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https://github.com/bsdhw/SMART.git
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Update of reports (new: 4, modified: 1172)
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@@ -14,7 +14,7 @@ TRIM Command: Available, deterministic
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Device is: In smartctl database 7.3/5528
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ATA Version is: ACS-2 (minor revision not indicated)
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SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
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Local Time is: Sun Aug 11 19:33:38 2024 EEST
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Local Time is: Sun Aug 11 22:40:08 2024 EEST
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SMART support is: Available - device has SMART capability.
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SMART support is: Enabled
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AAM feature is: Unavailable
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@@ -32,10 +32,10 @@ General SMART Values:
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Offline data collection status: (0x06) Offline data collection activity
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was aborted by the device with a fatal error.
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Auto Offline Data Collection: Disabled.
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Self-test execution status: ( 41) The self-test routine was interrupted
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by the host with a hard or soft reset.
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Self-test execution status: ( 121) The previous self-test completed having
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the read element of the test failed.
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Total time to complete Offline
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data collection: ( 37) seconds.
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data collection: ( 17) seconds.
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Offline data collection
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capabilities: (0x19) SMART execute Offline immediate.
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No Auto Offline data collection support.
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@@ -60,34 +60,34 @@ Vendor Specific SMART Attributes with Thresholds:
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ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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1 Raw_Read_Error_Rate POSR-- 166 166 006 - 0
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5 Retired_Block_Count -O--CK 253 100 036 - 0
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9 Power_On_Hours -O--CK 094 094 000 - 5735
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9 Power_On_Hours -O--CK 094 094 000 - 5738
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12 Power_Cycle_Count -O--CK 100 100 020 - 94
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100 Total_Erase_Count -O--CK 100 100 000 - 30847661
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168 Min_Erase_Count -O--CK 059 059 000 - 435
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100 Total_Erase_Count -O--CK 100 100 000 - 30903335
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168 Min_Erase_Count -O--CK 059 059 000 - 437
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169 Max_Erase_Count -O--CK 053 053 000 - 503
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171 Program_Fail_Count -O--CK 253 253 000 - 0
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172 Erase_Fail_Count -O--CK 253 253 000 - 0
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174 Unexpect_Power_Loss_Ct ----CK 100 100 000 - 7
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175 Program_Fail_Count_Chip -O--CK 253 253 000 - 0
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176 Unused_Rsvd_Blk_Cnt_Tot -O--CK 253 253 000 - 0
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177 Wear_Leveling_Count -O--CK 056 056 000 - 468
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177 Wear_Leveling_Count -O--CK 056 056 000 - 469
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178 Used_Rsvd_Blk_Cnt_Chip -O--CK 100 100 000 - 21
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179 Used_Rsvd_Blk_Cnt_Tot -O--CK 100 100 000 - 206
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180 Erase_Fail_Count -O--CK 100 100 000 - 5234
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184 End-to-End_Error -O--CK 100 100 000 - 6
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187 Reported_Uncorrect -O--CK 100 100 000 - 17
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188 Command_Timeout -O--CK 253 253 000 - 0
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194 Temperature_Celsius -O---- 050 000 000 - 50 (Min/Max 15/71)
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195 Hardware_ECC_Recovered -O--CK 098 065 000 - 95799200
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194 Temperature_Celsius -O---- 042 000 000 - 42 (Min/Max 15/71)
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195 Hardware_ECC_Recovered -O--CK 098 065 000 - 95799240
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196 Reallocated_Event_Count -O--CK 253 100 036 - 0
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198 Offline_Uncorrectable -O--CK 100 100 000 - 8
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199 UDMA_CRC_Error_Count -O--CK 253 253 000 - 0
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204 Soft_ECC_Correction -OSR-- 071 001 000 - 4904
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204 Soft_ECC_Correction -OSR-- 066 001 000 - 5796
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212 Phy_Error_Count -O--CK 253 253 000 - 0
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234 Unknown_SK_hynix_Attrib -O--CK 100 100 000 - 130281
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241 Total_Writes_GB -O--CK 100 100 000 - 9289
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234 Unknown_SK_hynix_Attrib -O--CK 100 100 000 - 130516
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241 Total_Writes_GB -O--CK 100 100 000 - 9311
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242 Total_Reads_GB -O--CK 100 100 000 - 833
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250 Read_Retry_Count -O--CK 100 100 000 - 8487440
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250 Read_Retry_Count -O--CK 100 100 000 - 8547581
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||||||_ K auto-keep
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|||||__ C event count
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||||___ R error rate
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@@ -115,7 +115,9 @@ No Errors Logged
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SMART Extended Self-test Log Version: 1 (2 sectors)
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Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
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# 1 Short offline Completed: read failure 90% 225 1460728
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# 1 Extended offline Completed: read failure 90% 5735 1461584
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# 2 Short offline Completed: read failure 90% 5735 1461352
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# 3 Short offline Completed: read failure 90% 225 1460728
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Selective Self-tests/Logging not supported
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