smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE amd64] (local build) Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: SAMSUNG SpinPoint F3 Device Model: SAMSUNG HD502HJ Serial Number: -- LU WWN Device Id: 5 0024e9 ... Firmware Version: 1AJ10001 User Capacity: 500,107,862,016 bytes [500 GB] Sector Size: 512 bytes logical/physical Rotation Rate: 7200 rpm Form Factor: 3.5 inches Device is: In smartctl database [for details use: -P show] ATA Version is: ATA8-ACS T13/1699-D revision 6 SATA Version is: SATA 2.6, 3.0 Gb/s Local Time is: Wed Feb 10 15:47:21 2021 EST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Disabled APM feature is: Disabled Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, NOT FROZEN [SEC1] Write SCT (Get) Feature Control Command failed: Read of ATA output registers not implemented [JMicron] Wt Cache Reorder: Unknown (SCT Feature Control command failed) === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 4560) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 76) minutes. SCT capabilities: (0x003f) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-K 100 100 051 - 6 2 Throughput_Performance -OS--K 252 252 000 - 0 3 Spin_Up_Time PO---K 082 082 025 - 5564 4 Start_Stop_Count -O--CK 100 100 000 - 144 5 Reallocated_Sector_Ct PO--CK 252 252 010 - 0 7 Seek_Error_Rate -OSR-K 252 252 051 - 0 8 Seek_Time_Performance --S--K 252 252 015 - 0 9 Power_On_Hours -O--CK 100 100 000 - 45051 10 Spin_Retry_Count -O--CK 252 252 051 - 0 11 Calibration_Retry_Count -O--CK 252 252 000 - 0 12 Power_Cycle_Count -O--CK 100 100 000 - 150 191 G-Sense_Error_Rate -O---K 252 252 000 - 0 192 Power-Off_Retract_Count -O---K 252 252 000 - 0 194 Temperature_Celsius -O---- 064 048 000 - 35 (Min/Max 17/53) 195 Hardware_ECC_Recovered -O-RCK 100 100 000 - 0 196 Reallocated_Event_Count -O--CK 252 252 000 - 0 197 Current_Pending_Sector -O--CK 252 252 000 - 0 198 Offline_Uncorrectable ----CK 252 252 000 - 0 199 UDMA_CRC_Error_Count -OS-CK 100 100 000 - 18 200 Multi_Zone_Error_Rate -O-R-K 100 100 000 - 7 223 Load_Retry_Count -O--CK 252 252 000 - 0 225 Load_Cycle_Count -O--CK 100 100 000 - 151 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning ATA_READ_LOG_EXT (addr=0x00:0x00, page=0, n=1) failed: 48-bit ATA commands not implemented [JMicron] Read GP Log Directory failed SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 2 Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x09 SL R/W 1 Selective self-test log 0x80-0x9f SL R/W 16 Host vendor specific log 0xe0 SL R/W 1 SCT Command/Status 0xe1 SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log (GP Log 0x03) not supported SMART Error Log Version: 1 ATA Error Count: 1 CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 1 occurred at disk power-on lifetime: 18658 hours (777 days + 10 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 01 00 00 00 e0 Error: ICRC, ABRT 1 sectors at LBA = 0x00000000 = 0 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 01 00 00 00 e0 00 00:08:16.000 READ DMA ef 03 42 00 00 00 a0 00 00:08:16.000 SET FEATURES [Set transfer mode] ec 00 00 00 00 00 a0 00 00:08:16.000 IDENTIFY DEVICE 00 00 01 01 00 00 00 00 00:08:16.000 NOP [Abort queued commands] 00 00 01 01 00 00 00 00 00:08:15.996 NOP [Abort queued commands] SMART Extended Self-test Log (GP Log 0x07) not supported SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 0 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Completed [00% left] (0-65535) 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 2 SCT Version (vendor specific): 256 (0x0100) Device State: Active (0) Current Temperature: 35 Celsius Power Cycle Min/Max Temperature: 21/35 Celsius Lifetime Min/Max Temperature: 20/67 Celsius Specified Max Operating Temperature: 80 Celsius Under/Over Temperature Limit Count: 0/0 SCT Temperature History Version: 2 Temperature Sampling Period: 5 minutes Temperature Logging Interval: 5 minutes Min/Max recommended Temperature: -5/80 Celsius Min/Max Temperature Limit: -10/85 Celsius Temperature History Size (Index): 128 (0) Write SCT (Get) Error Recovery Control Command failed: Read of ATA output registers not implemented [JMicron] SCT (Get) Error Recovery Control command failed Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported ATA_READ_LOG_EXT (addr=0x11:0x00, page=0, n=1) failed: 48-bit ATA commands not implemented [JMicron] Read SATA Phy Event Counters failed