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Andrey Ponomarenko
2021-05-18 23:01:35 +03:00
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139
SSD/Samsung/MMCRE28/MMCRE28G5MXP-0VB 128GB/C1B5EBA7D492 Normal file
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smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p14-HBSD amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG MMCRE28G5MXP-0VB
Serial Number: --
LU WWN Device Id: 5 0000f0 ...
Firmware Version: VBM1901Q
User Capacity: 128,035,676,160 bytes [128 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ATA/ATAPI-7 T13/1532D revision 1
Local Time is: Mon Mar 15 04:46:40 2021 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Disabled
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 240) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 4) minutes.
Extended self-test routine
recommended polling time: ( 24) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
9 Power_On_Hours -O--CK 090 090 000 - 47953
12 Power_Cycle_Count -O--CK 098 098 000 - 1437
175 Program_Fail_Count_Chip -O--CK 090 090 010 - 6
176 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
177 Wear_Leveling_Count PO--C- 085 085 017 - 881
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 055 055 010 - 27
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 097 097 010 - 98
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 097 097 010 - 3742
181 Program_Fail_Cnt_Total -O--CK 099 099 010 - 6
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 099 099 010 - 6
187 Reported_Uncorrect -O--CK 100 100 000 - 0
195 Hardware_ECC_Recovered -O-RC- 200 200 000 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 UDMA_CRC_Error_Count -OSRCK 253 253 000 - 0
232 Available_Reservd_Space PO--C- 055 055 010 - 33
233 Media_Wearout_Indicator -O--CK 099 099 000 - 7894420
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 0
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 GPL,SL R/O 1 Summary SMART error log
0x02 GPL,SL R/O 1 Comprehensive SMART error log
0x03 GPL,SL R/O 1 Ext. Comprehensive SMART error log
0x06 GPL,SL R/O 1 SMART self-test log
0x07 GPL,SL R/O 1 Extended self-test log
0x09 GPL,SL R/W 1 Selective self-test log
0x10 GPL,SL R/O 1 NCQ Command Error log
0x11 GPL,SL R/O 1 SATA Phy Event Counters log
0x80-0x9f GPL,SL R/W 1 Host vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 2 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 2 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

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smartctl 7.1 2019-12-30 r5022 [i386-unknown-openbsd6.8] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG MMCRE28GFMXP-MVB
Serial Number: --
LU WWN Device Id: 5 0000f0 ...
Firmware Version: VBM1AS1Q
User Capacity: 128,035,676,160 bytes [128 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ATA/ATAPI-7 T13/1532D revision 1
Local Time is: Fri Feb 12 17:11:14 2021 MSK
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 240) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 4) minutes.
Extended self-test routine
recommended polling time: ( 24) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
9 Power_On_Hours 0x0032 099 099 000 Old_age Always - 49
12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 113
178 Used_Rsvd_Blk_Cnt_Chip 0x0013 085 085 010 Pre-fail Always - 9
179 Used_Rsvd_Blk_Cnt_Tot 0x0013 099 099 010 Pre-fail Always - 24
180 Unused_Rsvd_Blk_Cnt_Tot 0x0013 099 099 010 Pre-fail Always - 3816
183 Runtime_Bad_Block 0x0013 100 100 010 Pre-fail Always - 0
SMART Error Log Version: 1
ATA Error Count: 1
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1 occurred at disk power-on lifetime: 38 hours (1 days + 14 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 01 b0 c2 e7 ee Error: IDNF 1 sectors at LBA = 0x0ee7c2b0 = 250069680
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 01 b0 c2 e7 ee 00 00:11:09.000 READ DMA
ca 00 08 c0 ec 78 e0 00 00:11:08.000 WRITE DMA
ca 00 08 00 25 3b e0 00 00:11:08.000 WRITE DMA
ca 00 08 98 d9 3a e0 00 00:11:06.000 WRITE DMA
ca 00 10 50 0d 63 e0 00 00:11:06.000 WRITE DMA
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.