smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE amd64] (local build) Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: SAMSUNG SpinPoint T166 Device Model: SAMSUNG HD501LJ Serial Number: -- LU WWN Device Id: 5 0000f0 ... Firmware Version: CR100-12 User Capacity: 500,107,862,016 bytes [500 GB] Sector Size: 512 bytes logical/physical Device is: In smartctl database [for details use: -P show] ATA Version is: ATA8-ACS T13/1699-D revision 3b SATA Version is: SATA 2.5, 3.0 Gb/s Local Time is: Mon May 25 14:02:02 2020 MSK SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM level is: 254 (maximum performance), recommended: 254 APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, NOT FROZEN [SEC1] Wt Cache Reorder: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 9032) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 154) minutes. SCT capabilities: (0x003f) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-- 100 100 051 - 4 3 Spin_Up_Time POS--- 100 100 015 - 7360 4 Start_Stop_Count -O--CK 096 096 000 - 4156 5 Reallocated_Sector_Ct PO--CK 253 253 010 - 0 7 Seek_Error_Rate POSR-- 253 253 051 - 0 8 Seek_Time_Performance P-S--K 253 253 015 - 0 9 Power_On_Hours -O--CK 100 100 000 - 96344 10 Spin_Retry_Count PO--CK 253 253 051 - 0 11 Calibration_Retry_Count -O--C- 253 253 000 - 0 12 Power_Cycle_Count -O--CK 096 096 000 - 4141 13 Read_Soft_Error_Rate -OSR-- 100 100 000 - 392426628 187 Reported_Uncorrect -O--CK 253 253 000 - 0 188 Command_Timeout -O--CK 100 100 000 - 1 190 Airflow_Temperature_Cel -O---K 061 050 000 - 39 194 Temperature_Celsius -O---K 121 088 000 - 39 195 Hardware_ECC_Recovered -O-RC- 100 100 000 - 392426628 196 Reallocated_Event_Count -O--CK 253 253 000 - 0 197 Total_Pending_Sectors -O--C- 253 253 000 - 0 198 Offline_Uncorrectable ----CK 253 253 000 - 0 199 UDMA_CRC_Error_Count -OSRCK 200 200 000 - 0 200 Multi_Zone_Error_Rate -O-R-- 100 100 000 - 0 201 Soft_Read_Error_Rate -O-R-- 100 100 000 - 0 202 Data_Address_Mark_Errs -O--CK 253 253 000 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 2 Comprehensive SMART error log 0x03 GPL R/O 2 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x09 GPL,SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (2 sectors) Invalid Error Log index = 0x0000, trying reserved byte (0x01) instead Device Error Count: 1 CR = Command Register FEATR = Features Register COUNT = Count (was: Sector Count) Register LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8 LH = LBA High (was: Cylinder High) Register ] LBA LM = LBA Mid (was: Cylinder Low) Register ] Register LL = LBA Low (was: Sector Number) Register ] DV = Device (was: Device/Head) Register DC = Device Control Register ER = Error register ST = Status register Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 1 [0] occurred at disk power-on lifetime: 12562 hours (523 days + 10 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 04 -- 51 00 80 00 00 00 21 c4 bf e0 00 Error: ABRT 128 sectors at LBA = 0x0021c4bf = 2213055 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- 35 00 00 00 80 00 00 00 21 c4 bf e0 00 00:01:58.375 WRITE DMA EXT 25 00 00 00 80 00 00 00 21 c5 bf e0 00 00:01:58.375 READ DMA EXT 25 00 00 00 80 00 00 00 21 c5 3f e0 00 00:01:58.375 READ DMA EXT 25 00 00 00 80 00 00 00 21 c4 bf e0 00 00:01:58.375 READ DMA EXT 25 00 00 00 80 00 00 00 21 c4 3f e0 00 00:01:58.375 READ DMA EXT SMART Extended Self-test Log (GP Log 0x07) not supported SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 0 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 2 SCT Version (vendor specific): 256 (0x0100) Device State: Active (0) Current Temperature: 39 Celsius Power Cycle Min/Max Temperature: 29/48 Celsius Lifetime Min/Max Temperature: 11/50 Celsius Under/Over Temperature Limit Count: 0/0 SCT Temperature History Version: 2 Temperature Sampling Period: 1 minute Temperature Logging Interval: 1 minute Min/Max recommended Temperature: -4/72 Celsius Min/Max Temperature Limit: -9/77 Celsius Temperature History Size (Index): 128 (27) SCT Error Recovery Control: Read: Disabled Write: Disabled Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 2 14 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 63 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC 0x8001 2 0 Vendor specific