Hardware_ECC_Recovered -O-RC- 200 200 000 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 UDMA_CRC_Error_Count -OSRCK 253 253 000 - 0
232 Available_Reservd_Space PO--C- 055 055 010 - 33
233 Media_Wearout_Indicator -O--CK 099 099 000 - 7894420
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 0
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 GPL,SL R/O 1 Summary SMART error log
0x02 GPL,SL R/O 1 Comprehensive SMART error log
0x03 GPL,SL R/O 1 Ext. Comprehensive SMART error log
0x06 GPL,SL R/O 1 SMART self-test log
0x07 GPL,SL R/O 1 Extended self-test log
0x09 GPL,SL R/W 1 Selective self-test log
0x10 GPL,SL R/O 1 NCQ Command Error log
0x11 GPL,SL R/O 1 SATA Phy Event Counters log
0x80-0x9f GPL,SL R/W 1 Host vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 2 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 2 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

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smartctl 7.1 2019-12-30 r5022 [i386-unknown-openbsd6.8] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG MMCRE28GFMXP-MVB
Serial Number: --
LU WWN Device Id: 5 0000f0 ...
Firmware Version: VBM1AS1Q
User Capacity: 128,035,676,160 bytes [128 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ATA/ATAPI-7 T13/1532D revision 1
Local Time is: Fri Feb 12 17:11:14 2021 MSK
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 240) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 4) minutes.
Extended self-test routine
recommended polling time: ( 24) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
9 Power_On_Hours 0x0032 099 099 000 Old_age Always - 49
12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 113
178 Used_Rsvd_Blk_Cnt_Chip 0x0013 085 085 010 Pre-fail Always - 9
179 Used_Rsvd_Blk_Cnt_Tot 0x0013 099 099 010 Pre-fail Always - 24
180 Unused_Rsvd_Blk_Cnt_Tot 0x0013 099 099 010 Pre-fail Always - 3816
183 Runtime_Bad_Block 0x0013 100 100 010 Pre-fail Always - 0
SMART Error Log Version: 1
ATA Error Count: 1
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1 occurred at disk power-on lifetime: 38 hours (1 days + 14 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 01 b0 c2 e7 ee Error: IDNF 1 sectors at LBA = 0x0ee7c2b0 = 250069680
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 01 b0 c2 e7 ee 00 00:11:09.000 READ DMA
ca 00 08 c0 ec 78 e0 00 00:11:08.000 WRITE DMA
ca 00 08 00 25 3b e0 00 00:11:08.000 WRITE DMA
ca 00 08 98 d9 3a e0 00 00:11:06.000 WRITE DMA
ca 00 10 50 0d 63 e0 00 00:11:06.000 WRITE DMA
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

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smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.2-STABLE amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: MZ-5EA2000-0D3
Serial Number: --
LU WWN Device Id: 5 002538 ...
Add. Product Id: DELL(tm)
Firmware Version: AXM17D3Q
User Capacity: 200,049,647,616 bytes [200 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic, zeroed
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ATA8-ACS T13/1699-D revision 6
SATA Version is: SATA 2.6, 3.0 Gb/s
Local Time is: Fri Jan 22 15:11:37 2021 AST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 763) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 6) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate -O-R-K 088 088 000 - 332133751
5 Reallocated_Sector_Ct PO--CK 100 100 001 - 0
9 Power_On_Hours -O--CK 035 035 000 - 28494
12 Power_Cycle_Count -O--CK 099 099 000 - 35
13 Read_Soft_Error_Rate -O-R-K 100 100 000 - 0
175 Program_Fail_Count_Chip -O--CK 100 100 000 - 0
176 Erase_Fail_Count_Chip -O--CK 100 100 000 - 0
177 Wear_Leveling_Count -O--CK 099 099 000 - 54
178 Used_Rsvd_Blk_Cnt_Chip PO--CK 080 080 001 - 32
179 Used_Rsvd_Blk_Cnt_Tot PO--CK 092 092 001 - 847
180 Unused_Rsvd_Blk_Cnt_Tot -O--CK 092 092 000 - 9782
181 Program_Fail_Cnt_Total -O--CK 100 100 000 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 000 - 0
183 Runtime_Bad_Block PO--CK 100 100 001 - 0
194 Temperature_Celsius -O---K 076 069 000 - 24 (Min/Max 22/26)
195 Hardware_ECC_Recovered -O--CK 100 100 000 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0
202 Unknown_SSD_Attribute PO--CK 100 099 090 - 0
232 Available_Reservd_Space -O--CK 080 080 000 - 134
233 Media_Wearout_Indicator -O--CK 001 001 000 - 12416950028
240 Unknown_SSD_Attribute -O--CK 100 100 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 2 Comprehensive SMART error log
0x03 GPL R/O 2 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 1 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 2 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x80-0x98 GPL,SL R/W 16 Host vendor specific log
0x99-0x9a GPL R/W 16 Host vendor specific log
0x9b-0x9f GPL,SL R/W 16 Host vendor specific log
0xd9 GPL VS 127 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (2 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (2 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 24 Celsius
Power Cycle Min/Max Temperature: 22/26 Celsius
Lifetime Min/Max Temperature: 13/45 Celsius
Under/Over Temperature Limit Count: 18/32
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/55 Celsius
Min/Max Temperature Limit: -10/70 Celsius
Temperature History Size (Index): 128 (88)
SCT Error Recovery Control:
Read: 80 (8.0 seconds)
Write: 80 (8.0 seconds)
Device Statistics page 0x00 is invalid (page=0x00, nentries=0)
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 0 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 1 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

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smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.2-STABLE amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: MZ-5EA2000-0D3
Serial Number: --
LU WWN Device Id: 5 002538 ...
Add. Product Id: DELL(tm)
Firmware Version: AXM17D3Q
User Capacity: 200,049,647,616 bytes [200 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic, zeroed
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ATA8-ACS T13/1699-D revision 6
SATA Version is: SATA 2.6, 3.0 Gb/s
Local Time is: Wed Feb 3 19:37:04 2021 AST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 763) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 6) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate -O-R-K 091 091 000 - 242058974
5 Reallocated_Sector_Ct PO--CK 100 100 001 - 0
9 Power_On_Hours -O--CK 004 004 000 - 42274
12 Power_Cycle_Count -O--CK 099 099 000 - 83
13 Read_Soft_Error_Rate -O-R-K 100 100 000 - 0
175 Program_Fail_Count_Chip -O--CK 100 100 000 - 0
176 Erase_Fail_Count_Chip -O--CK 100 100 000 - 0
177 Wear_Leveling_Count -O--CK 099 099 000 - 53
178 Used_Rsvd_Blk_Cnt_Chip PO--CK 074 074 001 - 43
179 Used_Rsvd_Blk_Cnt_Tot PO--CK 091 091 001 - 880
180 Unused_Rsvd_Blk_Cnt_Tot -O--CK 091 091 000 - 9749
181 Program_Fail_Cnt_Total -O--CK 100 100 000 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 000 - 0
183 Runtime_Bad_Block PO--CK 100 100 001 - 0
194 Temperature_Celsius -O---K 077 067 000 - 23 (Min/Max 20/23)
195 Hardware_ECC_Recovered -O--CK 100 100 000 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0
202 Unknown_SSD_Attribute PO--CK 100 099 090 - 0
232 Available_Reservd_Space -O--CK 074 074 000 - 123
233 Media_Wearout_Indicator -O--CK 001 001 000 - 10895935655
240 Unknown_SSD_Attribute -O--CK 100 100 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 2 Comprehensive SMART error log
0x03 GPL R/O 2 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 1 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 2 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x80-0x98 GPL,SL R/W 16 Host vendor specific log
0x99-0x9a GPL R/W 16 Host vendor specific log
0x9b-0x9f GPL,SL R/W 16 Host vendor specific log
0xd9 GPL VS 127 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (2 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (2 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 4125 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 23 Celsius
Power Cycle Min/Max Temperature: 20/23 Celsius
Lifetime Min/Max Temperature: 9/36 Celsius
Under/Over Temperature Limit Count: 15/31
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/55 Celsius
Min/Max Temperature Limit: -10/70 Celsius
Temperature History Size (Index): 128 (100)
SCT Error Recovery Control:
Read: 80 (8.0 seconds)
Write: 80 (8.0 seconds)
Device Statistics page 0x00 is invalid (page=0x00, nentries=0)
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 12 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 13 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

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smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.2-STABLE amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: MZ-5EA2000-0D3
Serial Number: --
LU WWN Device Id: 5 002538 ...
Add. Product Id: DELL(tm)
Firmware Version: AXM17D3Q
User Capacity: 200,049,647,616 bytes [200 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic, zeroed
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ATA8-ACS T13/1699-D revision 6
SATA Version is: SATA 2.6, 3.0 Gb/s
Local Time is: Fri Jan 22 15:11:36 2021 AST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 763) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 6) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate -O-R-K 090 090 000 - 268232886
5 Reallocated_Sector_Ct PO--CK 100 100 001 - 0
9 Power_On_Hours -O--CK 035 035 000 - 28494
12 Power_Cycle_Count -O--CK 099 099 000 - 38
13 Read_Soft_Error_Rate -O-R-K 100 100 000 - 0
175 Program_Fail_Count_Chip -O--CK 100 100 000 - 0
176 Erase_Fail_Count_Chip -O--CK 100 100 000 - 0
177 Wear_Leveling_Count -O--CK 099 099 000 - 54
178 Used_Rsvd_Blk_Cnt_Chip PO--CK 070 070 001 - 50
179 Used_Rsvd_Blk_Cnt_Tot PO--CK 091 091 001 - 933
180 Unused_Rsvd_Blk_Cnt_Tot -O--CK 091 091 000 - 9696
181 Program_Fail_Cnt_Total -O--CK 100 100 000 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 000 - 0
183 Runtime_Bad_Block PO--CK 100 100 001 - 0
194 Temperature_Celsius -O---K 075 067 000 - 25 (Min/Max 23/26)
195 Hardware_ECC_Recovered -O--CK 100 100 000 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0
202 Unknown_SSD_Attribute PO--CK 100 099 090 - 0
232 Available_Reservd_Space -O--CK 070 070 000 - 116
233 Media_Wearout_Indicator -O--CK 001 001 000 - 12349187385
240 Unknown_SSD_Attribute -O--CK 100 100 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 2 Comprehensive SMART error log
0x03 GPL R/O 2 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 1 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 2 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x80-0x98 GPL,SL R/W 16 Host vendor specific log
0x99-0x9a GPL R/W 16 Host vendor specific log
0x9b-0x9f GPL,SL R/W 16 Host vendor specific log
0xd9 GPL VS 127 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (2 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (2 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 25 Celsius
Power Cycle Min/Max Temperature: 23/26 Celsius
Lifetime Min/Max Temperature: 14/39 Celsius
Under/Over Temperature Limit Count: 0/27
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/55 Celsius
Min/Max Temperature Limit: -10/70 Celsius
Temperature History Size (Index): 128 (89)
SCT Error Recovery Control:
Read: 80 (8.0 seconds)
Write: 80 (8.0 seconds)
Device Statistics page 0x00 is invalid (page=0x00, nentries=0)
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 0 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 1 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

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@@ -0,0 +1,177 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.2-STABLE amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: MZ-5EA2000-0D3
Serial Number: --
LU WWN Device Id: 5 002538 ...
Add. Product Id: DELL(tm)
Firmware Version: AXM17D3Q
User Capacity: 200,049,647,616 bytes [200 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic, zeroed
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ATA8-ACS T13/1699-D revision 6
SATA Version is: SATA 2.6, 3.0 Gb/s
Local Time is: Wed Feb 3 19:37:04 2021 AST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 763) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 6) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate -O-R-K 092 092 000 - 209566852
5 Reallocated_Sector_Ct PO--CK 100 100 001 - 0
9 Power_On_Hours -O--CK 004 004 000 - 42383
12 Power_Cycle_Count -O--CK 099 099 000 - 66
13 Read_Soft_Error_Rate -O-R-K 100 100 000 - 0
175 Program_Fail_Count_Chip -O--CK 100 100 000 - 0
176 Erase_Fail_Count_Chip -O--CK 100 100 000 - 0
177 Wear_Leveling_Count -O--CK 099 099 000 - 52
178 Used_Rsvd_Blk_Cnt_Chip PO--CK 067 067 001 - 54
179 Used_Rsvd_Blk_Cnt_Tot PO--CK 090 090 001 - 1014
180 Unused_Rsvd_Blk_Cnt_Tot -O--CK 090 090 000 - 9615
181 Program_Fail_Cnt_Total -O--CK 100 100 000 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 000 - 0
183 Runtime_Bad_Block PO--CK 100 100 001 - 0
194 Temperature_Celsius -O---K 079 066 000 - 21 (Min/Max 19/22)
195 Hardware_ECC_Recovered -O--CK 100 100 000 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0
202 Unknown_SSD_Attribute PO--CK 100 099 090 - 0
232 Available_Reservd_Space -O--CK 067 067 000 - 112
233 Media_Wearout_Indicator -O--CK 001 001 000 - 10895594652
240 Unknown_SSD_Attribute -O--CK 100 100 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 2 Comprehensive SMART error log
0x03 GPL R/O 2 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 1 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 2 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x80-0x98 GPL,SL R/W 16 Host vendor specific log
0x99-0x9a GPL R/W 16 Host vendor specific log
0x9b-0x9f GPL,SL R/W 16 Host vendor specific log
0xd9 GPL VS 127 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (2 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (2 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 4223 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 21 Celsius
Power Cycle Min/Max Temperature: 19/22 Celsius
Lifetime Min/Max Temperature: 8/36 Celsius
Under/Over Temperature Limit Count: 0/31
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/55 Celsius
Min/Max Temperature Limit: -10/70 Celsius
Temperature History Size (Index): 128 (107)
SCT Error Recovery Control:
Read: 80 (8.0 seconds)
Write: 80 (8.0 seconds)
Device Statistics page 0x00 is invalid (page=0x00, nentries=0)
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 12 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 13 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

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@@ -0,0 +1,211 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 13.0-BETA3 amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG MZ5PA064HMCD-01000
Serial Number: --
Firmware Version: AXM0801Q
User Capacity: 64,023,257,088 bytes [64.0 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ATA8-ACS, ATA/ATAPI-7 T13/1532D revision 1
SATA Version is: SATA 2.6, 3.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Mon Feb 22 23:08:41 2021 WIB
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 420) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 7) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
9 Power_On_Hours -O--CK 099 099 --- - 172
12 Power_Cycle_Count -O--CK 099 099 --- - 283
177 Wear_Leveling_Count PO--C- 099 099 --- - 28
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 078 078 --- - 214
190 Airflow_Temperature_Cel -O---K 068 050 --- - 32
235 Unknown_Attribute -O--C- 099 099 --- - 176
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 0
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 GPL,SL R/O 1 Summary SMART error log
0x02 GPL,SL R/O 1 Comprehensive SMART error log
0x03 GPL,SL R/O 1 Ext. Comprehensive SMART error log
0x06 GPL,SL R/O 1 SMART self-test log
0x07 GPL,SL R/O 1 Extended self-test log
0x09 GPL,SL R/W 1 Selective self-test log
0x10 GPL,SL R/O 1 NCQ Command Error log
0x11 GPL,SL R/O 1 SATA Phy Event Counters log
0x80-0x9f GPL,SL R/W 1 Host vendor specific log
Warning! SMART Extended Comprehensive Error Log Structure error: invalid SMART checksum.
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
Device Error Count: 38 (device log contains only the most recent 4 errors)
CR = Command Register
FEATR = Features Register
COUNT = Count (was: Sector Count) Register
LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8
LH = LBA High (was: Cylinder High) Register ] LBA
LM = LBA Mid (was: Cylinder Low) Register ] Register
LL = LBA Low (was: Sector Number) Register ]
DV = Device (was: Device/Head) Register
DC = Device Control Register
ER = Error register
ST = Status register
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 38 [1] occurred at disk power-on lifetime: 17 hours (0 days + 17 hours)
When the command that caused the error occurred, the device was sleeping.
After command completion occurred, registers were:
ER -- ST COUNT LBA_48 LH LM LL DV DC
-- -- -- == -- == == == -- -- -- -- --
40 -- 51 00 40 00 00 00 54 1c c0 e0 00 Error: UNC at LBA = 0x00541cc0 = 5512384
Commands leading to the command that caused the error were:
CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name
-- == -- == -- == == == -- -- -- -- -- --------------- --------------------
42 00 ff 00 40 00 00 00 54 1c 80 00 00 00:03:15.000 READ VERIFY SECTOR(S) EXT
42 00 ff 00 40 00 00 00 54 1c 40 00 00 00:03:15.000 READ VERIFY SECTOR(S) EXT
42 00 ff 00 40 00 00 00 54 1c 00 00 00 00:03:15.000 READ VERIFY SECTOR(S) EXT
42 00 ff 00 40 00 00 00 54 1b c0 00 00 00:03:15.000 READ VERIFY SECTOR(S) EXT
42 00 ff 00 40 00 00 00 54 1b 80 00 00 00:03:15.000 READ VERIFY SECTOR(S) EXT
Error 37 [0] occurred at disk power-on lifetime: 17 hours (0 days + 17 hours)
When the command that caused the error occurred, the device was sleeping.
After command completion occurred, registers were:
ER -- ST COUNT LBA_48 LH LM LL DV DC
-- -- -- == -- == == == -- -- -- -- --
40 -- 51 00 40 00 00 00 54 08 00 e0 00 Error: UNC at LBA = 0x00540800 = 5507072
Commands leading to the command that caused the error were:
CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name
-- == -- == -- == == == -- -- -- -- -- --------------- --------------------
42 00 ff 00 40 00 00 00 54 07 c0 00 00 00:03:13.000 READ VERIFY SECTOR(S) EXT
42 00 ff 00 40 00 00 00 54 07 80 00 00 00:03:13.000 READ VERIFY SECTOR(S) EXT
42 00 ff 00 40 00 00 00 54 07 40 00 00 00:03:13.000 READ VERIFY SECTOR(S) EXT
42 00 ff 00 40 00 00 00 54 07 00 00 00 00:03:13.000 READ VERIFY SECTOR(S) EXT
42 00 ff 00 40 00 00 00 54 06 c0 00 00 00:03:13.000 READ VERIFY SECTOR(S) EXT
Error 36 [3] occurred at disk power-on lifetime: 17 hours (0 days + 17 hours)
When the command that caused the error occurred, the device was sleeping.
After command completion occurred, registers were:
ER -- ST COUNT LBA_48 LH LM LL DV DC
-- -- -- == -- == == == -- -- -- -- --
40 -- 51 00 40 00 00 00 51 21 40 e0 00 Error: UNC at LBA = 0x00512140 = 5316928
Commands leading to the command that caused the error were:
CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name
-- == -- == -- == == == -- -- -- -- -- --------------- --------------------
42 00 ff 00 40 00 00 00 51 21 00 00 00 00:03:09.000 READ VERIFY SECTOR(S) EXT
42 00 ff 00 40 00 00 00 51 20 c0 00 00 00:03:09.000 READ VERIFY SECTOR(S) EXT
42 00 ff 00 40 00 00 00 51 20 80 00 00 00:03:09.000 READ VERIFY SECTOR(S) EXT
42 00 ff 00 40 00 00 00 51 20 40 00 00 00:03:09.000 READ VERIFY SECTOR(S) EXT
42 00 ff 00 40 00 00 00 51 20 00 00 00 00:03:09.000 READ VERIFY SECTOR(S) EXT
Error 35 [2] occurred at disk power-on lifetime: 17 hours (0 days + 17 hours)
When the command that caused the error occurred, the device was sleeping.
After command completion occurred, registers were:
ER -- ST COUNT LBA_48 LH LM LL DV DC
-- -- -- == -- == == == -- -- -- -- --
40 -- 51 00 40 00 00 00 4c 39 c0 e0 00 Error: UNC at LBA = 0x004c39c0 = 4995520
Commands leading to the command that caused the error were:
CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name
-- == -- == -- == == == -- -- -- -- -- --------------- --------------------
42 00 ff 00 40 00 00 00 4c 39 80 00 00 00:02:59.000 READ VERIFY SECTOR(S) EXT
42 00 ff 00 40 00 00 00 4c 39 40 00 00 00:02:59.000 READ VERIFY SECTOR(S) EXT
42 00 ff 00 40 00 00 00 4c 39 00 00 00 00:02:59.000 READ VERIFY SECTOR(S) EXT
42 00 ff 00 40 00 00 00 4c 38 c0 00 00 00:02:59.000 READ VERIFY SECTOR(S) EXT
42 00 ff 00 40 00 00 00 4c 38 80 00 00 00:02:59.000 READ VERIFY SECTOR(S) EXT
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 2 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 1 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

