80486DX2-66/SMART-open-study
1
0
Fork 0
mirror of https://github.com/bsdhw/SMART.git synced 2025-05-31 16:21:41 +05:30
Code Issues Activity

Update of reports (new: 4, modified: 1172)

Browse Source
This commit is contained in:
Andrey Ponomarenko
2025-01-05 03:17:30 +03:00
parent f3761f28ca
commit f78ebcf301
1176 changed files with 24053 additions and 22535 deletions
Download Patch File Download Diff File Expand all files Collapse all files

46
SSD/AMD/R3/R3SL120G/C909BD08929C
View File

@@ -1,4 +1,4 @@
smartctl 7.4 2023-08-01 r5530 [FreeBSD 14.1-RELEASE-p2 amd64] (local build)
smartctl 7.4 2023-08-01 r5530 [FreeBSD 14.1-RELEASE-p4 amd64] (local build)
Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
@@ -13,7 +13,7 @@ TRIM Command: Available, deterministic, zeroed
Device is: In smartctl database 7.3/5528
ATA Version is: ACS-2 (minor revision not indicated)
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Thu Aug 15 20:40:26 2024 EDT
Local Time is: Mon Sep 16 22:44:43 2024 EDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
@@ -65,20 +65,20 @@ Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate ------ 100 100 000 - 0
5 Reallocated_Sector_Ct ------ 100 100 000 - 1
9 Power_On_Hours ------ 100 100 000 - 10132
9 Power_On_Hours ------ 100 100 000 - 10330
12 Power_Cycle_Count ------ 100 100 000 - 1032
160 Uncorrectable_Error_Cnt ------ 100 100 000 - 0
161 Valid_Spare_Block_Cnt ------ 100 100 000 - 81
163 Initial_Bad_Block_Count ------ 100 100 000 - 19
164 Total_Erase_Count ------ 100 100 000 - 1101837
165 Max_Erase_Count ------ 100 100 000 - 919
166 Min_Erase_Count ------ 100 100 000 - 818
167 Average_Erase_Count ------ 100 100 000 - 864
164 Total_Erase_Count ------ 100 100 000 - 1253446
165 Max_Erase_Count ------ 100 100 000 - 1036
166 Min_Erase_Count ------ 100 100 000 - 935
167 Average_Erase_Count ------ 100 100 000 - 983
168 Max_Erase_Count_of_Spec ------ 100 100 000 - 1000
169 Remaining_Lifetime_Perc ------ 100 100 000 - 14
169 Remaining_Lifetime_Perc ------ 100 100 000 - 2
175 Program_Fail_Count_Chip ------ 100 100 000 - 1
176 Erase_Fail_Count_Chip ------ 100 100 000 - 0
177 Wear_Leveling_Count ------ 100 100 050 - 8121
177 Wear_Leveling_Count ------ 100 100 050 - 9142
178 Runtime_Invalid_Blk_Cnt ------ 100 100 000 - 0
181 Program_Fail_Cnt_Total ------ 100 100 000 - 1
182 Erase_Fail_Count_Total ------ 100 100 000 - 0
@@ -90,9 +90,9 @@ ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
198 Offline_Uncorrectable ------ 100 100 000 - 0
199 UDMA_CRC_Error_Count ------ 100 100 050 - 80
232 Available_Reservd_Space ------ 100 100 000 - 100
241 Host_Writes_32MiB ------ 100 100 000 - 3116739
242 Host_Reads_32MiB ------ 100 100 000 - 170485
245 TLC_Writes_32MiB ------ 100 100 000 - 2203674
241 Host_Writes_32MiB ------ 100 100 000 - 3338252
242 Host_Reads_32MiB ------ 100 100 000 - 170770
245 TLC_Writes_32MiB ------ 100 100 000 - 2506892
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
@@ -123,7 +123,7 @@ No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Offline Completed without error 00% 10132 -
# 1 Offline Completed without error 00% 10330 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
@@ -141,7 +141,7 @@ SCT Status Version: 3
SCT Version (vendor specific): 0 (0x0000)
Device State: Active (0)
Current Temperature: 0 Celsius
Power Cycle Min/Max Temperature: -1/ 0 Celsius
Power Cycle Min/Max Temperature: 30/30 Celsius
Lifetime Min/Max Temperature: 0/30 Celsius
Under/Over Temperature Limit Count: 0/0
@@ -150,7 +150,7 @@ Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 0/100 Celsius
Min/Max Temperature Limit: 0/100 Celsius
Temperature History Size (Index): 128 (35)
Temperature History Size (Index): 128 (46)
SCT Error Recovery Control command not supported
@@ -158,19 +158,19 @@ Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 2) ==
0x01 0x008 4 1032 --- Lifetime Power-On Resets
0x01 0x010 4 10132 --- Power-on Hours
0x01 0x018 6 2395158264 --- Logical Sectors Written
0x01 0x020 6 1446409295 --- Number of Write Commands
0x01 0x028 6 2583012388 --- Logical Sectors Read
0x01 0x030 6 208167629 --- Number of Read Commands
0x01 0x010 4 10330 --- Power-on Hours
0x01 0x018 6 4027335960 --- Logical Sectors Written
0x01 0x020 6 1546884902 --- Number of Write Commands
0x01 0x028 6 2601663666 --- Logical Sectors Read
0x01 0x030 6 208757937 --- Number of Read Commands
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 8116448 --- Resets Between Cmd Acceptance and Completion
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 163618 --- Number of Hardware Resets
0x06 0x008 4 163896 --- Number of Hardware Resets
0x06 0x018 4 80 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 86 --- Percentage Used Endurance Indicator
0x07 0x008 1 98 --- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
@@ -188,7 +188,7 @@ ID Size Value Description
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 0 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 32 Device-to-host register FISes sent due to a COMRESET
0x000a 2 65 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC