smartctl 7.1 2019-12-30 r5022 [FreeBSD 11.3-RELEASE-p11 i386] (local build) Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Seagate U6 Device Model: ST320410A Serial Number: -- Firmware Version: 3.39 User Capacity: 20,020,396,032 bytes [20.0 GB] Sector Size: 512 bytes logical/physical Device is: In smartctl database [for details use: -P show] ATA Version is: ATA/ATAPI-6 (minor revision not indicated) Local Time is: Thu Aug 6 09:23:26 2020 +07 SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM level is: 128 (quiet), recommended: 128 APM level is: 64 (intermediate level with standby) Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 420) seconds. Offline data collection capabilities: (0x1d) SMART execute Offline immediate. No Auto Offline data collection support. Abort Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. No Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 42) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-- 062 052 025 - 182602739 3 Spin_Up_Time PO---- 098 098 000 - 0 4 Start_Stop_Count -O--CK 100 100 020 - 784 5 Reallocated_Sector_Ct PO--CK 100 100 036 - 2 7 Seek_Error_Rate POSR-- 077 060 030 - 61036697775 9 Power_On_Hours -O--CK 030 030 000 - 61916 10 Spin_Retry_Count PO--C- 100 100 097 - 0 12 Power_Cycle_Count -O--CK 098 098 020 - 2229 194 Temperature_Celsius -O---K 031 054 000 - 31 195 Hardware_ECC_Recovered -O-RC- 100 253 000 - 0 197 Current_Pending_Sector -O--C- 100 100 000 - 0 198 Offline_Uncorrectable ----C- 100 100 000 - 0 199 UDMA_CRC_Error_Count -OSRCK 200 200 000 - 0 200 Multi_Zone_Error_Rate ------ 100 253 000 - 0 202 Data_Address_Mark_Errs -O--CK 100 253 000 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory not supported SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 5 Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x80-0x9f SL R/W 16 Host vendor specific log 0xa0 SL VS 1 Device vendor specific log 0xa1 SL VS 20 Device vendor specific log 0xa2 SL VS 101 Device vendor specific log 0xa8 SL VS 20 Device vendor specific log 0xa9 SL VS 1 Device vendor specific log SMART Extended Comprehensive Error Log (GP Log 0x03) not supported SMART Error Log Version: 1 ATA Error Count: 1 CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 1 occurred at disk power-on lifetime: 75 hours (3 days + 3 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 00 51 20 71 17 8d eb Error: 32 sectors at LBA = 0x0b8d1771 = 193795953 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 ff 20 b1 10 2d e0 00 00:00:00.021 READ DMA c8 ff 01 4b ee 6d e0 00 00:00:01.261 READ DMA c8 ff 01 5f 66 00 e0 00 00:00:12.631 READ DMA c8 ff 03 5f f0 18 e0 00 00:00:00.020 READ DMA c8 ff 03 29 b9 01 e0 00 00:00:00.027 READ DMA SMART Extended Self-test Log (GP Log 0x07) not supported SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] Selective Self-tests/Logging not supported SCT Commands not supported Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) not supported