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smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p12-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG MZ7KH240HAHQ-00005
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: HXM7404Q
User Capacity: 240,057,409,536 bytes [240 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic, zeroed
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Wed Feb 3 22:41:45 2021 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 25) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 099 099 000 - 11
12 Power_Cycle_Count -O--CK 099 099 000 - 4
177 Wear_Leveling_Count PO--C- 100 100 005 - 0
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 1071
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
184 End-to-End_Error PO--CK 100 100 097 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 063 063 000 - 37
194 Temperature_Celsius -O---K 063 060 000 - 37 (Min/Max 22/37)
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
197 Current_Pending_Sector -O--CK 100 100 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
202 Exception_Mode_Status PO--CK 100 100 010 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 2
241 Total_LBAs_Written -O--CK 099 099 000 - 16406168
242 Total_LBAs_Read -O--CK 099 099 000 - 319238
243 SATA_Downshift_Ct -O--CK 100 100 000 - 0
244 Thermal_Throttle_St -O--CK 100 100 000 - 0
245 Timed_Workld_Media_Wear -O--CK 100 100 000 - 65535
246 Timed_Workld_RdWr_Ratio -O--CK 100 100 000 - 65535
247 Timed_Workld_Timer -O--CK 100 100 000 - 65535
251 NAND_Writes -O--CK 100 100 000 - 16449920
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x12 GPL R/O 1 SATA NCQ Non-Data log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa5 SL VS 16 Device vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: Active (0)
Current Temperature: 37 Celsius
Power Cycle Min/Max Temperature: 34/37 Celsius
Lifetime Min/Max Temperature: 22/37 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (75)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 4 --- Lifetime Power-On Resets
0x01 0x010 4 11 --- Power-on Hours
0x01 0x018 6 16406168 --- Logical Sectors Written
0x01 0x020 6 241873 --- Number of Write Commands
0x01 0x028 6 319238 --- Logical Sectors Read
0x01 0x030 6 11916 --- Number of Read Commands
0x01 0x038 6 3477000 --- Date and Time TimeStamp
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 37 --- Current Temperature
0x05 0x020 1 37 --- Highest Temperature
0x05 0x028 1 22 --- Lowest Temperature
0x05 0x058 1 70 --- Specified Maximum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 17 --- Number of Hardware Resets
0x06 0x010 4 0 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 0 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 8 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 8 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,208 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p12-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG MZ7KH240HAHQ-00005
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: HXM7404Q
User Capacity: 240,057,409,536 bytes [240 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic, zeroed
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Wed Feb 3 22:41:45 2021 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 25) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 099 099 000 - 11
12 Power_Cycle_Count -O--CK 099 099 000 - 4
177 Wear_Leveling_Count PO--C- 100 100 005 - 0
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 1067
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
184 End-to-End_Error PO--CK 100 100 097 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 062 061 000 - 38
194 Temperature_Celsius -O---K 062 060 000 - 38 (Min/Max 22/39)
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
197 Current_Pending_Sector -O--CK 100 100 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
202 Exception_Mode_Status PO--CK 100 100 010 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 2
241 Total_LBAs_Written -O--CK 099 099 000 - 16406168
242 Total_LBAs_Read -O--CK 099 099 000 - 615176
243 SATA_Downshift_Ct -O--CK 100 100 000 - 0
244 Thermal_Throttle_St -O--CK 100 100 000 - 0
245 Timed_Workld_Media_Wear -O--CK 100 100 000 - 65535
246 Timed_Workld_RdWr_Ratio -O--CK 100 100 000 - 65535
247 Timed_Workld_Timer -O--CK 100 100 000 - 65535
251 NAND_Writes -O--CK 100 100 000 - 16449920
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x12 GPL R/O 1 SATA NCQ Non-Data log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa5 SL VS 16 Device vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: Active (0)
Current Temperature: 38 Celsius
Power Cycle Min/Max Temperature: 35/39 Celsius
Lifetime Min/Max Temperature: 22/39 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (75)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 4 --- Lifetime Power-On Resets
0x01 0x010 4 11 --- Power-on Hours
0x01 0x018 6 16406168 --- Logical Sectors Written
0x01 0x020 6 241873 --- Number of Write Commands
0x01 0x028 6 615176 --- Logical Sectors Read
0x01 0x030 6 24358 --- Number of Read Commands
0x01 0x038 6 3477000 --- Date and Time TimeStamp
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 38 --- Current Temperature
0x05 0x020 1 39 --- Highest Temperature
0x05 0x028 1 22 --- Lowest Temperature
0x05 0x058 1 70 --- Specified Maximum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 17 --- Number of Hardware Resets
0x06 0x010 4 0 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 0 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 8 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 8 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,206 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p13-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG MZ7KM240HMHQ-00005
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: GXM5304Q
User Capacity: 240,057,409,536 bytes [240 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic, zeroed
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Thu Feb 11 15:19:59 2021 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Disabled
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 1740) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 29) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 096 096 000 - 16139
12 Power_Cycle_Count -O--CK 099 099 000 - 45
177 Wear_Leveling_Count PO--C- 099 099 005 - 103
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 1366
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
184 End-to-End_Error PO--CK 100 100 097 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 086 058 000 - 14
194 Temperature_Celsius -O---K 086 058 000 - 14 (Min/Max 5/42)
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
197 Current_Pending_Sector -O--CK 100 100 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
202 Exception_Mode_Status PO--CK 100 100 010 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 32
241 Total_LBAs_Written -O--CK 099 099 000 - 46535209379
242 Total_LBAs_Read -O--CK 099 099 000 - 216547951818
243 SATA_Downshift_Ct -O--CK 099 099 000 - 1
244 Thermal_Throttle_St -O--CK 100 100 000 - 0
245 Timed_Workld_Media_Wear -O--CK 100 100 000 - 65535
246 Timed_Workld_RdWr_Ratio -O--CK 100 100 000 - 65535
247 Timed_Workld_Timer -O--CK 100 100 000 - 65535
251 NAND_Writes -O--CK 100 100 000 - 53682396928
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x08 GPL R/O 2 Power Conditions log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was completed without error
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: SCT command executing in background (5)
Current Temperature: 14 Celsius
Power Cycle Min/Max Temperature: 5/20 Celsius
Lifetime Min/Max Temperature: 5/42 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (86)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 45 --- Lifetime Power-On Resets
0x01 0x010 4 16139 --- Power-on Hours
0x01 0x018 6 46535209379 --- Logical Sectors Written
0x01 0x020 6 216384 --- Number of Write Commands
0x01 0x028 6 216547951818 --- Logical Sectors Read
0x01 0x030 6 1890074 --- Number of Read Commands
0x01 0x038 6 443000 --- Date and Time TimeStamp
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 14 --- Current Temperature
0x05 0x020 1 42 --- Highest Temperature
0x05 0x028 1 5 --- Lowest Temperature
0x05 0x058 1 70 --- Specified Maximum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 15 --- Number of Hardware Resets
0x06 0x010 4 0 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 0 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 15 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 15 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,208 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p13-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG MZ7KM240HMHQ-00005
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: GXM5104Q
User Capacity: 240,057,409,536 bytes [240 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic, zeroed
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Thu Feb 11 15:19:59 2021 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Disabled
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 1740) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 29) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 096 096 000 - 16008
12 Power_Cycle_Count -O--CK 099 099 000 - 96
177 Wear_Leveling_Count PO--C- 099 099 005 - 73
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 1380
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
184 End-to-End_Error PO--CK 100 100 097 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 086 061 000 - 14
194 Temperature_Celsius -O---K 086 061 000 - 14 (Min/Max 5/39)
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
197 Current_Pending_Sector -O--CK 100 100 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
202 Exception_Mode_Status PO--CK 100 100 010 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 78
241 Total_LBAs_Written -O--CK 099 099 000 - 31146125373
242 Total_LBAs_Read -O--CK 099 099 000 - 32309875539
243 SATA_Downshift_Ct -O--CK 100 100 000 - 0
244 Thermal_Throttle_St -O--CK 100 100 000 - 0
245 Timed_Workld_Media_Wear -O--CK 100 100 000 - 65535
246 Timed_Workld_RdWr_Ratio -O--CK 100 100 000 - 65535
247 Timed_Workld_Timer -O--CK 100 100 000 - 65535
251 NAND_Writes -O--CK 100 100 000 - 38653436928
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x08 GPL R/O 2 Power Conditions log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was completed without error
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: SCT command executing in background (5)
Current Temperature: 14 Celsius
Power Cycle Min/Max Temperature: 5/21 Celsius
Lifetime Min/Max Temperature: 5/39 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (71)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 96 --- Lifetime Power-On Resets
0x01 0x010 4 16008 --- Power-on Hours
0x01 0x018 6 31146125373 --- Logical Sectors Written
0x01 0x020 6 2046743 --- Number of Write Commands
0x01 0x028 6 32309875539 --- Logical Sectors Read
0x01 0x030 6 42022 --- Number of Read Commands
0x01 0x038 6 1404000 --- Date and Time TimeStamp
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 14 --- Current Temperature
0x05 0x020 1 39 --- Highest Temperature
0x05 0x028 1 5 --- Lowest Temperature
0x05 0x058 1 55 --- Specified Maximum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 15 --- Number of Hardware Resets
0x06 0x010 4 0 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 0 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 15 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 15 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,176 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p13-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG MZ7KM960HAHP-0Z005
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: GXM1003Q
User Capacity: 960,197,124,096 bytes [960 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available, deterministic, zeroed
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Mon Feb 15 00:14:17 2021 CST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 3600) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 60) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 098 098 000 - 8561
12 Power_Cycle_Count -O--CK 099 099 000 - 14
177 Wear_Leveling_Count PO--C- 099 099 005 - 4
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 7671
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
184 End-to-End_Error PO--CK 100 100 097 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 056 056 000 - 44
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
197 Current_Pending_Sector -O--CK 100 100 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
202 Exception_Mode_Status PO--CK 100 100 010 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 7
241 Total_LBAs_Written -O--CK 099 099 000 - 7737541564
242 Total_LBAs_Read -O--CK 099 099 000 - 1543412274
243 SATA_Downshift_Ct -O--CK 100 100 000 - 0
244 Thermal_Throttle_St -O--CK 100 100 000 - 0
245 Timed_Workld_Media_Wear -O--CK 100 100 000 - 65535
246 Timed_Workld_RdWr_Ratio -O--CK 100 100 000 - 65535
247 Timed_Workld_Timer -O--CK 100 100 000 - 65535
251 NAND_Writes -O--CK 100 100 000 - 9353226288
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was completed without error
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: SCT command executing in background (5)
Current Temperature: 44 Celsius
Power Cycle Min/Max Temperature: 25/48 Celsius
Lifetime Min/Max Temperature: 0/70 Celsius
Under/Over Temperature Limit Count: 4294967295/4294967295
SCT Temperature History Version: 3 (Unknown, should be 2)
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (51)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 11 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 11 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,225 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p16-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG MZ7KM960HMJP-00005
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: GXM5304Q
User Capacity: 960,197,124,096 bytes [960 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic, zeroed
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sat May 15 19:11:19 2021 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Disabled
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 3600) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 60) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 097 097 000 - 12211
12 Power_Cycle_Count -O--CK 099 099 000 - 30
177 Wear_Leveling_Count PO--C- 099 099 005 - 81
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 5461
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
184 End-to-End_Error PO--CK 100 100 097 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 061 056 000 - 39
194 Temperature_Celsius -O---K 061 056 000 - 39 (Min/Max 20/44)
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
197 Current_Pending_Sector -O--CK 100 100 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
202 Exception_Mode_Status PO--CK 100 100 010 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 16
241 Total_LBAs_Written -O--CK 099 099 000 - 147024553537
242 Total_LBAs_Read -O--CK 099 099 000 - 66916133877
243 SATA_Downshift_Ct -O--CK 100 100 000 - 0
244 Thermal_Throttle_St -O--CK 100 100 000 - 0
245 Timed_Workld_Media_Wear -O--CK 100 100 000 - 65535
246 Timed_Workld_RdWr_Ratio -O--CK 100 100 000 - 65535
247 Timed_Workld_Timer -O--CK 100 100 000 - 65535
251 NAND_Writes -O--CK 100 100 000 - 171756341248
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x08 GPL R/O 2 Power Conditions log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 11964 -
# 2 Short offline Completed without error 00% 11940 -
# 3 Short offline Completed without error 00% 11916 -
# 4 Short offline Completed without error 00% 11892 -
# 5 Short offline Completed without error 00% 11868 -
# 6 Extended offline Completed without error 00% 11846 -
# 7 Short offline Completed without error 00% 11844 -
# 8 Short offline Completed without error 00% 11820 -
# 9 Short offline Completed without error 00% 11796 -
#10 Short offline Completed without error 00% 11772 -
#11 Short offline Completed without error 00% 11748 -
#12 Short offline Completed without error 00% 11724 -
#13 Short offline Completed without error 00% 11700 -
#14 Extended offline Completed without error 00% 11679 -
#15 Short offline Completed without error 00% 11676 -
#16 Short offline Completed without error 00% 11652 -
#17 Short offline Completed without error 00% 11628 -
#18 Short offline Completed without error 00% 11604 -
#19 Short offline Completed without error 00% 11580 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was completed without error
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: SCT command executing in background (5)
Current Temperature: 39 Celsius
Power Cycle Min/Max Temperature: 22/39 Celsius
Lifetime Min/Max Temperature: 20/44 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (49)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 30 --- Lifetime Power-On Resets
0x01 0x010 4 12211 --- Power-on Hours
0x01 0x018 6 147024553537 --- Logical Sectors Written
0x01 0x020 6 54388 --- Number of Write Commands
0x01 0x028 6 66916133941 --- Logical Sectors Read
0x01 0x030 6 24862 --- Number of Read Commands
0x01 0x038 6 926000 --- Date and Time TimeStamp
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 39 --- Current Temperature
0x05 0x020 1 44 --- Highest Temperature
0x05 0x028 1 20 --- Lowest Temperature
0x05 0x058 1 70 --- Specified Maximum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 8 --- Number of Hardware Resets
0x06 0x010 4 0 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 0 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 8 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 8 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,166 @@
smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG MZ7LF192HCGS-000L1
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: FXT03L1Q
User Capacity: 192,048,095,232 bytes [192 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sun Feb 21 07:24:00 2021 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 40) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 098 098 000 - 8053
12 Power_Cycle_Count -O--CK 097 097 000 - 2383
170 Unknown_Attribute -O--CK 100 100 010 - 0
171 Unknown_Attribute -O--CK 100 100 010 - 0
172 Unknown_Attribute -O--CK 100 100 010 - 0
173 Unknown_Attribute PO--CK 095 095 005 - 103
174 Unknown_Attribute -O--CK 099 099 000 - 63
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 1604
184 End-to-End_Error PO--CK 100 100 097 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
194 Temperature_Celsius -O--CK 066 053 000 - 34
199 UDMA_CRC_Error_Count -OSRCK 099 099 000 - 2
233 Media_Wearout_Indicator PO--C- 094 094 000 - 15913188
241 Total_LBAs_Written -O--CK 099 099 000 - 12065
242 Total_LBAs_Read -O--CK 099 099 000 - 15108
249 Unknown_Attribute -O--CK 099 099 000 - 19776
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xdf GPL,SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 8037 -
# 2 Short offline Completed without error 00% 8030 -
# 3 Short offline Completed without error 00% 8017 -
# 4 Short offline Completed without error 00% 8007 -
# 5 Short offline Completed without error 00% 7999 -
# 6 Short offline Completed without error 00% 7989 -
# 7 Short offline Completed without error 00% 7975 -
# 8 Short offline Completed without error 00% 7961 -
# 9 Short offline Completed without error 00% 7955 -
#10 Short offline Completed without error 00% 7943 -
#11 Short offline Completed without error 00% 7924 -
#12 Extended offline Completed without error 00% 7916 -
#13 Short offline Completed without error 00% 7908 -
#14 Short offline Completed without error 00% 7896 -
#15 Short offline Completed without error 00% 7884 -
#16 Short offline Completed without error 00% 7875 -
#17 Short offline Completed without error 00% 7860 -
#18 Short offline Completed without error 00% 7844 -
#19 Short offline Completed without error 00% 7833 -
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 2 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 2 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,219 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p12-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: MZ7LH1T9HMLT0D3
Serial Number: --
LU WWN Device Id: 5 002538 ...
Add. Product Id: DELL(tm)
Firmware Version: HE57
User Capacity: 1,920,383,410,176 bytes [1.92 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic, zeroed
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Mon Feb 8 19:47:25 2021 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Unavailable
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 29) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate -O-RC- 200 200 000 - 0
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 099 099 000 - 4346
12 Power_Cycle_Count -O--CK 099 099 000 - 48
13 Read_Soft_Error_Rate -O-RC- 200 200 000 - 0
177 Wear_Leveling_Count PO--C- 099 099 005 - 2
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
180 Unused_Rsvd_Blk_Cnt_Tot -O--C- 100 100 000 - 5857
181 Program_Fail_Cnt_Total -O--CK 100 100 000 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 000 - 0
184 End-to-End_Error PO--CK 100 100 097 - 0
194 Temperature_Celsius -O---K 054 054 000 - 46
195 Hardware_ECC_Recovered -O-RC- 100 100 000 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 UDMA_CRC_Error_Count -OSRCK 100 100 000 - 0
201 Unknown_SSD_Attribute PO--CK 100 100 001 - 0
202 Unknown_SSD_Attribute PO--CK 100 100 010 - 0
233 Media_Wearout_Indicator -O--CK 099 099 000 - 8712399041
235 Unknown_Attribute -O--C- 099 099 000 - 32
242 Total_LBAs_Read -O--CK 099 099 000 - 40095820359
243 Unknown_Attribute -O--CK 100 100 000 - 0
244 Unknown_Attribute -O--CK 100 100 000 - 0
245 Unknown_Attribute -O-RCK 099 099 000 - 99
246 Unknown_Attribute -O--CK 100 100 000 - 65535
247 Unknown_Attribute -O--CK 100 100 000 - 65535
248 Unknown_Attribute -O--CK 100 100 000 - 65535
251 Unknown_Attribute -O--CK 100 100 000 - 8724009856
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x12 GPL R/O 1 SATA NCQ Non-Data log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x16 GPL - 1 Reserved for Serial ATA
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x98 GPL,SL R/W 16 Host vendor specific log
0x99-0x9a GPL,SL R/W 1 Host vendor specific log
0x9b-0x9f GPL,SL R/W 16 Host vendor specific log
0xa5 SL VS 16 Device vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 3945 -
# 2 Extended offline Completed without error 00% 11 -
# 3 Short offline Completed without error 00% 11 -
# 4 Short offline Completed without error 00% 4 -
# 5 Short offline Completed without error 00% 3 -
# 6 Short offline Completed without error 00% 1 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: Active (0)
Current Temperature: 46 Celsius
Power Cycle Min/Max Temperature: 15/46 Celsius
Lifetime Min/Max Temperature: 14/47 Celsius
Specified Max Operating Temperature: 70 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (122)
SCT Error Recovery Control:
Read: 80 (8.0 seconds)
Write: 80 (8.0 seconds)
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 48 --- Lifetime Power-On Resets
0x01 0x010 4 4346 --- Power-on Hours
0x01 0x018 6 8712399041 --- Logical Sectors Written
0x01 0x020 6 45027307 --- Number of Write Commands
0x01 0x028 6 40095827271 --- Logical Sectors Read
0x01 0x030 6 47465477 --- Number of Read Commands
0x01 0x038 6 1277000 --- Date and Time TimeStamp
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 46 --- Current Temperature
0x05 0x020 1 47 --- Highest Temperature
0x05 0x028 1 14 --- Lowest Temperature
0x05 0x058 1 70 --- Specified Maximum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 142 --- Number of Hardware Resets
0x06 0x010 4 0 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 0 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 5 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 5 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,215 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p12-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: MZ7LH1T9HMLT0D3
Serial Number: --
LU WWN Device Id: 5 002538 ...
Add. Product Id: DELL(tm)
Firmware Version: HE57
User Capacity: 1,920,383,410,176 bytes [1.92 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic, zeroed
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Mon Feb 8 19:47:25 2021 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Unavailable
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 29) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate -O-RC- 200 200 000 - 0
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 099 099 000 - 4336
12 Power_Cycle_Count -O--CK 099 099 000 - 35
13 Read_Soft_Error_Rate -O-RC- 200 200 000 - 0
177 Wear_Leveling_Count PO--C- 099 099 005 - 1
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
180 Unused_Rsvd_Blk_Cnt_Tot -O--C- 100 100 000 - 5804
181 Program_Fail_Cnt_Total -O--CK 100 100 000 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 000 - 0
184 End-to-End_Error PO--CK 100 100 097 - 0
194 Temperature_Celsius -O---K 053 053 000 - 47
195 Hardware_ECC_Recovered -O-RC- 100 100 000 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 UDMA_CRC_Error_Count -OSRCK 100 100 000 - 0
201 Unknown_SSD_Attribute PO--CK 100 100 001 - 0
202 Unknown_SSD_Attribute PO--CK 100 100 010 - 0
233 Media_Wearout_Indicator -O--CK 099 099 000 - 3734246321
235 Unknown_Attribute -O--C- 099 099 000 - 19
242 Total_LBAs_Read -O--CK 099 099 000 - 45035135536
243 Unknown_Attribute -O--CK 100 100 000 - 0
244 Unknown_Attribute -O--CK 100 100 000 - 0
245 Unknown_Attribute -O-RCK 099 099 000 - 99
246 Unknown_Attribute -O--CK 100 100 000 - 65535
247 Unknown_Attribute -O--CK 100 100 000 - 65535
248 Unknown_Attribute -O--CK 100 100 000 - 65535
251 Unknown_Attribute -O--CK 100 100 000 - 3743321216
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x12 GPL R/O 1 SATA NCQ Non-Data log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x16 GPL - 1 Reserved for Serial ATA
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x98 GPL,SL R/W 16 Host vendor specific log
0x99-0x9a GPL,SL R/W 1 Host vendor specific log
0x9b-0x9f GPL,SL R/W 16 Host vendor specific log
0xa5 SL VS 16 Device vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 3935 -
# 2 Short offline Completed without error 00% 3849 -
# 3 Extended offline Completed without error 00% 1 -
# 4 Short offline Completed without error 00% 1 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: Active (0)
Current Temperature: 47 Celsius
Power Cycle Min/Max Temperature: 15/47 Celsius
Lifetime Min/Max Temperature: 14/47 Celsius
Specified Max Operating Temperature: 70 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (53)
SCT Error Recovery Control:
Read: 80 (8.0 seconds)
Write: 80 (8.0 seconds)
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 35 --- Lifetime Power-On Resets
0x01 0x010 4 4336 --- Power-on Hours
0x01 0x018 6 3734253233 --- Logical Sectors Written
0x01 0x020 6 25429506 --- Number of Write Commands
0x01 0x028 6 45035135536 --- Logical Sectors Read
0x01 0x030 6 103201641 --- Number of Read Commands
0x01 0x038 6 1461000 --- Date and Time TimeStamp
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 47 --- Current Temperature
0x05 0x020 1 47 --- Highest Temperature
0x05 0x028 1 14 --- Lowest Temperature
0x05 0x058 1 70 --- Specified Maximum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 132 --- Number of Hardware Resets
0x06 0x010 4 0 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 0 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 5 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 5 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

