smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.0-STABLE amd64] (local build) Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: SAMSUNG SpinPoint P120 Device Model: SAMSUNG SP2004C Serial Number: -- Firmware Version: VM100-50 User Capacity: 200,049,647,616 bytes [200 GB] Sector Size: 512 bytes logical/physical Device is: In smartctl database 7.3/5319 ATA Version is: ATA/ATAPI-7 T13/1532D revision 4a Local Time is: Wed Apr 6 21:45:36 2022 MSK ==> WARNING: May need -F samsung3 enabled; see manual for details. SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Disabled APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, NOT FROZEN [SEC1] Wt Cache Reorder: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x02) Offline data collection activity was completed without error. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 4542) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 75) minutes. SCT capabilities: (0x003f) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-- 100 100 051 - 0 3 Spin_Up_Time POS--- 253 253 025 - 5760 4 Start_Stop_Count -O--CK 096 096 000 - 4388 5 Reallocated_Sector_Ct PO--CK 253 253 010 - 0 7 Seek_Error_Rate POSR-- 253 253 051 - 0 8 Seek_Time_Performance P-S--K 253 253 015 - 0 9 Power_On_Hours -O--CK 100 100 000 - 3736 10 Spin_Retry_Count PO--CK 253 253 051 - 0 11 Calibration_Retry_Count -O--C- 253 253 000 - 0 12 Power_Cycle_Count -O--CK 097 097 000 - 3786 187 Reported_Uncorrect -O--CK 097 097 000 - 4 190 Airflow_Temperature_Cel -O---K 148 118 000 - 30 194 Temperature_Celsius -O---K 148 118 000 - 30 195 Hardware_ECC_Recovered -O-RC- 100 100 000 - 570833 196 Reallocated_Event_Count -O--CK 253 253 000 - 0 197 Current_Pending_Sector -O--C- 253 100 000 - 0 198 Offline_Uncorrectable ----CK 253 253 000 - 0 199 UDMA_CRC_Error_Count -OSRCK 200 200 000 - 0 200 Multi_Zone_Error_Rate -O-R-- 100 100 000 - 0 201 Soft_Read_Error_Rate -O-R-- 253 100 000 - 0 202 Data_Address_Mark_Errs -O--CK 100 100 000 - 3 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 2 Comprehensive SMART error log 0x03 GPL R/O 2 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log SMART Extended Comprehensive Error Log Version: 1 (2 sectors) Invalid Error Log index = 0x0500 (reserved = 0x00) SMART Extended Self-test Log (GP Log 0x07) not supported SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 0 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 2 SCT Version (vendor specific): 256 (0x0100) Device State: Active (0) Current Temperature: 30 Celsius Power Cycle Min/Max Temperature: --/31 Celsius Lifetime Min/Max Temperature: --/40 Celsius SCT Temperature History Version: 2 Temperature Sampling Period: 1 minute Temperature Logging Interval: 1 minute Min/Max recommended Temperature: 10/55 Celsius Min/Max Temperature Limit: 5/60 Celsius Temperature History Size (Index): 128 (63) SCT Error Recovery Control: Read: Disabled Write: Disabled Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x000a 2 2 Device-to-host register FISes sent due to a COMRESET 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 2 0 Transition from drive PhyRdy to drive PhyNRdy 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS 0x8001 2 0 Vendor specific