smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE-p7 amd64] (local build) Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: SAMSUNG SpinPoint P80 SD Device Model: SAMSUNG HD160JJ/P Serial Number: -- Firmware Version: ZM100-43 User Capacity: 160,041,885,696 bytes [160 GB] Sector Size: 512 bytes logical/physical Device is: In smartctl database [for details use: -P show] ATA Version is: ATA/ATAPI-7 T13/1532D revision 4a Local Time is: Wed Jul 15 11:32:42 2020 +05 SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED See vendor-specific Attribute list for marginal Attributes. General SMART Values: Offline data collection status: (0x84) Offline data collection activity was suspended by an interrupting command from host. Auto Offline Data Collection: Enabled. Self-test execution status: ( 37) The self-test routine was interrupted by the host with a hard or soft reset. Total time to complete Offline data collection: ( 3726) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 62) minutes. SCT capabilities: (0x003f) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-- 100 100 051 - 22 3 Spin_Up_Time POS--- 100 100 025 - 5760 4 Start_Stop_Count -O--CK 098 098 000 - 2841 5 Reallocated_Sector_Ct PO--CK 253 253 010 - 0 7 Seek_Error_Rate POSR-- 253 253 051 - 0 8 Seek_Time_Performance P-S--K 253 253 015 - 0 9 Power_On_Hours -O--CK 100 100 000 - 13148 10 Spin_Retry_Count PO--CK 253 253 051 - 0 11 Calibration_Retry_Count -O--C- 253 100 000 - 0 12 Power_Cycle_Count -O--CK 099 099 000 - 1494 187 Reported_Uncorrect -O--CK 253 253 000 - 0 190 Airflow_Temperature_Cel -O---K 042 029 045 NOW 58 194 Temperature_Celsius -O---K 042 029 000 - 58 195 Hardware_ECC_Recovered -O-RC- 100 100 000 - 39927804 196 Reallocated_Event_Count -O--CK 253 253 000 - 0 197 Current_Pending_Sector -O--C- 253 253 000 - 0 198 Offline_Uncorrectable ----CK 253 253 000 - 0 199 UDMA_CRC_Error_Count -OSRCK 200 200 000 - 0 200 Multi_Zone_Error_Rate -O-R-- 100 100 000 - 0 201 Soft_Read_Error_Rate -O-R-- 100 100 000 - 0 202 Data_Address_Mark_Errs -O--CK 253 253 000 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 2 Comprehensive SMART error log 0x03 GPL R/O 2 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log SMART Extended Comprehensive Error Log Version: 1 (2 sectors) Invalid Error Log index = 0x0000, trying reserved byte (0x01) instead Device Error Count: 1 CR = Command Register FEATR = Features Register COUNT = Count (was: Sector Count) Register LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8 LH = LBA High (was: Cylinder High) Register ] LBA LM = LBA Mid (was: Cylinder Low) Register ] Register LL = LBA Low (was: Sector Number) Register ] DV = Device (was: Device/Head) Register DC = Device Control Register ER = Error register ST = Status register Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 1 [0] occurred at disk power-on lifetime: 7103 hours (295 days + 23 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 84 -- 51 00 10 00 00 02 55 51 e7 e0 00 Error: ICRC, ABRT 16 sectors at LBA = 0x025551e7 = 39145959 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- 35 00 00 00 10 00 00 02 55 51 e7 e0 00 00:13:01.875 WRITE DMA EXT 35 00 00 00 08 00 00 00 40 ba 4f e0 00 00:12:58.813 WRITE DMA EXT 35 00 00 00 08 00 00 00 00 87 7f e0 00 00:12:57.813 WRITE DMA EXT 35 00 00 00 08 00 00 00 01 b3 bf e0 00 00:12:57.813 WRITE DMA EXT 35 00 00 00 08 00 00 00 01 7f 5f e0 00 00:12:57.813 WRITE DMA EXT SMART Extended Self-test Log (GP Log 0x07) not supported SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Extended offline Interrupted (host reset) 50% 1 - SMART Selective self-test log data structure revision number 0 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 2 SCT Version (vendor specific): 256 (0x0100) Device State: Active (0) Current Temperature: 58 Celsius Power Cycle Min/Max Temperature: --/60 Celsius Lifetime Min/Max Temperature: --/70 Celsius SCT Temperature History Version: 2 Temperature Sampling Period: 1 minute Temperature Logging Interval: 1 minute Min/Max recommended Temperature: 10/55 Celsius Min/Max Temperature Limit: 5/60 Celsius Temperature History Size (Index): 128 (53) SCT Error Recovery Control: Read: Disabled Write: Disabled Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x000a 2 10 Device-to-host register FISes sent due to a COMRESET 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 2 5 Transition from drive PhyRdy to drive PhyNRdy 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS 0x8001 2 0 Vendor specific