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@@ -0,0 +1,205 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p13-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG MZ7LN128HAHQ-000H1
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: MVT03H3Q
User Capacity: 128,035,676,160 bytes [128 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic, zeroed
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-3, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sat Mar 6 11:35:49 2021 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Disabled
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Disabled
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 3840) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 64) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate POSR-K 100 100 050 - 0
5 Reallocated_Sector_Ct PO--CK 100 100 005 - 0
9 Power_On_Hours -O--CK 100 100 000 - 5757
12 Power_Cycle_Count -O--CK 100 100 000 - 80
171 Program_Fail_Count_Chip -O--CK 100 100 000 - 0
172 Erase_Fail_Count_Chip -O--CK 100 100 000 - 0
173 Wear_Leveling_Count -O--CK 099 099 005 - 9
174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 60
176 Erase_Fail_Count_Chip -O---K 100 100 000 - 317
181 Program_Fail_Cnt_Total -O---K 100 001 000 - 1728057
183 Runtime_Bad_Block -O--CK 100 100 000 - 0
184 End-to-End_Error PO-RCK 100 100 097 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
188 Command_Timeout -O--CK 100 100 000 - 0
194 Temperature_Celsius -O---K 057 064 000 - 57 (Min/Max 27/64)
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 CRC_Error_Count -O--CK 100 100 000 - 0
201 Supercap_Status PO---K 100 100 005 - 100
241 Total_LBAs_Written -O--CK 100 100 000 - 61447
242 Total_LBAs_Read -O--CK 100 100 000 - 46644
243 SATA_Downshift_Ct -O--CK 100 100 000 - 104841
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x0a GPL R/W 1 Device Statistics Notification
0x0c GPL R/O 1 Pending Defects log
0x0d GPL,SL R/O 1 LPS Mis-alignment log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x19 GPL R/O 8 LBA Status log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 1 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was completed without error
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: Active (0)
Current Temperature: 56 Celsius
Power Cycle Min/Max Temperature: 37/61 Celsius
Lifetime Min/Max Temperature: 24/62 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (57)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 80 -D- Lifetime Power-On Resets
0x01 0x010 4 5757 -D- Power-on Hours
0x01 0x018 6 2013517288 -D- Logical Sectors Written
0x01 0x020 6 21831683 -D- Number of Write Commands
0x01 0x028 6 1528435123 -D- Logical Sectors Read
0x01 0x030 6 23285167 -D- Number of Read Commands
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 -D- Number of Reported Uncorrectable Errors
0x04 0x010 4 0 -D- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 56 -D- Current Temperature
0x05 0x020 1 62 -D- Highest Temperature
0x05 0x028 1 24 -D- Lowest Temperature
0x05 0x058 1 55 -D- Specified Maximum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 622 -D- Number of Hardware Resets
0x06 0x010 4 0 -D- Number of ASR Events
0x06 0x018 4 0 -D- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 0 ND- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c)
No Defects Logged
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 5 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 5 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,205 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p12-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG MZ7LN256HAJQ-000H1
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: MVT03H3Q
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic, zeroed
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-3, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Thu Feb 4 22:09:27 2021 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Disabled
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Disabled
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 5100) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 85) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate POSR-K 100 100 050 - 0
5 Reallocated_Sector_Ct PO--CK 100 100 005 - 0
9 Power_On_Hours -O--CK 100 100 000 - 9612
12 Power_Cycle_Count -O--CK 100 100 000 - 86
171 Program_Fail_Count_Chip -O--CK 100 100 000 - 0
172 Erase_Fail_Count_Chip -O--CK 100 100 000 - 0
173 Wear_Leveling_Count -O--CK 099 099 005 - 10
174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 58
176 Erase_Fail_Count_Chip -O---K 100 100 000 - 625
181 Program_Fail_Cnt_Total -O---K 099 066 000 - 338721
183 Runtime_Bad_Block -O--CK 100 100 000 - 0
184 End-to-End_Error PO-RCK 100 100 097 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
188 Command_Timeout -O--CK 100 100 000 - 10
194 Temperature_Celsius -O---K 045 046 000 - 45 (Min/Max 33/46)
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 CRC_Error_Count -O--CK 100 100 000 - 0
201 Supercap_Status PO---K 100 100 005 - 100
241 Total_LBAs_Written -O--CK 100 100 000 - 282939
242 Total_LBAs_Read -O--CK 100 100 000 - 139073
243 SATA_Downshift_Ct -O--CK 100 100 000 - 622145
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x0a GPL R/W 1 Device Statistics Notification
0x0c GPL R/O 1 Pending Defects log
0x0d GPL,SL R/O 1 LPS Mis-alignment log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x19 GPL R/O 8 LBA Status log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 0 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was completed without error
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: Active (0)
Current Temperature: 44 Celsius
Power Cycle Min/Max Temperature: 34/44 Celsius
Lifetime Min/Max Temperature: 12/44 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (26)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 86 -D- Lifetime Power-On Resets
0x01 0x010 4 9612 -D- Power-on Hours
0x01 0x018 6 9271349752 -D- Logical Sectors Written
0x01 0x020 6 161148089 -D- Number of Write Commands
0x01 0x028 6 4557161667 -D- Logical Sectors Read
0x01 0x030 6 78437785 -D- Number of Read Commands
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 -D- Number of Reported Uncorrectable Errors
0x04 0x010 4 10 -D- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 44 -D- Current Temperature
0x05 0x020 1 44 -D- Highest Temperature
0x05 0x028 1 12 -D- Lowest Temperature
0x05 0x058 1 55 -D- Specified Maximum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 192 -D- Number of Hardware Resets
0x06 0x010 4 0 -D- Number of ASR Events
0x06 0x018 4 0 -D- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 0 ND- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c)
No Defects Logged
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 19 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 19 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,170 @@
smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.2-RELEASE amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG MZ7LN256HCHP-000F0
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EMT01F0Q
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sat Mar 13 07:40:56 2021 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 133) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 099 099 000 - 904
12 Power_Cycle_Count -O--CK 099 099 000 - 843
170 Unused_Rsvd_Blk_Ct_Chip -O--CK 100 100 010 - 0
171 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
172 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
173 Wear_Leveling_Count PO--CK 099 099 005 - 9
174 Unexpect_Power_Loss_Ct -O--CK 099 099 000 - 81
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 761
184 End-to-End_Error PO--CK 100 100 097 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
194 Temperature_Celsius -O--CK 067 058 000 - 33
199 CRC_Error_Count -OSRCK 100 100 000 - 0
233 Media_Wearout_Indicator PO--C- 099 099 000 - 16701717
241 Total_LBAs_Written -O--CK 099 099 000 - 2032
242 Total_LBAs_Read -O--CK 099 099 000 - 613
249 Unknown_Samsung_Attr -O--CK 099 099 000 - 2464
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xdf GPL,SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: SCT command executing in background (5)
Current Temperature: 33 Celsius
Power Cycle Min/Max Temperature: 25/40 Celsius
Lifetime Min/Max Temperature: 0/70 Celsius
Under/Over Temperature Limit Count: 4294967295/4294901760
SMART Status: 0xffff (Reserved)
SCT Temperature History Version: 3 (Unknown, should be 2)
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (2)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 9 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 7 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,185 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p16-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG MZ7LN256HCHP-000H1
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EMT02H0Q
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Fri May 14 09:40:55 2021 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 2160) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 36) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate POSR-K 200 200 002 - 0
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 068 068 001 - 20699
11 Unknown_SSD_Attribute -O---K 099 099 001 - 17
12 Power_Cycle_Count -O--CK 099 099 001 - 62
170 Unused_Rsvd_Blk_Ct_Chip PO--CK 100 100 010 - 743
171 Program_Fail_Count_Chip -O---K 100 100 010 - 0
172 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
173 Wear_Leveling_Count PO--CK 088 088 005 - 248
174 Unexpect_Power_Loss_Ct -O--CK 099 099 001 - 17
183 Runtime_Bad_Block -O--CK 100 100 001 - 0
184 End-to-End_Error PO--CK 100 100 097 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
188 Command_Timeout -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O---K 053 049 040 - 47
196 Reallocated_Event_Count -O--CK 253 253 001 - 0
198 Offline_Uncorrectable ----CK 100 100 001 - 0
199 CRC_Error_Count -O---K 100 100 001 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 3 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xb6 GPL,SL VS 127 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 15159 -
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was completed without error
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: SCT command executing in background (5)
Current Temperature: 46 Celsius
Power Cycle Min/Max Temperature: 33/49 Celsius
Lifetime Min/Max Temperature: 0/70 Celsius
Under/Over Temperature Limit Count: 4294967295/4294901760
SMART Status: 0xffff (Reserved)
SCT Temperature History Version: 3 (Unknown, should be 2)
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (87)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 2) ==
0x01 0x018 6 103448724376 --- Logical Sectors Written
0x01 0x028 6 610896405 --- Logical Sectors Read
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 47 --- Current Temperature
0x05 0x020 1 47 --- Highest Temperature
0x05 0x028 1 47 --- Lowest Temperature
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 152 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 152 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,97 @@
smartctl 7.1 2019-12-30 r5022 [x86_64-unknown-openbsd6.8] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG MZ7LN256HCHP-000L7
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EMT03L6Q
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Nov 10 08:17:30 2020 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART Status not supported: Incomplete response, ATA output registers missing
SMART overall-health self-assessment test result: PASSED
Warning: This result is based on an Attribute check.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 133) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0
9 Power_On_Hours 0x0032 097 097 000 Old_age Always - 12388
12 Power_Cycle_Count 0x0032 098 098 000 Old_age Always - 1471
170 Unused_Rsvd_Blk_Ct_Chip 0x0032 100 100 010 Old_age Always - 0
171 Program_Fail_Count_Chip 0x0032 100 100 010 Old_age Always - 0
172 Erase_Fail_Count_Chip 0x0032 100 100 010 Old_age Always - 0
173 Wear_Leveling_Count 0x0033 093 093 005 Pre-fail Always - 129
174 Unexpect_Power_Loss_Ct 0x0032 099 099 000 Old_age Always - 27
178 Used_Rsvd_Blk_Cnt_Chip 0x0013 100 100 010 Pre-fail Always - 0
180 Unused_Rsvd_Blk_Cnt_Tot 0x0013 100 100 010 Pre-fail Always - 787
184 End-to-End_Error 0x0033 100 100 097 Pre-fail Always - 0
187 Uncorrectable_Error_Cnt 0x0032 100 100 000 Old_age Always - 0
194 Temperature_Celsius 0x0032 070 051 000 Old_age Always - 30
199 CRC_Error_Count 0x003e 100 100 000 Old_age Always - 0
233 Media_Wearout_Indicator 0x0013 093 093 000 Pre-fail Always - 15695084
241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 14933
242 Total_LBAs_Read 0x0032 099 099 000 Old_age Always - 14139
249 Unknown_Samsung_Attr 0x0032 099 099 000 Old_age Always - 33024
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

