smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE-p2 amd64] (local build) Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Crucial/Micron RealSSD m4/C400/P400 Device Model: M4-CT128M4SSD1 Serial Number: -- LU WWN Device Id: 5 00a075 ... Firmware Version: 070H User Capacity: 128,035,676,160 bytes [128 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available, deterministic Device is: In smartctl database 7.3/5319 ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 6 SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Tue Oct 4 01:10:59 2022 UTC SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM level is: 254 (maximum performance) Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x80) Offline data collection activity was never started. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 595) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 9) minutes. Conveyance self-test routine recommended polling time: ( 3) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-K 100 100 050 - 0 5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0 9 Power_On_Hours -O--CK 100 100 001 - 62232 12 Power_Cycle_Count -O--CK 100 100 001 - 285 170 Grown_Failing_Block_Ct PO--CK 100 100 010 - 0 171 Program_Fail_Count -O--CK 100 100 001 - 0 172 Erase_Fail_Count -O--CK 100 100 001 - 0 173 Wear_Leveling_Count PO--CK 042 042 010 - 1765 174 Unexpect_Power_Loss_Ct -O--CK 100 100 001 - 233 181 Non4k_Aligned_Access -O---K 100 100 001 - 9986 6135 3850 183 SATA_Iface_Downshift -O--CK 100 100 001 - 0 184 End-to-End_Error PO--CK 100 100 050 - 0 187 Reported_Uncorrect -O--CK 100 100 001 - 0 188 Command_Timeout -O--CK 100 100 001 - 0 189 Factory_Bad_Block_Ct -OSR-- 100 100 001 - 80 194 Temperature_Celsius -O---K 100 100 000 - 0 195 Hardware_ECC_Recovered -O-RCK 100 100 001 - 0 196 Reallocated_Event_Count -O--CK 100 100 001 - 0 197 Current_Pending_Sector -O--CK 100 100 001 - 0 198 Offline_Uncorrectable ----CK 100 100 001 - 0 199 UDMA_CRC_Error_Count -O--CK 100 100 001 - 0 202 Perc_Rated_Life_Used ---RC- 042 042 001 - 58 206 Write_Error_Rate -OSR-- 100 100 001 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 51 Comprehensive SMART error log 0x03 GPL R/O 16383 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 255 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 3449 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa0 GPL VS 2000 Device vendor specific log 0xa0 SL VS 208 Device vendor specific log 0xa1-0xbf GPL,SL VS 1 Device vendor specific log 0xc0 GPL VS 80 Device vendor specific log 0xc1-0xdf GPL,SL VS 1 Device vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (16383 sectors) No Errors Logged SMART Extended Self-test Log size 3449 not supported SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Vendor (0xff) Completed without error 00% 59235 - # 2 Vendor (0xff) Completed without error 00% 21241 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 1 (0x0001) Device State: Active (0) Current Temperature: 0 Celsius Power Cycle Min/Max Temperature: --/ 0 Celsius Lifetime Min/Max Temperature: --/ 0 Celsius SCT Temperature History Version: 2 Temperature Sampling Period: 10 minutes Temperature Logging Interval: 10 minutes Min/Max recommended Temperature: 0/70 Celsius Min/Max Temperature Limit: -5/75 Celsius Temperature History Size (Index): 478 (12) SCT Error Recovery Control: Read: 40 (4.0 seconds) Write: 40 (4.0 seconds) Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 2) == 0x01 0x008 4 285 --- Lifetime Power-On Resets 0x01 0x010 4 62232 --- Power-on Hours 0x01 0x018 6 90986570755 --- Logical Sectors Written 0x01 0x020 6 2914703636 --- Number of Write Commands 0x01 0x028 6 100339101943 --- Logical Sectors Read 0x01 0x030 6 1087032348 --- Number of Read Commands 0x04 ===== = = === == General Errors Statistics (rev 1) == 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors 0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion 0x05 ===== = = === == Temperature Statistics (rev 1) == 0x05 0x008 1 0 --- Current Temperature 0x05 0x010 1 0 --- Average Short Term Temperature 0x05 0x018 1 0 --- Average Long Term Temperature 0x05 0x020 1 0 --- Highest Temperature 0x05 0x028 1 0 --- Lowest Temperature 0x05 0x030 1 0 --- Highest Average Short Term Temperature 0x05 0x038 1 0 --- Lowest Average Short Term Temperature 0x05 0x040 1 0 --- Highest Average Long Term Temperature 0x05 0x048 1 0 --- Lowest Average Long Term Temperature 0x05 0x050 4 - --- Time in Over-Temperature 0x05 0x058 1 70 --- Specified Maximum Operating Temperature 0x05 0x060 4 - --- Time in Under-Temperature 0x05 0x068 1 0 --- Specified Minimum Operating Temperature 0x06 ===== = = === == Transport Statistics (rev 1) == 0x06 0x008 4 0 --- Number of Hardware Resets 0x06 0x010 4 0 --- Number of ASR Events 0x06 0x018 4 0 --- Number of Interface CRC Errors 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 2 N-- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 4 0 Command failed due to ICRC error 0x000a 4 29 Device-to-host register FISes sent due to a COMRESET