View File

@@ -0,0 +1,172 @@
smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG MZ7LN256HCHP-000L7
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EMT03L6Q
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Feb 9 12:14:31 2021 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 133) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 099 099 000 - 759
12 Power_Cycle_Count -O--CK 098 098 000 - 1383
170 Unused_Rsvd_Blk_Ct_Chip -O--CK 100 100 010 - 0
171 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
172 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
173 Wear_Leveling_Count PO--CK 098 098 005 - 23
174 Unexpect_Power_Loss_Ct -O--CK 099 099 000 - 154
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 762
184 End-to-End_Error PO--CK 100 100 097 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
194 Temperature_Celsius -O--CK 067 044 000 - 33
199 CRC_Error_Count -OSRCK 100 100 000 - 0
233 Media_Wearout_Indicator PO--C- 098 098 000 - 16584277
241 Total_LBAs_Written -O--CK 099 099 000 - 3999
242 Total_LBAs_Read -O--CK 099 099 000 - 1733
249 Unknown_Samsung_Attr -O--CK 099 099 000 - 5888
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa5 SL VS 16 Device vendor specific log
0xce SL VS 16 Device vendor specific log
0xdf GPL,SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: SCT command executing in background (5)
Current Temperature: 32 Celsius
Power Cycle Min/Max Temperature: 32/40 Celsius
Lifetime Min/Max Temperature: 0/70 Celsius
Under/Over Temperature Limit Count: 4294967295/4294901760
SMART Status: 0xffff (Reserved)
SCT Temperature History Version: 3 (Unknown, should be 2)
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (1)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 8 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 8 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,189 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 13.0-BETA1 amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG MZ7LN256HMJP-00000
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: MAV0100Q
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sat Feb 13 15:15:48 2021 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 133) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 094 094 000 - 27419
12 Power_Cycle_Count -O--CK 099 099 000 - 26
170 Unused_Rsvd_Blk_Ct_Chip -O--CK 100 100 010 - 0
171 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
172 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
173 Wear_Leveling_Count PO--CK 084 084 005 - 198
174 Unexpect_Power_Loss_Ct -O--CK 099 099 000 - 6
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 789
184 End-to-End_Error PO--CK 100 100 097 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
194 Temperature_Celsius -O--CK 074 062 000 - 26
199 CRC_Error_Count -OSRCK 100 100 000 - 0
233 Media_Wearout_Indicator PO--C- 083 083 000 - 14008974
241 Total_LBAs_Written -O--CK 099 099 000 - 9755
242 Total_LBAs_Read -O--CK 099 099 000 - 11347
249 NAND_Writes_1GiB -O--CK 099 099 000 - 50784
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xdf GPL,SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 26108 -
# 2 Extended offline Completed without error 00% 26094 -
# 3 Extended offline Completed without error 00% 25289 -
# 4 Extended offline Completed without error 00% 25275 -
# 5 Extended offline Completed without error 00% 25027 -
# 6 Extended offline Completed without error 00% 25012 -
# 7 Extended offline Completed without error 00% 24130 -
# 8 Extended offline Completed without error 00% 24116 -
# 9 Extended offline Completed without error 00% 23710 -
#10 Extended offline Completed without error 00% 23695 -
#11 Extended offline Completed without error 00% 19021 -
#12 Short offline Completed without error 00% 19014 -
#13 Extended offline Completed without error 00% 19014 -
#14 Extended offline Completed without error 00% 18999 -
#15 Extended offline Completed without error 00% 18746 -
#16 Extended offline Completed without error 00% 18731 -
#17 Extended offline Completed without error 00% 15829 -
#18 Extended offline Completed without error 00% 15814 -
#19 Extended offline Completed without error 00% 17 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: Active (0)
Current Temperature: 24 Celsius
Power Cycle Min/Max Temperature: 24/38 Celsius
Lifetime Min/Max Temperature: 20/40 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (57)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 205 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 205 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,191 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 13.0-BETA1 amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG MZ7LN256HMJP-00000
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: MAV0100Q
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sat Feb 13 15:15:48 2021 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 133) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 094 094 000 - 26233
12 Power_Cycle_Count -O--CK 099 099 000 - 28
170 Unused_Rsvd_Blk_Ct_Chip -O--CK 100 100 010 - 0
171 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
172 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
173 Wear_Leveling_Count PO--CK 077 077 005 - 287
174 Unexpect_Power_Loss_Ct -O--CK 099 099 000 - 9
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 826
184 End-to-End_Error PO--CK 100 100 097 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
194 Temperature_Celsius -O--CK 073 059 000 - 27
199 CRC_Error_Count -OSRCK 100 100 000 - 0
233 Media_Wearout_Indicator PO--C- 076 076 000 - 12764664
241 Total_LBAs_Written -O--CK 099 099 000 - 38604
242 Total_LBAs_Read -O--CK 099 099 000 - 48674
249 NAND_Writes_1GiB -O--CK 099 099 000 - 73504
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xdf GPL,SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 24923 -
# 2 Extended offline Completed without error 00% 24908 -
# 3 Extended offline Completed without error 00% 24104 -
# 4 Extended offline Completed without error 00% 24089 -
# 5 Extended offline Completed without error 00% 23841 -
# 6 Extended offline Completed without error 00% 23827 -
# 7 Extended offline Completed without error 00% 22945 -
# 8 Extended offline Completed without error 00% 22930 -
# 9 Extended offline Completed without error 00% 22524 -
#10 Extended offline Completed without error 00% 22510 -
#11 Extended offline Completed without error 00% 17835 -
#12 Short offline Completed without error 00% 17829 -
#13 Extended offline Completed without error 00% 16285 -
#14 Extended offline Completed without error 00% 16153 -
#15 Extended offline Completed without error 00% 16139 -
#16 Extended offline Completed without error 00% 14658 -
#17 Short offline Completed without error 00% 14652 -
#18 Extended offline Completed without error 00% 14651 -
#19 Extended offline Completed without error 00% 14645 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: Active (0)
Current Temperature: 26 Celsius
Power Cycle Min/Max Temperature: 25/39 Celsius
Lifetime Min/Max Temperature: 23/41 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (99)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 205 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 205 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,204 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p12-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG MZ7LN256HMJP-000H1
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: MAV01H3Q
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic, zeroed
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-3, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sat Mar 20 22:20:42 2021 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Disabled
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Disabled
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 5100) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 85) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate POSR-K 100 100 050 - 0
5 Reallocated_Sector_Ct PO--CK 100 100 005 - 0
9 Power_On_Hours -O--CK 100 100 000 - 30813
12 Power_Cycle_Count -O--CK 100 100 000 - 62
171 Program_Fail_Count_Chip -O--CK 100 100 000 - 0
172 Erase_Fail_Count_Chip -O--CK 100 100 000 - 0
173 Wear_Leveling_Count -O--CK 099 099 005 - 4
174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 36
176 Erase_Fail_Count_Chip -O---K 100 100 000 - 760
181 Program_Fail_Cnt_Total -O---K 100 016 000 - 281474976710655
183 Runtime_Bad_Block -O--CK 100 100 000 - 0
184 End-to-End_Error PO-RCK 100 100 097 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
188 Command_Timeout -O--CK 100 100 000 - 0
194 Temperature_Celsius -O---K 031 043 000 - 31 (Min/Max 25/40)
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 CRC_Error_Count -O--CK 100 100 000 - 0
241 Total_LBAs_Written -O--CK 100 100 000 - 386333
242 Total_LBAs_Read -O--CK 100 100 000 - 95870
243 SATA_Downshift_Ct -O--CK 100 100 000 - 691783
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x0a GPL R/W 1 Device Statistics Notification
0x0c GPL R/O 1 Pending Defects log
0x0d GPL,SL R/O 1 LPS Mis-alignment log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x19 GPL R/O 8 LBA Status log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 0 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was completed without error
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: Active (0)
Current Temperature: 30 Celsius
Power Cycle Min/Max Temperature: 27/36 Celsius
Lifetime Min/Max Temperature: 22/43 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (85)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 62 -D- Lifetime Power-On Resets
0x01 0x010 4 30813 -D- Power-on Hours
0x01 0x018 6 12659364901 -D- Logical Sectors Written
0x01 0x020 6 226561853 -D- Number of Write Commands
0x01 0x028 6 3141485253 -D- Logical Sectors Read
0x01 0x030 6 188720810 -D- Number of Read Commands
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 -D- Number of Reported Uncorrectable Errors
0x04 0x010 4 0 -D- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 30 -D- Current Temperature
0x05 0x020 1 43 -D- Highest Temperature
0x05 0x028 1 22 -D- Lowest Temperature
0x05 0x058 1 55 -D- Specified Maximum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 256 -D- Number of Hardware Resets
0x06 0x010 4 0 -D- Number of ASR Events
0x06 0x018 4 0 -D- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 0 ND- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c)
No Defects Logged
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 19 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 19 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,175 @@
smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG MZ7LN256HMJP-000L7
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: MAV02L6Q
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sun Mar 7 07:57:47 2021 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x80) Offline data collection activity
was never started.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 85) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 098 098 000 - 5639
12 Power_Cycle_Count -O--CK 098 098 000 - 1660
170 Unused_Rsvd_Blk_Ct_Chip -O--CK 100 100 010 - 0
171 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
172 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
173 Wear_Leveling_Count PO--CK 098 098 005 - 17
174 Unexpect_Power_Loss_Ct -O--CK 099 099 000 - 208
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 732
184 End-to-End_Error PO--CK 100 100 097 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
194 Temperature_Celsius -O--CK 063 049 000 - 37 (Min/Max 15/51)
199 CRC_Error_Count -OSRCK 098 098 000 - 1457
233 Media_Wearout_Indicator PO--C- 098 098 001 - 16539537
241 Total_LBAs_Written -O--CK 099 099 000 - 6563
242 Total_LBAs_Read -O--CK 099 099 000 - 3469
249 Unknown_Samsung_Attr -O--CK 099 099 000 - 6563
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa5 SL VS 16 Device vendor specific log
0xce SL VS 16 Device vendor specific log
0xdf GPL,SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 2403 -
# 2 Short offline Completed without error 00% 1 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: Active (0)
Current Temperature: ? Celsius
Power Cycle Min/Max Temperature: 35/35 Celsius
Lifetime Min/Max Temperature: 20/50 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (98)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 3 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 3 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,172 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.2-RELEASE-p6 amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG MZ7TD128HAFV-000L1
Serial Number: --
LU WWN Device Id: 5 002538 ...
Add. Product Id: 00000000
Firmware Version: DXT05L0Q
User Capacity: 128,035,676,160 bytes [128 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available, deterministic, zeroed
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Apr 27 16:26:42 2021 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (65476) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 30) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
9 Power_On_Hours -O--CK 098 098 000 - 7359
12 Power_Cycle_Count -O--CK 097 097 000 - 2806
175 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
176 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
177 Wear_Leveling_Count PO--C- 089 089 005 - 132
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 3120
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
184 End-to-End_Error PO--CK 100 100 097 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 072 042 000 - 28
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 CRC_Error_Count -OSRCK 253 253 000 - 0
233 Media_Wearout_Indicator -O-RCK 199 199 000 - 9587636
234 Unknown_Samsung_Attr -O--C- 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 821
236 Unknown_Samsung_Attr -O--C- 099 099 000 - 87
237 Unknown_Samsung_Attr -O--C- 099 099 000 - 132
238 Unknown_Samsung_Attr -O--C- 100 100 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 GPL,SL R/O 1 Summary SMART error log
0x02 GPL,SL R/O 1 Comprehensive SMART error log
0x03 GPL,SL R/O 1 Ext. Comprehensive SMART error log
0x06 GPL,SL R/O 1 SMART self-test log
0x07 GPL,SL R/O 1 Extended self-test log
0x09 GPL,SL R/W 1 Selective self-test log
0x10 GPL,SL R/O 1 NCQ Command Error log
0x11 GPL,SL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 1 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa0 GPL,SL VS 16 Device vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: SCT command executing in background (5)
Current Temperature: 28 Celsius
Power Cycle Min/Max Temperature: 24/40 Celsius
Lifetime Min/Max Temperature: 0/70 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 3 (Unknown, should be 2)
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (31)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 2 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 2 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,170 @@
smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG MZ7TD256HAFV-000L7
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: DXT04L6Q
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Mar 9 08:16:44 2021 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (53956) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 40) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
9 Power_On_Hours -O--CK 098 098 000 - 9538
12 Power_Cycle_Count -O--CK 099 099 000 - 888
175 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
176 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
177 Wear_Leveling_Count PO--C- 089 089 005 - 124
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 6240
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
184 End-to-End_Error PO--CK 100 100 097 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 071 029 000 - 29
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 CRC_Error_Count -OSRCK 253 253 000 - 0
233 Media_Wearout_Indicator -O-RCK 199 199 000 - 9632692
234 Unknown_Samsung_Attr -O--C- 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 174
236 Unknown_Samsung_Attr -O--C- 099 099 000 - 73
237 Unknown_Samsung_Attr -O--C- 099 099 000 - 124
238 Unknown_Samsung_Attr -O--C- 100 100 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 GPL,SL R/O 1 Summary SMART error log
0x02 GPL,SL R/O 1 Comprehensive SMART error log
0x03 GPL,SL R/O 1 Ext. Comprehensive SMART error log
0x06 GPL,SL R/O 1 SMART self-test log
0x07 GPL,SL R/O 1 Extended self-test log
0x09 GPL,SL R/W 1 Selective self-test log
0x10 GPL,SL R/O 1 NCQ Command Error log
0x11 GPL,SL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 1 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa0 GPL,SL VS 16 Device vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: SCT command executing in background (5)
Current Temperature: 40 Celsius
Power Cycle Min/Max Temperature: 40/40 Celsius
Lifetime Min/Max Temperature: 0/70 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 3 (Unknown, should be 2)
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (0)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 10 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 10 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,163 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.2-RELEASE-p3 amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG MZ7TE128HMGR-00004
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT0300Q
User Capacity: 128,035,676,160 bytes [128 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Wed Mar 3 20:50:25 2021 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 70) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 000 - 0
9 Power_On_Hours -O--CK 098 098 000 - 7290
12 Power_Cycle_Count -O--CK 098 098 000 - 1606
177 Wear_Leveling_Count PO--C- 092 092 000 - 92
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 100
181 Program_Fail_Cnt_Total -O--CK 100 100 000 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 000 - 0
183 Runtime_Bad_Block PO--C- 100 100 000 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 075 051 000 - 25
195 Hardware_ECC_Recovered -O-RC- 200 200 000 - 0
199 UDMA_CRC_Error_Count -OSRCK 100 100 000 - 0
235 Unknown_Attribute -O--C- 099 099 000 - 46
241 Total_LBAs_Written -O--CK 099 099 000 - 19244682764
242 Total_LBAs_Read -O--CK 099 099 000 - 42062840741
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 25 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/43009
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (0)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 4 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 3 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,172 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p13-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG MZ7TE128HMGR-000L1
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT06L0Q
User Capacity: 128,035,676,160 bytes [128 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Wed Feb 10 13:23:57 2021 PST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 70) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
9 Power_On_Hours -O--CK 087 087 000 - 63730
12 Power_Cycle_Count -O--CK 099 099 000 - 134
175 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
176 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
177 Wear_Leveling_Count PO--C- 092 092 005 - 86
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 2196
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
184 End-to-End_Error PO--CK 100 100 097 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 063 049 000 - 37
195 Hardware_ECC_Recovered -O-RC- 200 200 000 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 UDMA_CRC_Error_Count -OSRCK 100 100 000 - 0
233 Media_Wearout_Indicator -O-RCK 199 199 000 - 25
234 Unknown_Attribute -O--C- 100 100 000 - 0
235 Unknown_Attribute -O--C- 099 099 000 - 69
236 Unknown_Attribute -O--C- 099 099 000 - 40
237 Unknown_Attribute -O--C- 099 099 000 - 86
238 Unknown_Attribute -O--C- 100 100 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xdf GPL,SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 37 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/232048
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (23)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 20 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 20 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,169 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.2-RELEASE-p3 amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG MZ7TY128HDHP-00000
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: MAT0100Q
User Capacity: 128,035,676,160 bytes [128 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Wed Mar 3 20:41:37 2021 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 64) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 098 098 000 - 5253
12 Power_Cycle_Count -O--CK 099 099 000 - 754
170 Unknown_Attribute -O--CK 100 100 010 - 0
171 Unknown_Attribute -O--CK 100 100 010 - 0
172 Unknown_Attribute -O--CK 100 100 010 - 0
173 Unknown_Attribute PO--CK 095 095 005 - 40
174 Unknown_Attribute -O--CK 099 099 000 - 42
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 946
184 End-to-End_Error PO--CK 100 100 097 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
194 Temperature_Celsius -O--CK 074 051 000 - 26
199 UDMA_CRC_Error_Count -OSRCK 100 100 000 - 0
233 Media_Wearout_Indicator PO--C- 095 095 000 - 15938354
241 Total_LBAs_Written -O--CK 099 099 000 - 4760
242 Total_LBAs_Read -O--CK 099 099 000 - 7716
249 Unknown_Attribute -O--CK 099 099 000 - 5120
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xdf GPL,SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: Active (0)
Current Temperature: ? Celsius
Power Cycle Min/Max Temperature: 30/30 Celsius
Lifetime Min/Max Temperature: 22/49 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (119)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 3 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 3 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,170 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p12-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG MZ7TY128HDHP-000L1
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: MAT03L0Q
User Capacity: 128,035,676,160 bytes [128 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Wed Jan 20 21:21:35 2021 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 64) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 096 096 000 - 15417
12 Power_Cycle_Count -O--CK 099 099 000 - 1008
170 Unknown_Attribute -O--CK 100 100 010 - 0
171 Unknown_Attribute -O--CK 100 100 010 - 0
172 Unknown_Attribute -O--CK 100 100 010 - 0
173 Unknown_Attribute PO--CK 091 091 005 - 70
174 Unknown_Attribute -O--CK 099 099 000 - 49
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 822
184 End-to-End_Error PO--CK 100 100 097 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
194 Temperature_Celsius -O--CK 080 049 000 - 20 (Min/Max 11/51)
199 UDMA_CRC_Error_Count -OSRCK 100 100 000 - 0
233 Media_Wearout_Indicator PO--C- 091 091 001 - 15309208
241 Total_LBAs_Written -O--CK 099 099 000 - 8850
242 Total_LBAs_Read -O--CK 099 099 000 - 4162
249 Unknown_Attribute -O--CK 099 099 000 - 8976
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xdf GPL,SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 5533 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: Active (0)
Current Temperature: 20 Celsius
Power Cycle Min/Max Temperature: ?/22 Celsius
Lifetime Min/Max Temperature: 14/49 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (67)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 24 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 24 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,170 @@
smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.2-RELEASE amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG MZ7TY256HDHP-000L7
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: MAT03L6Q
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sat Dec 12 14:43:21 2020 JST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 85) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 099 099 000 - 4438
12 Power_Cycle_Count -O--CK 098 098 000 - 1523
170 Unknown_Attribute -O--CK 100 100 010 - 0
171 Unknown_Attribute -O--CK 100 100 010 - 0
172 Unknown_Attribute -O--CK 100 100 010 - 0
173 Unknown_Attribute PO--CK 085 085 005 - 125
174 Unknown_Attribute -O--CK 099 099 000 - 23
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 1854
184 End-to-End_Error PO--CK 100 100 097 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
194 Temperature_Celsius -O--CK 069 040 000 - 31 (Min/Max 10/60)
199 UDMA_CRC_Error_Count -OSRCK 100 100 000 - 0
233 Media_Wearout_Indicator PO--C- 084 084 001 - 14155775
241 Total_LBAs_Written -O--CK 099 099 000 - 7317
242 Total_LBAs_Read -O--CK 099 099 000 - 14911
249 Unknown_Attribute -O--CK 099 099 000 - 32224
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa5 SL VS 16 Device vendor specific log
0xce SL VS 16 Device vendor specific log
0xdf GPL,SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: Active (0)
Current Temperature: 31 Celsius
Power Cycle Min/Max Temperature: ?/42 Celsius
Lifetime Min/Max Temperature: 17/55 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (59)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 7 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 83 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,154 @@
smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG MZHPV512HDGL-00000
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: BXW2500Q
User Capacity: 512,110,190,592 bytes [512 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Mon May 17 07:03:56 2021 EDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 35) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 099 099 010 - 1
9 Power_On_Hours -O--CK 097 097 000 - 12960
12 Power_Cycle_Count -O--CK 086 086 000 - 13894
170 Unused_Rsvd_Blk_Ct_Chip -O--CK 099 099 010 - 1
171 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
172 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
173 Wear_Leveling_Count PO--CK 092 092 005 - 251
174 Unexpect_Power_Loss_Ct -O--CK 099 099 000 - 160
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 099 099 010 - 1
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 099 099 010 - 1656
184 End-to-End_Error PO--CK 100 100 097 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
194 Temperature_Celsius -O--CK 070 027 000 - 30
199 CRC_Error_Count -OSRCK 100 100 000 - 0
233 Media_Wearout_Indicator -O--CK 099 099 000 - 128728
241 Total_LBAs_Written -O--CK 099 099 000 - 24619
242 Total_LBAs_Read -O--CK 099 099 000 - 135493
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xdf GPL VS 1 Device vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: SCT command executing in background (5)
Current Temperature: 30 Celsius
Power Cycle Min/Max Temperature: 27/40 Celsius
Lifetime Min/Max Temperature: 0/70 Celsius
Under/Over Temperature Limit Count: 4294967295/4294901760
SMART Status: 0xffff (Reserved)
SCT Temperature History Version: 3 (Unknown, should be 2)
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (9)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 4 0 Command failed due to ICRC error
0x000a 4 4 Device-to-host register FISes sent due to a COMRESET

View File

@@ -0,0 +1,149 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p13-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: MZMPC032HBCD-000D1
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: CXM13D1Q
User Capacity: 32,017,047,552 bytes [32.0 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Thu Feb 18 23:05:51 2021 -03
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Disabled
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 180) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 3) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 097 097 000 - 14708
12 Power_Cycle_Count -O--CK 098 098 000 - 1639
175 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
176 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
177 Wear_Leveling_Count PO--C- 083 083 010 - 600
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 094 094 010 - 24
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 095 095 010 - 38
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 095 095 010 - 778
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
195 Hardware_ECC_Recovered -O-RC- 200 200 000 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 UDMA_CRC_Error_Count -OSRCK 253 253 000 - 0
232 Available_Reservd_Space PO--C- 094 094 000 - 384
241 Total_LBAs_Written -O--CK 099 099 000 - 43585326651
242 Total_LBAs_Read -O--CK 099 099 000 - 521636384
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 GPL,SL R/O 1 Summary SMART error log
0x02 GPL,SL R/O 2 Comprehensive SMART error log
0x03 GPL,SL R/O 2 Ext. Comprehensive SMART error log
0x06 GPL,SL R/O 1 SMART self-test log
0x07 GPL,SL R/O 2 Extended self-test log
0x09 GPL,SL R/W 1 Selective self-test log
0x10 GPL,SL R/O 1 NCQ Command Error log
0x11 GPL,SL R/O 1 SATA Phy Event Counters log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (2 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (2 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 2441 -
# 2 Short offline Completed without error 00% 2271 -
# 3 Short offline Completed without error 00% 2271 -
# 4 Short offline Completed without error 00% 2157 -
# 5 Short offline Completed without error 00% 2122 -
# 6 Short offline Completed without error 00% 922 -
# 7 Short offline Completed without error 00% 0 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 49152 R_ERR response for data FIS
0x0003 2 53248 R_ERR response for device-to-host data FIS
0x0004 2 57344 R_ERR response for host-to-device data FIS
0x0005 2 7952 R_ERR response for non-data FIS
0x0006 2 2562 R_ERR response for device-to-host non-data FIS
0x0007 2 4096 R_ERR response for host-to-device non-data FIS
0x0008 2 7952 Device-to-host non-data FIS retries
0x0009 2 7953 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 6947 Device-to-host register FISes sent due to a COMRESET
0x000b 2 6145 CRC errors within host-to-device FIS
0x000d 2 7953 Non-CRC errors within host-to-device FIS
0x000f 2 8176 R_ERR response for host-to-device data FIS, CRC
0x0010 2 15 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 49153 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 12112 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,171 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 14.0-CURRENT amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG MZMTD128HAFV-000L1
Serial Number: --
LU WWN Device Id: 5 002538 ...
Add. Product Id: 00000000
Firmware Version: DXT42L0Q
User Capacity: 128,035,676,160 bytes [128 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available, deterministic, zeroed
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Fri Feb 5 08:32:56 2021 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (65476) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 30) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
9 Power_On_Hours -O--CK 092 092 000 - 35710
12 Power_Cycle_Count -O--CK 098 098 000 - 1151
175 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
176 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
177 Wear_Leveling_Count PO--C- 043 043 005 - 680
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 3120
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
184 End-to-End_Error PO--CK 100 100 097 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 056 028 000 - 44
195 Hardware_ECC_Recovered -O-RC- 200 200 000 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 UDMA_CRC_Error_Count -OSRCK 253 253 000 - 13
233 Media_Wearout_Indicator -O-RCK 199 199 000 - 7402498
234 Unknown_Attribute -O--C- 100 100 000 - 0
235 Unknown_Attribute -O--C- 099 099 000 - 76
236 Unknown_Attribute -O--C- 099 099 000 - 626
237 Unknown_Attribute -O--C- 099 099 000 - 680
238 Unknown_Attribute -O--C- 100 100 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 GPL,SL R/O 1 Summary SMART error log
0x02 GPL,SL R/O 1 Comprehensive SMART error log
0x03 GPL,SL R/O 1 Ext. Comprehensive SMART error log
0x06 GPL,SL R/O 1 SMART self-test log
0x07 GPL,SL R/O 1 Extended self-test log
0x09 GPL,SL R/W 1 Selective self-test log
0x10 GPL,SL R/O 1 NCQ Command Error log
0x11 GPL,SL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 1 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa0 GPL,SL VS 16 Device vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: SCT command executing in background (5)
Current Temperature: 43 Celsius
Power Cycle Min/Max Temperature: 31/61 Celsius
Lifetime Min/Max Temperature: 0/70 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 3 (Unknown, should be 2)
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (105)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 82 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 81 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,170 @@
smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE-p6 amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG MZMTD256HAGM-000L1
Serial Number: --
LU WWN Device Id: 5 002538 ...
Add. Product Id: 00000000
Firmware Version: DXT43L0Q
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Jan 5 14:26:07 2021 HKT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (53956) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 40) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
9 Power_On_Hours -O--CK 098 098 000 - 9388
12 Power_Cycle_Count -O--CK 094 094 000 - 5161
175 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
176 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
177 Wear_Leveling_Count PO--C- 069 069 005 - 371
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 6240
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
184 End-to-End_Error PO--CK 100 100 097 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 074 039 000 - 26
195 Hardware_ECC_Recovered -O-RC- 200 200 000 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 UDMA_CRC_Error_Count -OSRCK 253 253 000 - 0
233 Media_Wearout_Indicator -O-RCK 199 199 000 - 39805820
234 Unknown_Attribute -O--C- 100 100 000 - 0
235 Unknown_Attribute -O--C- 099 099 000 - 76
236 Unknown_Attribute -O--C- 099 099 000 - 320
237 Unknown_Attribute -O--C- 099 099 000 - 371
238 Unknown_Attribute -O--C- 100 100 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 GPL,SL R/O 1 Summary SMART error log
0x02 GPL,SL R/O 1 Comprehensive SMART error log
0x03 GPL,SL R/O 1 Ext. Comprehensive SMART error log
0x06 GPL,SL R/O 1 SMART self-test log
0x07 GPL,SL R/O 1 Extended self-test log
0x09 GPL,SL R/W 1 Selective self-test log
0x10 GPL,SL R/O 1 NCQ Command Error log
0x11 GPL,SL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 1 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa0 GPL,SL VS 16 Device vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: SCT command executing in background (5)
Current Temperature: 40 Celsius
Power Cycle Min/Max Temperature: 40/40 Celsius
Lifetime Min/Max Temperature: 0/70 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 3 (Unknown, should be 2)
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (0)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 2 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 2 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,165 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p12-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG MZMTE128HMGR-00007
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT4206Q
User Capacity: 128,035,676,160 bytes [128 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Thu Feb 4 21:10:46 2021 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 70) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 000 - 0
9 Power_On_Hours -O--CK 099 096 000 - 12
12 Power_Cycle_Count -O--CK 099 099 000 - 36
177 Wear_Leveling_Count PO--C- 100 094 000 - 100
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 100
181 Program_Fail_Cnt_Total -O--CK 100 100 000 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 000 - 0
183 Runtime_Bad_Block PO--C- 100 100 000 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 050 038 000 - 50
195 Hardware_ECC_Recovered -O-RC- 200 200 000 - 0
199 UDMA_CRC_Error_Count -OSRCK 100 100 000 - 1
235 Unknown_Attribute -O--C- 099 099 000 - 19
241 Total_LBAs_Written -O--CK 099 099 000 - 32506032
242 Total_LBAs_Read -O--CK 099 099 000 - 16404732
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 16 Device vendor specific log
0xce GPL,SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 50 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/115023
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (7)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 6 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 6 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,172 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p15-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG MZMTE128HMGR-000L2
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT43L0Q
User Capacity: 128,035,676,160 bytes [128 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Wed Apr 7 10:07:04 2021 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 70) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
9 Power_On_Hours -O--CK 099 098 000 - 119
12 Power_Cycle_Count -O--CK 099 098 000 - 22
175 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
176 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
177 Wear_Leveling_Count PO--C- 099 088 005 - 10
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 2181
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
184 End-to-End_Error PO--CK 100 100 097 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 064 054 000 - 36
195 Hardware_ECC_Recovered -O-RC- 200 200 000 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 UDMA_CRC_Error_Count -OSRCK 100 100 000 - 0
233 Media_Wearout_Indicator -O-RCK 199 001 000 - 9
234 Unknown_Attribute -O--C- 100 100 000 - 0
235 Unknown_Attribute -O--C- 099 099 000 - 12
236 Unknown_Attribute -O--C- 100 099 000 - 0
237 Unknown_Attribute -O--C- 099 099 000 - 10
238 Unknown_Attribute -O--C- 100 100 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xdf GPL,SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 36 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/36511
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (46)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 11 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 11 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,163 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p15-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG MZMTE128HMGR-000MV
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT41M0Q
User Capacity: 128,035,676,160 bytes [128 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Wed Apr 7 14:27:15 2021 +07
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 70) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 000 - 0
9 Power_On_Hours -O--CK 099 099 000 - 2256
12 Power_Cycle_Count -O--CK 099 099 000 - 68
177 Wear_Leveling_Count PO--C- 099 099 000 - 99
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 100
181 Program_Fail_Cnt_Total -O--CK 100 100 000 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 000 - 0
183 Runtime_Bad_Block PO--C- 100 100 000 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 048 031 000 - 52
195 Hardware_ECC_Recovered -O-RC- 200 200 000 - 0
199 UDMA_CRC_Error_Count -OSRCK 100 100 000 - 0
235 Unknown_Attribute -O--C- 099 099 000 - 50
241 Total_LBAs_Written -O--CK 099 099 000 - 908913052
242 Total_LBAs_Read -O--CK 099 099 000 - 5820280208
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 52 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/13547
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (89)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 7 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 7 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,173 @@
smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG MZNLN128HCGR-000L1
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EMT22L0Q
User Capacity: 128,035,676,160 bytes [128 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Wed Feb 3 14:59:56 2021 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 64) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 096 096 000 - 18759
12 Power_Cycle_Count -O--CK 099 099 000 - 905
170 Unused_Rsvd_Blk_Ct_Chip -O--CK 100 100 010 - 0
171 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
172 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
173 Wear_Leveling_Count PO--CK 096 096 005 - 69
174 Unexpect_Power_Loss_Ct -O--CK 099 099 000 - 64
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 384
184 End-to-End_Error PO--CK 100 100 097 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
194 Temperature_Celsius -O--CK 056 034 000 - 44
199 CRC_Error_Count -OSRCK 100 100 000 - 0
233 Media_Wearout_Indicator PO--C- 096 096 000 - 16198401
241 Total_LBAs_Written -O--CK 099 099 000 - 4561
242 Total_LBAs_Read -O--CK 099 099 000 - 7723
249 Unknown_Samsung_Attr -O--CK 099 099 000 - 8832
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xdf GPL,SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 18466 -
# 2 Short offline Completed without error 00% 18466 -
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: SCT command executing in background (5)
Current Temperature: 43 Celsius
Power Cycle Min/Max Temperature: 36/43 Celsius
Lifetime Min/Max Temperature: 0/70 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 3 (Unknown, should be 2)
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (3)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 6 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 6 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

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smartctl 7.2 2020-12-30 r5155 [FreeBSD 13.0-CURRENT amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG MZNLN256HAJQ-000H1
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: MVT24H3Q
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: Solid State Device
Form Factor: M.2
TRIM Command: Available, deterministic, zeroed
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-3, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Fri Jan 29 12:01:19 2021 EET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Disabled
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Disabled
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 5100) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 85) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate POSR-K 100 100 050 - 0
5 Reallocated_Sector_Ct PO--CK 100 100 005 - 0
9 Power_On_Hours -O--CK 100 100 000 - 13406
12 Power_Cycle_Count -O--CK 100 100 000 - 48
171 Program_Fail_Count_Chip -O--CK 100 100 000 - 0
172 Erase_Fail_Count_Chip -O--CK 100 100 000 - 0
173 Wear_Leveling_Count -O--CK 099 099 005 - 2
174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 25
176 Erase_Fail_Count_Chip -O---K 100 100 000 - 636
181 Program_Fail_Cnt_Total -O---K 099 099 000 - 2004
183 Runtime_Bad_Block -O--CK 100 100 000 - 0
184 End-to-End_Error PO-RCK 100 100 097 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
188 Command_Timeout -O--CK 100 100 000 - 0
194 Temperature_Celsius -O---K 031 044 000 - 31 (Min/Max 29/42)
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 CRC_Error_Count -O--CK 100 100 000 - 0
201 Supercap_Status PO---K 100 100 005 - 100
241 Total_LBAs_Written -O--CK 100 100 000 - 116398
242 Total_LBAs_Read -O--CK 100 100 000 - 42417
243 SATA_Downshift_Ct -O--CK 100 100 000 - 116398
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x0a GPL R/W 1 Device Statistics Notification
0x0c GPL R/O 1 Pending Defects log
0x0d GPL,SL R/O 1 LPS Mis-alignment log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x19 GPL R/O 8 LBA Status log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 3907 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was completed without error
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: Active (0)
Current Temperature: 31 Celsius
Power Cycle Min/Max Temperature: ?/40 Celsius
Lifetime Min/Max Temperature: 26/44 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (97)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 48 -D- Lifetime Power-On Resets
0x01 0x010 4 13406 -D- Power-on Hours
0x01 0x018 6 3814132807 -D- Logical Sectors Written
0x01 0x020 6 154588735 -D- Number of Write Commands
0x01 0x028 6 1389932963 -D- Logical Sectors Read
0x01 0x030 6 52084366 -D- Number of Read Commands
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 -D- Number of Reported Uncorrectable Errors
0x04 0x010 4 0 -D- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 31 -D- Current Temperature
0x05 0x020 1 44 -D- Highest Temperature
0x05 0x028 1 26 -D- Lowest Temperature
0x05 0x058 1 55 -D- Specified Maximum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 799 -D- Number of Hardware Resets
0x06 0x010 4 0 -D- Number of ASR Events
0x06 0x018 4 0 -D- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 0 ND- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c)
No Defects Logged
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 30874 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 3 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

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@@ -0,0 +1,175 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.2-RELEASE-p1 amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG MZNLN256HCHP-000L7
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EMT22L6Q
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Jan 19 21:57:49 2021 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 133) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 094 094 000 - 25838
12 Power_Cycle_Count -O--CK 099 099 000 - 663
170 Unused_Rsvd_Blk_Ct_Chip -O--CK 100 100 010 - 0
171 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
172 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
173 Wear_Leveling_Count PO--CK 088 088 005 - 246
174 Unexpect_Power_Loss_Ct -O--CK 099 099 000 - 86
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 768
184 End-to-End_Error PO--CK 100 100 097 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
194 Temperature_Celsius -O--CK 061 029 000 - 39
199 CRC_Error_Count -OSRCK 100 100 000 - 0
233 Media_Wearout_Indicator PO--C- 087 087 000 - 14713617
241 Total_LBAs_Written -O--CK 099 099 000 - 14703
242 Total_LBAs_Read -O--CK 099 099 000 - 24260
249 NAND_Writes_1GiB -O--CK 099 099 000 - 62976
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa5 SL VS 16 Device vendor specific log
0xce SL VS 16 Device vendor specific log
0xdf GPL,SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: SCT command executing in background (5)
Current Temperature: 38 Celsius
Power Cycle Min/Max Temperature: 26/40 Celsius
Lifetime Min/Max Temperature: 0/70 Celsius
Under/Over Temperature Limit Count: 4294967295/4294901760
SMART Status: 0xffff (Reserved)
SCT Temperature History Version: 3 (Unknown, should be 2)
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (20)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 11 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 11 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

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@@ -0,0 +1,173 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.2-RELEASE-p4 amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG MZNLN256HCHP-000L7
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EMT22L6Q
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Mar 2 23:39:42 2021 PST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 133) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 095 095 000 - 23985
12 Power_Cycle_Count -O--CK 099 099 000 - 160
170 Unused_Rsvd_Blk_Ct_Chip -O--CK 100 100 010 - 0
171 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
172 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
173 Wear_Leveling_Count PO--CK 086 086 005 - 289
174 Unexpect_Power_Loss_Ct -O--CK 099 099 000 - 45
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 653
184 End-to-End_Error PO--CK 100 100 097 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
194 Temperature_Celsius -O--CK 065 047 000 - 35
199 CRC_Error_Count -OSRCK 100 100 000 - 0
233 Media_Wearout_Indicator PO--C- 085 085 000 - 14352907
241 Total_LBAs_Written -O--CK 099 099 000 - 19953
242 Total_LBAs_Read -O--CK 099 099 000 - 19625
249 NAND_Writes_1GiB -O--CK 099 099 000 - 74016
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa5 SL VS 16 Device vendor specific log
0xce SL VS 16 Device vendor specific log
0xdf GPL,SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: SCT command executing in background (5)
Current Temperature: 35 Celsius
Power Cycle Min/Max Temperature: 33/42 Celsius
Lifetime Min/Max Temperature: 0/70 Celsius
Under/Over Temperature Limit Count: 4294967295/4294901760
SMART Status: 0xffff (Reserved)
SCT Temperature History Version: 3 (Unknown, should be 2)
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (40)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 83 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 86 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,173 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.2-RELEASE-p4 amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG MZNLN256HCHP-000L7
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EMT22L6Q
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Fri Apr 9 07:52:39 2021 AEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 133) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 098 098 000 - 9677
12 Power_Cycle_Count -O--CK 097 097 000 - 2665
170 Unused_Rsvd_Blk_Ct_Chip -O--CK 100 100 010 - 0
171 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
172 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
173 Wear_Leveling_Count PO--CK 096 096 005 - 64
174 Unexpect_Power_Loss_Ct -O--CK 099 099 000 - 125
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 770
184 End-to-End_Error PO--CK 100 100 097 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
194 Temperature_Celsius -O--CK 064 045 000 - 36
199 CRC_Error_Count -OSRCK 100 100 000 - 0
233 Media_Wearout_Indicator PO--C- 096 096 000 - 16240344
241 Total_LBAs_Written -O--CK 099 099 000 - 7663
242 Total_LBAs_Read -O--CK 099 099 000 - 7800
249 NAND_Writes_1GiB -O--CK 099 099 000 - 16400
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa5 SL VS 16 Device vendor specific log
0xce SL VS 16 Device vendor specific log
0xdf GPL,SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: SCT command executing in background (5)
Current Temperature: 40 Celsius
Power Cycle Min/Max Temperature: 40/40 Celsius
Lifetime Min/Max Temperature: 0/70 Celsius
Under/Over Temperature Limit Count: 4294967295/4294901760
SMART Status: 0xffff (Reserved)
SCT Temperature History Version: 3 (Unknown, should be 2)
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (0)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 3 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 3 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,169 @@
smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.2-RELEASE amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG MZNLN256HMHQ-000
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: MAV22K0Q
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: M.2
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Thu Feb 18 10:30:07 2021 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 85) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 099 099 000 - 135
12 Power_Cycle_Count -O--CK 099 099 000 - 335
170 Unused_Rsvd_Blk_Ct_Chip -O--CK 100 100 010 - 0
171 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
172 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
173 Wear_Leveling_Count PO--CK 099 099 005 - 3
174 Unexpect_Power_Loss_Ct -O--CK 099 099 000 - 50
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 755
184 End-to-End_Error PO--CK 100 100 097 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
194 Temperature_Celsius -O--CK 076 058 000 - 24
199 CRC_Error_Count -OSRCK 100 100 000 - 0
233 Media_Wearout_Indicator PO--C- 099 099 000 - 16735271
241 Total_LBAs_Written -O--CK 099 099 000 - 1092
242 Total_LBAs_Read -O--CK 099 099 000 - 1352
249 Unknown_Samsung_Attr -O--CK 099 099 000 - 1092
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xdf GPL,SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: Active (0)
Current Temperature: ? Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: 19/41 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (70)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 3 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 3 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,204 @@
smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG MZNTY256HDHP-000H1
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: MAT21H3Q
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: Solid State Device
Form Factor: < 1.8 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-3, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Thu Jan 21 17:06:19 2021 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Disabled
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Disabled
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 5100) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 85) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate POSR-K 100 100 050 - 0
5 Reallocated_Sector_Ct PO--CK 100 100 005 - 0
9 Power_On_Hours -O--CK 100 100 000 - 2330
12 Power_Cycle_Count -O--CK 100 100 000 - 2222
171 Program_Fail_Count_Chip -O--CK 100 100 000 - 0
172 Erase_Fail_Count_Chip -O--CK 100 100 000 - 0
173 Wear_Leveling_Count -O--CK 094 094 005 - 43
174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 134
176 Erase_Fail_Count_Chip -O---K 100 100 000 - 1800
181 Program_Fail_Cnt_Total -O---K 097 095 000 - 281474976710655
183 Runtime_Bad_Block -O--CK 100 100 000 - 0
184 End-to-End_Error PO-RCK 100 100 097 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
188 Command_Timeout -O--CK 100 100 000 - 24
194 Temperature_Celsius -O---K 034 068 000 - 34 (Min/Max 19/42)
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 CRC_Error_Count -O--CK 100 100 000 - 0
241 Total_LBAs_Written -O--CK 100 100 000 - 494596
242 Total_LBAs_Read -O--CK 100 100 000 - 584744
243 SATA_Downshift_Ct -O--CK 100 100 000 - 494596
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x0a GPL R/W 1 Device Statistics Notification
0x0c GPL R/O 1 Pending Defects log
0x0d GPL,SL R/O 1 LPS Mis-alignment log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x19 GPL R/O 8 LBA Status log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 4 -
# 2 Short offline Completed without error 00% 1 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was completed without error
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: Active (0)
Current Temperature: 34 Celsius
Power Cycle Min/Max Temperature: ?/38 Celsius
Lifetime Min/Max Temperature: -1/65 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (104)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 2222 -D- Lifetime Power-On Resets
0x01 0x010 4 2330 -D- Power-on Hours
0x01 0x018 6 16206947525 -D- Logical Sectors Written
0x01 0x020 6 252162271 -D- Number of Write Commands
0x01 0x028 6 19160915102 -D- Logical Sectors Read
0x01 0x030 6 262419989 -D- Number of Read Commands
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 -D- Number of Reported Uncorrectable Errors
0x04 0x010 4 24 -D- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 34 -D- Current Temperature
0x05 0x020 1 65 -D- Highest Temperature
0x05 0x028 1 -1 -D- Lowest Temperature
0x05 0x058 1 55 -D- Specified Maximum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 6701 -D- Number of Hardware Resets
0x06 0x010 4 0 -D- Number of ASR Events
0x06 0x018 4 0 -D- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 5 ND- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c)
No Defects Logged
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 20 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 20 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,171 @@
smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG MZYTE256HMHP-000L2
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT06L0Q
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Mon Dec 31 23:16:38 2012 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 80) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
9 Power_On_Hours -O--CK 099 099 000 - 882
12 Power_Cycle_Count -O--CK 099 099 000 - 114
175 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
176 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
177 Wear_Leveling_Count PO--C- 099 099 005 - 2
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 4321
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
184 End-to-End_Error PO--CK 100 100 097 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 073 060 000 - 27
195 Hardware_ECC_Recovered -O-RC- 200 200 000 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 UDMA_CRC_Error_Count -OSRCK 100 100 000 - 0
233 Media_Wearout_Indicator -O-RCK 199 199 000 - 22
234 Unknown_Attribute -O--C- 100 100 000 - 0
235 Unknown_Attribute -O--C- 099 099 000 - 19
236 Unknown_Attribute -O--C- 099 099 000 - 1
237 Unknown_Attribute -O--C- 099 099 000 - 2
238 Unknown_Attribute -O--C- 100 100 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xdf GPL,SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 27 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/5316
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (4)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 15 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 15 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,153 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 13.0-RELEASE amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung Portable SSD T5
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: MVT42P1Q
User Capacity: 500,107,862,016 bytes [500 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: mSATA
TRIM Command: Available, deterministic, zeroed
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Apr 13 18:35:41 2021 MST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Unavailable
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 85) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 099 099 000 - 2543
12 Power_Cycle_Count -O--CK 099 099 000 - 110
177 Wear_Leveling_Count PO--C- 099 099 000 - 3
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 057 041 000 - 43
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 65
241 Total_LBAs_Written -O--CK 099 099 000 - 2752934985
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa0 GPL VS 255 Device vendor specific log
0xa1 SL VS 16 Device vendor specific log
0xa5 SL VS 16 Device vendor specific log
0xc0-0xc2 SL VS 1 Device vendor specific log
0xc6-0xc8 SL VS 1 Device vendor specific log
0xcb SL VS 128 Device vendor specific log
0xce-0xcf SL VS 16 Device vendor specific log
0xd4 SL VS 1 Device vendor specific log
0xd6-0xd8 SL VS 1 Device vendor specific log
0xda SL VS 1 Device vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 18627 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 85 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -17,71 +17,128 @@ Please take all columns into account when reading the table. Pay attention on th
number of tested samples and power-on days. Simultaneous high values of both MTBF
and errors are possible if only rare drives in the subset encounter errors.
Days — avg. days per sample,
Err — avg. errors per sample,
MTBF — avg. MTBF in years per sample.
Days — avg. days per sample,
Err — avg. errors per sample,
MTBF — avg. MTBF in years per sample.
| MFG | Model | Size | Samples | Days | Err | MTBF |
|-----------|--------------------|--------|---------|-------|-------|--------|
| Samsung | SSD 840 EVO | 120 GB | 2 | 3427 | 0 | 9.39 |
| Samsung | SSD 840 Series | 120 GB | 1 | 2655 | 0 | 7.28 |
| Samsung | SSD 840 PRO Series | 128 GB | 1 | 2487 | 0 | 6.81 |
| Samsung | MZ7TD256HAFV-000L7 | 256 GB | 1 | 2052 | 0 | 5.62 |
| Samsung | MZ7TE128HMGR-000L1 | 128 GB | 1 | 2655 | 0 | 7.28 |
| Samsung | MMCRE28G5MXP-0VB | 128 GB | 1 | 1998 | 0 | 5.47 |
| Samsung | SSD 850 PRO | 128 GB | 5 | 1921 | 0 | 5.27 |
| Samsung | SSD PB22-JS3 TM | 64 GB | 1 | 1801 | 0 | 4.94 |
| Samsung | SSD 850 PRO | 128 GB | 2 | 1798 | 0 | 4.93 |
| Samsung | SSD 840 PRO Series | 128 GB | 8 | 1791 | 3 | 4.62 |
| Samsung | SSD 840 EVO | 120 GB | 11 | 1758 | 32 | 4.50 |
| Samsung | MZMTE512HMHP-000MV | 512 GB | 2 | 1593 | 0 | 4.36 |
| Samsung | SSD 750 EVO | 120 GB | 1 | 1425 | 0 | 3.91 |
| Samsung | MZMTD128HAFV-000L1 | 128 GB | 1 | 1487 | 0 | 4.08 |
| Samsung | MZ-5EA2000-0D3 | 200 GB | 4 | 1475 | 0 | 4.04 |
| Samsung | SSD PM830 2.5" 7mm | 256 GB | 2 | 1416 | 0 | 3.88 |
| Samsung | SSD PB22-JS3 2.5" | 128 GB | 1 | 1365 | 0 | 3.74 |
| Samsung | SSD 840 Series | 120 GB | 5 | 1364 | 0 | 3.74 |
| Samsung | SSD 840 Series | 250 GB | 2 | 1328 | 0 | 3.64 |
| Samsung | SSD 830 Series | 128 GB | 4 | 1312 | 0 | 3.60 |
| Samsung | MZ7LM240HCGR-0E003 | 240 GB | 2 | 1295 | 0 | 3.55 |
| Samsung | SSD 850 EVO M.2 | 500 GB | 3 | 1191 | 0 | 3.26 |
| Samsung | SSD 840 PRO Series | 256 GB | 2 | 1183 | 0 | 3.24 |
| Samsung | MZ7LN256HMJP-000H1 | 256 GB | 1 | 1283 | 0 | 3.52 |
| Samsung | MZ7TD256HAFV-000L7 | 256 GB | 2 | 1224 | 0 | 3.36 |
| Samsung | SSD RBX Series ... | 64 GB | 1 | 1182 | 0 | 3.24 |
| Samsung | SSD 840 EVO 250... | 250 GB | 1 | 1131 | 0 | 3.10 |
| Samsung | MZ7LN256HMJP-00000 | 256 GB | 2 | 1117 | 0 | 3.06 |
| Samsung | SSD 850 EVO mSATA | 1 TB | 1 | 2157 | 1 | 2.96 |
| Samsung | MZ7PD128HAFV-000H7 | 128 GB | 1 | 1060 | 0 | 2.91 |
| Samsung | SSD 850 EVO mSATA | 250 GB | 3 | 1033 | 0 | 2.83 |
| Samsung | SSD 750 EVO | 500 GB | 1 | 854 | 0 | 2.34 |
| Samsung | SSD 850 EVO | 250 GB | 18 | 835 | 0 | 2.29 |
| Samsung | SSD 850 EVO | 1 TB | 5 | 1085 | 1 | 2.09 |
| Samsung | SSD SM871 2.5 7mm | 256 GB | 1 | 1021 | 0 | 2.80 |
| Samsung | SSD 840 EVO | 500 GB | 4 | 1138 | 209 | 2.74 |
| Samsung | SSD 850 EVO | 120 GB | 5 | 997 | 0 | 2.73 |
| Samsung | SSD 850 EVO M.2 | 500 GB | 4 | 987 | 0 | 2.71 |
| Samsung | SSD 750 EVO | 250 GB | 6 | 864 | 0 | 2.37 |
| Samsung | MZ7LN256HCHP-000H1 | 256 GB | 1 | 862 | 0 | 2.36 |
| Samsung | SSD 850 EVO M.2 | 120 GB | 1 | 831 | 0 | 2.28 |
| Samsung | SSD 830 Series | 64 GB | 2 | 812 | 0 | 2.23 |
| Samsung | SSD 860 EVO mSATA | 250 GB | 3 | 787 | 0 | 2.16 |
| Samsung | MZNLN128HCGR-000L1 | 128 GB | 1 | 781 | 0 | 2.14 |
| Samsung | SSD 850 EVO | 250 GB | 51 | 773 | 0 | 2.12 |
| Samsung | MZNLN256HCHP-000L7 | 256 GB | 4 | 768 | 0 | 2.11 |
| Samsung | SSD CM871 2.5 7mm | 128 GB | 1 | 750 | 0 | 2.06 |
| Samsung | SSD 850 EVO | 2 TB | 1 | 742 | 0 | 2.03 |
| Samsung | SSD 750 EVO | 250 GB | 1 | 734 | 0 | 2.01 |
| Samsung | SSD 840 EVO | 1 TB | 1 | 727 | 0 | 1.99 |
| Samsung | SSD 830 Series | 256 GB | 2 | 731 | 0 | 2.00 |
| Samsung | SSD 840 EVO | 250 GB | 16 | 725 | 0 | 1.99 |
| Samsung | SSD 850 PRO | 512 GB | 11 | 721 | 0 | 1.98 |
| Samsung | MZMPC032HBCD-00000 | 32 GB | 1 | 721 | 0 | 1.98 |
| Samsung | SSD 850 EVO M.2 | 250 GB | 6 | 719 | 0 | 1.97 |
| Samsung | SSD 860 EVO | 2 TB | 2 | 717 | 0 | 1.97 |
| Samsung | SSD 840 EVO | 250 GB | 3 | 690 | 0 | 1.89 |
| Samsung | MZ7PC128HAFU-000L1 | 128 GB | 1 | 683 | 0 | 1.87 |
| Samsung | SSD 850 PRO | 256 GB | 5 | 608 | 0 | 1.67 |
| Samsung | MZNLN256HCHP-000L7 | 256 GB | 1 | 595 | 0 | 1.63 |
| Samsung | SSD 850 EVO | 500 GB | 10 | 550 | 0 | 1.51 |
| Samsung | SSD 850 EVO | 1 TB | 8 | 875 | 1 | 1.84 |
| Samsung | MZ7KM240HMHQ-00005 | 240 GB | 2 | 669 | 0 | 1.83 |
| Samsung | SSD 840 PRO Series | 256 GB | 8 | 898 | 1 | 1.79 |
| Samsung | SG9MSM6D024GPM00 | 22 GB | 1 | 649 | 0 | 1.78 |
| Samsung | SSD 850 PRO | 256 GB | 9 | 642 | 0 | 1.76 |
| Samsung | MZ7TY128HDHP-000L1 | 128 GB | 1 | 642 | 0 | 1.76 |
| Samsung | SSD 850 EVO | 500 GB | 24 | 665 | 1 | 1.72 |
| Samsung | MZMPC032HBCD-000D1 | 32 GB | 1 | 612 | 0 | 1.68 |
| Samsung | MZNLN256HAJQ-000H1 | 256 GB | 1 | 558 | 0 | 1.53 |
| Samsung | MZ7TE256HMHP-000H1 | 256 GB | 1 | 544 | 0 | 1.49 |
| Samsung | MZ7TY256HDHP-000L7 | 256 GB | 1 | 516 | 0 | 1.41 |
| Samsung | SSD 750 EVO | 120 GB | 3 | 540 | 0 | 1.48 |
| Samsung | MZ7KM960HMJP-00005 | 960 GB | 1 | 508 | 0 | 1.39 |
| Samsung | SSD PM830 2.5" 7mm | 128 GB | 1 | 505 | 0 | 1.38 |
| Samsung | MZ7LN512HMJP-000L7 | 512 GB | 1 | 483 | 0 | 1.32 |
| Samsung | SSD 750 EVO | 500 GB | 2 | 471 | 0 | 1.29 |
| Samsung | SSD 860 EVO mSATA | 1 TB | 3 | 446 | 0 | 1.22 |
| Samsung | SSD PM830 FDE 2... | 256 GB | 1 | 440 | 0 | 1.21 |
| Samsung | SSD 860 EVO M.2 | 2 TB | 2 | 425 | 0 | 1.17 |
| Samsung | MZ7LN256HAJQ-000H1 | 256 GB | 1 | 400 | 0 | 1.10 |
| Samsung | MZMTD256HAGM-000L1 | 256 GB | 1 | 391 | 0 | 1.07 |
| Samsung | SSD 840 EVO | 1 TB | 4 | 385 | 0 | 1.06 |
| Samsung | SSD PM830 mSATA | 128 GB | 1 | 385 | 0 | 1.06 |
| Samsung | SSD 860 EVO mSATA | 1 TB | 1 | 346 | 0 | 0.95 |
| Samsung | SSD 860 EVO | 1 TB | 6 | 320 | 0 | 0.88 |
| Samsung | SSD 850 PRO | 512 GB | 1 | 306 | 0 | 0.84 |
| Samsung | SSD 860 PRO | 256 GB | 1 | 279 | 0 | 0.76 |
| Samsung | SSD 850 EVO | 120 GB | 2 | 255 | 0 | 0.70 |
| Samsung | SSD 860 EVO | 500 GB | 9 | 244 | 0 | 0.67 |
| Samsung | SSD 860 EVO M.2 | 2 TB | 3 | 358 | 0 | 0.98 |
| Samsung | MZ7KM960HAHP-0Z005 | 960 GB | 1 | 356 | 0 | 0.98 |
| Samsung | MZ7TY256HDHP-000L7 | 256 GB | 2 | 350 | 0 | 0.96 |
| Samsung | MZ7LF192HCGS-000L1 | 192 GB | 1 | 335 | 0 | 0.92 |
| Samsung | SSD 860 PRO | 1 TB | 3 | 333 | 0 | 0.91 |
| Samsung | SSD 860 EVO | 500 GB | 29 | 317 | 0 | 0.87 |
| Samsung | MZ7TD128HAFV-000L1 | 128 GB | 1 | 306 | 0 | 0.84 |
| Samsung | MZ7TE128HMGR-00004 | 128 GB | 1 | 303 | 0 | 0.83 |
| Samsung | MZ7LN256HCHP-000L7 | 256 GB | 3 | 250 | 0 | 0.69 |
| Samsung | MZ7LN128HAHQ-000H1 | 128 GB | 1 | 239 | 0 | 0.66 |
| Samsung | SSD 840 Series | 500 GB | 1 | 238 | 0 | 0.65 |
| Samsung | MZ7LN256HMJP-000L7 | 256 GB | 1 | 234 | 0 | 0.64 |
| Samsung | MZHPV512HDGL-000L1 | 512 GB | 1 | 222 | 0 | 0.61 |
| Samsung | MZ7LN256HCHP-000L7 | 256 GB | 1 | 204 | 0 | 0.56 |
| Samsung | MZ7TY128HDHP-00000 | 128 GB | 1 | 218 | 0 | 0.60 |
| Samsung | SSD 860 EVO | 250 GB | 23 | 217 | 0 | 0.59 |
| Samsung | SSD 860 EVO mSATA | 500 GB | 6 | 203 | 0 | 0.56 |
| Samsung | SSD 860 EVO | 1 TB | 12 | 202 | 0 | 0.55 |
| Samsung | SSD 860 PRO | 512 GB | 2 | 185 | 0 | 0.51 |
| Samsung | SSD 860 PRO | 256 GB | 10 | 185 | 0 | 0.51 |
| Samsung | MZ7LH1T9HMLT0D3 | 1.9 TB | 2 | 180 | 0 | 0.50 |
| Samsung | SSD PM871b M.2 ... | 256 GB | 1 | 158 | 0 | 0.43 |
| Samsung | SSD 860 EVO M.2 | 500 GB | 1 | 144 | 0 | 0.40 |
| Samsung | SSD 860 EVO | 250 GB | 7 | 143 | 0 | 0.39 |
| Samsung | MZHPV512HDGL-00000 | 512 GB | 2 | 270 | 1 | 0.37 |
| Samsung | SSD 860 QVO | 4 TB | 2 | 135 | 0 | 0.37 |
| Samsung | MZHPV256HDGL-000L1 | 256 GB | 1 | 131 | 0 | 0.36 |
| Samsung | SSD 850 EVO M.2 | 250 GB | 2 | 130 | 0 | 0.36 |
| Samsung | SSD 860 QVO | 1 TB | 3 | 113 | 0 | 0.31 |
| Samsung | Portable SSD T5 | 500 GB | 1 | 105 | 0 | 0.29 |
| Samsung | SSD 860 QVO | 1 TB | 7 | 100 | 0 | 0.28 |
| Samsung | MZNTY256HDHP-000H1 | 256 GB | 1 | 97 | 0 | 0.27 |
| Samsung | MZMTE128HMGR-000MV | 128 GB | 1 | 94 | 0 | 0.26 |
| Samsung | SSD 860 QVO | 2 TB | 1 | 88 | 0 | 0.24 |
| Samsung | SSD 860 EVO | 4 TB | 1 | 68 | 0 | 0.19 |
| Samsung | MZMTE1T0HMJH-00000 | 1 TB | 1 | 59 | 0 | 0.16 |
| Samsung | SSD 870 QVO | 2 TB | 2 | 58 | 0 | 0.16 |
| Samsung | SSD 860 EVO M.2 | 1 TB | 2 | 53 | 0 | 0.15 |
| Samsung | SSD 650 | 120 GB | 1 | 50 | 0 | 0.14 |
| Samsung | MZ7LN256HCHP-000F0 | 256 GB | 1 | 37 | 0 | 0.10 |
| Samsung | MZYTE256HMHP-000L2 | 256 GB | 1 | 36 | 0 | 0.10 |
| Samsung | SSD PM810 2.5" 7mm | 256 GB | 1 | 362 | 24 | 0.04 |
| Samsung | MZNLN256HAJQ-000L7 | 256 GB | 1 | 14 | 0 | 0.04 |
| Samsung | SSD 860 EVO M.2 | 1 TB | 1 | 13 | 0 | 0.04 |
| Samsung | SSD 850 PRO | 1 TB | 1 | 13 | 0 | 0.04 |
| Samsung | SSD 870 EVO | 250 GB | 5 | 10 | 0 | 0.03 |
| Samsung | MZNLN256HMHQ-000 | 256 GB | 1 | 5 | 0 | 0.02 |
| Samsung | MZMTE128HMGR-000L2 | 128 GB | 1 | 4 | 0 | 0.01 |
| Samsung | MMCRE28GFMXP-MVB | 128 GB | 1 | 2 | 0 | 0.01 |
| Samsung | MZNLH512HALU-00000 | 512 GB | 1 | 1 | 0 | 0.01 |
| Samsung | MZHPV512HDGL-00000 | 512 GB | 1 | 1 | 0 | 0.00 |
| Samsung | SSD UM410 Serie... | 16 GB | 1 | 38 | 24 | 0.00 |
| Samsung | MZ5PA064HMCD-01000 | 64 GB | 1 | 7 | 4 | 0.00 |
| Samsung | SSD 860 EVO M.2 | 250 GB | 3 | 0 | 0 | 0.00 |
| Samsung | MZMTE128HMGR-00007 | 128 GB | 1 | 0 | 0 | 0.00 |
| Samsung | MZ7KH240HAHQ-00005 | 240 GB | 2 | 0 | 0 | 0.00 |
| Samsung | SSD 860 PRO | 2 TB | 1 | 0 | 0 | 0.00 |
SSD by Family
-------------
@@ -90,11 +147,11 @@ Please take all columns into account when reading the table. Pay attention on th
number of tested samples and power-on days. Simultaneous high values of both MTBF
and errors are possible if only rare drives in the subset encounter errors.
Days — avg. days per sample,
Err — avg. errors per sample,
MTBF — avg. MTBF in years per sample.
Days — avg. days per sample,
Err — avg. errors per sample,
MTBF — avg. MTBF in years per sample.
| MFG | Family | Models | Samples | Days | Err | MTBF |
|-----------|------------------------|--------|---------|-------|-------|--------|
| Samsung | Samsung based SSDs | 52 | 126 | 710 | 1 | 1.89 |
| Samsung | Unknown | 7 | 10 | 378 | 3 | 1.03 |
| Samsung | Samsung based SSDs | 101 | 387 | 680 | 4 | 1.80 |
| Samsung | Unknown | 15 | 26 | 386 | 1 | 1.05 |

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@@ -0,0 +1,118 @@
smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: SG9MSM6D024GPM00
Serial Number: --
Firmware Version: S8FM05.3
User Capacity: 22,515,204,096 bytes [22.5 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ATA8-ACS (minor revision not indicated)
SATA Version is: SATA 3.0, 6.0 Gb/s
Local Time is: Mon Jan 11 22:36:34 2021 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Disabled
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 255) seconds.
Offline data collection
capabilities: (0x1b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
No Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 2) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate PO-R-- 100 100 050 - 0
9 Power_On_Hours -O--C- 100 100 000 - 15595
12 Power_Cycle_Count -O--C- 100 100 000 - 2100
168 Unknown_Attribute -O--C- 100 100 000 - 3
192 Power-Off_Retract_Count -O--C- 100 100 000 - 19
194 Temperature_Celsius -O---K 100 100 020 - 30
170 Unknown_Attribute PO---- 100 100 010 - 37
173 Unknown_Attribute -O--C- 100 100 000 - 23265696
218 Unknown_Attribute PO-R-- 100 100 050 - 0
241 Total_LBAs_Written PO--C- 100 100 000 - 3296
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 51 Comprehensive SMART error log
0x03 GPL R/O 64 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (64 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
Selective Self-tests/Logging not supported
SCT Commands not supported
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 4 3 Transition from drive PhyRdy to drive PhyNRdy
0x000a 4 4 Device-to-host register FISes sent due to a COMRESET
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,148 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p12-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: Samsung SSD 650 120GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: FXT01B0Q
User Capacity: 120,034,123,776 bytes [120 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Mon Feb 8 05:42:08 2021 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 40) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 099 099 000 - 1221
12 Power_Cycle_Count -O--CK 099 099 000 - 526
177 Wear_Leveling_Count PO--C- 099 099 000 - 12
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 099 010 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 058 052 000 - 42
195 Hardware_ECC_Recovered -O-RC- 200 200 000 - 0
199 UDMA_CRC_Error_Count -OSRCK 100 100 000 - 0
235 Unknown_Attribute -O--C- 099 099 000 - 59
241 Total_LBAs_Written -O--CK 099 099 000 - 4300737628
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Aborted by host 70% 133 -
# 2 Short offline Completed without error 00% 96 -
# 3 Short offline Completed without error 00% 93 -
# 4 Short offline Completed without error 00% 40 -
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 55 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 56 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,168 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p13-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 750 EVO 120GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: MAT01B6Q
User Capacity: 120,034,123,776 bytes [120 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Tue Mar 2 17:32:52 2021 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 64) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 099 099 000 - 4088
12 Power_Cycle_Count -O--CK 099 099 000 - 98
177 Wear_Leveling_Count PO--C- 096 096 000 - 16
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 062 047 000 - 38
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 72
241 Total_LBAs_Written -O--CK 099 099 000 - 8419128339
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 SL VS 16 Device vendor specific log
0xa5 SL VS 16 Device vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: Active (0)
Current Temperature: 38 Celsius
Power Cycle Min/Max Temperature: ?/44 Celsius
Lifetime Min/Max Temperature: 26/53 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (53)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 2 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 2 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,167 @@
smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 750 EVO 120GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: MAT01B6Q
User Capacity: 120,034,123,776 bytes [120 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Sun Apr 4 16:44:06 2021 EDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 64) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 099 099 000 - 629
12 Power_Cycle_Count -O--CK 098 098 000 - 1552
177 Wear_Leveling_Count PO--C- 098 098 000 - 9
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 066 048 000 - 34
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 099 099 000 - 12
235 POR_Recovery_Count -O--C- 099 099 000 - 77
241 Total_LBAs_Written -O--CK 099 099 000 - 2234255080
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 SL VS 16 Device vendor specific log
0xa5 SL VS 16 Device vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: Active (0)
Current Temperature: ? Celsius
Power Cycle Min/Max Temperature: 34/34 Celsius
Lifetime Min/Max Temperature: 19/52 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (73)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 3 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 2 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,188 @@
smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.2-RELEASE-p1 amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 750 EVO 250GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: MAT01B6Q
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Wed Dec 16 21:56:49 2020 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x80) Offline data collection activity
was never started.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 133) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 094 094 000 - 29159
12 Power_Cycle_Count -O--CK 099 099 000 - 134
177 Wear_Leveling_Count PO--C- 095 095 000 - 24
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 065 051 000 - 35
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 82
241 Total_LBAs_Written -O--CK 099 099 000 - 12146625751
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 SL VS 16 Device vendor specific log
0xa5 SL VS 16 Device vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 29140 -
# 2 Short offline Completed without error 00% 29109 -
# 3 Short offline Completed without error 00% 29085 -
# 4 Extended offline Completed without error 00% 29064 -
# 5 Short offline Completed without error 00% 29061 -
# 6 Short offline Completed without error 00% 29037 -
# 7 Short offline Completed without error 00% 29013 -
# 8 Short offline Completed without error 00% 28989 -
# 9 Short offline Completed without error 00% 28965 -
#10 Short offline Completed without error 00% 28941 -
#11 Short offline Completed without error 00% 28917 -
#12 Extended offline Completed without error 00% 28896 -
#13 Short offline Completed without error 00% 28893 -
#14 Short offline Completed without error 00% 28869 -
#15 Short offline Completed without error 00% 28845 -
#16 Short offline Completed without error 00% 28821 -
#17 Short offline Completed without error 00% 28797 -
#18 Short offline Completed without error 00% 28773 -
#19 Short offline Completed without error 00% 28749 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: SCT command executing in background (5)
Current Temperature: 32 Celsius
Power Cycle Min/Max Temperature: 30/40 Celsius
Lifetime Min/Max Temperature: 0/70 Celsius
Under/Over Temperature Limit Count: 4294967295/4294901760
SMART Status: 0xffdf (Reserved)
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (19)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 5 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 5 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,171 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.2-RELEASE-p2 amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 750 EVO 250GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: MAT01B6Q
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Mon Feb 8 00:54:53 2021 GMT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 133) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 095 095 000 - 23245
12 Power_Cycle_Count -O--CK 098 098 000 - 1328
177 Wear_Leveling_Count PO--C- 059 059 000 - 207
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 074 046 000 - 26
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 36
241 Total_LBAs_Written -O--CK 099 099 000 - 60078597514
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 SL VS 16 Device vendor specific log
0xa5 SL VS 16 Device vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: Active (0)
Current Temperature: 26 Celsius
Power Cycle Min/Max Temperature: 24/40 Celsius
Lifetime Min/Max Temperature: 0/70 Celsius
Under/Over Temperature Limit Count: 4294967295/4294901760
SMART Status: 0xffff (Reserved)
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (27)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 21 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 21 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,188 @@
smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.2-RELEASE-p1 amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 750 EVO 250GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: MAT01B6Q
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Wed Dec 16 21:56:49 2020 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x80) Offline data collection activity
was never started.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 133) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 094 094 000 - 29160
12 Power_Cycle_Count -O--CK 099 099 000 - 138
177 Wear_Leveling_Count PO--C- 095 095 000 - 23
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 099 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 065 053 000 - 35
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 86
241 Total_LBAs_Written -O--CK 099 099 000 - 12052279562
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 SL VS 16 Device vendor specific log
0xa5 SL VS 16 Device vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 29140 -
# 2 Short offline Completed without error 00% 29109 -
# 3 Short offline Completed without error 00% 29085 -
# 4 Extended offline Completed without error 00% 29064 -
# 5 Short offline Completed without error 00% 29061 -
# 6 Short offline Completed without error 00% 29037 -
# 7 Short offline Completed without error 00% 29013 -
# 8 Short offline Completed without error 00% 28989 -
# 9 Short offline Completed without error 00% 28965 -
#10 Short offline Completed without error 00% 28941 -
#11 Short offline Completed without error 00% 28917 -
#12 Extended offline Completed without error 00% 28896 -
#13 Short offline Completed without error 00% 28893 -
#14 Short offline Completed without error 00% 28869 -
#15 Short offline Completed without error 00% 28845 -
#16 Short offline Completed without error 00% 28821 -
#17 Short offline Completed without error 00% 28797 -
#18 Short offline Completed without error 00% 28773 -
#19 Short offline Completed without error 00% 28749 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: SCT command executing in background (5)
Current Temperature: 32 Celsius
Power Cycle Min/Max Temperature: 30/40 Celsius
Lifetime Min/Max Temperature: 0/70 Celsius
Under/Over Temperature Limit Count: 4294442991/4294901760
SMART Status: 0xffff (Reserved)
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (19)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 5 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 5 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,171 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.2-RELEASE-p2 amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 750 EVO 250GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: MAT01B6Q
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Mon Feb 8 00:54:53 2021 GMT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 133) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 097 097 000 - 14989
12 Power_Cycle_Count -O--CK 098 098 000 - 1384
177 Wear_Leveling_Count PO--C- 054 054 000 - 231
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 073 048 000 - 27
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 34
241 Total_LBAs_Written -O--CK 099 099 000 - 58980858433
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 SL VS 16 Device vendor specific log
0xa5 SL VS 16 Device vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: Active (0)
Current Temperature: 27 Celsius
Power Cycle Min/Max Temperature: 26/40 Celsius
Lifetime Min/Max Temperature: 0/70 Celsius
Under/Over Temperature Limit Count: 4294967295/4294901760
SMART Status: 0xffff (Reserved)
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (29)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 21 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 21 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,155 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p14-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 750 EVO 250GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: MAT01B6Q
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Sun Mar 28 12:57:43 2021 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Read SCT Status failed: Input/output error
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 133) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 097 097 000 - 10354
12 Power_Cycle_Count -O--CK 099 099 000 - 814
177 Wear_Leveling_Count PO--C- 090 090 000 - 50
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 069 049 000 - 31
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 099 099 000 - 1
235 POR_Recovery_Count -O--C- 099 099 000 - 15
241 Total_LBAs_Written -O--CK 099 099 000 - 17544182890
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 SL VS 16 Device vendor specific log
0xa5 SL VS 16 Device vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Read SCT Status failed: Input/output error
Read SCT Status failed: Input/output error
SCT (Get) Error Recovery Control command failed
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 12 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 12 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,168 @@
smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.2-RELEASE-p1 amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 750 EVO 500GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: MAT01B6Q
User Capacity: 500,107,862,016 bytes [500 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Wed Dec 16 13:56:26 2020 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 265) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 099 099 000 - 2157
12 Power_Cycle_Count -O--CK 097 097 000 - 2472
177 Wear_Leveling_Count PO--C- 098 098 000 - 7
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 075 049 000 - 25
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 37
241 Total_LBAs_Written -O--CK 099 099 000 - 9144067466
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 SL VS 16 Device vendor specific log
0xa5 SL VS 16 Device vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: Active (0)
Current Temperature: 40 Celsius
Power Cycle Min/Max Temperature: 40/40 Celsius
Lifetime Min/Max Temperature: 0/70 Celsius
Under/Over Temperature Limit Count: 4294967295/4294901760
SMART Status: 0xffff (Reserved)
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (0)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 4 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 3 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,138 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p12-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG SSD 830 Series
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: CXM03B1Q
User Capacity: 128,035,676,160 bytes [128 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2 T13/2015-D revision 2
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Wed Feb 3 04:35:49 2021 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 540) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 9) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 090 090 000 - 49237
12 Power_Cycle_Count -O--CK 098 098 000 - 1224
177 Wear_Leveling_Count PO--C- 095 095 000 - 168
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 070 055 000 - 30
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 253 253 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 39
241 Total_LBAs_Written -O--CK 099 099 000 - 23177417874
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 GPL,SL R/O 1 Summary SMART error log
0x02 GPL,SL R/O 2 Comprehensive SMART error log
0x03 GPL,SL R/O 2 Ext. Comprehensive SMART error log
0x06 GPL,SL R/O 1 SMART self-test log
0x07 GPL,SL R/O 2 Extended self-test log
0x09 GPL,SL R/W 1 Selective self-test log
0x10 GPL,SL R/O 1 NCQ Command Error log
0x11 GPL,SL R/O 1 SATA Phy Event Counters log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (2 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (2 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 49152 R_ERR response for data FIS
0x0003 2 53248 R_ERR response for device-to-host data FIS
0x0004 2 57344 R_ERR response for host-to-device data FIS
0x0005 2 7952 R_ERR response for non-data FIS
0x0006 2 2562 R_ERR response for device-to-host non-data FIS
0x0007 2 4096 R_ERR response for host-to-device non-data FIS
0x0008 2 7952 Device-to-host non-data FIS retries
0x0009 2 7953 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 366 Device-to-host register FISes sent due to a COMRESET
0x000b 2 6145 CRC errors within host-to-device FIS
0x000d 2 7953 Non-CRC errors within host-to-device FIS
0x000f 2 8176 R_ERR response for host-to-device data FIS, CRC
0x0010 2 15 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 49153 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 12112 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,137 @@
smartctl 7.0 2018-12-30 r4883 [FreeBSD 12.1-RELEASE-p7 amd64] (local build)
Copyright (C) 2002-18, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG SSD 830 Series
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: CXM03B1Q
User Capacity: 128,035,676,160 bytes [128 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2 T13/2015-D revision 2
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sat Nov 14 12:57:25 2020 PST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 540) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 9) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 088 088 000 - 57670
12 Power_Cycle_Count -O--CK 099 099 000 - 174
177 Wear_Leveling_Count PO--C- 051 051 000 - 1777
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 074 045 000 - 26
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 253 253 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 100
241 Total_LBAs_Written -O--CK 099 099 000 - 190496617657
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 GPL,SL R/O 1 Summary SMART error log
0x02 GPL,SL R/O 2 Comprehensive SMART error log
0x03 GPL,SL R/O 2 Ext. Comprehensive SMART error log
0x06 GPL,SL R/O 1 SMART self-test log
0x07 GPL,SL R/O 2 Extended self-test log
0x09 GPL,SL R/W 1 Selective self-test log
0x10 GPL,SL R/O 1 NCQ Command Error log
0x11 GPL,SL R/O 1 SATA Phy Event Counters log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (2 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (2 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 49152 R_ERR response for data FIS
0x0003 2 53248 R_ERR response for device-to-host data FIS
0x0004 2 57344 R_ERR response for host-to-device data FIS
0x0005 2 7952 R_ERR response for non-data FIS
0x0006 2 2562 R_ERR response for device-to-host non-data FIS
0x0007 2 4096 R_ERR response for host-to-device non-data FIS
0x0008 2 7952 Device-to-host non-data FIS retries
0x0009 2 7953 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 1242 Device-to-host register FISes sent due to a COMRESET
0x000b 2 6145 CRC errors within host-to-device FIS
0x000d 2 7953 Non-CRC errors within host-to-device FIS
0x000f 2 8176 R_ERR response for host-to-device data FIS, CRC
0x0010 2 15 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 49153 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 12112 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,139 @@
smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.2-RELEASE amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG SSD 830 Series
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: CXM03B1Q
User Capacity: 128,035,676,160 bytes [128 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2 T13/2015-D revision 2
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Mon Dec 7 00:59:04 2020 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 540) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 9) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 099 099 000 - 244
12 Power_Cycle_Count -O--CK 099 099 000 - 432
177 Wear_Leveling_Count PO--C- 099 099 000 - 24
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 072 054 000 - 28
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 253 253 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 210
241 Total_LBAs_Written -O--CK 099 099 000 - 3117512018
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 GPL,SL R/O 1 Summary SMART error log
0x02 GPL,SL R/O 2 Comprehensive SMART error log
0x03 GPL,SL R/O 2 Ext. Comprehensive SMART error log
0x06 GPL,SL R/O 1 SMART self-test log
0x07 GPL,SL R/O 2 Extended self-test log
0x09 GPL,SL R/W 1 Selective self-test log
0x10 GPL,SL R/O 1 NCQ Command Error log
0x11 GPL,SL R/O 1 SATA Phy Event Counters log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (2 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (2 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 49152 R_ERR response for data FIS
0x0003 2 53248 R_ERR response for device-to-host data FIS
0x0004 2 57344 R_ERR response for host-to-device data FIS
0x0005 2 7952 R_ERR response for non-data FIS
0x0006 2 2562 R_ERR response for device-to-host non-data FIS
0x0007 2 4096 R_ERR response for host-to-device non-data FIS
0x0008 2 7952 Device-to-host non-data FIS retries
0x0009 2 7953 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 1426 Device-to-host register FISes sent due to a COMRESET
0x000b 2 6145 CRC errors within host-to-device FIS
0x000d 2 7953 Non-CRC errors within host-to-device FIS
0x000f 2 8176 R_ERR response for host-to-device data FIS, CRC
0x0010 2 15 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 49153 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 12112 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,138 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p12-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG SSD 830 Series
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: CXM03B1Q
User Capacity: 128,035,676,160 bytes [128 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2 T13/2015-D revision 2
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Mon Jan 25 06:26:10 2021 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 540) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 9) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 096 096 000 - 18835
12 Power_Cycle_Count -O--CK 099 099 000 - 550
177 Wear_Leveling_Count PO--C- 094 094 000 - 203
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 063 044 000 - 37
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 001 001 000 - 414695
235 POR_Recovery_Count -O--C- 099 099 000 - 62
241 Total_LBAs_Written -O--CK 099 099 000 - 14018591409
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 GPL,SL R/O 1 Summary SMART error log
0x02 GPL,SL R/O 2 Comprehensive SMART error log
0x03 GPL,SL R/O 2 Ext. Comprehensive SMART error log
0x06 GPL,SL R/O 1 SMART self-test log
0x07 GPL,SL R/O 2 Extended self-test log
0x09 GPL,SL R/W 1 Selective self-test log
0x10 GPL,SL R/O 1 NCQ Command Error log
0x11 GPL,SL R/O 1 SATA Phy Event Counters log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (2 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (2 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 21479 Command failed due to ICRC error
0x0002 2 49152 R_ERR response for data FIS
0x0003 2 53248 R_ERR response for device-to-host data FIS
0x0004 2 57344 R_ERR response for host-to-device data FIS
0x0005 2 7952 R_ERR response for non-data FIS
0x0006 2 2562 R_ERR response for device-to-host non-data FIS
0x0007 2 4096 R_ERR response for host-to-device non-data FIS
0x0008 2 7952 Device-to-host non-data FIS retries
0x0009 2 7953 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 1103 Device-to-host register FISes sent due to a COMRESET
0x000b 2 6145 CRC errors within host-to-device FIS
0x000d 2 7953 Non-CRC errors within host-to-device FIS
0x000f 2 8176 R_ERR response for host-to-device data FIS, CRC
0x0010 2 15 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 49153 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 12112 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,139 @@
smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG SSD 830 Series
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: CXM03B1Q
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2 T13/2015-D revision 2
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sat Feb 13 21:56:42 2021 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 1020) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 17) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 097 097 000 - 11935
12 Power_Cycle_Count -O--CK 095 095 000 - 5046
177 Wear_Leveling_Count PO--C- 096 096 000 - 126
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 075 056 000 - 25
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 253 253 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 549
241 Total_LBAs_Written -O--CK 099 099 000 - 20505226755
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 GPL,SL R/O 1 Summary SMART error log
0x02 GPL,SL R/O 2 Comprehensive SMART error log
0x03 GPL,SL R/O 2 Ext. Comprehensive SMART error log
0x06 GPL,SL R/O 1 SMART self-test log
0x07 GPL,SL R/O 2 Extended self-test log
0x09 GPL,SL R/W 1 Selective self-test log
0x10 GPL,SL R/O 1 NCQ Command Error log
0x11 GPL,SL R/O 1 SATA Phy Event Counters log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (2 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (2 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 49152 R_ERR response for data FIS
0x0003 2 53248 R_ERR response for device-to-host data FIS
0x0004 2 57344 R_ERR response for host-to-device data FIS
0x0005 2 7952 R_ERR response for non-data FIS
0x0006 2 2562 R_ERR response for device-to-host non-data FIS
0x0007 2 4096 R_ERR response for host-to-device non-data FIS
0x0008 2 7952 Device-to-host non-data FIS retries
0x0009 2 7953 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 46222 Device-to-host register FISes sent due to a COMRESET
0x000b 2 6145 CRC errors within host-to-device FIS
0x000d 2 7953 Non-CRC errors within host-to-device FIS
0x000f 2 8176 R_ERR response for host-to-device data FIS, CRC
0x0010 2 15 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 49153 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 12112 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,140 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p12-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG SSD 830 Series
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: CXM03B1Q
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2 T13/2015-D revision 2
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Wed Feb 3 21:52:53 2021 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 1020) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 17) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 095 095 000 - 23179
12 Power_Cycle_Count -O--CK 090 090 000 - 9548
177 Wear_Leveling_Count PO--C- 090 090 000 - 333
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 075 056 000 - 25
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 253 253 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 581
241 Total_LBAs_Written -O--CK 099 099 000 - 102650678412
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 GPL,SL R/O 1 Summary SMART error log
0x02 GPL,SL R/O 2 Comprehensive SMART error log
0x03 GPL,SL R/O 2 Ext. Comprehensive SMART error log
0x06 GPL,SL R/O 1 SMART self-test log
0x07 GPL,SL R/O 2 Extended self-test log
0x09 GPL,SL R/W 1 Selective self-test log
0x10 GPL,SL R/O 1 NCQ Command Error log
0x11 GPL,SL R/O 1 SATA Phy Event Counters log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (2 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (2 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 21950 -
# 2 Short offline Completed without error 00% 10792 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 49152 R_ERR response for data FIS
0x0003 2 53248 R_ERR response for device-to-host data FIS
0x0004 2 57344 R_ERR response for host-to-device data FIS
0x0005 2 7952 R_ERR response for non-data FIS
0x0006 2 2562 R_ERR response for device-to-host non-data FIS
0x0007 2 4096 R_ERR response for host-to-device non-data FIS
0x0008 2 7952 Device-to-host non-data FIS retries
0x0009 2 7953 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 16974 Device-to-host register FISes sent due to a COMRESET
0x000b 2 6145 CRC errors within host-to-device FIS
0x000d 2 7953 Non-CRC errors within host-to-device FIS
0x000f 2 8176 R_ERR response for host-to-device data FIS, CRC
0x0010 2 15 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 49153 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 12112 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,139 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.2-RELEASE amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG SSD 830 Series
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: CXM03B1Q
User Capacity: 64,023,257,088 bytes [64.0 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2 T13/2015-D revision 2
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Tue Mar 9 17:34:19 2021 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 300) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 5) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 093 093 000 - 31139
12 Power_Cycle_Count -O--CK 099 099 000 - 992
177 Wear_Leveling_Count PO--C- 093 093 000 - 241
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 072 059 000 - 28
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 253 253 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 65
241 Total_LBAs_Written -O--CK 099 099 000 - 7429633179
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 GPL,SL R/O 1 Summary SMART error log
0x02 GPL,SL R/O 2 Comprehensive SMART error log
0x03 GPL,SL R/O 2 Ext. Comprehensive SMART error log
0x06 GPL,SL R/O 1 SMART self-test log
0x07 GPL,SL R/O 2 Extended self-test log
0x09 GPL,SL R/W 1 Selective self-test log
0x10 GPL,SL R/O 1 NCQ Command Error log
0x11 GPL,SL R/O 1 SATA Phy Event Counters log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (2 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (2 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 30337 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 49152 R_ERR response for data FIS
0x0003 2 53248 R_ERR response for device-to-host data FIS
0x0004 2 57344 R_ERR response for host-to-device data FIS
0x0005 2 7952 R_ERR response for non-data FIS
0x0006 2 2562 R_ERR response for device-to-host non-data FIS
0x0007 2 4096 R_ERR response for host-to-device non-data FIS
0x0008 2 7952 Device-to-host non-data FIS retries
0x0009 2 7953 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 2321 Device-to-host register FISes sent due to a COMRESET
0x000b 2 6145 CRC errors within host-to-device FIS
0x000d 2 7953 Non-CRC errors within host-to-device FIS
0x000f 2 8176 R_ERR response for host-to-device data FIS, CRC
0x0010 2 15 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 49153 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 12112 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,138 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p13-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG SSD 830 Series
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: CXM03B1Q
User Capacity: 64,023,257,088 bytes [64.0 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2 T13/2015-D revision 2
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Wed Feb 24 22:34:39 2021 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 300) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 5) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 098 098 000 - 7854
12 Power_Cycle_Count -O--CK 097 097 000 - 2512
177 Wear_Leveling_Count PO--C- 094 094 000 - 215
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 074 054 000 - 26
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 097 097 000 - 2139
235 POR_Recovery_Count -O--C- 099 099 000 - 1024
241 Total_LBAs_Written -O--CK 099 099 000 - 7710696555
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 GPL,SL R/O 1 Summary SMART error log
0x02 GPL,SL R/O 2 Comprehensive SMART error log
0x03 GPL,SL R/O 2 Ext. Comprehensive SMART error log
0x06 GPL,SL R/O 1 SMART self-test log
0x07 GPL,SL R/O 2 Extended self-test log
0x09 GPL,SL R/W 1 Selective self-test log
0x10 GPL,SL R/O 1 NCQ Command Error log
0x11 GPL,SL R/O 1 SATA Phy Event Counters log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (2 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (2 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 2139 Command failed due to ICRC error
0x0002 2 49152 R_ERR response for data FIS
0x0003 2 53248 R_ERR response for device-to-host data FIS
0x0004 2 57344 R_ERR response for host-to-device data FIS
0x0005 2 7952 R_ERR response for non-data FIS
0x0006 2 2562 R_ERR response for device-to-host non-data FIS
0x0007 2 4096 R_ERR response for host-to-device non-data FIS
0x0008 2 7952 Device-to-host non-data FIS retries
0x0009 2 7953 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 10121 Device-to-host register FISes sent due to a COMRESET
0x000b 2 6145 CRC errors within host-to-device FIS
0x000d 2 7953 Non-CRC errors within host-to-device FIS
0x000f 2 8176 R_ERR response for host-to-device data FIS, CRC
0x0010 2 15 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 49153 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 12112 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,167 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p14-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 840 EVO 120GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT0BB0Q
User Capacity: 120,034,123,776 bytes [120 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Mon Mar 15 11:51:41 2021 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 4200) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 70) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 093 093 000 - 33976
12 Power_Cycle_Count -O--CK 099 099 000 - 508
177 Wear_Leveling_Count PO--C- 086 086 000 - 167
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 064 041 000 - 36
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 244
241 Total_LBAs_Written -O--CK 099 099 000 - 26944742271
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 16 Device vendor specific log
0xce GPL,SL VS 16 Device vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 0 -
# 2 Extended offline Completed without error 00% 0 -
# 3 Short offline Completed without error 00% 0 -
# 4 Short offline Aborted by host 00% 0 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 36 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/132272
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (4)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 2 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 2 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,163 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p13-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 840 EVO 120GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT0AB0Q
User Capacity: 120,034,123,776 bytes [120 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sun Feb 14 16:11:51 2021 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 4200) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 70) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 084 084 010 - 347
9 Power_On_Hours -O--CK 093 093 000 - 30723
12 Power_Cycle_Count -O--CK 064 064 000 - 36165
177 Wear_Leveling_Count PO--C- 001 001 000 - 1339
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 084 084 010 - 347
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 084 084 010 - 347
187 Uncorrectable_Error_Cnt -O--CK 099 099 000 - 1
190 Airflow_Temperature_Cel -O--CK 059 040 000 - 41
195 ECC_Error_Rate -O-RC- 199 199 000 - 1
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 36106
241 Total_LBAs_Written -O--CK 099 099 000 - 173366669564
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 16 Device vendor specific log
0xce GPL,SL VS 16 Device vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 41 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/184964
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (103)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 2 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 2 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

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@@ -0,0 +1,166 @@
smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 840 EVO 120GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT0DB6Q
User Capacity: 120,034,123,776 bytes [120 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sun Jan 3 11:30:59 2021 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 4200) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 70) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 096 096 000 - 17489
12 Power_Cycle_Count -O--CK 093 093 000 - 6324
177 Wear_Leveling_Count PO--C- 083 083 000 - 204
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 072 041 000 - 28
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 099 099 000 - 5
235 POR_Recovery_Count -O--C- 099 099 000 - 429
241 Total_LBAs_Written -O--CK 099 099 000 - 46823315743
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 16 Device vendor specific log
0xce GPL,SL VS 16 Device vendor specific log
0xde SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 28 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/109212
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (5)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 422 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 7 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

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smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.2-RELEASE-p1 amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 840 EVO 120GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT0BB6Q
User Capacity: 120,034,123,776 bytes [120 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Mon Jan 11 21:45:19 2021 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 4200) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 70) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 086 086 000 - 68867
12 Power_Cycle_Count -O--CK 099 099 000 - 399
177 Wear_Leveling_Count PO--C- 099 099 000 - 3
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 061 055 000 - 39
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 106
241 Total_LBAs_Written -O--CK 099 099 000 - 1086910924
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 16 Device vendor specific log
0xce GPL,SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 39 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/276968
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (18)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 3 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 3 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

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@@ -0,0 +1,164 @@
smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 840 EVO 120GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT0BB6Q
User Capacity: 120,034,123,776 bytes [120 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Fri Feb 12 15:39:28 2021 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 4200) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 70) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 099 099 000 - 4945
12 Power_Cycle_Count -O--CK 097 097 000 - 2336
177 Wear_Leveling_Count PO--C- 097 097 000 - 27
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 067 043 000 - 33
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 84
241 Total_LBAs_Written -O--CK 099 099 000 - 7601029704
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 16 Device vendor specific log
0xce GPL,SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 33 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/29478
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (3)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 6 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 6 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

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@@ -0,0 +1,168 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p15-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 840 EVO 120GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT0DB6Q
User Capacity: 120,034,123,776 bytes [120 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Apr 13 15:30:06 2021 EDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
See vendor-specific Attribute list for marginal Attributes.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 4200) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 70) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 093 093 000 - 32516
12 Power_Cycle_Count -O--CK 098 098 000 - 1633
177 Wear_Leveling_Count PO--C- 091 091 000 - 108
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 001 010 Past 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 065 046 000 - 35
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 099 099 000 - 492
235 POR_Recovery_Count -O--C- 099 099 000 - 918
241 Total_LBAs_Written -O--CK 099 099 000 - 42939237181
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 16 Device vendor specific log
0xce GPL,SL VS 16 Device vendor specific log
0xde SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 35 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/137666
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (22)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 35 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 35 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,165 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p14-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 840 EVO 120GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT0BB6Q
User Capacity: 120,034,123,776 bytes [120 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Fri Mar 26 21:50:25 2021 IST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 4200) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 70) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 090 090 000 - 47822
12 Power_Cycle_Count -O--CK 099 099 000 - 122
177 Wear_Leveling_Count PO--C- 099 099 000 - 3
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 071 060 000 - 29
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 108
241 Total_LBAs_Written -O--CK 099 099 000 - 2076318289
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 16 Device vendor specific log
0xce GPL,SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 29 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/165236
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (24)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 3 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 3 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,167 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p12-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 840 EVO 120GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT0CB6Q
User Capacity: 120,034,123,776 bytes [120 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Wed Feb 3 15:14:26 2021 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 4200) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 70) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 094 094 000 - 26139
12 Power_Cycle_Count -O--CK 099 099 000 - 684
177 Wear_Leveling_Count PO--C- 086 086 000 - 163
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 068 051 000 - 32
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 286
241 Total_LBAs_Written -O--CK 099 099 000 - 22171583165
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 16 Device vendor specific log
0xce GPL,SL VS 16 Device vendor specific log
0xde SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 406 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 32 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/135346
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (5)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 23 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 23 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,168 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p15-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 840 EVO 120GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT0BB6Q
User Capacity: 120,034,123,776 bytes [120 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Mon Apr 12 20:14:50 2021 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 4200) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 70) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 092 092 000 - 37294
12 Power_Cycle_Count -O--CK 098 098 000 - 1456
177 Wear_Leveling_Count PO--C- 095 095 000 - 60
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 055 052 000 - 45
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 94
241 Total_LBAs_Written -O--CK 099 099 000 - 45349653995
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 16 Device vendor specific log
0xce GPL,SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 66 -
# 2 Short offline Aborted by host 00% 781 -
# 3 Short offline Completed without error 00% 1 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 45 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/159317
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (51)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 8 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 8 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,171 @@
smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 840 EVO 1TB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT0DB6Q
User Capacity: 1,000,204,886,016 bytes [1.00 TB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sat Feb 13 21:56:42 2021 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (15000) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 250) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 098 098 000 - 6703
12 Power_Cycle_Count -O--CK 097 097 000 - 2191
177 Wear_Leveling_Count PO--C- 099 099 000 - 7
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 075 049 000 - 25
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 099 099 000 - 2
235 POR_Recovery_Count -O--C- 099 099 000 - 444
241 Total_LBAs_Written -O--CK 099 099 000 - 15455675613
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 16 Device vendor specific log
0xce GPL,SL VS 16 Device vendor specific log
0xde SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 1 -
# 2 Short offline Completed without error 00% 0 -
# 3 Short offline Completed without error 00% 0 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 25 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/40057
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (3)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 3 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 3 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,167 @@
smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 840 EVO 1TB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT0BB6Q
User Capacity: 1,000,204,886,016 bytes [1.00 TB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Fri Feb 12 15:10:14 2021 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (15000) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 250) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 097 097 000 - 10285
12 Power_Cycle_Count -O--CK 093 093 000 - 6177
177 Wear_Leveling_Count PO--C- 098 098 000 - 14
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 069 042 000 - 31
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 099 099 000 - 2
235 POR_Recovery_Count -O--C- 099 099 000 - 4306
241 Total_LBAs_Written -O--CK 099 099 000 - 26024793202
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 16 Device vendor specific log
0xce GPL,SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 0 -
# 2 Short offline Completed without error 00% 0 -
# 3 Short offline Completed without error 00% 0 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 31 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/61510
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (1)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 4 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 3 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,168 @@
smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 840 EVO 1TB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT0DB6Q
User Capacity: 1,000,204,886,016 bytes [1.00 TB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Mon Mar 15 17:11:31 2021 EDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (15000) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 250) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 099 099 000 - 2596
12 Power_Cycle_Count -O--CK 096 096 000 - 3758
177 Wear_Leveling_Count PO--C- 099 099 000 - 6
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 077 056 000 - 23
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 099 099 000 - 1
235 POR_Recovery_Count -O--C- 099 099 000 - 1558
241 Total_LBAs_Written -O--CK 099 099 000 - 14209359448
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 16 Device vendor specific log
0xce GPL,SL VS 16 Device vendor specific log
0xde SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 23 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/15345
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (0)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 3 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 3 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,175 @@
smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: Samsung SSD 840 EVO 250GB mSATA
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT42B6Q
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Tue Feb 9 16:56:45 2021 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 16) The self-test routine was aborted by
the host.
Total time to complete Offline
data collection: ( 4800) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 80) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 094 094 000 - 27158
12 Power_Cycle_Count -O--CK 099 099 000 - 213
177 Wear_Leveling_Count PO--C- 094 094 000 - 70
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 065 043 000 - 35
195 Hardware_ECC_Recovered -O-RC- 200 200 000 - 0
199 UDMA_CRC_Error_Count -OSRCK 099 099 000 - 200
235 Unknown_Attribute -O--C- 099 099 000 - 142
241 Total_LBAs_Written -O--CK 099 099 000 - 27165370488
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 16 Device vendor specific log
0xce GPL,SL VS 16 Device vendor specific log
0xde SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Aborted by host 00% 13 -
# 2 Short offline Aborted by host 00% 13 -
# 3 Short offline Aborted by host 00% 13 -
# 4 Short offline Aborted by host 00% 0 -
# 5 Short offline Aborted by host 00% 0 -
# 6 Short offline Aborted by host 00% 0 -
# 7 Short offline Aborted by host 00% 7 -
# 8 Short offline Aborted by host 00% 7 -
# 9 Short offline Aborted by host 00% 0 -
#10 Short offline Aborted by host 00% 0 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 35 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/134321
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (2)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 4 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 4 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,169 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p15-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 840 EVO 250GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT0DB6Q
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sat Apr 3 08:17:23 2021 CDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
See vendor-specific Attribute list for marginal Attributes.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 4800) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 80) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 001 010 Past 0
9 Power_On_Hours -O--CK 094 094 000 - 28251
12 Power_Cycle_Count -O--CK 097 097 000 - 2618
177 Wear_Leveling_Count PO--C- 068 068 000 - 378
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 001 010 Past 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 001 010 Past 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 072 039 000 - 28
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 1029
241 Total_LBAs_Written -O--CK 099 099 000 - 183937021946
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 16 Device vendor specific log
0xce GPL,SL VS 16 Device vendor specific log
0xde SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 2263 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 28 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/154628
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (10)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 5 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 5 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,165 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p13-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 840 EVO 250GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT0BB6Q
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Fri Feb 26 17:58:29 2021 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 4800) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 80) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 097 097 000 - 13687
12 Power_Cycle_Count -O--CK 098 098 000 - 1528
177 Wear_Leveling_Count PO--C- 097 097 000 - 27
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 068 057 000 - 32
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 83
241 Total_LBAs_Written -O--CK 099 099 000 - 21076309248
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 16 Device vendor specific log
0xce GPL,SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 32 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/69317
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (11)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 3 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 3 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,165 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 13.0-RELEASE amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 840 EVO 250GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT0BB0Q
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue May 11 16:33:52 2021 BST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 4800) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 80) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 095 095 000 - 22092
12 Power_Cycle_Count -O--CK 094 094 000 - 5958
177 Wear_Leveling_Count PO--C- 092 092 000 - 93
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 071 048 000 - 29
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 2593
241 Total_LBAs_Written -O--CK 099 099 000 - 39665657336
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 16 Device vendor specific log
0xce GPL,SL VS 16 Device vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 29 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/169934
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (54)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 15 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 15 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,169 @@
smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.2-RELEASE amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 840 EVO 250GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT0DB6Q
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Mar 23 05:01:13 2021 EDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 4800) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 80) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 099 099 000 - 1673
12 Power_Cycle_Count -O--CK 096 096 000 - 3765
177 Wear_Leveling_Count PO--C- 098 098 000 - 13
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 073 041 000 - 27
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 561
241 Total_LBAs_Written -O--CK 099 099 000 - 9127243049
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 16 Device vendor specific log
0xce GPL,SL VS 16 Device vendor specific log
0xde SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 0 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 27 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/10003
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (8)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 22 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 22 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,167 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p13-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 840 EVO 250GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT0DB6Q
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Feb 23 05:53:14 2021 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 4800) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 80) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 098 098 000 - 9536
12 Power_Cycle_Count -O--CK 098 098 000 - 1649
177 Wear_Leveling_Count PO--C- 094 094 000 - 62
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 072 044 000 - 28
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 474
241 Total_LBAs_Written -O--CK 099 099 000 - 31949431535
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 16 Device vendor specific log
0xce GPL,SL VS 16 Device vendor specific log
0xde SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 28 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/57192
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (4)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 3 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 3 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,166 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p13-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 840 EVO 250GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT0CB6Q
User Capacity: 250,058,268,160 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sun Feb 21 15:06:45 2021 AEDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 4800) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 80) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 095 095 000 - 20919
12 Power_Cycle_Count -O--CK 097 097 000 - 2394
177 Wear_Leveling_Count PO--C- 095 095 000 - 49
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 068 041 000 - 32
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 387
241 Total_LBAs_Written -O--CK 099 099 000 - 30815717669
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 16 Device vendor specific log
0xce GPL,SL VS 16 Device vendor specific log
0xde SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 32 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/104009
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (19)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 28 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 28 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,164 @@
smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 840 EVO 250GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT0BB6Q
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Mon May 17 07:03:56 2021 EDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 4800) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 80) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 097 097 000 - 14910
12 Power_Cycle_Count -O--CK 081 081 000 - 18607
177 Wear_Leveling_Count PO--C- 097 097 000 - 34
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 076 048 000 - 24
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 17386
241 Total_LBAs_Written -O--CK 099 099 000 - 21687706795
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 16 Device vendor specific log
0xce GPL,SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 24 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/89428
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (9)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 4 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 4 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,174 @@
smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 840 EVO 250GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT0DB6Q
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Feb 16 05:02:35 2021 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 4800) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 80) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 098 098 000 - 7735
12 Power_Cycle_Count -O--CK 093 093 000 - 6397
177 Wear_Leveling_Count PO--C- 092 092 000 - 87
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 072 053 000 - 28
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 099 099 000 - 5
235 POR_Recovery_Count -O--C- 099 099 000 - 926
241 Total_LBAs_Written -O--CK 099 099 000 - 58606747884
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 16 Device vendor specific log
0xce GPL,SL VS 16 Device vendor specific log
0xde SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 0 -
# 2 Short offline Completed without error 00% 0 -
# 3 Short offline Completed without error 00% 0 -
# 4 Short offline Completed without error 00% 0 -
# 5 Short offline Completed without error 00% 1 -
# 6 Short offline Completed without error 00% 0 -
# 7 Short offline Completed without error 00% 0 -
# 8 Short offline Completed without error 00% 0 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 28 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/45855
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (3)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 5 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 5 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,162 @@
smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE-p6 amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 840 EVO 250GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT0BB0Q
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Mon Dec 14 11:11:08 2020 MSK
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 4800) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 80) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 098 098 000 - 8274
12 Power_Cycle_Count -O--CK 094 094 000 - 5226
177 Wear_Leveling_Count PO--C- 098 098 000 - 17
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 069 051 000 - 31
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 134
241 Total_LBAs_Written -O--CK 099 099 000 - 14257710946
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 16 Device vendor specific log
0xce GPL,SL VS 16 Device vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 31 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/49652
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (1)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 6 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 4 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,91 @@
smartctl 7.1 2019-12-30 r5022 [x86_64-unknown-openbsd6.8] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 840 EVO 250GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT0AB0Q
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Mon Nov 16 07:58:33 2020 AEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART Status not supported: Incomplete response, ATA output registers missing
SMART overall-health self-assessment test result: PASSED
Warning: This result is based on an Attribute check.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 4800) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 80) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0
9 Power_On_Hours 0x0032 098 098 000 Old_age Always - 7586
12 Power_Cycle_Count 0x0032 093 093 000 Old_age Always - 6673
177 Wear_Leveling_Count 0x0013 072 072 000 Pre-fail Always - 331
179 Used_Rsvd_Blk_Cnt_Tot 0x0013 100 100 010 Pre-fail Always - 0
181 Program_Fail_Cnt_Total 0x0032 100 100 010 Old_age Always - 0
182 Erase_Fail_Count_Total 0x0032 100 100 010 Old_age Always - 0
183 Runtime_Bad_Block 0x0013 100 100 010 Pre-fail Always - 0
187 Uncorrectable_Error_Cnt 0x0032 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0032 068 034 000 Old_age Always - 32
195 ECC_Error_Rate 0x001a 200 200 000 Old_age Always - 0
199 CRC_Error_Count 0x003e 099 099 000 Old_age Always - 1
235 POR_Recovery_Count 0x0012 099 099 000 Old_age Always - 167
241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 30810320434
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

View File

@@ -0,0 +1,168 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p15-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 840 EVO 250GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT0DB6Q
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Fri Apr 9 16:41:03 2021 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
See vendor-specific Attribute list for marginal Attributes.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 4800) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 80) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 001 010 Past 0
9 Power_On_Hours -O--CK 093 093 000 - 32462
12 Power_Cycle_Count -O--CK 095 095 000 - 4865
177 Wear_Leveling_Count PO--C- 088 088 000 - 137
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 001 010 Past 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 001 010 Past 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 059 046 000 - 41
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 450
241 Total_LBAs_Written -O--CK 099 099 000 - 106001538189
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 16 Device vendor specific log
0xce GPL,SL VS 16 Device vendor specific log
0xde SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 41 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/194186
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (3)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 5 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 5 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,165 @@
smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.2-RELEASE amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 840 EVO 250GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT0CB6Q
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Wed Dec 16 18:43:20 2020 MST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 4800) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 80) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 090 090 000 - 47017
12 Power_Cycle_Count -O--CK 099 099 000 - 110
177 Wear_Leveling_Count PO--C- 099 099 000 - 8
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 075 057 000 - 25
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 48
241 Total_LBAs_Written -O--CK 099 099 000 - 8559206386
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 16 Device vendor specific log
0xce GPL,SL VS 16 Device vendor specific log
0xde SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 25 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/203351
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (32)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 23 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 23 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,167 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 13.0-STABLE amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 840 EVO 250GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT0BB6Q
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Mon May 10 08:46:19 2021 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x05) Offline data collection activity
was aborted by an interrupting command from host.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 9) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 4800) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 80) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 097 097 000 - 14950
12 Power_Cycle_Count -O--CK 097 097 000 - 2140
177 Wear_Leveling_Count PO--C- 094 094 000 - 66
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 074 035 000 - 26
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 315
241 Total_LBAs_Written -O--CK 099 099 000 - 43028265965
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 16 Device vendor specific log
0xce GPL,SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Offline Completed without error 50% 0 -
# 2 Offline Completed without error 50% 0 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: SMART Off-line Data Collection executing in background (4)
Current Temperature: 26 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/89531
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (12)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 29 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 24 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,166 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.2-RELEASE amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 840 EVO 500GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT0CB6Q
User Capacity: 500,107,862,016 bytes [500 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Wed Mar 17 23:16:48 2021 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 6600) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 110) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 085 085 000 - 75627
12 Power_Cycle_Count -O--CK 099 099 000 - 65
177 Wear_Leveling_Count PO--C- 066 066 000 - 401
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 075 055 000 - 25
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 099 099 000 - 2
235 POR_Recovery_Count -O--C- 099 099 000 - 40
241 Total_LBAs_Written -O--CK 099 099 000 - 397596447880
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 16 Device vendor specific log
0xce GPL,SL VS 16 Device vendor specific log
0xde SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 25 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/332095
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (122)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 53 R_ERR response for non-data FIS
0x0006 2 53 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 5 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 3 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 53 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 53 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,165 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.2-RELEASE-p1 amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 840 EVO 500GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT0BB0Q
User Capacity: 500,107,862,016 bytes [500 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Jan 19 19:54:06 2021 PST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 6600) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 110) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 097 097 000 - 10219
12 Power_Cycle_Count -O--CK 095 095 000 - 4655
177 Wear_Leveling_Count PO--C- 099 099 000 - 12
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 063 043 000 - 37
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 120
241 Total_LBAs_Written -O--CK 099 099 000 - 13370415052
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 16 Device vendor specific log
0xce GPL,SL VS 16 Device vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 37 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/60963
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (0)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 3 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 2 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,165 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.2-RELEASE-p1 amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 840 EVO 500GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT0BB6Q
User Capacity: 500,107,862,016 bytes [500 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sun Feb 7 10:09:26 2021 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 6600) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 110) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 099 099 010 - 4
9 Power_On_Hours -O--CK 097 097 000 - 13272
12 Power_Cycle_Count -O--CK 098 098 000 - 1811
177 Wear_Leveling_Count PO--C- 099 099 000 - 7
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 099 099 010 - 4
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 099 099 010 - 4
187 Uncorrectable_Error_Cnt -O--CK 099 099 000 - 831
190 Airflow_Temperature_Cel -O--CK 064 049 000 - 36
195 ECC_Error_Rate -O-RC- 199 199 000 - 831
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 298
241 Total_LBAs_Written -O--CK 099 099 000 - 3245765490
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 16 Device vendor specific log
0xce GPL,SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 36 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/79560
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (11)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 34 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 32 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,166 @@
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.2-RELEASE-p1 amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 840 EVO 500GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EXT0BB0Q
User Capacity: 500,107,862,016 bytes [500 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Jan 19 19:54:06 2021 PST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 6600) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 110) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 097 097 000 - 10223
12 Power_Cycle_Count -O--CK 095 095 000 - 4655
177 Wear_Leveling_Count PO--C- 098 098 000 - 14
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 058 045 000 - 42
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 120
241 Total_LBAs_Written -O--CK 099 099 000 - 18201033379
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 16 Device vendor specific log
0xce GPL,SL VS 16 Device vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 2 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 42 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/60953
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (0)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 3 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 3 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,163 @@
smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE-p10 amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 840 PRO Series
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: DXM05B0Q
User Capacity: 128,035,676,160 bytes [128 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Fri Nov 6 15:28:41 2020 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 15) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 090 090 000 - 49338
12 Power_Cycle_Count -O--CK 099 099 000 - 142
177 Wear_Leveling_Count PO--C- 094 094 000 - 191
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 066 058 000 - 34
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 121
241 Total_LBAs_Written -O--CK 099 099 000 - 28447165877
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 GPL,SL R/O 1 Summary SMART error log
0x02 GPL,SL R/O 1 Comprehensive SMART error log
0x03 GPL,SL R/O 1 Ext. Comprehensive SMART error log
0x06 GPL,SL R/O 1 SMART self-test log
0x07 GPL,SL R/O 1 Extended self-test log
0x09 GPL,SL R/W 1 Selective self-test log
0x10 GPL,SL R/O 1 NCQ Command Error log
0x11 GPL,SL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 1 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa0 GPL,SL VS 16 Device vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: SCT command executing in background (5)
Current Temperature: 35 Celsius
Power Cycle Min/Max Temperature: 31/41 Celsius
Lifetime Min/Max Temperature: 0/70 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 3 (Unknown, should be 2)
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (41)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 5 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 5 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

View File

@@ -0,0 +1,165 @@
smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.2-STABLE amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 840 PRO Series
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: DXM05B0Q
User Capacity: 128,035,676,160 bytes [128 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: Solid State Device
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Wed Jan 20 07:06:10 2021 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x80) Offline data collection activity
was never started.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 15) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 092 092 000 - 37025
12 Power_Cycle_Count -O--CK 099 099 000 - 117
177 Wear_Leveling_Count PO--C- 091 091 000 - 312
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 063 043 000 - 37
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 105
241 Total_LBAs_Written -O--CK 099 099 000 - 26094076694
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 GPL,SL R/O 1 Summary SMART error log
0x02 GPL,SL R/O 1 Comprehensive SMART error log
0x03 GPL,SL R/O 1 Ext. Comprehensive SMART error log
0x06 GPL,SL R/O 1 SMART self-test log
0x07 GPL,SL R/O 1 Extended self-test log
0x09 GPL,SL R/W 1 Selective self-test log
0x10 GPL,SL R/O 1 NCQ Command Error log
0x11 GPL,SL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 1 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa0 GPL,SL VS 16 Device vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 14864 -
# 2 Short offline Completed without error 00% 14863 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: SCT command executing in background (5)
Current Temperature: 37 Celsius
Power Cycle Min/Max Temperature: 35/43 Celsius
Lifetime Min/Max Temperature: 0/70 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 3 (Unknown, should be 2)
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (122)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 7 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 7 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

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